JPS59122193A - Solid-state image pickup device - Google Patents

Solid-state image pickup device

Info

Publication number
JPS59122193A
JPS59122193A JP57229039A JP22903982A JPS59122193A JP S59122193 A JPS59122193 A JP S59122193A JP 57229039 A JP57229039 A JP 57229039A JP 22903982 A JP22903982 A JP 22903982A JP S59122193 A JPS59122193 A JP S59122193A
Authority
JP
Japan
Prior art keywords
region
solid
light
resin layer
photoelectric conversion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57229039A
Other languages
Japanese (ja)
Inventor
Yasuo Ishihara
石原 保雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP57229039A priority Critical patent/JPS59122193A/en
Priority to US06/564,403 priority patent/US4667092A/en
Publication of JPS59122193A publication Critical patent/JPS59122193A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0216Coatings
    • H01L31/02161Coatings for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/02162Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0232Optical elements or arrangements associated with the device
    • H01L31/02327Optical elements or arrangements associated with the device the optical elements being integrated or being directly associated to the device, e.g. back reflectors

Abstract

PURPOSE:To improve sensitivity and to pevent color mixture by forming a color filter array corresponding to each photoelectric converting element in a solid- state image pickup device and using a photosensing resin on the filter array so as to collect the incident light to the photoelectric converting element. CONSTITUTION:A photoelectric converting region 11 is arraged on the major plane of a semiconductor substrate 10, a signal photoelectric-converted at the region 11 is read by a region 12 of a CCD register, the region 12 includes a transfer gate and a light shield layer 13 passing no light is formed on its upper part. Then a color filter is formed on the element surface by coloring red 15, green 16 and blue 17 with a photoresist through a chromatophilia resin layer 4, and then a resin layer 18 of photosensing performance is formed on it and a lens array 19 is formed so that the light incident thereto is collected effectively to the photosensing region 11. The incident light 20 is collected completely in the photoelectric converting region by the radius of curvature of the lens 19 and the thickness of the resin layer 18.

Description

【発明の詳細な説明】 本発明は固体撮像装置の感度向上およびカラー撮像装置
の混色防止に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to improving the sensitivity of solid-state imaging devices and preventing color mixture in color imaging devices.

一般に固体撮像製置は、半導体基板主面に光電変換部及
び信号読ろ出し部を有するため、有効な光電変換領域と
して100−使用することはできない◇この欠点を解決
する手段として、光電変換領域と信号読み出し領域を分
離したCCD(電荷結合素子)フレーム拳トランスファ
一方式、あるいはCCDインターライン転送方式、  
MOS mti&像素子上に光導電膜を形成し、光14
!変換効率を向上させる構成が提案されている。
In general, solid-state imaging devices have a photoelectric conversion section and a signal readout section on the main surface of a semiconductor substrate, so they cannot be used as an effective photoelectric conversion area. A CCD (charge-coupled device) frame transfer system with separate signal readout area or CCD interline transfer system,
A photoconductive film is formed on the MOS mti & image element, and the light 14
! Configurations have been proposed to improve conversion efficiency.

しかし、これらの方法はチップサイズの増大、製作の困
#さ、光電変換以外の特性劣化など問題点も多い=o8
らに固体撮像装置をカラー撮像装置に応用する場合、光
電変換領域とカラーフィルタアレーとの目金せずによっ
て生じる混色の問題かあった0 本発明は上に述べた欠点をなくシ、高感度で混色のない
固体撮像装置を提供するものである。
However, these methods have many problems such as increased chip size, difficulty in manufacturing, and deterioration of characteristics other than photoelectric conversion = o8
Furthermore, when a solid-state imaging device is applied to a color imaging device, there is a problem of color mixing caused by the lack of contact between the photoelectric conversion region and the color filter array. This provides a solid-state imaging device that does not cause color mixture.

本発明によれば同一半導体基板上にモザイク上に形成さ
れた光電変素子群と、光電咄凛子群で形−換さう れた信号を読み出す手段とかlなる固体撮像装置におい
て、前記光電変換素子群の各光電変換素子J。
According to the present invention, in a solid-state imaging device comprising a group of photoelectric conversion elements formed in a mosaic manner on the same semiconductor substrate, and a means for reading out a signal transformed by the photoelectric conversion element group, the photoelectric conversion element group Each photoelectric conversion element J.

に対応し、な721.且つ、この光電変換素子の主面に
色フイルタアレーが形成されてなり、該色フイルタアレ
ー上に感光性樹脂を用いて前記光電変換素子に入射光を
集光させるだめの集光レンズが形成されていることを特
徴とする固体撮像装置が得られる。
Corresponding to 721. Further, a color filter array is formed on the main surface of the photoelectric conversion element, and a condensing lens for condensing incident light onto the photoelectric conversion element is formed using a photosensitive resin on the color filter array. A solid-state imaging device is obtained.

次に図面を用いて、本発明について説明する。Next, the present invention will be explained using the drawings.

第1図〜第4図は本発明の固体撮像装置の一実施例をそ
の製造方法と共に説明するための図で主要工程における
固体撮像装置の断面概念図を示している。
1 to 4 are diagrams for explaining an embodiment of the solid-state imaging device of the present invention together with its manufacturing method, and show conceptual cross-sectional views of the solid-state imaging device in main steps.

第1図は通常のCODインターライン方式方式固装像装
置面を模式的に示したもので半導体基板lOの主面には
例えばフォトダイオードからなる光電変換領域11が配
置されている。12は光電変換部ρ 埃1゛e光電変換した信号を読み出すCODレジスタメ
領域で、第1図には図示してないが光電変換領域11と
CCDレジスタ12の間には信号電荷の転送を制御する
トランスファゲートが配置されている。
FIG. 1 schematically shows the surface of a conventional COD interline solid-state image device, in which a photoelectric conversion region 11 made of, for example, a photodiode is arranged on the main surface of a semiconductor substrate IO. Reference numeral 12 denotes a COD register area for reading out the photoelectrically converted signal, which is located between the photoelectric converter area 11 and the CCD register 12 and controls the transfer of signal charges. A transfer gate is placed.

またCODレジスタおよびトランスファゲート領域は例
えばAjのような光を通さない層13で遮光/されてい
る。CODレジスタ詔よびトランスファゲート領域の主
面と遮光層13間には、絶縁層転送電極が配置されてい
るが本発明の動作と関係がないため図示されていない。
Further, the COD register and the transfer gate region are shielded from light by a layer 13 that does not transmit light, such as Aj. An insulating layer transfer electrode is arranged between the main surface of the COD register and transfer gate region and the light shielding layer 13, but it is not shown because it has no relation to the operation of the present invention.

第2図は第1図に示したCODインターライン転送方式
に色フィルターを形成した場合の一実施例である。14
は例えばポリビニールアルコール、アクリルなどの可染
性樹脂層で、フォトレジスト技術を用いて、次々に赤1
5、緑16、背17の染料を染め分けたものである。第
3図は、素子表面上にモザイク状あるいはストライプ状
に色フィルターを形成した後、例えば14の可染性樹脂
層あるいはP GMAのような透明で感光性のある樹脂
層18を形成する。樹脂層18は、染色層の保睦膜とし
ての役割も行っている。樹脂層18を被着した後撮像装
置のボンデングパット部上のPGM人を光化学反応を用
いて除去する。
FIG. 2 shows an example in which a color filter is formed in the COD interline transfer method shown in FIG. 14
is a layer of dyeable resin, such as polyvinyl alcohol or acrylic, which is colored red one after another using photoresist technology.
5, green 16, and back 17 dyes. In FIG. 3, after forming color filters in a mosaic or stripe pattern on the surface of the device, for example, 14 dyeable resin layers or a transparent photosensitive resin layer 18 such as PGMA are formed. The resin layer 18 also serves as a protective film for the dyed layer. After depositing the resin layer 18, the PGM layer on the bonding pad portion of the imaging device is removed using a photochemical reaction.

第4図は感光性樹脂層18の表面に入射した光を感光領
域11へ有効に集光するよう形成されたレンズアレーで
19のような凸レンズを形成した一実施例である。
FIG. 4 shows an embodiment in which a convex lens 19 is formed in a lens array formed to effectively condense light incident on the surface of the photosensitive resin layer 18 onto the photosensitive area 11.

入射光側はレンズ19の曲率半径と樹脂層18の厚さに
より光電変換領域の中に完全に集光することができる0 このように入射光を光電変換部の1点あるいは、小さな
面積上に集光することにより、色フィルタ15.16.
17の目合せがずれても、充分マージンを。
The incident light side can be completely focused into the photoelectric conversion region by the radius of curvature of the lens 19 and the thickness of the resin layer 18. In this way, the incident light can be focused on one point or a small area of the photoelectric conversion section. By focusing the light, color filters 15, 16.
Even if the alignment of 17 is off, there is enough margin.

もって混色のない固体撮像装置を得ることができる0 また感光性樹脂層18上に形成するレンズ19の形状は
凸レンズに限定することなく、■溝形あるいは台形構造
により入射光を光電変換領域に集光することもできる。
As a result, a solid-state imaging device without color mixture can be obtained.0 Furthermore, the shape of the lens 19 formed on the photosensitive resin layer 18 is not limited to a convex lens; It can also be illuminated.

さらに本発明はCCDフレームFurthermore, the present invention provides a CCD frame.

【図面の簡単な説明】[Brief explanation of the drawing]

第1−第4図は本発明の固体撮像装置の一実施例をその
製造方法と共に説明するための図で、各主要工程におけ
る固体撮像装置の断面を模式的に示したものである〇 第1図はCODイン−!−ライン転送方式撮像装置の断
面模式図、第2図は、第1図に示した撮像装置上に色フ
ィルタを形成した断面図、第3図は色フィルター上にさ
らに樹脂層を被着した断面図、第4図樹脂層上に入射光
を集光するレンズを形成した断面図を示す。 IOは基板半導体、IIは光電変換領域、12は信号読
み出し領域、13は遮光層、15,16.17は色フィ
ル夛、18は感光性透明樹脂、19はレンズを示す。
Figures 1 to 4 are diagrams for explaining one embodiment of the solid-state imaging device of the present invention together with its manufacturing method, and schematically show cross-sections of the solid-state imaging device in each main process. The figure is COD in-! - A schematic cross-sectional view of a line transfer type imaging device; FIG. 2 is a cross-sectional view of a color filter formed on the image pickup device shown in FIG. 1; and FIG. 3 is a cross-sectional view of a color filter further coated with a resin layer. FIG. 4 shows a cross-sectional view in which a lens for condensing incident light is formed on the resin layer. IO is a substrate semiconductor, II is a photoelectric conversion region, 12 is a signal readout region, 13 is a light shielding layer, 15, 16, 17 are color filters, 18 is a photosensitive transparent resin, and 19 is a lens.

Claims (1)

【特許請求の範囲】[Claims] 同−半導体基板上にモザイク状に形成された光電変換素
子群と、光電変換素子群で光電変換された信号を読ろ出
す手段からなる固体撮像装置において、前記充電変換素
子群の各光電変換素子に対応し、この主面に色フイルタ
−アレーか形成されてなり、該色フイルタ−アレー上に
感光性樹脂を用いて前記光を変換素子に入射光を集光さ
せるための集光レンズが形成きれていることを*aとす
る固体撮像装置。
In the solid-state imaging device comprising a group of photoelectric conversion elements formed in a mosaic shape on a semiconductor substrate and a means for reading out signals photoelectrically converted by the group of photoelectric conversion elements, each photoelectric conversion element of the group of charging conversion elements Corresponding to this, a color filter array is formed on the main surface, and a condensing lens is formed using a photosensitive resin on the color filter array to condense the incident light onto the light conversion element. A solid-state imaging device that is marked *a if it is sharp.
JP57229039A 1982-12-28 1982-12-28 Solid-state image pickup device Pending JPS59122193A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP57229039A JPS59122193A (en) 1982-12-28 1982-12-28 Solid-state image pickup device
US06/564,403 US4667092A (en) 1982-12-28 1983-12-22 Solid-state image device with resin lens and resin contact layer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57229039A JPS59122193A (en) 1982-12-28 1982-12-28 Solid-state image pickup device

Publications (1)

Publication Number Publication Date
JPS59122193A true JPS59122193A (en) 1984-07-14

Family

ID=16885783

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57229039A Pending JPS59122193A (en) 1982-12-28 1982-12-28 Solid-state image pickup device

Country Status (1)

Country Link
JP (1) JPS59122193A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59148482A (en) * 1983-02-14 1984-08-25 Hitachi Ltd Manufacture of solid-state image pickup element
JPS61203663A (en) * 1985-02-13 1986-09-09 Nec Corp Manufacture of solid-state image pick-up device
FR2671198A1 (en) * 1990-12-31 1992-07-03 Samsung Electronics Co Ltd COLOR FILTER AND MANUFACTURING METHOD THEREOF.
WO2007116887A1 (en) 2006-04-03 2007-10-18 Toppan Printing Co., Ltd. Color image sensor and method for fabricating color image sensor
US7683302B2 (en) 2004-10-08 2010-03-23 Panasonic Corporation Solid-state imaging device having on-chip color filter layers and solid-state imaging device manufacturing method of the solid-state imaging device
CN111405256A (en) * 2018-12-13 2020-07-10 爱思开海力士有限公司 Image sensing device having organic pixel array and inorganic pixel array

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59148482A (en) * 1983-02-14 1984-08-25 Hitachi Ltd Manufacture of solid-state image pickup element
JPH0544193B2 (en) * 1983-02-14 1993-07-05 Hitachi Ltd
JPS61203663A (en) * 1985-02-13 1986-09-09 Nec Corp Manufacture of solid-state image pick-up device
FR2671198A1 (en) * 1990-12-31 1992-07-03 Samsung Electronics Co Ltd COLOR FILTER AND MANUFACTURING METHOD THEREOF.
US7989752B2 (en) 2004-10-08 2011-08-02 Panasonic Corporation Solid-state imaging device and solid-state imaging device manufacturing method
US7683302B2 (en) 2004-10-08 2010-03-23 Panasonic Corporation Solid-state imaging device having on-chip color filter layers and solid-state imaging device manufacturing method of the solid-state imaging device
US8134110B2 (en) 2004-10-08 2012-03-13 Panasonic Corporation Solid-state imaging device and solid-state imaging device manufacturing method
WO2007116887A1 (en) 2006-04-03 2007-10-18 Toppan Printing Co., Ltd. Color image sensor and method for fabricating color image sensor
US8049805B2 (en) 2006-04-03 2011-11-01 Toppan Printing Co., Ltd. Color imaging device and color imaging device manufacturing method
EP2482316A1 (en) 2006-04-03 2012-08-01 Toppan Printing Co., Ltd. Color imaging device and color imaging device manufacturing method
CN111405256A (en) * 2018-12-13 2020-07-10 爱思开海力士有限公司 Image sensing device having organic pixel array and inorganic pixel array
US11244975B2 (en) 2018-12-13 2022-02-08 SK Hynix Inc. Image sensing device having organic pixel array and inorganic pixel array
CN111405256B (en) * 2018-12-13 2022-03-08 爱思开海力士有限公司 Image sensing device having organic pixel array and inorganic pixel array

Similar Documents

Publication Publication Date Title
US4721999A (en) Color imaging device having white, cyan and yellow convex lens filter portions
US7816169B2 (en) Colors only process to reduce package yield loss
US5677200A (en) Color charge-coupled device and method of manufacturing the same
JPH05335531A (en) Solid-state imaging device
JP3180748B2 (en) Solid-state imaging device
US5900655A (en) Charge coupled device with stripe layers corresponding to CCD regions
JPS6038989A (en) Solid-state image pickup device and its manufacture
TWI292960B (en) Image sensor with improved uniformity of effective incident light
JP4528879B2 (en) Solid-state imaging device and manufacturing method thereof
JPH0750401A (en) Solid state image pick-up device and manufacturing method thereof
JPS59122193A (en) Solid-state image pickup device
JPH0964329A (en) Solid-state image pickup element
JP3033242B2 (en) Solid-state imaging device
JPH069229B2 (en) Method of manufacturing solid-state imaging device
JPH04199874A (en) Solid state image sensing device
US5895943A (en) Color charge-coupled device
JPH04259256A (en) Solid state image sensor
JPS61203663A (en) Manufacture of solid-state image pick-up device
JPH08335686A (en) Color solid-state image pickup element and its manufacture
JPS58125973A (en) Solid-state image pickup element
KR100192321B1 (en) The structure of solid-state image sensing device and manufacturing method thereof
JPH04348565A (en) Solid-state image pickup device
KR20010011607A (en) Solid static pick-up device having microlens and method for manufacturing the same
JPH1127588A (en) Solid-state image-pickup device and its manufacture
JPH06163864A (en) Solid-state image pickup device