JPS59181573U - Sample chamber exhaust system in charged particle beam equipment - Google Patents

Sample chamber exhaust system in charged particle beam equipment

Info

Publication number
JPS59181573U
JPS59181573U JP7588683U JP7588683U JPS59181573U JP S59181573 U JPS59181573 U JP S59181573U JP 7588683 U JP7588683 U JP 7588683U JP 7588683 U JP7588683 U JP 7588683U JP S59181573 U JPS59181573 U JP S59181573U
Authority
JP
Japan
Prior art keywords
sample chamber
particle beam
charged particle
exhaust system
chamber exhaust
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7588683U
Other languages
Japanese (ja)
Inventor
健二 小原
Original Assignee
日本電子株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電子株式会社 filed Critical 日本電子株式会社
Priority to JP7588683U priority Critical patent/JPS59181573U/en
Publication of JPS59181573U publication Critical patent/JPS59181573U/en
Pending legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本考案の一実施例装置を示す構成略図である。 1・・・・・・試料室、2・・・・・・試料、3・・・
・・・2次電子検出器、4.5・・・・・・盲蓋、6・
・・・・・真空ポンプ、j・・・・・・電源、8・・・
・・・光検出器、9・・・・・・判別回路。
The drawing is a schematic diagram showing the structure of an embodiment of the present invention. 1...sample chamber, 2...sample, 3...
...Secondary electron detector, 4.5...Blind lid, 6.
...Vacuum pump, j...Power supply, 8...
...Photodetector, 9...Discrimination circuit.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 荷電粒子が照射される試料を収納する試料室と、該試料
室内に設けられた光を検出する光検出器と、該光検出器
よりの信号を判別する判別回路と、該判別回路よりの信
号によって前記試料室内を排気する真空ポンプを制御す
る手段を備えたことを特徴とする荷電粒子線装置におけ
る試料室排気装置。
A sample chamber that stores a sample to be irradiated with charged particles, a photodetector that detects light provided in the sample chamber, a discrimination circuit that discriminates a signal from the photodetector, and a signal from the discrimination circuit. A sample chamber evacuation device in a charged particle beam apparatus, comprising means for controlling a vacuum pump for evacuating the sample chamber.
JP7588683U 1983-05-20 1983-05-20 Sample chamber exhaust system in charged particle beam equipment Pending JPS59181573U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7588683U JPS59181573U (en) 1983-05-20 1983-05-20 Sample chamber exhaust system in charged particle beam equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7588683U JPS59181573U (en) 1983-05-20 1983-05-20 Sample chamber exhaust system in charged particle beam equipment

Publications (1)

Publication Number Publication Date
JPS59181573U true JPS59181573U (en) 1984-12-04

Family

ID=30205946

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7588683U Pending JPS59181573U (en) 1983-05-20 1983-05-20 Sample chamber exhaust system in charged particle beam equipment

Country Status (1)

Country Link
JP (1) JPS59181573U (en)

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