JPS59152584A - Production of magnetic bubble memory - Google Patents

Production of magnetic bubble memory

Info

Publication number
JPS59152584A
JPS59152584A JP58026386A JP2638683A JPS59152584A JP S59152584 A JPS59152584 A JP S59152584A JP 58026386 A JP58026386 A JP 58026386A JP 2638683 A JP2638683 A JP 2638683A JP S59152584 A JPS59152584 A JP S59152584A
Authority
JP
Japan
Prior art keywords
bump
plating
conductor
thin film
foundation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58026386A
Other languages
Japanese (ja)
Inventor
Akira Hirano
明 平野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP58026386A priority Critical patent/JPS59152584A/en
Publication of JPS59152584A publication Critical patent/JPS59152584A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/14Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)

Abstract

PURPOSE:To make foundation plating unnecessary to simplify the process, by forming a negative pattern of a bump forming part on a conductor thin film with a photoresist and plating the bump forming part to for a bump. CONSTITUTION:A conductor thin film 22 and a TaMo-Au or a TaMo-Au-TaMo to be a bump foundation are formed on a crystal 20 for bubble through a spacer 21 consisting of an SiO2 by a sputtering or vapor-deposition method. A photoresist 23 is applied as shown in Fig. (b) to form a negative pattern in the part where the bump should be formed. The bump forming part is plated with Au as shown in Fig. (c) to form a bump 24. Hereafter, various processes are performed successively as shown in figures and finally, windows 31 are opened in an insulating layer and a protection layer in the bump part as shown in Fig. (k) to complete a device. Since the conductor thin film before lithography is used as a conductive layer as a foundation of plating though the conductive layer is normally required as the foundation of plating, the process is simplified, and the range of selection of conductor and bump materials is extended.

Description

【発明の詳細な説明】 (1)発明の技術分野 本発明は電子計算機またはその端末機等の記憶装置とし
て用いられる磁気バブルメモリ装置に関し、特にそのメ
モリ素子の作製法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (1) Technical Field of the Invention The present invention relates to a magnetic bubble memory device used as a storage device for an electronic computer or a terminal thereof, and particularly to a method for manufacturing the memory element.

(2)技術の背景 N2子計算装置の端末機等のメモリとして用いられる磁
気バブルメモリは、不揮発性、高記憶密度、低消費電力
等積々の特徴をもち、さらには機械的要素を全く含まな
い固体素子であることがら非常に高い信頼性を有し、大
容量メモリとして将来が期待されている。
(2) Background of the technology Magnetic bubble memory used as memory for terminals, etc. of N2 child computing devices has many features such as non-volatility, high storage density, and low power consumption, and furthermore, it does not contain any mechanical elements. Because it is a solid-state device, it has extremely high reliability and is expected to have a promising future as a large-capacity memory.

この磁気バブルメモリは1例えば結晶のO軸方向にのみ
磁化容易軸を有する一軸異方性をもったオルソフェライ
トや、磁性ガーネット等の単結晶薄膜上にパーマロイに
よる多数の薄膜微細パターンを形成しておき、膜面に垂
直なバイアス磁界を加えたときに生ずる円筒磁区(これ
をバブルという)を外部磁界によシバーマロイパターン
の転送路を移動させ、このパーマロイパターンにおける
バブルの有無を11″、′01に対応させてメモリとし
て使用するものである。
This magnetic bubble memory is made by forming a large number of thin film fine patterns using permalloy on a single crystal thin film such as orthoferrite, which has uniaxial anisotropy and has an easy axis of magnetization only in the O-axis direction of the crystal, or magnetic garnet. Then, by applying a bias magnetic field perpendicular to the film surface, the cylindrical magnetic domain (called a bubble) that is generated is moved along the transfer path of the shivermalloy pattern by an external magnetic field, and the presence or absence of bubbles in this permalloy pattern is determined at 11'',' 01 and is used as a memory.

(3)従来技術と問題点 第1図は従来の磁気バブルメモリの構成を説声 明するための図である。同図において、1はバブル用結
晶、2はスペーサ、3はゲート類の駆動用導体、4は絶
縁層、5はパーマロイ、6は保護層。
(3) Prior Art and Problems FIG. 1 is a diagram for explaining the structure of a conventional magnetic bubble memory. In the figure, 1 is a bubble crystal, 2 is a spacer, 3 is a conductor for driving gates, 4 is an insulating layer, 5 is permalloy, and 6 is a protective layer.

7はめっき用下地、8は外部接続用バンブをそれぞれ示
している。
7 indicates a plating base, and 8 indicates a bump for external connection.

第2図は第1図に示した磁気バブルメモリの作製法を説
明するための図であp、a−にはその工程を示す。図に
よシ説明すると先ずa図の如くバブル用結晶1の上にス
ペーサ2及び導体層3Iを形成する。次にb図の如くホ
トレジストを塗布し、パターニングして導体パターンと
なる部分のレジスト9を残す。次にC図の如く導体層を
エツチングして導体パターン3を形成する。次にd図の
如く絶縁層4を形成する。次にe図の如くパーマロイパ
ターン5を形成する。次にf図の如く保護層6を形成す
る。次にg図の如く絶縁層4及び保護層6に導体パター
ン3及びパーマロイパターン5に達する窓10.10’
をあける。次いでh図の如く全面に下地めっき7を施す
。次に1図の如くホトレジスト11を塗布し、バンプと
なる部分のパターニングを行なう。次にj図の如くめっ
きを行なってバンプ8を形成する。次いでに図の如くホ
トレジストを除去し、最後にバンプ8部分以外のめっき
下地をエツチング除去して第1図の如きバブルメモリが
得られる。
FIG. 2 is a diagram for explaining the method of manufacturing the magnetic bubble memory shown in FIG. 1, and the steps are shown at p and a-. To explain with reference to the figures, first, as shown in Figure A, a spacer 2 and a conductor layer 3I are formed on a bubble crystal 1. Next, as shown in Figure b, a photoresist is applied and patterned to leave a portion of the resist 9 that will become a conductive pattern. Next, as shown in Figure C, the conductor layer is etched to form a conductor pattern 3. Next, an insulating layer 4 is formed as shown in Figure d. Next, a permalloy pattern 5 is formed as shown in figure e. Next, a protective layer 6 is formed as shown in figure f. Next, windows 10 and 10' reaching the conductor pattern 3 and permalloy pattern 5 in the insulating layer 4 and the protective layer 6 as shown in figure g.
Open. Next, base plating 7 is applied to the entire surface as shown in Figure h. Next, as shown in FIG. 1, photoresist 11 is applied, and the portions that will become bumps are patterned. Next, plating is performed as shown in Figure J to form bumps 8. Next, the photoresist is removed as shown in the figure, and finally the plating base other than the bump 8 portion is removed by etching to obtain a bubble memory as shown in FIG.

このように従来の作製法では、保護層6の窓あけ後に蒸
着やめっき法によシバンプ8を形成していた。このため
保護層を介してパルプが形成されるため導電用のめっき
下地を必要としていた。このめっき用下地は導体パター
ン3及びパーマロイパターン5の両者と高温にて拡散し
ないような金属であり、また保護層の5i02と密着性
が良い金属である必要があp、その選択に制限があると
いう欠点があった。また下地めっきを必要とすることは
工程を複雑にするという欠点もある。
As described above, in the conventional manufacturing method, the bumps 8 are formed by vapor deposition or plating after opening the protective layer 6. Therefore, since pulp is formed through the protective layer, a conductive plating base is required. This plating base must be a metal that does not diffuse into both the conductor pattern 3 and the permalloy pattern 5 at high temperatures, and must also have good adhesion to the protective layer 5i02, but there are restrictions on its selection. There was a drawback. There is also the disadvantage that the need for base plating complicates the process.

(4)発明の目的 本発明は上記従来の欠点に鑑み、外部接続用のバンプを
形成するときに下地めっきを要さず工程を簡略化した磁
気バブルメモリ作製法を提供することを目的とするもの
である。
(4) Purpose of the Invention In view of the above-mentioned conventional drawbacks, an object of the present invention is to provide a method for manufacturing a magnetic bubble memory that simplifies the process by not requiring base plating when forming bumps for external connection. It is something.

(5)発明の構成 そしてこの目的は本発明によれば、導体薄膜を形成した
後ホトレジストにてバンプ作成部分のネガパターンを形
成し5次いで該バンプ作成部分にめっきを行なってバン
プを形成し、その後、導体パターンを作成する諸工程を
含むことを特徴とする磁気バブルメモリ作製法を提供す
ることによって達成される。
(5) Structure and object of the invention According to the present invention, after forming a conductor thin film, a negative pattern of a bump forming area is formed using photoresist, and then plating is performed on the bump forming area to form a bump. This is achieved by providing a method for manufacturing a magnetic bubble memory characterized by including steps of subsequently creating a conductor pattern.

(6)発明の実施例 以下本発明実施例を図面によって詳述する。(6) Examples of the invention Embodiments of the present invention will be described in detail below with reference to the drawings.

第3図は本発明による磁気バブルメモリ作製法を説明す
るだめの図であj) 、  B−には工程説明用断面図
である。図により本発明法を説明すると。
FIG. 3 is a diagram for explaining the method of manufacturing a magnetic bubble memory according to the present invention, and B- is a cross-sectional diagram for explaining the process. The method of the present invention will be explained using figures.

先ずa−図の如くバブル用結晶20の上に8102の・
 スペーサ21を介して導体薄膜22及びバンプ下地と
なるTaMo−Au又はTaMo −Au  TlMo
がスパッタ及び蒸着法によって形成される。次にb図の
如くホトレジスト23を塗布しバンプを作成する部分に
ネガパターンを形成する。次にC図の如くバンプ作成部
分にAllめっきを行なってバンプ24を形成する。次
にd図の如くレジストを除去し、更にe図の如くホトレ
ジスト25を塗布して、投影露光法にてパターニングし
、エツチングしてf図の如く導体パターン26を形成す
る。次いでg図の如く樹脂のコーティング又は5iOz
のスパッターにより絶縁層27を形成する。次にh図の
如く絶縁層27にプラズマエツチングにてパーマロイ接
続用の窓あけを行ないコンタクトホール28を作成する
。次に1図の如くパーマロイを蒸着しホトリソグラフィ
法にてパーマロイパターン29を作成する。次にj図の
如(Si02の保護層30を形成し、最後にに図の如く
バンプ部分の絶縁層及び保護層に窓31を窓あけして完
成する。
First, as shown in figure a, 8102 is placed on top of the bubble crystal 20.
TaMo-Au or TaMo-Au TlMo which becomes the conductor thin film 22 and the bump base via the spacer 21
is formed by sputtering and vapor deposition methods. Next, as shown in Figure b, a photoresist 23 is applied to form a negative pattern in the area where bumps are to be formed. Next, as shown in Figure C, the bump forming portion is subjected to All plating to form the bump 24. Next, the resist is removed as shown in Figure d, and a photoresist 25 is applied as shown in Figure E, patterned by a projection exposure method, and etched to form a conductor pattern 26 as shown in Figure F. Then, as shown in figure g, resin coating or 5iOz
An insulating layer 27 is formed by sputtering. Next, as shown in Fig. h, a window for permalloy connection is formed in the insulating layer 27 by plasma etching to form a contact hole 28. Next, as shown in FIG. 1, permalloy is deposited and a permalloy pattern 29 is created by photolithography. Next, as shown in Figure J, a protective layer 30 of Si02 is formed, and finally, a window 31 is formed in the insulating layer and protective layer at the bump portion as shown in the figure to complete the process.

なお、導体にAAを用いた場合には、その上にT+ (
厚さsooりを蒸着した後、バンプ用のネガパターンを
作成し、 Pt又はPd及びAuiめっきしてバンプを
形成する。何様にAfl上にOr(厚さ500λ)を蒸
着した後OuとAuをめっきしても作成することができ
る。また導体とバンプの材料の組合わせは上記に限られ
ず様々な構成かり能である。
Note that when AA is used as the conductor, T+ (
After depositing a sufficient thickness, a negative pattern for bumps is created, and the bumps are formed by plating with Pt or Pd and Au. It can be created by depositing Or (thickness 500λ) on Afl and then plating O and Au. Further, the combination of materials for the conductor and bumps is not limited to the above, and various configurations are possible.

(7)発明の詳細 な説明した如く本発明の磁気バブルメモリ作製法は1通
常めっきの下地として導電層を要するところを、リング
ラフィ前の導体薄膜で兼用することかできるので工程の
簡略化が可能となった。
(7) As described in detail, the method for manufacturing a magnetic bubble memory of the present invention simplifies the process by using a conductive thin film before phosphorography instead of a conductive layer that normally requires a conductive layer as a base for plating. It has become possible.

又コンダクタ−とパーマロイの両者に適したメッキ下地
を選ぶ必要がなくなった為、コンダクタ−及びノ゛<ン
プ材料の選定範囲が著しく拡大され、その効果は犬なる
ものである。
Furthermore, since it is no longer necessary to select a plating base suitable for both the conductor and permalloy, the range of selection of conductor and lamp materials is significantly expanded, and the effect is remarkable.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の磁気バブルメモリの構成を説明するだめ
の図、第2図は従来の磁気バブルメモリの作製法を説明
するための図、第3図は本発明による磁気バブルメモリ
の作成法を説明するための図である。 図面において、20はバブル用結晶、21はスペーサ、
22は導体薄膜、23及び25はホトレジスト、24は
バンプ、26は導体パターン。 27は絶縁層、28はコンタクトホーt、29はパーマ
ロイパターン、30は保護層、31は窓をそれぞれ示す
。 第1図
Figure 1 is a diagram for explaining the configuration of a conventional magnetic bubble memory, Figure 2 is a diagram for explaining a method for manufacturing a conventional magnetic bubble memory, and Figure 3 is a diagram for explaining a method for manufacturing a magnetic bubble memory according to the present invention. FIG. In the drawing, 20 is a bubble crystal, 21 is a spacer,
22 is a conductor thin film, 23 and 25 are photoresists, 24 is a bump, and 26 is a conductor pattern. 27 is an insulating layer, 28 is a contact hole, 29 is a permalloy pattern, 30 is a protective layer, and 31 is a window. Figure 1

Claims (1)

【特許請求の範囲】[Claims] 1、 導体薄膜を形成した後ホトレジストにてバンプ作
成部分のネガパターンを形成し、次いで該バンプ作成部
分にめっきを行なってバンプを形成し、その後、導体=
パターンを作成する諸工程を含むことを特徴とする磁気
バブルメモリ作成方法。
1. After forming the conductor thin film, form a negative pattern of the bump forming area with photoresist, then plate the bump forming area to form the bump, and then conductor=
A method for creating a magnetic bubble memory characterized by including steps of creating a pattern.
JP58026386A 1983-02-21 1983-02-21 Production of magnetic bubble memory Pending JPS59152584A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58026386A JPS59152584A (en) 1983-02-21 1983-02-21 Production of magnetic bubble memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58026386A JPS59152584A (en) 1983-02-21 1983-02-21 Production of magnetic bubble memory

Publications (1)

Publication Number Publication Date
JPS59152584A true JPS59152584A (en) 1984-08-31

Family

ID=12192089

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58026386A Pending JPS59152584A (en) 1983-02-21 1983-02-21 Production of magnetic bubble memory

Country Status (1)

Country Link
JP (1) JPS59152584A (en)

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