JPS59186538A - Ophthalmic apparatus - Google Patents

Ophthalmic apparatus

Info

Publication number
JPS59186538A
JPS59186538A JP58061417A JP6141783A JPS59186538A JP S59186538 A JPS59186538 A JP S59186538A JP 58061417 A JP58061417 A JP 58061417A JP 6141783 A JP6141783 A JP 6141783A JP S59186538 A JPS59186538 A JP S59186538A
Authority
JP
Japan
Prior art keywords
eye
light
examined
light source
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58061417A
Other languages
Japanese (ja)
Other versions
JPH0365969B2 (en
Inventor
勲 松村
恭司 関口
馬立 治久
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP58061417A priority Critical patent/JPS59186538A/en
Publication of JPS59186538A publication Critical patent/JPS59186538A/en
Priority to US07/004,822 priority patent/US4762410A/en
Publication of JPH0365969B2 publication Critical patent/JPH0365969B2/ja
Granted legal-status Critical Current

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  • Eye Examination Apparatus (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 本発明は、眼底の撮影、眼の屈折力や角膜形状を測定す
る器械等において、被検眼のまばたきを検知したり、被
検眼と器械との距離を検知する眼科装置に関するもので
ある。
DETAILED DESCRIPTION OF THE INVENTION The present invention provides an ophthalmological device that detects the blinking of an eye to be examined and the distance between the eye to be examined and an instrument in an instrument that photographs the fundus of the eye, measures the refractive power of the eye, and the shape of the cornea. It is related to.

眼底の観察、撮影は眼科診断のみならず高血圧、糖尿病
の検査等成人病検診の分野においても広〈実施されてお
り、特に成人病検診の領域においては無散瞳眼底カメラ
の普及が著しい。ところが、この無散瞳眼底撮影の場合
には、一度撮影光を発光させると縮瞳が起り、再ひ自然
散瞳させるまでに待ち時間が必要になってくる上に、良
好な撮影結果が得られない場合は撮影のやり直しのため
の時間の無駄が極めて大きい。このため、被検眼のまば
たきによる失敗を如何に防止するかは重大な問題となっ
てくる。
Observation and photography of the fundus are widely practiced not only in ophthalmological diagnosis but also in the field of adult disease screening, such as hypertension and diabetes testing, and non-mydriatic fundus cameras are becoming particularly popular in the field of adult disease screening. However, in the case of this non-mydriatic fundus photography, once the photographing light is emitted, miosis occurs, and it is necessary to wait for the pupil to naturally dilate again, and it is difficult to obtain good photographic results. If this is not possible, there is a huge waste of time in reshooting. Therefore, how to prevent failure due to blinking of the eye to be examined becomes a serious problem.

本発明の目的は、上述の問題点を解決し、被検眼がまば
たきをしたか否かを検知すると共に、撮影光源の発光を
停止するようにした眼科装置を提供することにあり、そ
の要旨は、a察又は撮影のために被検眼を照明する手段
及びその反射光を受光する手段を備えた装置において、
被検眼に向けて瞼検出用光束を投影する手段と、被検眼
からの該時検知用光束の反射光を受光する手段とを有し
、該受光手段における反射光の受像位置から装置゛δの
作動を確61することを特徴とするものである。
SUMMARY OF THE INVENTION An object of the present invention is to solve the above-mentioned problems and to provide an ophthalmological apparatus that detects whether or not the subject's eye blinks and also stops the emission of light from a photographing light source. , an apparatus equipped with a means for illuminating the eye to be examined for observation or photography, and a means for receiving the reflected light,
It has a means for projecting a light beam for eyelid detection toward the subject's eye, and a means for receiving the reflected light of the detection light flux from the subject's eye. It is characterized by ensuring operation 61.

第1図は眼底カメラに適用した本発明の一実施例を示す
構成図であり、1はタングステンランプ客から成るa室
光源であり、この観察光源1から発光された光は、コン
デンサレンズ2a、赤外フィルタ3、キャノン放電管等
から成る撮影光源4、コンデンサレンズ2bを介してミ
ラー5に入射し、ここで偏向され順次にリングスリ・ン
ト板6、リレーレンズ7a、7bを経由して穴開きミラ
ー8に到達するようになっている。上述の照明光学系か
ら穴開きミラー8に入射した光は、穴開きミラー8によ
り被検眼Eの方向に反射され、被検眼Eの眼底Efを照
射し元の光路を戻り、更に穴開きミラー8を透過して観
察光学系に至ることになる。穴開きミラー8と被検眼E
との間には対物レンズ9が配置されており、穴開きミラ
ー8の背後にハ光軸に沿ってフォーカシングレンズ10
、撮影レンズ11、跳ね上げミラー12、シャッタ13
、撮影フィルム14が順次に配列されている。跳ね上げ
ミラー12の反射側には、光軸に沿って順次に撮影フィ
ルム14と共役の位置に置かれたフィールドレンズ15
、光路を変更するミラー16、TVレンズ17、撮像管
18が配置されている。
FIG. 1 is a block diagram showing an embodiment of the present invention applied to a fundus camera. Reference numeral 1 denotes a room light source consisting of a tungsten lamp, and the light emitted from this observation light source 1 is transmitted through a condenser lens 2a, The light enters a mirror 5 through an infrared filter 3, a photographing light source 4 consisting of a Canon discharge tube, etc., a condenser lens 2b, is deflected there, and is then sequentially passed through a ring slit plate 6, relay lenses 7a and 7b, and then perforated. It is designed to reach mirror 8. The light that enters the perforated mirror 8 from the above-mentioned illumination optical system is reflected by the perforated mirror 8 in the direction of the eye E to be examined, illuminates the fundus Ef of the eye E, returns to the original optical path, and then returns to the perforated mirror 8. and reaches the observation optical system. Hole mirror 8 and eye to be examined E
An objective lens 9 is arranged between the apertured mirror 8 and a focusing lens 10 along the optical axis.
, photographing lens 11, flip-up mirror 12, shutter 13
, photographic films 14 are arranged in sequence. On the reflective side of the flip-up mirror 12, there are field lenses 15 placed sequentially along the optical axis at positions conjugate with the photographic film 14.
, a mirror 16 for changing the optical path, a TV lens 17, and an image pickup tube 18 are arranged.

また、対物レンズ9の側部には時検知用照明光源19が
配置されており、被検眼Eに向うその射出光路に沿って
、第2図に示すようなスリット状の開口20aを有する
マスク板2o、撮影レンズ21が順次に配列され、その
被検眼前眼部からの反射光は対物レンズ9を隔てて照明
光源19と対称的に置かれた受像レンズ22、ラインセ
ンサ23に入射するようになっている。
Further, a time detection illumination light source 19 is arranged on the side of the objective lens 9, and a mask plate having a slit-shaped opening 20a as shown in FIG. 2o, photographing lenses 21 are arranged in sequence so that the reflected light from the anterior segment of the subject's eye enters an image receiving lens 22 and a line sensor 23 placed symmetrically with the illumination light source 19 across the objective lens 9; It has become.

この眼底カメラにおいては、照明光源1と撮影光源4は
コンデンサレンズ2aに関してほぼ共役てあり、観察時
には観察光源1が点灯され、写真撮影時には撮影光源4
か瞬時的に点灯される。光源像は別のコンデンサレンズ
2bによりリングスリット板6の近傍に一旦結像され、
次いてリレーレンズ7a、7bによりリンクスリント板
6の環状開口の像が穴聞きミラー8の近傍に結像され。
In this fundus camera, the illumination light source 1 and the photography light source 4 are almost conjugate with respect to the condenser lens 2a, and the observation light source 1 is turned on during observation, and the photography light source 4 is turned on during photography.
or it will turn on instantly. The light source image is once formed near the ring slit plate 6 by another condenser lens 2b,
Next, an image of the annular opening of the link slint plate 6 is formed in the vicinity of the listening mirror 8 by the relay lenses 7a and 7b.

ここで照明光は反射され左行する。そして、対物レンズ
9により被検眼Eの角11ジの近傍に環状開口の像を結
んだ後に眼底Efを照明する。
Here, the illumination light is reflected and travels to the left. Then, after forming an image of the annular aperture near the corner 11 of the eye E to be examined using the objective lens 9, the fundus Ef is illuminated.

眼底Efからの反射光は右行し、角膜及び対物レンズ9
により一旦結像した後に、穴開きミラー8を通過しフォ
ーカシングレンズ10及び撮影レンズ11によって合焦
結像されることになる。観察時には、眼底像は実線位置
にある跳ね上げミラー12により上方に導かれ、TVレ
ンズ17を介して撮像v18によって画像化され、写真
撮影時には跳ね上げミラー12が点線位置に回転し、眼
底像は開放されたシャッタ13を経由して撮影フィルム
14上に結像する。
The reflected light from the fundus Ef travels to the right and passes through the cornea and objective lens 9.
After the light is once formed into an image, it passes through the perforated mirror 8 and is focused and imaged by the focusing lens 10 and the photographing lens 11. During observation, the fundus image is guided upward by the flip-up mirror 12 located at the solid line position, and is converted into an image by the imaging v18 via the TV lens 17. When photography is performed, the flip-up mirror 12 rotates to the dotted line position, and the fundus image is The image is formed on the photographic film 14 via the opened shutter 13.

照明光源19からラインセンサ23に至る光学系はまは
たきを検知するためのものであり、照明光i19から射
出された時検知用光束は、マスク板20のスリマl−2
0aを経て撮影レンズ21でスリット状の光束となり、
第3図に示すように被検眼Eの虹彩部分を照明する。そ
して、虹彩Ei上のスリット照明光の反射光は受像レン
ズ22を介してラインセンサ23上に投影される。虹彩
Ei上のスリット照明部P1はラインセンサ23上で0
1の位置に結像する。ここで、被検眼Eがまばたきを行
ったとすると、スリット照明部は瞼Elに移動し、この
瞼E1上でのスリット照明部P2のラインセンサ23上
での結像位置は第4図に示すように02に移る。従って
、まばたきによってラインセンサ23上での照明部はQ
lから02に移行し、ラインセンサ23−ヒでの座標上
の移動として検知されることになる。そして、この信号
は図示しない表示手段により発光・発音等の手段で警報
したり、撮影光源4の発光を停止するなどの手段へと連
結できる。
The optical system from the illumination light source 19 to the line sensor 23 is for detecting dust, and the detection luminous flux emitted from the illumination light i19 is transmitted to the line sensor 23 of the mask plate 20.
After passing through 0a, it becomes a slit-shaped light beam at the photographing lens 21,
As shown in FIG. 3, the iris of the eye E to be examined is illuminated. Then, the reflected light of the slit illumination light on the iris Ei is projected onto the line sensor 23 via the image receiving lens 22. The slit illumination section P1 on the iris Ei is 0 on the line sensor 23.
Image is formed at position 1. Here, if the eye E to be examined blinks, the slit illumination section moves to the eyelid El, and the imaging position of the slit illumination section P2 on the eyelid E1 on the line sensor 23 is as shown in FIG. Move to 02. Therefore, when you blink, the illumination area on the line sensor 23 is Q
It shifts from l to 02, and is detected as a movement on the coordinates by the line sensor 23-hi. This signal can be connected to a display means (not shown) to issue a warning by emitting light or making a sound, or to stop the light emission of the photographing light source 4.

上述のシステムはまばたきの検知機構であるが、眼底カ
メラのアライメント機構としても使用できる。即ち、被
検眼Eと対物レンズ9との距離間隔は、そのままライン
センサ23上での像位置に対応し、予めその位置を設定
しておくことにより、その距離間隔の適否を判断するこ
とが可能である。この距離間隔については別の表示手段
、例えばTVモニタ上でのディスプレイ等にも表示する
ことができる。
Although the system described above is a blink detection mechanism, it can also be used as an alignment mechanism for a fundus camera. That is, the distance interval between the eye E to be examined and the objective lens 9 directly corresponds to the image position on the line sensor 23, and by setting that position in advance, it is possible to judge whether the distance interval is appropriate. It is. This distance interval can also be displayed on another display means, such as a display on a TV monitor.

また上述の実施例においては、照明光源19がらの瞼検
知用照明光の投影を対物レンズ9を用いずに行っている
が、対物レンズ9を介して投影・受像することも可能で
ある。第5図はその場合の実施例を示したものであり、
照明光源19から出射された光束はマスク20、撮影レ
ンズ21を経てスリット光となり、対物レンズ9を経て
被検眼Eにスリット照明部を形成するようにされている
。この照明部の反射像は対物レンズ9の直後に配置され
た偏向ミラー24、スリット開口25を経てラインセン
サ23に至り、Ql或いはQ2の受像位置に光束が投影
されることになる。また1 この実施例では光束の投影
位置を虹彩Eiとしたが、常膜の部分を使用することも
できる。更には、本来の眼底カメラの機能と区別するた
めに、瞼検知用光束の波長を観察・撮影時に使用する観
察光源1、撮影光#4とは異なる波長領域光を用いるな
どの手法も可能なことは云うまでもない。更には、眼底
カメラへの適用以外にも、例えば眼屈折力の測定装置や
角膜形状の測定装置への適用も可能であり、測定された
データの選択や削除に利用することも考えられる。
Further, in the above embodiment, the illumination light for eyelid detection from the illumination light source 19 is projected without using the objective lens 9, but it is also possible to project and receive the image through the objective lens 9. FIG. 5 shows an example in that case,
The light flux emitted from the illumination light source 19 passes through a mask 20 and a photographing lens 21 to become slit light, passes through an objective lens 9, and forms a slit illumination portion on the eye E to be examined. The reflected image of this illumination section passes through a deflection mirror 24 and a slit opening 25 arranged immediately after the objective lens 9, and reaches the line sensor 23, where a luminous flux is projected onto the image receiving position Ql or Q2. In addition, 1. In this embodiment, the projection position of the luminous flux is set to the iris Ei, but the normal membrane portion can also be used. Furthermore, in order to distinguish it from the function of the original fundus camera, it is also possible to use a method such as using light in a wavelength range different from the observation light source 1 and photographing light #4, which are used for observation and photographing, for the wavelength of the light beam for eyelid detection. Needless to say. Furthermore, in addition to application to a fundus camera, the present invention can also be applied to, for example, an eye refractive power measuring device or a corneal shape measuring device, and may be used to select or delete measured data.

上述したように本発明に係る眼科装置は、被検眼上での
反則位置の差異を検知することにより、容易に瞼のまば
たきを検知することができ、眼底の撮影や眼科測定での
誤操作の検知に効力を発揮しイI)る。
As described above, the ophthalmological apparatus according to the present invention can easily detect blinking of the eyelid by detecting the difference in the position of the irregularity on the eye to be examined, and can detect erroneous operations in fundus photography and ophthalmological measurements. It will be effective.

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本発明に係る眼科装置の実施例を示し、第1図は
その光学的配置図、第2図はマスクの正面図、第3図は
まばたき検知機構動作の説明図、第4図はラインセンサ
上での像移動の説明図、第5図はまばたき検知機構の他
の実施例の光学的配置図である。 符号1は観察光源、4は撮影光源、6はリングスリット
板、8は穴開きミラー、9は対物レンズ、12は跳ね上
げミラー、14は撮影フィルム、19は照明光源、20
はマスク板、21は撮影レンズ、22は受像レンズ、2
3はラインセンサ、24は偏向ミラー、25はスリット
開口、Eは被検眼、Efは眼底、Elは虹彩、Elは瞼
、Pl、P2は照明部、Ql、 Q2は受像位置である
The drawings show an embodiment of the ophthalmological apparatus according to the present invention, in which Fig. 1 is an optical arrangement thereof, Fig. 2 is a front view of the mask, Fig. 3 is an explanatory diagram of the operation of the blink detection mechanism, and Fig. 4 is a line diagram. FIG. 5, which is an explanatory diagram of image movement on the sensor, is an optical layout diagram of another embodiment of the blink detection mechanism. 1 is an observation light source, 4 is a photographic light source, 6 is a ring slit plate, 8 is a perforated mirror, 9 is an objective lens, 12 is a flip-up mirror, 14 is a photographic film, 19 is an illumination light source, 20
2 is a mask plate, 21 is a photographing lens, 22 is an image receiving lens, 2
3 is a line sensor, 24 is a deflection mirror, 25 is a slit aperture, E is the eye to be examined, Ef is the fundus, El is the iris, El is the eyelid, Pl and P2 are the illumination units, and Ql and Q2 are image receiving positions.

Claims (1)

【特許請求の範囲】 1、観察又は撮影のために被検眼を照明する手段及びそ
の反射光を受光する手段を備えた装置において、被検眼
に向けて瞼検出用光束を投影する手段と、被検眼からの
該瞼検知用光束の反射光を受光する手段とを有し、該受
光手段における反射光の受像位置から装置の作動を確認
することを特徴とする眼科装置。 2、前記瞼検知用光束はスリット状とした特許請求の範
囲第1項に記載の眼科装置。 3、前記装置の作動の確認は被検眼のまばたきとした特
許請求の範囲第1項に記載の眼科装置6゜ 4、前記装置の作動の確認は被検眼までの距離の検出と
した特許請求の範囲第1項に記載の眼科装置。 5、前記反射光の受像位置が所定の位置から外れた場合
に警告手段を作動するようにした特許請求の範囲f51
項に記載の眼科装置。 6、前記反射光の受像位置が所定の位置から外れた場合
に機能の一部又は全部を停止させるようにした特許請求
の範囲第1項に記載の眼科装置。
[Scope of Claims] 1. An apparatus comprising a means for illuminating the eye to be examined for observation or photography and a means for receiving the reflected light, comprising means for projecting a light beam for eyelid detection toward the eye to be examined; 1. An ophthalmologic apparatus, comprising means for receiving reflected light of the eyelid detection light beam from an eyelid test, and the operation of the apparatus is confirmed from the position at which the reflected light is received by the light receiving means. 2. The ophthalmologic apparatus according to claim 1, wherein the eyelid detection light beam has a slit shape. 3. The ophthalmological device according to claim 1, in which the operation of the device is confirmed by the blinking of the eye to be examined. The ophthalmological device according to scope 1. 5. Claim f51 in which a warning means is activated when the image receiving position of the reflected light deviates from a predetermined position.
Ophthalmological devices as described in Section. 6. The ophthalmological apparatus according to claim 1, wherein part or all of the functions are stopped when the image receiving position of the reflected light deviates from a predetermined position.
JP58061417A 1983-04-07 1983-04-07 Ophthalmic apparatus Granted JPS59186538A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP58061417A JPS59186538A (en) 1983-04-07 1983-04-07 Ophthalmic apparatus
US07/004,822 US4762410A (en) 1983-04-07 1987-01-12 Ophthalmic instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58061417A JPS59186538A (en) 1983-04-07 1983-04-07 Ophthalmic apparatus

Publications (2)

Publication Number Publication Date
JPS59186538A true JPS59186538A (en) 1984-10-23
JPH0365969B2 JPH0365969B2 (en) 1991-10-15

Family

ID=13170501

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58061417A Granted JPS59186538A (en) 1983-04-07 1983-04-07 Ophthalmic apparatus

Country Status (1)

Country Link
JP (1) JPS59186538A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4953111A (en) * 1987-02-12 1990-08-28 Omron Tateisi Electronics Co. Doze detector
JP4633242B2 (en) * 2000-10-18 2011-02-16 株式会社ニコン Ophthalmic equipment
WO2015083524A1 (en) * 2013-12-03 2015-06-11 浜松ホトニクス株式会社 Measuring device and measuring method
JP2015118523A (en) * 2013-12-18 2015-06-25 浜松ホトニクス株式会社 Measuring device and measuring method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53126791A (en) * 1977-04-12 1978-11-06 Canon Kk Ophthalmolgic decice

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53126791A (en) * 1977-04-12 1978-11-06 Canon Kk Ophthalmolgic decice

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4953111A (en) * 1987-02-12 1990-08-28 Omron Tateisi Electronics Co. Doze detector
JP4633242B2 (en) * 2000-10-18 2011-02-16 株式会社ニコン Ophthalmic equipment
WO2015083524A1 (en) * 2013-12-03 2015-06-11 浜松ホトニクス株式会社 Measuring device and measuring method
JP2015107155A (en) * 2013-12-03 2015-06-11 浜松ホトニクス株式会社 Measuring device and measurement method
US10722112B2 (en) 2013-12-03 2020-07-28 Hamamatsu Photonics K.K. Measuring device and measuring method
JP2015118523A (en) * 2013-12-18 2015-06-25 浜松ホトニクス株式会社 Measuring device and measuring method
WO2015093202A1 (en) * 2013-12-18 2015-06-25 浜松ホトニクス株式会社 Measurement device and measurement method
US10478063B2 (en) 2013-12-18 2019-11-19 Hamamatsu Photonics K.K. Measurement device and measurement method

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