JPS59108907A - ３次元物体の位置検出装置 - Google Patents
３次元物体の位置検出装置Info
- Publication number
- JPS59108907A JPS59108907A JP21944082A JP21944082A JPS59108907A JP S59108907 A JPS59108907 A JP S59108907A JP 21944082 A JP21944082 A JP 21944082A JP 21944082 A JP21944082 A JP 21944082A JP S59108907 A JPS59108907 A JP S59108907A
- Authority
- JP
- Japan
- Prior art keywords
- slit
- edge
- image
- slit light
- pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000009826 distribution Methods 0.000 claims abstract description 14
- 239000000284 extract Substances 0.000 claims description 3
- 238000012545 processing Methods 0.000 abstract description 9
- 230000000694 effects Effects 0.000 abstract description 3
- PCTMTFRHKVHKIS-BMFZQQSSSA-N (1s,3r,4e,6e,8e,10e,12e,14e,16e,18s,19r,20r,21s,25r,27r,30r,31r,33s,35r,37s,38r)-3-[(2r,3s,4s,5s,6r)-4-amino-3,5-dihydroxy-6-methyloxan-2-yl]oxy-19,25,27,30,31,33,35,37-octahydroxy-18,20,21-trimethyl-23-oxo-22,39-dioxabicyclo[33.3.1]nonatriaconta-4,6,8,10 Chemical compound C1C=C2C[C@@H](OS(O)(=O)=O)CC[C@]2(C)[C@@H]2[C@@H]1[C@@H]1CC[C@H]([C@H](C)CCCC(C)C)[C@@]1(C)CC2.O[C@H]1[C@@H](N)[C@H](O)[C@@H](C)O[C@H]1O[C@H]1/C=C/C=C/C=C/C=C/C=C/C=C/C=C/[C@H](C)[C@@H](O)[C@@H](C)[C@H](C)OC(=O)C[C@H](O)C[C@H](O)CC[C@@H](O)[C@H](O)C[C@H](O)C[C@](O)(C[C@H](O)[C@H]2C(O)=O)O[C@H]2C1 PCTMTFRHKVHKIS-BMFZQQSSSA-N 0.000 abstract 1
- 238000001514 detection method Methods 0.000 description 15
- 238000000034 method Methods 0.000 description 14
- 238000010586 diagram Methods 0.000 description 5
- 238000013507 mapping Methods 0.000 description 5
- 239000011159 matrix material Substances 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 238000009529 body temperature measurement Methods 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
Landscapes
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP21944082A JPS59108907A (ja) | 1982-12-14 | 1982-12-14 | ３次元物体の位置検出装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP21944082A JPS59108907A (ja) | 1982-12-14 | 1982-12-14 | ３次元物体の位置検出装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59108907A true JPS59108907A (ja) | 1984-06-23 |
| JPS6352324B2 JPS6352324B2 (enrdf_load_stackoverflow) | 1988-10-18 |
Family
ID=16735436
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP21944082A Granted JPS59108907A (ja) | 1982-12-14 | 1982-12-14 | ３次元物体の位置検出装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59108907A (enrdf_load_stackoverflow) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01141306A (ja) * | 1987-11-27 | 1989-06-02 | Ngk Insulators Ltd | 線パターンの直線性の判定方法 |
| US4846576A (en) * | 1985-05-20 | 1989-07-11 | Fujitsu Limited | Method for measuring a three-dimensional position of an object |
-
1982
- 1982-12-14 JP JP21944082A patent/JPS59108907A/ja active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4846576A (en) * | 1985-05-20 | 1989-07-11 | Fujitsu Limited | Method for measuring a three-dimensional position of an object |
| JPH01141306A (ja) * | 1987-11-27 | 1989-06-02 | Ngk Insulators Ltd | 線パターンの直線性の判定方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6352324B2 (enrdf_load_stackoverflow) | 1988-10-18 |
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