JPS59122966A - Measurement of delay time - Google Patents
Measurement of delay timeInfo
- Publication number
- JPS59122966A JPS59122966A JP22451382A JP22451382A JPS59122966A JP S59122966 A JPS59122966 A JP S59122966A JP 22451382 A JP22451382 A JP 22451382A JP 22451382 A JP22451382 A JP 22451382A JP S59122966 A JPS59122966 A JP S59122966A
- Authority
- JP
- Japan
- Prior art keywords
- pulse
- period
- cycle
- delay time
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
Description
【発明の詳細な説明】
(a) 発明の技術分野
本発明は信号波形における時間間隔特に遅延時間測定方
法の改良に関する。DETAILED DESCRIPTION OF THE INVENTION (a) Technical Field of the Invention The present invention relates to improvements in methods for measuring time intervals in signal waveforms, particularly delay times.
伽) 技術の背景
従来よりアナログあるいはデジタルイ百号の波形観測あ
るいは複数信号または信号の変化点における時間間隔即
ち後続信号のまたは変化点における遅延時間差の測定手
段としてオシロスコープまたは計数器を利用する方法が
広く用いられている。佽)Technical Background Traditionally, there has been a method of using an oscilloscope or a counter as a means of observing analog or digital waveforms or measuring the time interval between multiple signals or signal change points, that is, the delay time difference between subsequent signals or change points. Widely used.
(e) 従来技術と問題点
オシロスコープは通常陰極線管((CRT )l用いて
入力信号電圧を一方の偏向手段に加えて輝点をY方向に
ふらせると同時に、入力信号と同期するX方向の偏向手
段により掃引して入力信号電圧の波形を観測する。(e) Prior art and problems Oscilloscopes usually use a cathode ray tube (CRT) to apply an input signal voltage to one deflection means to make the bright spot swing in the Y direction, and at the same time deflect the bright spot in the X direction in synchronization with the input signal. The waveform of the input signal voltage is observed by sweeping with the deflection means.
入力信号の増幅器2時間軸発生器、各種の調整回路等を
内蔵して直流よル数GHzに及ぶ信号の観測手段として
広く利用されている。また複数組の入力信号偏向手段を
有するORT Sるいは入力信号と同期する幅の狭いサ
ンプリングパルスによりで瞬間値を抽出する手段を用い
て複数の信号を同時に測定する多現象観測手段の他、入
力信号がトリガとなって掃引を開始する手段を備えてい
るのでで入力信号の変化点によって掃引を開始し、後続
する他の入力信号または他の変化点を観測する方法によ
9時間間隔例えば被測定回路の遅延時間を測定出来るが
トリガとなる先行信号がトリガに好適条件の鋭い立下り
または立下りのパルスとは限らないのでそのトリガレベ
ルの変動に伴い基準点が浮動したり、また遅延時間の値
によっては特に坑
遅延時間が大きい場合に4取精度の関係から測定精度が
得られない欠点を有していた。また別の計数器による方
法は先行する入力信喜または変化点により計算器のゲー
トを用いて基準クロツクの計数を開始し、後続する入力
4g号または変化点によりゲートを閉じることにより計
時を行い9通常デジタル表示による容易な読取手段の他
、基準クロr
ツクに例えば1o/1m程度の優れた精度と分解能を備
えているが、計数器のゲートトリガが通常信号レベルに
よるため緩やかな変化あるいに複雑な変化を伴う信号に
ついては目的の変化点を的確に捕える保証が得られない
点でオシロスコープによる目視観測に劣っている。It has a built-in input signal amplifier, two time axis generators, various adjustment circuits, etc., and is widely used as a means of observing signals with a DC frequency of several GHz. In addition to multi-phenomenon observation means that simultaneously measures multiple signals using ORT S having multiple sets of input signal deflection means or means for extracting instantaneous values using narrow sampling pulses synchronized with input signals, Since the device is equipped with a means for starting the sweep when a signal becomes a trigger, the sweep is started by a change point of the input signal, and by observing other subsequent input signals or other change points, the sweep is started at a 9-hour interval, for example, by observing another input signal or another change point. Although the delay time of the measurement circuit can be measured, the preceding signal that serves as the trigger is not necessarily a sharp falling edge or a falling pulse, which is the ideal condition for triggering, so the reference point may float due to fluctuations in the trigger level, and the delay time may vary. Depending on the value of , particularly when the well delay time is large, measurement accuracy cannot be obtained due to the relationship between the four-take accuracy. Another method using a counter is to start counting the reference clock using the gate of the calculator in response to a preceding input signal or change point, and to measure time by closing the gate in response to a subsequent input signal or change point. In addition to an easy reading method using a digital display, the reference clock has excellent accuracy and resolution of, for example, 1o/1m, but since the gate trigger of the counter is usually based on the signal level, gradual changes or complicated For signals with significant changes, it is inferior to visual observation using an oscilloscope in that there is no guarantee that the desired change point can be accurately captured.
(d) 発明の目的
本発明の目的(儂従来におけるオシロスコープの時間測
定に〉ける欠点を除去しつつオシロスコープにおける目
視観測の利点と計数器の利点とを生かして高精度で取扱
いの容易な遅延時間測定手段を提供しようとするもので
ある。(d) Object of the Invention The object of the present invention is to provide a delay time that is highly accurate and easy to handle by taking advantage of the advantages of visual observation in an oscilloscope and the advantages of a counter while eliminating the disadvantages of conventional time measurement using an oscilloscope. The aim is to provide a means of measurement.
(e) 発明の構成
この目的に、任意の繰返し周期によりパルス波形を発生
する手段該パルス波形の繰返し周期測定手段、該パルス
発生手段による1次パルスを印加してn倍の繰返し周期
を有する長周期ノくルスを出力する計数手段、該長周期
パルスを遅延して2次パルスを碍る手段卦よびオシロス
コープによるタイミング観測手段を設けてなり、パルス
発生手段の繰返し周期を変化しつつ周期測定手段および
観測手段により、2次パルスの立上りに、該1次ノ(ル
スvch−ける次サイクルの立上りを一致せしめる@1
周期ζ1,2次パルスを被測定回路に印加して掛る被測
定パルスの立とシに該1次パルスの1サイクルまたは複
数mサイクルの立−りりを一致せしめて得る第2周期ζ
2tたはmζ3を読取り、第1周期ζ1.と第2周期ζ
2またにmζ3との差時間より被測定回路の遅延時間を
Tモることを特徴とする遅延時間の測定方法を提供する
ことによって達成することが出来る。(e) Structure of the Invention For this purpose, a means for generating a pulse waveform with an arbitrary repetition period, a means for measuring the repetition period of the pulse waveform, and a length having a repetition period of n times by applying the primary pulse by the pulse generation means are provided. A counting means for outputting a periodic pulse, a means for delaying the long-period pulse to generate a secondary pulse, and a timing observation means using an oscilloscope are provided, and the period measuring means is provided while changing the repetition period of the pulse generating means. and the observation means makes the rising edge of the next cycle of the primary pulse coincide with the rising edge of the secondary pulse @1
A second period ζ obtained by applying a period ζ 1, a secondary pulse to the circuit under test and making the rising edge of one cycle or a plurality of m cycles of the primary pulse coincide with the rising edge of the applied pulse to be measured.
2t or mζ3, the first period ζ1. and the second period ζ
This can be achieved by providing a delay time measuring method characterized in that the delay time of the circuit under test is determined by the time difference between mζ3 and mζ3.
(1) 発明の実施例
以下図面を参照しつつ本発明の一実施例について説明す
る。(1) Embodiment of the invention An embodiment of the invention will be described below with reference to the drawings.
第1図は本発明の一実施例における遅延時間の測定方法
によるブロック図しよび第2図1′f:、そのタイムチ
ャートである。FIG. 1 is a block diagram of a delay time measuring method according to an embodiment of the present invention, and FIG. 2 is a time chart thereof.
図において14可変周期発振器、2は計数回路。In the figure, 14 is a variable period oscillator, and 2 is a counting circuit.
3は遅延IL21路4はオシロスコープ、5は周期測定
器、6は被測定回路(■)UT)である。3 is a delay IL 21, 4 is an oscilloscope, 5 is a period measuring device, and 6 is a circuit under test (■) UT).
可変周期発振器1は設定する任意の繰返し周期この一次
パルスPaを連続してまたは図示省略したが別途必要に
より外部信号に同期して計数回路2に送出する、同繰返
し周期ζは後述する遅延時間Tの予想値より短かめにセ
ットしておくものとする。n進計数機能により構成され
ろ計数回路2は1次パルスPQの周期このn倍周期例え
ばここでは4倍周期を持つ長周期パルスPトに変換して
遅延回路に送出する。to11計数回路2の遅延時間に
であるこのnは任意値で良く必ずしも2 の形をとる必
要はないが、予想される遅延時間Tを勘案して測定に際
し支障のないよう充分に大きい値を選択する。ここで長
周期パルスPbを受信した遅延回路3ば任意の遅延時間
を与えて2次パルス圧送出するが、2次パルスPcと先
に長周期パルスPbの期準とした1次パルスPaKt、
;−ける立上りに一致するように可変周期発振器1をi
!!l整し、オシロスコープ4の画面上で観測すると共
に周期測定器5により第1周期ζ1を得ろ。The variable period oscillator 1 sends out this primary pulse Pa continuously at a set repetition period or in synchronization with an external signal as required (not shown) to the counting circuit 2. The repetition period ζ is determined by the delay time T described later. The value should be set shorter than the expected value. The counting circuit 2, which has an n-ary counting function, converts the period of the primary pulse PQ into a long-period pulse PQ having a period n times the period, for example, four times the period here, and sends it to the delay circuit. This n, which is the delay time of the to11 counting circuit 2, can be any value and does not necessarily have to be in the form of 2, but in consideration of the expected delay time T, select a value that is large enough so that there is no problem during measurement. do. Here, the delay circuit 3 that receives the long-period pulse Pb gives an arbitrary delay time and sends out the secondary pulse pressure.
; - The variable period oscillator 1 is set to match the rising edge of i.
! ! 1, observe it on the screen of the oscilloscope 4, and obtain the first period ζ1 using the period measuring device 5.
次に2次パルスPcを])1,1.T、6に印加して測
定対象となる被測定パルスPdを送出せしめ、更に被測
定パルスPdおよび1次パルスPaをオシロスコープ4
に大願し2次パルスPcの立上シをトリガとして観測し
つつ、被測定パルスPdの立上υに1次パルスPaを変
化せしめて碍る変化1次パルスPaaまたばPaa’の
1サイクル後または複数りn。Next, the secondary pulse Pc])1,1. T, 6 is applied to send out the pulse to be measured Pd to be measured, and the pulse to be measured Pd and the primary pulse Pa are sent to the oscilloscope 4.
While observing the rising edge of the secondary pulse Pc as a trigger, change the primary pulse Pa at the rising edge υ of the pulse to be measured Pd to complete the change after one cycle of the primary pulse Paa or Paa'. Or more than one n.
〃サイクル後の立上りを一致せしめて同期測定器5vc
より第2周期ζ2または〃ζ3を優る。ここで第2周期
ζ2と第2周期ζ2またts)/lζ3との差を得れば
遅延時間Tは
T−ζl−ζ2または T−ζ1〜濯ζ3によりDu
Ta の遅延時間を容易に高精度で測定することが出
来る。〃Synchronized measuring device 5vc by matching the rise after the cycle
It is better than the second period ζ2 or 〃ζ3. Here, if we obtain the difference between the second period ζ2 and the second period ζ2 or ts)/lζ3, the delay time T becomes T-ζl-ζ2 or Du by T-ζ1 to ζ3.
The delay time of Ta can be easily measured with high precision.
(2) 発明の詳細
な説明したように本発明によればパルス発生手段による
パルスを長期化旦遅延ネ段1cより観測り
に都合のよい測定用パルスに変形してD7Tに印加して
、波形立上りの一致は確認の容易な波形観測手段による
と共に、遅延時間は遅延パルスの鈍化特性に影響される
ことのないパルス発生手段における立上り特性に変化の
少い即ちしきい値変化の少い状態のノ(ルスによって、
1辱られ、従来におけるしきい値の不明確さによる誤差
を除去出来もまた印加測定)(ルスを長大周期としてい
るので例えば高速立上り)(ルスにおけろインビーダン
ス不整合時の反射波の影響を容易に回避出来る等広範囲
の遅延時間に対して精度を損9ことなく容易に対応出来
ろ遅延時間の測定方法の1嶋れるので有用である。(2) As described in detail, according to the present invention, the pulse generated by the pulse generating means is transformed into a measurement pulse convenient for observation by the long delay stage 1c and applied to D7T, and the waveform is The coincidence of the rises is determined by waveform observation means that can be easily confirmed, and the delay time is determined by using a pulse generating means that is not affected by the slowing characteristics of the delayed pulse and has a state in which there is little change in the rise characteristics, that is, there is little change in the threshold value. No (by Luz,
1) It is possible to remove the error caused by the unclearness of the threshold value in the conventional method (applied measurement) (for example, high-speed rise because the Luss has a long period) (In the Luss, it is possible to eliminate the error caused by the unclearness of the threshold value) This method is useful because it is one of the methods for measuring delay times that can easily deal with a wide range of delay times without sacrificing accuracy, such as by easily avoiding effects.
第1図は本発明の一実施例における遅延時間の測定方法
によるブロック図および第2図は七のタイムチャートで
めろ。図において1は可変周期発振器、2は計数回路、
3は遅延回路、4はオシロスコープ、5は被測定回路お
よび6は周期演11定器である。FIG. 1 is a block diagram of a method for measuring delay time in an embodiment of the present invention, and FIG. 2 is a time chart. In the figure, 1 is a variable period oscillator, 2 is a counting circuit,
3 is a delay circuit, 4 is an oscilloscope, 5 is a circuit to be measured, and 6 is a period generator.
Claims (1)
パルス波形の繰返し周期測定手段、該パルス発生手段に
よる1次パルスを印加してn倍の繰返し周期を存する長
周期パルスを出力する計数手段、該長周期パルスを遅延
して2次パルスを7%る手段およびオシロスコープによ
るタイミング観測手段を設けてな勺、パルス発生手段の
繰返し周期を変化しつつ周期測定手段および観測手段に
より2次パルスの立上りに、該1次パルスにおける次サ
イクルの立上りを一致せしめる第1周期ζ1と、2次パ
ルスを被測定回路に印刀口して潜る被測定パルスの立上
りlCf11次パルスの1サイクルまたは複数mサイク
ルの立上シを一致せしめて潜る第2周期ζ2 またはI
nζ3を読取り、第1周期ζ1と第2周期ζ2またFl
Inζ3との差時間より被測定回路の遅延時間を潜る
ことを特徴とする遅延時間間の測定方法Means for generating a pulse waveform with an arbitrary repetition period; means for measuring the repetition period of the pulse waveform; counting means for applying the primary pulse of the pulse generating means to output a long-period pulse having a repetition period n times; A means for delaying the long-period pulse to reduce the secondary pulse to 7% and a timing observation means using an oscilloscope are provided, and while changing the repetition period of the pulse generation means, the period measurement means and observation means are used to monitor the rise of the secondary pulse. , the first period ζ1 that makes the rising edge of the next cycle in the primary pulse coincide with the rising edge of the pulse to be measured lCf1 which imprints the secondary pulse into the circuit under test, and the rising edge of one cycle or a plurality of m cycles of the primary pulse. The second period ζ2 or I to match the shi and dive
Read nζ3, first period ζ1, second period ζ2 and Fl
A method for measuring delay time characterized by subtracting the delay time of the circuit under test from the difference time from Inζ3
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22451382A JPS59122966A (en) | 1982-12-21 | 1982-12-21 | Measurement of delay time |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22451382A JPS59122966A (en) | 1982-12-21 | 1982-12-21 | Measurement of delay time |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59122966A true JPS59122966A (en) | 1984-07-16 |
JPS6356506B2 JPS6356506B2 (en) | 1988-11-08 |
Family
ID=16814968
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP22451382A Granted JPS59122966A (en) | 1982-12-21 | 1982-12-21 | Measurement of delay time |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59122966A (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5633584A (en) * | 1979-08-27 | 1981-04-04 | Fujitsu Ltd | Measurement of time delay |
-
1982
- 1982-12-21 JP JP22451382A patent/JPS59122966A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5633584A (en) * | 1979-08-27 | 1981-04-04 | Fujitsu Ltd | Measurement of time delay |
Also Published As
Publication number | Publication date |
---|---|
JPS6356506B2 (en) | 1988-11-08 |
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