JPS59108907A - ３次元物体の位置検出装置 - Google Patents

３次元物体の位置検出装置

Info

Publication number
JPS59108907A
JPS59108907A JP57219440A JP21944082A JPS59108907A JP S59108907 A JPS59108907 A JP S59108907A JP 57219440 A JP57219440 A JP 57219440A JP 21944082 A JP21944082 A JP 21944082A JP S59108907 A JPS59108907 A JP S59108907A
Authority
JP
Japan
Prior art keywords
slit
edge
image
slit light
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57219440A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6352324B2 (en:Method
Inventor
Norio Aoki
青木　則夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP57219440A priority Critical patent/JPS59108907A/ja
Publication of JPS59108907A publication Critical patent/JPS59108907A/ja
Publication of JPS6352324B2 publication Critical patent/JPS6352324B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP57219440A 1982-12-14 1982-12-14 ３次元物体の位置検出装置 Granted JPS59108907A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57219440A JPS59108907A (ja) 1982-12-14 1982-12-14 ３次元物体の位置検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57219440A JPS59108907A (ja) 1982-12-14 1982-12-14 ３次元物体の位置検出装置

Publications (2)

Publication Number Publication Date
JPS59108907A true JPS59108907A (ja) 1984-06-23
JPS6352324B2 JPS6352324B2 (en:Method) 1988-10-18

Family

ID=16735436

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57219440A Granted JPS59108907A (ja) 1982-12-14 1982-12-14 ３次元物体の位置検出装置

Country Status (1)

Country Link
JP (1) JPS59108907A (en:Method)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01141306A (ja) * 1987-11-27 1989-06-02 Ngk Insulators Ltd 線パターンの直線性の判定方法
US4846576A (en) * 1985-05-20 1989-07-11 Fujitsu Limited Method for measuring a three-dimensional position of an object

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4846576A (en) * 1985-05-20 1989-07-11 Fujitsu Limited Method for measuring a three-dimensional position of an object
JPH01141306A (ja) * 1987-11-27 1989-06-02 Ngk Insulators Ltd 線パターンの直線性の判定方法

Also Published As

Publication number Publication date
JPS6352324B2 (en:Method) 1988-10-18

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