JPS59163546A - Sample moving device - Google Patents

Sample moving device

Info

Publication number
JPS59163546A
JPS59163546A JP58037395A JP3739583A JPS59163546A JP S59163546 A JPS59163546 A JP S59163546A JP 58037395 A JP58037395 A JP 58037395A JP 3739583 A JP3739583 A JP 3739583A JP S59163546 A JPS59163546 A JP S59163546A
Authority
JP
Japan
Prior art keywords
sample
upper moving
arrow
moving table
moving base
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58037395A
Other languages
Japanese (ja)
Inventor
Masabumi Kanetomo
正文 金友
Takeshi Tajima
但馬 武
Kiyoshi Miyake
三宅 潔
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP58037395A priority Critical patent/JPS59163546A/en
Publication of JPS59163546A publication Critical patent/JPS59163546A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/12Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a flowing fluid or a flowing granular solid

Abstract

PURPOSE:To execute easily an operation of replacement of a sample, and to reduce a fault caused by gnawing of a driving system, etc. by driving an upper moving base by a chain, constituting it so that it can move freely on a lower moving base, and guiding all bearing parts by a rotary bearing using a rolling contact. CONSTITUTION:Total four pieces of plates 57 to which two bearings 56 are attached respectively are placed on a fixed base 55 in a vessel 51. This bearing 56 guides a lower moving base 58 in the direction as indicated with an arrow 59. The fixed base 55 is provided with four bearings 60, and guides the lower moving base 58 in the direction as indicated with an arrow 69. The lower moving base 58 moves in the forward and backward directions as indicated with an arrow 61 by an engagement of a pinion 79 and a rack 80 by driving of a rotation leading-in device 78. Also, a guide groove 82 is worked in the same direction as the moving direction, and in this groove, a bearing 63 attached to an upper moving base 62 moves in the direction as indicated with the arrow 61. Driving of this upper moving base 62 is executed by a chain 81 guided by a sprocket 65 whose both ends are supported by a rolling rotary bearing 64 on the lower moving base 58 and he fixed base 55.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は低真空圧のもとて試料の移動および受は渡しを
行う分析装置、蒸着装置等に用いられる試料移動装置の
改良に関するものである。
[Detailed Description of the Invention] [Field of Application of the Invention] The present invention relates to an improvement in a sample moving device used in an analysis device, a vapor deposition device, etc., which moves, receives, and transfers a sample under low vacuum pressure. .

〔背景技術〕[Background technology]

良質の薄膜を得る為には、不純物の極度に少ない低真空
圧の環境で蒸着を行うことが必賛である・しかも、その
薄膜を観察するために、例えば組成分析4行うオージェ
分析や、不純物の付層しない試料r得るため蒸着前に試
料をスパッタエツチングするクリーニング処理がある。
In order to obtain a high-quality thin film, it is essential to perform deposition in a low vacuum environment with extremely few impurities.Moreover, in order to observe the thin film, for example Auger analysis, which performs composition analysis4, and impurity In order to obtain a sample r without any deposition, there is a cleaning process in which the sample is sputter-etched before vapor deposition.

これらのオージェ分析やスパッタエツチングは、汚染の
関係で蒸着と同一真空室内で行うことができないので、
この蒸着装置には蒸着室と共に分析室、前処理室が必要
である。すなわち、このような蒸着装置では同−試相を
蒸着室5分析呈、前処理室に運搬する為の試料移動装置
が必要不可欠のものとなる。
Auger analysis and sputter etching cannot be performed in the same vacuum chamber as vapor deposition due to contamination.
This vapor deposition apparatus requires an analysis chamber and a pretreatment chamber as well as a vapor deposition chamber. That is, in such a vapor deposition apparatus, a sample moving device for transporting the same sample phase to the vapor deposition chamber 5 for analysis and pretreatment chamber is essential.

また、低真空圧で分析を行う装置では、真空排気の時間
を短かくして効率ケ上げる為試料交換時に分析室全大気
圧に開放しないために試料交換至をバルブケ介して分析
室に取り付ける構造とする。
In addition, for equipment that performs analysis at low vacuum pressure, in order to shorten the evacuation time and increase efficiency, the sample exchange station is attached to the analysis chamber via a valve so that the analysis chamber is not exposed to the full atmospheric pressure when replacing the sample. .

すなわち、試料交換時には、以下の手順による。That is, when replacing the sample, the following procedure is followed.

(1)バルブを閉じる。(11)試料交換室を大気に開
放し試料?納める。011)試料交換室を排気し、真空
圧とする。(iV)パルプr開ける。(V)試料交換室
から分析室へ試料?運搬する。IVDバルブ?閉じる。
(1) Close the valve. (11) Open the sample exchange chamber to the atmosphere and sample? Pay. 011) Evacuate the sample exchange chamber and apply vacuum pressure. (iv) Open the pulp r. (V) Sample from sample exchange room to analysis room? transport. IVD valve? close.

よって、この分析装置に於いても試料を交換室から分析
室に運搬する移動装置が必要不可決のものとなる。
Therefore, even in this analyzer, a moving device for transporting the sample from the exchange room to the analysis room becomes indispensable.

また、これらの装置では、前記した様に符に低真空圧で
蒸清1分析?行うだめ、真空室内の壁面および移動装置
表面から放出さCるガス?常に排気系で排気しなければ
低真空圧が維持できない。
Also, with these devices, as mentioned above, distillation 1 analysis can be performed at low vacuum pressure. What should I do? C gas released from the walls of the vacuum chamber and the surface of the moving device? Low vacuum pressure cannot be maintained unless the exhaust system is used constantly.

すなわち、真空排気系の能力には限度があるため放出ガ
ス量ケ出来るだけ少なくすることが必要である。したが
って、放出ガスの少い材料であるステンレス鋼、無酸素
銅のような限られた材料しか使用できない。
That is, since the capacity of the vacuum evacuation system is limited, it is necessary to reduce the amount of released gas as much as possible. Therefore, only limited materials such as stainless steel and oxygen-free copper, which emit less gas, can be used.

また、放出ガスの主成分である真空室内の壁面に付着し
ている水分を短時間で放出させる為に真空室全体を数時
間に渡って150〜200Cで加熱し、水分を強制的に
壁面から放出させるベーキング処理を行うことが必要と
なる。
In addition, in order to release moisture adhering to the walls of the vacuum chamber, which is the main component of the released gas, in a short time, the entire vacuum chamber is heated at 150 to 200 C for several hours to force the moisture away from the walls. It is necessary to carry out a baking treatment to release it.

一方、試料移動のなめらかな動き?得るために、潤滑剤
全案内面に使用するとこの潤滑材から多量のガスが長時
間に渡って放出され、分析蒸着に悪影響?与える。しか
も、そのガスが前記の放出ガスとなる。よって、低真空
圧内で使用する移動装置では潤滑剤は使用できない。
On the other hand, is the sample moving smoothly? If a lubricant is used on the entire guide surface in order to obtain a lubricant, a large amount of gas will be released from the lubricant over a long period of time, which will have an adverse effect on analytical deposition. give. Moreover, this gas becomes the above-mentioned released gas. Therefore, lubricants cannot be used in moving devices used within low vacuum pressures.

このだめ、このような装置で用いられる試料移動装置に
は、放出ガスが少なくて、ベーキング?行った時に接触
部にかじbr生じない性質が要求される。
Unfortunately, the sample moving device used in such an apparatus has a low release gas and is not used for baking. It is required that there is no scratching in the contact area when the contact is made.

第1図に従来の試料移動装置を示す。試料移動機構?収
めた容器1が、ゲートパルプ24介し試料台3を固定し
た低真空容器4に収り付いている。
FIG. 1 shows a conventional sample moving device. Sample movement mechanism? The contained container 1 is housed in a low vacuum container 4 to which a sample stage 3 is fixed via a gate pulp 24.

容器1内の固定台5の上に配置された2本の長いガイド
6上を上移動台7に取り付いた直線のころがり軸受27
が移動する。すなわち、上移動台7が矢印1工方向に動
くわけである。この駆動は、容器1に取り付いた回転導
入器8の先端のビニオン9と上移動台7上のラック10
のかみ合いで行なわれる。さらに、上移動台7には、移
動方向と同じ向きに案内面12が加工されており、この
中金上移動台13に取シついたベアリング14がころが
シ移動する。上移動台13には両端にワイヤ15が固定
されている。このワイヤ15は、上移動台7上のブー9
16で方向?それぞれ180゜曲げられ、固定台5に固
定されている。すなわち、第2図で駆動の原理を示すよ
うに、ラック31とビニオン32とで、上移動台33が
矢印34で示す距離だけ右方向に移動すると上移動台3
5は矢印36で示す上移動台33の移動距離のちょうど
2倍の距離だけ移動するわけである。すなわち、第1図
の上移動台7の倍の移動短期1だけ上移動台13が動く
。この時、上移動台13には、試料17を保持する試料
ホルダ18がのせられている。
A linear rolling bearing 27 is attached to the upper moving table 7 on two long guides 6 placed on the fixed table 5 in the container 1.
moves. That is, the upper moving table 7 moves in the direction of the arrow. This drive is carried out by the pinion 9 at the tip of the rotating introducer 8 attached to the container 1 and the rack 10 on the upper moving table 7.
It is done by interlocking. Furthermore, a guide surface 12 is machined in the upper moving table 7 in the same direction as the moving direction, and a bearing 14 attached to this inner metal upper moving table 13 is moved by rollers. A wire 15 is fixed to both ends of the upper moving table 13. This wire 15 is connected to the boot 9 on the upper moving table 7.
Direction at 16? Each of them is bent by 180 degrees and fixed to a fixed base 5. That is, as shown in FIG. 2 to illustrate the driving principle, when the upper moving table 33 is moved to the right by the distance indicated by the arrow 34 by the rack 31 and the pinion 32, the upper moving table 3
5 moves by exactly twice the distance that the upper moving table 33 moves as indicated by the arrow 36. That is, the upper movable table 13 moves by a short period of time 1, which is twice as long as the upper movable table 7 in FIG. At this time, a sample holder 18 that holds the sample 17 is placed on the upper moving table 13.

ここで、上移動台13が矢印11で示す前方向が、試料
台3と試料17ケ交換する位酋となる。試料交換時には
、上移動台13倉前に移動させ、試料ホルダ18上にあ
るビン19ケ試料台3上にある案内20でひっかけるこ
とで交換?行う。この時、試料台3上の案内20がビン
19tひっかけるため矢印21方向に回転する回転機構
28が合せて試料台3上に配置されて贋る。さらに、交
換の位置合せの為に試料台3の下部には、矢印22方向
に動くX移動台23と矢印24方向に動くZ移動台が取
り付いている。なお、この交換を確実にするために低真
空容器4には、内部r観察する為の観察用のガラス窓2
6が取り付いている。
Here, the forward direction of the upper moving stage 13 as indicated by the arrow 11 is the point at which the 17 samples are exchanged with the sample stage 3. When replacing the sample, move the upper moving table 13 to the front and hook the 19 bottles on the sample holder 18 with the guide 20 on the sample table 3. conduct. At this time, since the guide 20 on the sample stand 3 catches the bottle 19t, the rotation mechanism 28 that rotates in the direction of the arrow 21 is also placed on the sample stand 3 and is counterfeited. Furthermore, for alignment during exchange, an X moving table 23 that moves in the direction of arrow 22 and a Z moving table that moves in the direction of arrow 24 are attached to the lower part of the sample stage 3. In order to ensure this replacement, the low vacuum container 4 is equipped with an observation glass window 2 for observing the inside.
6 is attached.

しかしなから、上述した装置には、次のような欠点があ
る。
However, the above-mentioned device has the following drawbacks.

(1)試料を交換する試料台上に、試料ホルダのピンと
ひっかけるための回転移動が特別に必要となる。
(1) A special rotational movement is required on the sample stage where the sample is to be exchanged in order to hook it onto the pin of the sample holder.

すなわち、この移動を真空外部より導入する回転移動機
構が必要であるため、装置が複雑となシ、故障が多い。
That is, since a rotational movement mechanism is required to introduce this movement from outside the vacuum, the apparatus is complicated and often malfunctions.

(2)試料交換時、試料台の回転移動と、移動台の直線
移動との両方全駆動する回転導入器r同時にタイミング
ケ合せて動かす必要があるため操作が繁雑である。
(2) When exchanging a sample, the rotating introducer r that drives both the rotational movement of the sample stage and the linear movement of the moving stage must be moved at the same time, making the operation complicated.

(3)上移動台のガイドが細く長いので、装置全体が大
きくなり放出ガスが多くなる。また、ベーキングのくシ
返しで、ガイドに生じる熱変形の影脅(1rなくすため
軸と軸受のすき間を大きくすると、(1)軸受内のボー
ルと軸の間でモーメント力により応力集中が生じ、両名
°がかじシやすく7よる。(11)この部分のすき間に
よシ移動梢度が悪くなる。
(3) Since the guide of the upper moving table is long and thin, the entire device becomes large and a large amount of gas is released. In addition, if the gap between the shaft and the bearing is increased to eliminate the thermal deformation that occurs in the guide during baking, (1) stress concentration will occur due to moment force between the ball in the bearing and the shaft; (11) Due to the gap in this part, the movement of the tree becomes worse.

(4)ピニオンが片持ち支持のため駆動時にその支持部
に大きなモーメント荷重が加わるので長時間の使用には
耐えない。
(4) Since the pinion is supported on a cantilever, a large moment load is applied to the support portion during driving, so it cannot withstand long-term use.

以上のような理由で、本格動台?備えた真空装置では、
試料交換の操作が復雑で長時間を要すので、確実性の乏
・しいものとなる。しかも、1駆動系およびガイドのか
じりによる故障が多く、真空排気に要する時間も長いも
のとなっている。
For the above reasons, is it a full-fledged movement? The vacuum equipment equipped with
The sample exchange operation is complicated and takes a long time, resulting in poor reliability. Moreover, there are many failures due to galling of the drive system and guide, and the time required for evacuation is also long.

〔発明の目的〕[Purpose of the invention]

したがって、本発明の目的は、上記の欠点に層目してな
されたものであり、上述の如き真空装置に於いて、試料
交換の操作が容易で、駆動系等のかじり付きによる故障
が少ない試料移動装置ケ提供することにある。
Therefore, an object of the present invention has been made to address the above-mentioned drawbacks, and is to provide a vacuum apparatus such as the one described above, in which the sample exchange operation is easy and there are fewer failures due to galling of the drive system, etc. The goal is to provide mobile devices.

〔発明の概要〕[Summary of the invention]

上記の目的全達成するため、本発明では、上移動台ケチ
ェーン駆動とし、上移動台上を自由に動ける構造とした
。さらに、軸受部はすべてころがり接触を用いた回転軸
受による案内とし、摩擦係数を小さくシ、かじシ付きの
ないものとした。また、試料交換は、棒をガイドとする
位置決め案内をもつ移動台の一方向の動きのみで行う構
造として、光換時の操作性が良好、で、故障の少い低真
空圧の環境で使用できる装置とした。
In order to achieve all of the above objects, the present invention employs a chain-driven structure for the upper moving table so that it can move freely on the upper moving table. Furthermore, all bearings are guided by rotary bearings that use rolling contact, have a low coefficient of friction, and are not rudded. In addition, the structure allows sample exchange to be performed only by moving the moving table in one direction, which has a positioning guide using a rod, which provides good operability during light exchange, and can be used in a low-vacuum environment with fewer failures. This is a device that can do this.

〔発明の実施例〕[Embodiments of the invention]

第3図は、本発明による試料移動装置を分析装置に適用
した一実施例を示す図である。同図において、試料移動
機構を収めた容器51が、ゲ・−トバルブ52ケ介して
低真空圧の分析室53に取り付いている。分析室53内
には試料台54が固定されているっ容器51内の固定台
55上にそれぞれ2個のベアリング56が取り付いた板
57が計4個配置されている、このベアリング56は、
上移動台58ケ矢印59方向にガイドしている。まだ、
その他に固定台55には、4個のベアリング60が、矢
印69方向に上移動台58茫ガイドするだめ備えられて
いる。上移動台58は、容器51の外部に取り付いた回
転導入器78の駆動によるピニオン79と上移動台58
上のラック80とのかみ合いで、矢印610前後方向に
移動する。
FIG. 3 is a diagram showing an embodiment in which the sample moving device according to the present invention is applied to an analysis device. In the figure, a container 51 containing a sample moving mechanism is attached to an analysis chamber 53 with a low vacuum pressure via a gate valve 52. A sample stage 54 is fixed in the analysis chamber 53. A total of four plates 57 each having two bearings 56 are arranged on a fixed stage 55 in the container 51.
The upper moving table 58 guides in the direction of arrow 59. still,
In addition, the fixed table 55 is provided with four bearings 60 for guiding the upper moving table 58 in the direction of the arrow 69. The upper moving table 58 is connected to a pinion 79 driven by a rotation introducer 78 attached to the outside of the container 51.
By engaging with the upper rack 80, it moves in the front and back direction of the arrow 610.

また、上移動台58内には、移動方向と同方向に案内溝
82が加工されており、この中?上移動台62に取シ付
いたベアリング63が矢印61方向に移動する。この上
移動台62の駆動は、上移動台58と固定台55上に両
端rころがり回転軸受64で支持されたスプロケット6
5で案内されたチェーン81で行なわれる。第4図にこ
の駆動の原理図を示す。上移動台91の上に上移動台9
2が重ねて取り付いており、上移動台91に備えられた
ラック93を回転導入器94に取り付いたピニオン98
で駆動することで、上移動台91が移動する。この時、
前記した椋に上移動台92は上移動台91のちょうど2
倍の距離だけ動く。また、上移動台92は、両端に取り
付いたチェーン97で上移動台91上を回転導入器95
の先端に取り付いたスプロケット96の回転で、上移動
台91の動きと独立して自由にすべりのない移動が可能
である。第3図に示す上移動台62上にバネ66で矢印
59で示す上下方向と矢印69で示す左右方向に移動を
制限されるつめ67と案内板68とが取り付いている。
Further, a guide groove 82 is machined in the upper moving table 58 in the same direction as the moving direction. The bearing 63 attached to the upper moving table 62 moves in the direction of arrow 61. The upper moving table 62 is driven by a sprocket 6 supported by rolling bearings 64 at both ends on the upper moving table 58 and the fixed table 55.
This is done with a chain 81 guided by 5. FIG. 4 shows a diagram of the principle of this drive. The upper moving table 9 is placed on the upper moving table 91.
2 are attached one on top of the other, and a rack 93 provided on the upper moving table 91 is connected to a pinion 98 attached to a rotation introducer 94.
The upper moving table 91 moves by driving the upper moving table 91. At this time,
The upper moving table 92 of the above-mentioned plow is located exactly 2nd of the upper moving table 91.
Move twice as far. The upper moving table 92 also rotates the introducer 95 over the upper moving table 91 with chains 97 attached to both ends.
By rotating the sprocket 96 attached to the tip of the upper moving table 91, it is possible to move freely and without slipping independently of the movement of the upper moving table 91. A pawl 67 and a guide plate 68 are mounted on the upper movable table 62 shown in FIG. 3 by means of springs 66 and whose movement is restricted in the vertical direction indicated by arrow 59 and the horizontal direction indicated by arrow 69.

案内板68は試料ホルダ70の受は部83に入っている
。ここで、試料ホルダ70に取如付くビン71が、つめ
67とかみ合っている。すなわち、試料ホルダ70は、
上移動台62に固定されている。この時、上移動台62
が矢印72で示す方向に移動し、上移動台58に取り付
くカイト棒73が、試料台54の案内穴74に入るとさ
らに上移動台62ば、試料台54に接近し、試料台54
の板バネ75の中に入りこみ、ストッパ83にぶつかる
と、りめ67がピン71からはずれ、試料ホルダ70は
、試料台54に受は渡されるわけである。この試料交換
を観桜する目的で分析室にはのぞき窓76が取シ付いて
いる。
The guide plate 68 is placed in the receiving portion 83 of the sample holder 70 . Here, the bottle 71 that is attached to the sample holder 70 is engaged with the pawl 67. That is, the sample holder 70 is
It is fixed to the upper moving table 62. At this time, the upper moving table 62
moves in the direction shown by the arrow 72, and when the kite rod 73 attached to the upper moving stage 58 enters the guide hole 74 of the sample stage 54, the upper moving stage 62 approaches the sample stage 54, and the kite rod 73 attached to the upper moving stage 58 approaches the sample stage 54,
When the sample holder 70 enters the leaf spring 75 and hits the stopper 83, the rim 67 comes off the pin 71, and the sample holder 70 is transferred to the sample table 54. A viewing window 76 is installed in the analysis room for the purpose of observing this sample exchange.

〔発明の効果〕〔Effect of the invention〕

以上のような構造にしたことにより、本発明は、(i)
試料交換が、試料移動機構の一軸の直線送りのみで可能
となり、操作が簡単で、装置全体の偽造が単純化される
By having the above structure, the present invention provides (i)
Sample exchange is possible with only one-axis linear feed of the sample moving mechanism, which simplifies operation and falsification of the entire device.

(2)試料交換時の位置決めが、移動台のガイド(シー
と試料台の案内穴で、可能となυ、上移動台の駆動がチ
ェーンのためすべりが発生しないので、確実な交4換ぶ
てきる。
(2) Positioning when replacing the sample is possible with the movable stage guide (see) and the guide hole on the sample stage.The upper movable stage is driven by a chain, which prevents slipping, ensuring reliable replacement. I'll come.

(3)比較的小さい台上に移動台が乗っているため、装
置全体が小型となる。そのため、部品材料表面からの放
出ガスが少くなり、低真空圧装置に適した試料移動装置
となる。
(3) Since the movable table is mounted on a relatively small table, the entire apparatus becomes compact. Therefore, less gas is released from the surface of the component material, making the sample moving device suitable for low vacuum pressure devices.

(4)駆動用の回転移動するビニオン、スプロケットベ
アリングは、全てころがり回転軸受の両端支持のため、
モーメント荷重による破損が少いので長時間安定して高
梢度?保った回転が可能である1゜以上によって、操作
が容易で、故障の少ない、低真空圧装置へ適した試料移
動装置r侍ることがゼきた。
(4) The rotating drive binions and sprocket bearings are all supported at both ends of rolling bearings.
Stable for long periods of time with high degree of topography due to less damage due to moment loads? Since it is possible to rotate at a constant angle of 1° or more, it has become possible to create a sample moving device that is easy to operate, has few failures, and is suitable for low vacuum pressure devices.

この試料移動装置は、特に低真空圧を使用するオージェ
電子分光分析装置、ESCA装置、分子線蒸着装置等に
適用可能である。また、長距離の試料移動が必要な場合
は本試料移動袈置ケ複数個そなえれば、上記の目的?達
成できることは明らかである。
This sample moving device is particularly applicable to Auger electron spectrometers, ESCA devices, molecular beam evaporation devices, etc. that use low vacuum pressure. In addition, if you need to move a sample over a long distance, you can use multiple sample transfer racks to meet the above objectives. What can be achieved is clear.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の試料移動装置の斜視図、第2図は従来の
移動装置の移動原理の略図、第3図は本発明による移動
装置の斜視図、第4図は本発明による移動装置の略図?
示す。 1・・・容器、4・・・真空容器、11・・・矢印、1
5・・・ワイヤ、20・・・案内、32・・・ビニオン
、52・・・ゲートバルブ、60・・・ベアリング、8
1・・・チェーン、■ 1  図 第  2  図
FIG. 1 is a perspective view of a conventional sample moving device, FIG. 2 is a schematic diagram of the principle of movement of a conventional sample moving device, FIG. 3 is a perspective view of a moving device according to the present invention, and FIG. 4 is a perspective view of a moving device according to the present invention. Schematic diagram?
show. 1... Container, 4... Vacuum container, 11... Arrow, 1
5... Wire, 20... Guide, 32... Binion, 52... Gate valve, 60... Bearing, 8
1... Chain, ■ 1 Figure 2

Claims (1)

【特許請求の範囲】[Claims] 1、真空圧となる容器内部に固定する固定台上の複数個
のころがシ回転軸受で、前後の移動方向に長い案内面、
パイプ外部の回転導入器につながるビニオンとかみ合う
ラックおよびその両端にスプロケット?備える上移動台
を支持し、その上に上記下移動台内の粟内面を移動する
ころがり回転軸受?保有し、試料を保持し、上記上移動
台と上記固定台上の櫟数個のスプロケットに巻きつき、
さらにパイプ外部の上記回転導入器とつながるスプロケ
ットとかみ合うチェーンの両@?固定する上移動台を積
み重ね、しかも案内ケ含む軸受けころが9回転軸受を用
いることを特徴とする試料移動装置。
1. The multiple rollers on the fixed base fixed inside the container under vacuum pressure are rotary bearings, and the guide surface is long in the direction of back and forth movement.
A rack that engages with a binion that connects to a rotating introducer on the outside of the pipe, and sprockets at both ends? A rolling bearing that supports an upper moving table and moves on the inner surface of the millet in the lower moving table? holding the sample, wrapping it around several sprockets on the upper moving table and the fixed table,
Furthermore, the sprocket that connects to the above-mentioned rotation introducer outside the pipe and the chain that engages with each other @? A sample moving device characterized by stacking fixed upper moving tables and using a 9-turn bearing for bearing rollers including guides.
JP58037395A 1983-03-09 1983-03-09 Sample moving device Pending JPS59163546A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58037395A JPS59163546A (en) 1983-03-09 1983-03-09 Sample moving device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58037395A JPS59163546A (en) 1983-03-09 1983-03-09 Sample moving device

Publications (1)

Publication Number Publication Date
JPS59163546A true JPS59163546A (en) 1984-09-14

Family

ID=12496337

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58037395A Pending JPS59163546A (en) 1983-03-09 1983-03-09 Sample moving device

Country Status (1)

Country Link
JP (1) JPS59163546A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6288332A (en) * 1985-10-15 1987-04-22 Fujitsu Ltd Testing apparatus
JPH0448254A (en) * 1990-06-15 1992-02-18 Denshi Kagaku Kk Device and method for detecting desorbed gas

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6288332A (en) * 1985-10-15 1987-04-22 Fujitsu Ltd Testing apparatus
JPH0353776B2 (en) * 1985-10-15 1991-08-16
JPH0448254A (en) * 1990-06-15 1992-02-18 Denshi Kagaku Kk Device and method for detecting desorbed gas

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