JPS59113176A - Vacuum deposition method - Google Patents
Vacuum deposition methodInfo
- Publication number
- JPS59113176A JPS59113176A JP22198682A JP22198682A JPS59113176A JP S59113176 A JPS59113176 A JP S59113176A JP 22198682 A JP22198682 A JP 22198682A JP 22198682 A JP22198682 A JP 22198682A JP S59113176 A JPS59113176 A JP S59113176A
- Authority
- JP
- Japan
- Prior art keywords
- vacuum
- substrate
- drum
- jar
- brushes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/02—Pretreatment of the material to be coated
- C23C14/021—Cleaning or etching treatments
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
【発明の詳細な説明】
技術分野
この発明は、真空ペルジャー内に基板をセットし該真空
ペルジャー内を減圧して、真空蒸着により上記基板表面
に薄膜を形成する真空蒸着方法に関する。TECHNICAL FIELD This invention relates to a vacuum evaporation method in which a substrate is set in a vacuum pelger, the pressure inside the vacuum pelger is reduced, and a thin film is formed on the surface of the substrate by vacuum evaporation.
従来技術
例えば、電子写真複写機の感光体ドラムは真空ペルジャ
ー内でアルミニウムドラムに感光体の薄膜を真空蒸着方
法により形成して製作されるが、このような真空蒸着に
より基板に薄膜を形成する技術においてはダストによる
基板の汚染の除去が一つの技術課題となっている。Prior Art For example, the photoreceptor drum of an electrophotographic copying machine is manufactured by forming a thin film of the photoreceptor on an aluminum drum in a vacuum pelger using a vacuum deposition method. One of the technical challenges in this field is to remove contamination of the substrate due to dust.
真空蒸着が施こされる基板にダストの付着による汚染が
あると、蒸着膜にピンホール状欠陥や突起等の局部的異
常成長が発生し、欠陥製品になる。If the substrate on which vacuum deposition is performed is contaminated by adhesion of dust, localized abnormal growth such as pinhole-like defects and protrusions will occur in the deposited film, resulting in defective products.
これを防止するために従来広のような方法が採られてい
る。To prevent this, conventional methods have been adopted.
(イ) 真空ペルジャー内に基板をセットする前に基板
を洗浄する。(b) Clean the substrate before setting it in the vacuum pelger.
(ロ) 真空ペルジャー近傍のクリーニング。(b) Cleaning near the vacuum pelger.
(ハ)蒸着物質の蒸発源からの突沸の防止。(c) Prevention of bumping of the vapor deposited material from the evaporation source.
しかし、真空蒸着の一連の工程中、最も基板が汚染され
るのは、真空ペルジャー内の排気(減圧)過程である。However, in a series of vacuum deposition steps, the most likely to contaminate the substrate is the evacuation (depressurization) process in the vacuum pelger.
大気圧近傍の気体中には1μm以下のダストが常に浮遊
しており、又真空装置の周囲の空気がどれほどクリーン
であったとしても、真空中でのプロセスで発生したダス
トは履歴として真空ペルジャー内部に降り積っており、
ペルジャー内排気時に発生するペルジャー内乱流により
このダストが錦上り浮遊するのでペルジャー内に基板を
セットする前に基板を洗浄しても基板が汚染するのを防
ぐことはできなかった。Dust of 1 μm or less is always floating in gas near atmospheric pressure, and no matter how clean the air around the vacuum equipment is, the dust generated during the vacuum process remains inside the vacuum Pelger. It is raining down on
This dust becomes turbulent inside the Pel jar when the Pel jar is evacuated, and therefore, even if the substrate is cleaned before being set in the Pel jar, it is not possible to prevent the substrate from becoming contaminated.
目 的
本発明は、従来の真空蒸着方法のダスト除去に関する上
述の欠点を解消し、基板表面のダスト汚れを確実に除去
することのできる真空蒸着方法を提供することを目的と
する。OBJECTS The present invention aims to eliminate the above-mentioned drawbacks regarding dust removal of conventional vacuum evaporation methods, and to provide a vacuum evaporation method that can reliably remove dust stains from the surface of a substrate.
構 成
以下、本発明を図面に示す実施例とともに詳細に説明す
る。Configuration The present invention will be described in detail below along with embodiments shown in the drawings.
さて、気体の真空度があるレベル以上になると(即ち、
絶対国力がある値より低くなると)気体中にあるダスト
等の物体の運動の抗力は気体の密度に比例して減少する
ため、重力の作用で落下し易くなり、平均自由行程(飛
程)が低下し、浮遊ダストの密度は大幅に低下すること
が期待できる。Now, when the degree of vacuum of the gas exceeds a certain level (i.e.,
(When the absolute national power becomes lower than a certain value), the drag of objects such as dust in the gas decreases in proportion to the density of the gas, making them easier to fall due to the action of gravity, and the mean free path (range) decreases. It can be expected that the density of suspended dust will decrease significantly.
このことは実験によっても確認されている。This has also been confirmed by experiments.
この発明は、この事実に著目し、真空ペルジャー内を排
気し、真空度があるレベル以上に達し、浮遊ダストの密
度が少なくなった時点で基板表面をクリーニングし、ダ
ストを除去することにより、その」二に更にダストが舞
落ちることを防止し、又除去したダストが錦上ることを
防止し、もって基板表面を清浄に保持して真空蒸着を行
なうことを特徴とする。This invention focuses on this fact, and by evacuating the inside of the vacuum pelger and cleaning the substrate surface to remove dust when the degree of vacuum reaches a certain level and the density of floating dust has decreased. Second, it is further characterized by preventing dust from falling and preventing removed dust from climbing up, thereby keeping the surface of the substrate clean during vacuum evaporation.
上記の如く、本発明による基板表面のクリーニングは真
空ペルジャー内であるレベル以上の真空中で行なわれる
ので1クリ一ニング手段としてはまず一般的な液体洗浄
の導入は困難である。又、エアの吹付けはペルジャー内
のm力が上昇するので不可であり、又エア吸引によるク
リーニングも真空中では不可能である。さらに静電気力
によるダストの除去も装置が大損りになり実用的でなく
、又ダストの静電気的特性に左右されるので確実な効果
は期待できない。As mentioned above, since cleaning of the substrate surface according to the present invention is carried out in a vacuum pelger at a vacuum level above a certain level, it is difficult to introduce general liquid cleaning as a cleaning means. Further, blowing air is impossible because the m-force inside the Pel jar increases, and cleaning by air suction is also impossible in a vacuum. Furthermore, removing dust by electrostatic force also causes great damage to the device, making it impractical, and since it depends on the electrostatic characteristics of the dust, no reliable effect can be expected.
そこで、本発明の真空蒸着方法では基板の表面のダスト
をクリーニング部材で機械的に掃き落すようにした。上
記のクリーニング部材としては、例えば化学繊維や兎等
の獣毛から成る柔軟なファーブラシが適当である。Therefore, in the vacuum deposition method of the present invention, the dust on the surface of the substrate is mechanically swept off with a cleaning member. As the above-mentioned cleaning member, for example, a flexible fur brush made of chemical fiber or animal hair such as rabbit hair is suitable.
以下、実施例について説明する。Examples will be described below.
実施例
蒸着材料:アモルファス5e−As合金(A835.5
重量%)
基 板ニアルミニウムドラム(直径80 mm×長さ
340mm)
基板温度:200℃
基板加熱方法:電子ビーム加熱
(蒸着時)真空度:〜10TOrr。Example vapor deposition material: Amorphous 5e-As alloy (A835.5
Weight %) Substrate Nialuminum drum (diameter 80 mm x length 340 mm) Substrate temperature: 200°C Substrate heating method: Electron beam heating (during vapor deposition) Vacuum degree: ~10 TOrr.
ドラム回転数: 20 rpm
クリーニング部材:円筒状ファーブラシO操作手順
(1)第1図に示す如く、アルミニウムドラム3をペル
ジャー内のベースプレート1に軸支されたシャフト8に
支持リング2、セットジグ4を用いてセットし、回転を
開始する。Drum rotation speed: 20 rpm Cleaning member: Cylindrical fur brush O Operation procedure (1) As shown in FIG. to set it and start rotating.
(2) ペルジャーを閉めて、排気(減圧)を開始す
なりリーニングブラシ6がアルミニウムドラム6に接離
可能に設けられており、ペルジャー内真空度が所定のレ
ベルに達する迄は、クリーニングブラシ6はアルミニウ
ムドラム3から離間した囚の位置で停止している。(2) The cleaning brush 6 is provided so that it can come into contact with and separate from the aluminum drum 6 as soon as the Pel Jar is closed and exhaustion (depressurization) is started. The prisoner is stopped at a position separated from the aluminum drum 3.
(3) ペルジャー内真空度が10 Torr、に
達した時点でクリーニングブラシ6はアルミニウムドラ
ムに接触する(B)の位置迄移動する。(3) When the vacuum level inside the Pelger reaches 10 Torr, the cleaning brush 6 moves to the position (B) where it contacts the aluminum drum.
(4) クリーニングブラシ6を回転させ回転してい
るアルミニウムドラム3をクリーニングする。(4) Rotate the cleaning brush 6 to clean the rotating aluminum drum 3.
(5) クリーニングが終了するとクリーニングブラ
シ乙の回転を停止し、もとの(A)の位置に復帰させる
。(5) When cleaning is completed, stop the rotation of cleaning brush B and return it to the original position (A).
(6) 電子ビーム銃(EBG)5により、回転して
いるアルミニウムドラム6を加熱する。(6) The rotating aluminum drum 6 is heated by the electron beam gun (EBG) 5.
(7)蒸発源7を加熱して蒸着材料を蒸発させアルミニ
ラムドラム3に蒸着を施し、蒸着物質の薄膜を形成する
。(7) The evaporation source 7 is heated to evaporate the evaporation material and the evaporation material is evaporated onto the aluminum drum drum 3 to form a thin film of the evaporation material.
なお、クリーニングブラシ6は1回の蒸着毎(二交換す
ることが必要である。Note that the cleaning brush 6 needs to be replaced every (twice) every vapor deposition.
Oクリーニング効果
上記の方法によりアルミニウムドラム3上に形成された
蒸着膜上の突起(局部的異常成長)密度とクリーニング
時間との関係を第6図に示す。なお、突起密度は感圧紙
(富士写真フィルムプレスケール)により測定したもの
である。O Cleaning Effect FIG. 6 shows the relationship between the density of protrusions (local abnormal growth) on the vapor deposited film formed on the aluminum drum 3 by the above method and the cleaning time. Note that the protrusion density was measured using pressure-sensitive paper (Fuji Photo Film Prescale).
突起発生の原因としては本発明で問題としている基板(
アルミニウム)のダスト汚染の他アルミニウム基板のア
ウトガス、蒸発源7の突沸等があるため、クリーニング
により突起は皆無とはならないが、大幅な低減効果が認
められた。The cause of the protrusion generation is the substrate (
In addition to dust contamination (aluminum), outgassing from the aluminum substrate, bumping from the evaporation source 7, etc., cleaning did not completely eliminate protrusions, but a significant reduction effect was observed.
効 果
以上の如く、本発明の真空蒸着方法によれば、真空蒸着
による薄膜形成過程での基板汚れに起因する局部的異常
成長(ピンホール、突起)を大幅に低減する事ができる
。Effects As described above, according to the vacuum evaporation method of the present invention, local abnormal growth (pinholes, protrusions) caused by substrate contamination during the thin film formation process by vacuum evaporation can be significantly reduced.
7−
なお、本発明は、実施例に示した電子写真複写機用感光
体ドラムのけが、真空蒸着により表面に薄膜が形成され
る種々の製品の真空蒸着法にも適用することができ同様
の効果が得られる。7- The present invention can also be applied to the vacuum deposition method of various products in which a thin film is formed on the surface of the electrophotographic copying machine photoreceptor drum shown in the example by vacuum deposition, and similar methods can be applied. Effects can be obtained.
第1図は本発明の方法を実施する装置の一実施例のペル
ジャーの内部に基板をセットした状態を示す側面図、第
2図はその実施例の装置のペルジャー内の機器の配置を
示す断面図、第3図は上記装置による計測値にもとづき
作製した本発明の効果を示す曲線図である。
3・・・アルミニウムドラム(基板)
6・・・クリーニングブラシ(クリーニング部材) 8
−
377Fig. 1 is a side view showing a state in which a substrate is set inside a Pel jar of an embodiment of a device for carrying out the method of the present invention, and Fig. 2 is a cross section showing the arrangement of equipment inside the Pel jar of the device of the embodiment. 3 are curve diagrams showing the effects of the present invention, which were produced based on the measured values by the above-mentioned apparatus. 3... Aluminum drum (substrate) 6... Cleaning brush (cleaning member) 8
-377
Claims (2)
ジャー内を減圧して、真空蒸着により上記基板表面に薄
膜を形成する真空蒸着方法において、上記真空ペルジャ
ー内に基板をセットし、該真空ペルジャー内を減圧した
後、該真空ペルジャー内(二設けたクリーニング部材に
より基板表面の塵埃を掃き落し、次いで真空蒸着を行な
うことを特徴とする真空蒸着方法。(1) In a vacuum evaporation method in which a substrate is set in a vacuum pelger, the pressure inside the vacuum pelger is reduced, and a thin film is formed on the surface of the substrate by vacuum evaporation, the substrate is set in the vacuum pelger, and the vacuum pelger is A vacuum evaporation method characterized in that after reducing the pressure inside the vacuum pelger, dust on the surface of the substrate is swept off using two cleaning members provided in the vacuum pelger, and then vacuum evaporation is performed.
グブラシであることを特徴とする特許請求の範囲第1項
に記載の真空蒸着方法。(2) The vacuum deposition method according to claim 1, wherein the cleaning member is a cleaning brush with flexible bristles.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22198682A JPS59113176A (en) | 1982-12-20 | 1982-12-20 | Vacuum deposition method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22198682A JPS59113176A (en) | 1982-12-20 | 1982-12-20 | Vacuum deposition method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS59113176A true JPS59113176A (en) | 1984-06-29 |
Family
ID=16775280
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP22198682A Pending JPS59113176A (en) | 1982-12-20 | 1982-12-20 | Vacuum deposition method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59113176A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0387904A2 (en) * | 1989-03-17 | 1990-09-19 | Matsushita Electric Industrial Co., Ltd. | Method of producing thin film |
-
1982
- 1982-12-20 JP JP22198682A patent/JPS59113176A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0387904A2 (en) * | 1989-03-17 | 1990-09-19 | Matsushita Electric Industrial Co., Ltd. | Method of producing thin film |
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