JPS59122966A - 遅延時間の測定方法 - Google Patents

遅延時間の測定方法

Info

Publication number
JPS59122966A
JPS59122966A JP22451382A JP22451382A JPS59122966A JP S59122966 A JPS59122966 A JP S59122966A JP 22451382 A JP22451382 A JP 22451382A JP 22451382 A JP22451382 A JP 22451382A JP S59122966 A JPS59122966 A JP S59122966A
Authority
JP
Japan
Prior art keywords
pulse
period
cycle
delay time
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP22451382A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6356506B2 (OSRAM
Inventor
Hideyuki Obara
小原　秀行
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP22451382A priority Critical patent/JPS59122966A/ja
Publication of JPS59122966A publication Critical patent/JPS59122966A/ja
Publication of JPS6356506B2 publication Critical patent/JPS6356506B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measurement Of Resistance Or Impedance (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP22451382A 1982-12-21 1982-12-21 遅延時間の測定方法 Granted JPS59122966A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22451382A JPS59122966A (ja) 1982-12-21 1982-12-21 遅延時間の測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22451382A JPS59122966A (ja) 1982-12-21 1982-12-21 遅延時間の測定方法

Publications (2)

Publication Number Publication Date
JPS59122966A true JPS59122966A (ja) 1984-07-16
JPS6356506B2 JPS6356506B2 (OSRAM) 1988-11-08

Family

ID=16814968

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22451382A Granted JPS59122966A (ja) 1982-12-21 1982-12-21 遅延時間の測定方法

Country Status (1)

Country Link
JP (1) JPS59122966A (OSRAM)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5633584A (en) * 1979-08-27 1981-04-04 Fujitsu Ltd Measurement of time delay

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5633584A (en) * 1979-08-27 1981-04-04 Fujitsu Ltd Measurement of time delay

Also Published As

Publication number Publication date
JPS6356506B2 (OSRAM) 1988-11-08

Similar Documents

Publication Publication Date Title
US6137749A (en) Apparatus and method for measuring time intervals with very high resolution
JPH0261811B2 (OSRAM)
US2591738A (en) Cathode-ray tube voltage measuring device
US2651752A (en) Electrical fault finder
US2844790A (en) Interval timer
JPH075203A (ja) 信号の擬似ランダム反復サンプリング
US5463639A (en) Automatic pattern synchronizing circuit of an error detector
JPH0371064A (ja) ゲート発生回路
US2428021A (en) Electrical wave analyzing system
CA1090420A (en) Sweep calibration method and apparatus
US10119997B2 (en) Method for measuring the waveform capture rate of a digital storage oscilloscope based on average dead time measurement
JPS59122966A (ja) 遅延時間の測定方法
US2939075A (en) Delay calibrating apparatus
US3466553A (en) Control circuit for a sampling system
US3581213A (en) Synchronized burst generator
JP3379905B2 (ja) 電気光学サンプリングオシロスコープ
US3704416A (en) Sequential sampling system
JPH06103293B2 (ja) 超音波測定装置のａ／ｄ変換処理方式
EP0962782A1 (en) Electro-optic sampling oscilloscope
JPH0261715B2 (OSRAM)
JPS6383677A (ja) サンプリング方式
US2889515A (en) Delay line test means and techniques
US3389336A (en) Time delay tester having feedback induced oscillation
JPS60119474A (ja) ダイナミツク・フイルタの試験装置
Yuanshang et al. Pulse Parameters Rapid Detection Technology of Peak Power Sensors