JPS59119664A - Mesh - Google Patents

Mesh

Info

Publication number
JPS59119664A
JPS59119664A JP22896582A JP22896582A JPS59119664A JP S59119664 A JPS59119664 A JP S59119664A JP 22896582 A JP22896582 A JP 22896582A JP 22896582 A JP22896582 A JP 22896582A JP S59119664 A JPS59119664 A JP S59119664A
Authority
JP
Japan
Prior art keywords
mesh
sample
handling
support
electron microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22896582A
Other languages
Japanese (ja)
Inventor
Kenjiro Hayashi
林　賢次郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Suwa Seikosha KK
Original Assignee
Seiko Epson Corp
Suwa Seikosha KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp, Suwa Seikosha KK filed Critical Seiko Epson Corp
Priority to JP22896582A priority Critical patent/JPS59119664A/en
Publication of JPS59119664A publication Critical patent/JPS59119664A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support

Abstract

PURPOSE:To facilitate production of a sample for observation as well as simplifying handling of a mesh by providing said mesh to be used as a sample support of a transmission type electron microscope with a holding part. CONSTITUTION:A mesh 1 to be used as a sample support of a transmission type electron microscope is provided with a holding part 2. Accordingly, when thinning the sample into film in the state of being placed on the mesh 1 by chemical etching or ion etching, the process can be simplified by utilizing the support 2, the mesh can be prevented from being broken when handling said mesh 1 by using a pincette, thus improving safety of handling.

Description

【発明の詳細な説明】 本発明は透過電子顕微鏡の試料台として用いるメツシュ
に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a mesh used as a sample stage for a transmission electron microscope.

従来のメツシュは図１に示す如く、円形のものである。A conventional mesh is circular, as shown in FIG.

ピンセットを用いて取り扱う場合、メツシュを折らない
ようにする事は非常に難がしく、熟練を要した。又、試
料をメツシュ全体に載せてしまうとさらに取り扱いが困
難となり、複雑な試料前処を行う時、メツシュを破損す
るおそれがあった０ 本発明はかかる欠点を除失したもので、その目的はメツ
シーの取り扱いを容易にし、顕微鏡観察用試料の作成を
容易にするものである。When handling with tweezers, it is very difficult to avoid breaking the mesh and requires skill. In addition, if the sample is placed on the entire mesh, handling becomes even more difficult, and there is a risk of damaging the mesh when performing complicated sample preparation.The present invention eliminates these drawbacks, and its purpose is to This facilitates the handling of the mesh and the preparation of samples for microscopic observation.

第２図において、本発明によるメツシュの１例を示す。In FIG. 2, an example of a mesh according to the invention is shown.

従来のメツシュ１にピンセットによる支持部２を設けた
ものである。本発明によるメツシュを用いれは、メツシ
ュの取り扱いが容易になり観察用試料の作成も確実に行
うことができる。A conventional mesh 1 is provided with a support portion 2 using tweezers. By using the mesh according to the present invention, the mesh can be easily handled and observation samples can be prepared reliably.

一般に透過型筒１子顕微鏡は、１ｏｏｏＸ前後の薄膜を
観察する。そのため試料は破壊されやすく、メツシュに
薄膜を載せた状態でも細心の注意が必要となる。１−２
かも、試料は最初から観察可能な１０００χ　前後にな
っていることはなく、ケミカルエツチングあるいはイオ
ンエツチング等の手法により薄膜化をすることが多い。Generally, a transmission tube single-child microscope observes a thin film of around 100X. Therefore, the sample is easily destroyed, and great care must be taken even when a thin film is placed on the mesh. 1-2
However, the sample does not have an observable value of around 1000χ from the beginning, and is often thinned by chemical etching or ion etching.

このような操作を行う時、本発明による支持部を設けて
あれば、複雑な試料前処即を容蓼、に行うことができる
。When carrying out such operations, if the supporting section according to the present invention is provided, complicated sample preparation can be carried out easily.

【図面の簡単な説明】[Brief explanation of the drawing]

図１・・・・・従来のメツシー 図２・・本発明によるメッシュ 第１図 第２図 ３３８− Figure 1: Conventional Metsushi Figure 2: Mesh according to the present invention Figure 1 Figure 2 338-

Claims (1)

【特許請求の範囲】[Claims] 支持部を有する透過型電子顕微鏡用メンシー。Mency for transmission electron microscopes with a support part.
JP22896582A 1982-12-27 1982-12-27 Mesh Pending JPS59119664A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22896582A JPS59119664A (en) 1982-12-27 1982-12-27 Mesh

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22896582A JPS59119664A (en) 1982-12-27 1982-12-27 Mesh

Publications (1)

Publication Number Publication Date
JPS59119664A true JPS59119664A (en) 1984-07-10

Family

ID=16884636

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22896582A Pending JPS59119664A (en) 1982-12-27 1982-12-27 Mesh

Country Status (1)

Country Link
JP (1) JPS59119664A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007141866A (en) * 2007-02-26 2007-06-07 Hitachi Ltd Electronic microscopic method and electronic microscope using the same, and biological material inspection method and biological inspection device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007141866A (en) * 2007-02-26 2007-06-07 Hitachi Ltd Electronic microscopic method and electronic microscope using the same, and biological material inspection method and biological inspection device

Similar Documents

Publication Publication Date Title
US7375325B2 (en) Method for preparing a sample for electron microscopic examinations, and sample supports and transport holders used therefor
US7005636B2 (en) Method and apparatus for manipulating a microscopic sample
Booker et al. Method of preparing Si and Ge specimens for examination by transmission electron microscopy
US6982429B2 (en) Transmission electron microscope sample preparation
US6140652A (en) Device containing sample preparation sites for transmission electron microscopic analysis and processes of formation and use
US5821544A (en) Electron microscope specimen supports
JPS59119664A (en) Mesh
JP3751062B2 (en) Sample holder for cross-sectional TEM observation and TEM apparatus including the same
JP2842083B2 (en) Sample holder, sample processing observation system using the same, sample observation method, transmission electron microscope, and ion beam device
JPS59119663A (en) Mesh
JP2002062226A (en) Sample preparing device for fib sample
JP2000230891A (en) Method for preparing sample for transmission type electron microscope
KR0150675B1 (en) Method of making samples with tem
Mims et al. Ultrastructure of ascospore delimitation in freeze substituted samples of Ascodesmis nigricans (Pezizales)
Rebel et al. Nuclear inclusions in osteoclasts in Paget’s bone disease
JPH0817381A (en) Sample device of electron microscope
JP2018153142A (en) Nanopipette
US9821486B2 (en) Integrated lamellae extraction station
JPS60264033A (en) Supporting member of sample holder for ambience sample chamber of electron microscope
JPS5821174Y2 (en) Sealed quartz reaction tube device
JP2515762B2 (en) Microcentrifuge cell
JP2002022625A (en) Micro sampling system and micro knife
SU1285337A1 (en) Method of preparing specimen for electron microscopic investigation
GB637361A (en) Improvements in and relating to electron microscope
US2256191A (en) Method for examining objects in an air space by means of electron microscopes