JPS59163943U - 光軸モニタ装置 - Google Patents

光軸モニタ装置

Info

Publication number
JPS59163943U
JPS59163943U JP1983057795U JP5779583U JPS59163943U JP S59163943 U JPS59163943 U JP S59163943U JP 1983057795 U JP1983057795 U JP 1983057795U JP 5779583 U JP5779583 U JP 5779583U JP S59163943 U JPS59163943 U JP S59163943U
Authority
JP
Japan
Prior art keywords
optical axis
monitor device
light beam
axis monitor
monitor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1983057795U
Other languages
English (en)
Inventor
隆 西尾
友良 池谷
Original Assignee
パイオニア株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by パイオニア株式会社 filed Critical パイオニア株式会社
Priority to JP1983057795U priority Critical patent/JPS59163943U/ja
Priority to US06/601,458 priority patent/US4627725A/en
Publication of JPS59163943U publication Critical patent/JPS59163943U/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G01B11/272—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Moving Of The Head For Recording And Reproducing By Optical Means (AREA)
  • Optical Head (AREA)
  • Manufacturing Optical Record Carriers (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。

Description

【図面の簡単な説明】
第１図は本考案の原理を示す模式図、第２図は光軸モニ
タ用回路の一例を示す図、第３図は本考案の実施例の模
式図である。 主要部分の符号の説明、１・・・・・・光源、２・・・
・・・光路、３・・・・・・ビームスプリッタ、４・・
・・・・モニタ用受光素子。

Claims (1)

    【実用新案登録請求の範囲】
  1. 光学装置における光ビームの光軸変動をモニタする光軸
    モニタ装置であって、前記光ビームの通過経路内に設け
    られたｅ−ムスプリツタと、前記ビームスプリッタによ
    り分岐された光ビームを受光するモニタ素子とからなり
    、前記モニタ素子の出力により前記光ビームの光軸変動
    情報を得るようにしてなることを特徴とする光軸モニタ
    装置。
JP1983057795U 1983-04-18 1983-04-18 光軸モニタ装置 Pending JPS59163943U (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP1983057795U JPS59163943U (ja) 1983-04-18 1983-04-18 光軸モニタ装置
US06/601,458 US4627725A (en) 1983-04-18 1984-04-18 Optical axis monitoring system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1983057795U JPS59163943U (ja) 1983-04-18 1983-04-18 光軸モニタ装置

Publications (1)

Publication Number Publication Date
JPS59163943U true JPS59163943U (ja) 1984-11-02

Family

ID=13065822

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1983057795U Pending JPS59163943U (ja) 1983-04-18 1983-04-18 光軸モニタ装置

Country Status (2)

Country Link
US (1) US4627725A (ja)
JP (1) JPS59163943U (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008003607A (ja) * 2006-06-23 2008-01-10 Asml Holding Nv 光学ズーム組立体における光学素子の軸外トランスレーションの補正

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06101127B2 (ja) * 1985-03-13 1994-12-12 シャープ株式会社 光学ヘツド
JPH0746435B2 (ja) * 1985-03-14 1995-05-17 オリンパス光学工業株式会社 光学的情報記録再生装置における光ピックアップの異常判別装置
DE3531615A1 (de) * 1985-09-04 1987-03-05 Busch Dieter & Co Prueftech Vorrichtung zum feststellen und ueberwachen von aenderungen der position von wellen
US5026964A (en) * 1986-02-28 1991-06-25 General Electric Company Optical breakthrough sensor for laser drill
US4818101A (en) * 1986-12-02 1989-04-04 The Boeing Company Laser-doppler velocimetry
GB2209089B (en) * 1987-08-26 1991-07-03 Sony Corp Optical recording and/or reproducing apparatus.
US4889425A (en) * 1987-11-02 1989-12-26 The Boeing Company Laser alignment system
DE3739698A1 (de) * 1987-11-24 1989-06-08 Messerschmitt Boelkow Blohm Optronisches visier
US4907881A (en) * 1988-03-10 1990-03-13 The United States Of America As Represented By The United States Department Of Energy Precision alignment device
JPH0249225A (ja) * 1988-05-27 1990-02-19 Canon Inc 光学的情報記録再生装置
JPH0770066B2 (ja) * 1988-10-27 1995-07-31 パイオニア株式会社 光軸モニタ装置
DE3836954A1 (de) * 1988-10-29 1990-05-03 Philips Patentverwaltung Verfahren und anordnung zur ermittlung der lage der optischen achse eines lwl
US5224052A (en) * 1989-10-26 1993-06-29 Hamar M R Laser alignment control system
AU8322791A (en) * 1990-08-15 1992-03-17 Fraunhofer-Gesellschaft Zur Forderung Der Angewandten Forschung E.V. Device for detecting the position of laser beams
FR2772475B1 (fr) * 1997-12-17 2000-02-11 Cilas Procede et dispositif pour corriger automatiquement des erreurs de positionnement d'elements optiques d'une chaine optique
DE10111825B4 (de) * 2001-03-13 2019-03-07 Leica Microsystems Cms Gmbh Anordnung zum Justieren von mindestens einem Lichtstrahl in einem optischen System
DE10111824B4 (de) * 2001-03-13 2017-04-06 Leica Microsystems Cms Gmbh Verfahren zum Justieren eines Mikroskops und Mikroskop mit Einrichtung zum Justieren des Lichtstrahls
DE10233074B4 (de) * 2002-07-19 2005-05-19 Leica Microsystems Heidelberg Gmbh Optische Vorrichtung zum Vereinigen von Lichtstrahlen und Scanmikroskop
JP4446087B2 (ja) * 2004-03-01 2010-04-07 独立行政法人情報通信研究機構 光検出装置及びこれを用いた光検出システム
ES2403172B1 (es) * 2011-09-22 2014-12-12 Jeanología, S.L. Método y sistema de ajuste de la alineación de un haz fotónico

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS449519Y1 (ja) * 1964-11-04 1969-04-17
JPS5318178B2 (ja) * 1973-10-09 1978-06-13

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3723013A (en) * 1970-10-23 1973-03-27 Atomic Energy Commission Alignment system
JPS5016423A (ja) * 1973-06-11 1975-02-21
US3942894A (en) * 1974-11-20 1976-03-09 The United States Of America As Represented By The Secretary Of The Air Force Self referencing retransmitting alignment sensor for a collimated light beam
US4123780A (en) * 1975-12-22 1978-10-31 Victor Company Of Japan, Limited Signal noise filtration for laser beam recording system
US4155096A (en) * 1977-03-22 1979-05-15 Martin Marietta Corporation Automatic laser boresighting
US4117319A (en) * 1977-07-05 1978-09-26 Rockwell International Corporation Alignment system for lasers
US4146329A (en) * 1977-09-14 1979-03-27 The United States Of America As Represented By The Secretary Of The Navy Autoalignment system for high power laser
US4295740A (en) * 1978-09-05 1981-10-20 Westinghouse Electric Corp. Photoelectric docking device
US4346994A (en) * 1980-06-25 1982-08-31 Cummins Engine Company, Inc. Secondary alignment target for an electro-optical alignment measuring system
JPS57147148A (en) * 1981-03-05 1982-09-10 Olympus Optical Co Ltd Information reproducer with magnetooptic system
JPS5877036A (ja) * 1981-10-30 1983-05-10 Olympus Optical Co Ltd ピット中心検出方法
US4466088A (en) * 1981-12-21 1984-08-14 Burroughs Corporation Galvo position sensor for track selection in optical data disk system
US4466739A (en) * 1982-02-26 1984-08-21 Kasner William H Laser beam alignment system

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS449519Y1 (ja) * 1964-11-04 1969-04-17
JPS5318178B2 (ja) * 1973-10-09 1978-06-13

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008003607A (ja) * 2006-06-23 2008-01-10 Asml Holding Nv 光学ズーム組立体における光学素子の軸外トランスレーションの補正

Also Published As

Publication number Publication date
US4627725A (en) 1986-12-09

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