JPS59171805A - Measuring device for amount of eccentricity - Google Patents
Measuring device for amount of eccentricityInfo
- Publication number
- JPS59171805A JPS59171805A JP4652383A JP4652383A JPS59171805A JP S59171805 A JPS59171805 A JP S59171805A JP 4652383 A JP4652383 A JP 4652383A JP 4652383 A JP4652383 A JP 4652383A JP S59171805 A JPS59171805 A JP S59171805A
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- measured
- eccentricity
- amount
- difference
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
【発明の詳細な説明】
本発明は、高周波発振式磁気変位側及び高周波発振式静
電容量変位計を用いて、回転する物体(被測定物)等の
偏芯量を測定し、電気信号に変換する装置に関するもの
である。Detailed Description of the Invention The present invention uses a high frequency oscillation type magnetic displacement side and a high frequency oscillation type capacitance displacement meter to measure the eccentricity of a rotating object (object to be measured), etc., and converts it into an electrical signal. It relates to a device for converting.
従来、円柱形や円筒形等の部品製造工程においては、そ
の直径や内径等の寸法を測定し部品の良否選別を行なっ
ていた。Conventionally, in the process of manufacturing cylindrical or cylindrical parts, dimensions such as the diameter and inner diameter of the parts have been measured to determine whether the parts are good or bad.
近年、これらの良否判別は、直径及び内径等の寸法(公
差)より、その部品を回転させた時点の偏芯量を測定す
ることにより、部品全体の平衡度(バランス)を測定し
たいと言う要求が増してきたO
本発明は、物体(被測定物)の直径の大小にかかわらず
、物体を回転させた時の偏芯量のみをilH+1定する
目的で考案した。又、本方式を用いろことによや、温度
変化等で生じる変位計自身の誤差を相殺出来ろ利Aがあ
る。In recent years, there has been a demand for determining the quality of these parts by measuring the balance of the entire part by measuring the amount of eccentricity at the time the part is rotated, rather than dimensions (tolerances) such as diameter and inner diameter. The present invention was devised for the purpose of determining only the amount of eccentricity ilH+1 when rotating an object, regardless of the diameter of the object (object to be measured). Moreover, the use of this method has the advantage of being able to cancel out errors of the displacement meter itself caused by temperature changes and the like.
以下図面とともに本発明を実施例に基づき詳細に説明す
る。Hereinafter, the present invention will be explained in detail based on examples together with the drawings.
第1図は本発明の一実施例を示す簡略構成図であゆ、第
2図は実施例装置の要部波形図である。FIG. 1 is a simplified configuration diagram showing an embodiment of the present invention, and FIG. 2 is a waveform diagram of a main part of the embodiment device.
1は検出グローブであり、2は高周波発振式変位計であ
る。ここで、被測定物6と検出プローブ1との間隔(ギ
ャップ)dlc比例した電圧りを出力するものである。1 is a detection glove, and 2 is a high frequency oscillation type displacement meter. Here, a voltage proportional to the distance (gap) dlc between the object to be measured 6 and the detection probe 1 is outputted.
3はピークホールド回路で前記の電圧りの最大電圧Xを
保持する。又、4rユボトムホ一ルド回路で同様に電圧
りの最小電圧Yを保持する機能を有する。511差動増
幅器であり電圧XからYを減算した電圧2を出力する。3 is a peak hold circuit that holds the maximum voltage X of the voltages mentioned above. Further, the 4R bottom hold circuit similarly has the function of holding the minimum voltage Y of the voltage. It is a 511 differential amplifier and outputs voltage 2 obtained by subtracting Y from voltage X.
第8図は測定原理図で、7は被測定物体、8は検出ブロ
ーブである。FIG. 8 is a diagram showing the principle of measurement, where 7 is an object to be measured and 8 is a detection probe.
2なる電圧は被測定物体が検出プローブから最も離れた
時の電圧Xと最も接近した時の電圧Yとの差(z=x−
y )の電圧であり、これに被測定物体65実際に動い
た距@VC比例する電圧であり、被測定物の偏芯量にほ
かならない。The voltage 2 is the difference between voltage X when the object to be measured is farthest from the detection probe and voltage Y when it is closest (z=x-
y), which is proportional to the actual distance @VC of the object to be measured 65, and is nothing but the amount of eccentricity of the object to be measured.
本発明方式で偏芯量を測定すれば、前記のfAII定原
理で明らかな様に、被測定物に対し検出プローブを任意
の位置に設置しても正確な測定ができ、又同じ理由で変
位訂自身の温度ドリフトにより生ずる誤差も著しく軽減
できる特徴をも有する。なお、本実施例では、回転物に
対する偏芯量について説明したが、被測定物が往復運動
や振動するものについての振れ幅の測定にも応用できる
ことは明らかである。If the amount of eccentricity is measured using the method of the present invention, as is clear from the above-mentioned fAII fixed principle, accurate measurement can be made even if the detection probe is placed at any position with respect to the object to be measured. It also has the feature of significantly reducing errors caused by temperature drift of the printer itself. In this embodiment, the amount of eccentricity with respect to a rotating object has been explained, but it is clear that the present invention can also be applied to measurement of the amplitude of vibration of an object to be measured that undergoes reciprocating motion or vibration.
【図面の簡単な説明】
第一図は本発明の一実施例の簡略構成図第二図は実施例
装置の要部波形図
第三図は測定原理図
1・・・検出グローブ部 2・・高周波発振式変位計
3・・・ピークホールド回路
4・・・ボトムホールド回路[Brief Description of the Drawings] Figure 1 is a simplified configuration diagram of an embodiment of the present invention. Figure 2 is a waveform diagram of the main parts of the embodiment device. Figure 3 is a diagram of the measurement principle. 1... Detection glove section 2... High frequency oscillation type displacement meter 3...Peak hold circuit 4...Bottom hold circuit
Claims (1)
ークホールド及びボトムホールドを同時に行なう機能を
有するもので、ピークホールド電圧とボトムホールド電
圧との差の電圧を出力させ、これを偏芯量電圧として出
力する装置。This device uses a high-frequency oscillation type displacement meter and has the function of simultaneously performing peak hold and bottom hold on its output voltage.It outputs the voltage that is the difference between the peak hold voltage and the bottom hold voltage, and calculates this as the amount of eccentricity. A device that outputs voltage.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4652383A JPS59171805A (en) | 1983-03-20 | 1983-03-20 | Measuring device for amount of eccentricity |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4652383A JPS59171805A (en) | 1983-03-20 | 1983-03-20 | Measuring device for amount of eccentricity |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS59171805A true JPS59171805A (en) | 1984-09-28 |
Family
ID=12749630
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4652383A Pending JPS59171805A (en) | 1983-03-20 | 1983-03-20 | Measuring device for amount of eccentricity |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59171805A (en) |
-
1983
- 1983-03-20 JP JP4652383A patent/JPS59171805A/en active Pending
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