JPS59100881A - Testing method of alternating current breaker - Google Patents
Testing method of alternating current breakerInfo
- Publication number
- JPS59100881A JPS59100881A JP57211673A JP21167382A JPS59100881A JP S59100881 A JPS59100881 A JP S59100881A JP 57211673 A JP57211673 A JP 57211673A JP 21167382 A JP21167382 A JP 21167382A JP S59100881 A JPS59100881 A JP S59100881A
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- JP
- Japan
- Prior art keywords
- test
- capacitor
- reactor
- load
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Tests Of Circuit Breakers, Generators, And Electric Motors (AREA)
Abstract
Description
【発明の詳細な説明】
この発明は交流遮断器で負荷電流程度以下の比較的小さ
い電流を開閉する際の開閉試験の試験方法に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a test method for a switching test when switching a relatively small current equal to or lower than the load current in an AC circuit breaker.
この種の試験に幻する試験回路として従来の例を第1図
に示す。図において1は交流の商用周波電源で通常短絡
発電機が使用される。2は投入器、3は供試遮断器、4
は供試負荷で、この負荷としては力率改善用コンデンサ
や、無負荷の架空送電辞や地中ケーブルなどの進相負荷
を模擬したコンデンサや、リアクトル、抵抗およびこれ
らの組合せがある。このような回路でたとえば投入、遮
断に伴なう廿−ジ電圧を測定するり合、まず投入器2を
投入して供試遮断器3の電源側端子に電圧を印加し、次
に供試遮断器3の投入および遮断を行−
%。また供試g断器3の遮断性能検証試験では予め供試
遮@器3を投入しておいて然る役に投入器2を投入しひ
きつづき供試遮断器3を遮断する。A conventional example of a test circuit for this type of test is shown in FIG. In the figure, reference numeral 1 denotes an AC commercial frequency power source, and a short-circuit generator is usually used. 2 is a closing device, 3 is a test circuit breaker, 4
is the test load, and this load includes a power factor correction capacitor, a capacitor simulating a phase-advancing load such as an unloaded overhead power line or underground cable, a reactor, a resistor, and combinations thereof. For example, when measuring the voltage associated with closing and disconnecting in such a circuit, first turn on the closing device 2 to apply voltage to the power supply terminal of the circuit breaker under test 3, and then Turn on and off circuit breaker 3 -%. Further, in the breaking performance verification test of the test circuit breaker 3, the test circuit breaker 3 is turned on in advance, and the test circuit breaker 3 is turned on for the appropriate role, and then the test circuit breaker 3 is turned off.
こ9ような試験回路による試験では
1、電源としての短絡発電機が通常大電流における短絡
試験用の大容量機であり、運転および試験にともなう電
力消費量が大きく、かつ必要とする試験員の数と時間と
から試験費が無視で鎗ない。In tests using such test circuits, 1. The short-circuit generator used as the power source is usually a large-capacity machine for short-circuit tests at large currents, and the power consumption associated with operation and testing is large, and the number of testers required is low. Considering the number and time involved, the cost of the exam is ignored.
2、供試遮断器の同形器が使用される回路の商用周波数
には50Hzと60Hzとがあり、厳密にはこの両周波
数のもとで試験が行われるべきであるが、短絡試験場と
してこの両周波数の電源を設備化することは経済的負担
が゛大きいため、通常は−・ずれかの周波数の電源しか
設備化されていない。2. There are 50Hz and 60Hz as the commercial frequencies of the circuit in which the same type of circuit breaker under test is used.Strictly speaking, the test should be conducted under both of these frequencies, but as a short-circuit test site, both of these frequencies are used. Since it is a heavy economic burden to install a power source with a certain frequency, normally only a power source with one of the following frequencies is installed.
従って他の周波数に対しては何らかの等価試験を行なう
こととなり、直接試験による性能検証や開閉現象の解明
ができない。Therefore, some kind of equivalent test must be performed for other frequencies, and it is not possible to verify performance or clarify the switching phenomenon by direct testing.
などの欠点があった。これらの欠点を補うものとして例
えば第2図のような試験回路が知られて℃・る。同図に
おいてコンデンサ5は低圧の配電電圧から昇圧された商
用周波の交流電源6により整流器7a、抵抗7bからな
る整流装置7を介して充電される。供試遮断器3の投入
状態において投入器2を投入すると供試負荷すなわちリ
アクトル9に放電電流が流れる。次に供試遮断器3を遮
断するととにより遮断性能の検証が可能となる。このと
きの電流周波数はコンデンサ5のキャパシタンスとりア
クドル9のインダクタンスとにより50Hzまたは60
Hzとされる。この場合には商用周波の交流電源の容量
は小さくて済み、従って試験にともなう消費電力量も極
めて少なく、また実験室規模での簡便な試験が可能とな
るので試験費用も大巾に低減される。−万この試験回路
では
1、振動電流を発生させる必要から負荷がリアクトルに
限られ、しかも力率が実質的に零のりアクドルに限られ
る。力率が零以外の、抵抗を含む負荷ではコンデンサ5
の端子電圧および試験電流が急速に減衰して正しい試験
を行なうことができない。There were drawbacks such as. For example, a test circuit as shown in FIG. 2 is known to compensate for these drawbacks. In the figure, a capacitor 5 is charged by a commercial frequency AC power source 6 boosted from a low distribution voltage via a rectifier 7 comprising a rectifier 7a and a resistor 7b. When the closing device 2 is closed while the test circuit breaker 3 is closed, a discharge current flows through the test load, that is, the reactor 9. Next, the test circuit breaker 3 is shut off, thereby making it possible to verify the shutoff performance. The current frequency at this time is 50Hz or 60Hz depending on the capacitance of the capacitor 5 and the inductance of the handle 9.
It is assumed to be Hz. In this case, the capacity of the commercial frequency AC power supply is small, and therefore the power consumption associated with the test is extremely low.Also, it is possible to perform a simple test on a laboratory scale, which greatly reduces the test cost. . - In this test circuit, the load is limited to a reactor due to the necessity of generating an oscillating current, and furthermore, the power factor is limited to an axle with substantially zero power factor. Capacitor 5 for loads containing resistance with a power factor other than zero
The terminal voltage and test current attenuate rapidly, making it impossible to perform a correct test.
2、電流遮断後の供試遮断器3の端子にかかる回復電圧
が直流電圧となり実際と一致しない。2. The recovery voltage applied to the terminals of the test circuit breaker 3 after current interruption becomes a DC voltage and does not match the actual voltage.
3、投入試験も直流電圧下の投入試験となり実際と一致
しない。3. The closing test was also conducted under DC voltage, which did not match the actual test.
など別の欠点を有している。It has other drawbacks.
本発明は上記の欠点を除去して試験費用がより安価で、
かつ簡便に実施でき、しかも供試遮断器の同形器が使用
される回路の商用周波数と一致させた試験のできる試験
方法を提供することを目的とする。この目的は交流電源
より整流装置を介して充電されるコンデンサと、該コン
デンサの両端子に投入器を介し【接続されるす7クトル
とにより共振回路を形成させ、該共振回路の共振周波数
が所定の商用周波数に等しくかつ該商用周波数における
前記リアクトルのインピーダンスが供試負荷のインピー
ダンスの0.1倍以下となるように前記コンデンサのキ
ャパシタンスと前記リアクトルのインダクタンスとを設
定するとともに、前記リアクトルの両端子の間に直接ま
たは変圧器を介して供試遮断器と供試負荷とを含む負荷
側回路を接続し、予め前記コンデンサに充電された電荷
を前記投入器の投入により前記リアクトルを通して放電
した際に該コンデンサないし前記リアクトルの両端子間
に現われる振動電圧を試験の電源電圧とすることにより
達せられる。以下本発明を図面に示す実施例により詳細
に説明する。The present invention eliminates the above-mentioned drawbacks, has lower testing costs, and
It is an object of the present invention to provide a test method that is easy to carry out, and allows the test to match the commercial frequency of a circuit in which a circuit breaker of the same shape as the circuit breaker under test is used. The purpose of this is to form a resonant circuit by a capacitor that is charged from an AC power source via a rectifier and a capacitor that is connected to both terminals of the capacitor via a charger, and the resonant frequency of the resonant circuit is set to a predetermined value. The capacitance of the capacitor and the inductance of the reactor are set so that the impedance of the reactor at the commercial frequency is equal to the commercial frequency of 0.1 times or less than the impedance of the test load, and both terminals of the reactor are set. A load-side circuit including a test breaker and a test load is connected directly or through a transformer between This is achieved by using the oscillating voltage appearing between both terminals of the capacitor or the reactor as the power supply voltage for the test. The present invention will be explained in detail below with reference to embodiments shown in the drawings.
第3図は本発明の実施例を示す試験回路図である。第2
図との比較から見られるように、商用周波電源6、整流
器7a、抵抗7b、コンデンサ5、投入器2までは第2
図と全く同一であり、投入器2の負荷側が本発明による
ものである。すなわちコンデンサ50両端子に投入a2
を介して接続されるリアクトル10とコンデンサ5とに
より共振回路を形成し、さらにこのリアクトル10の両
端子の間に供試遮断器の同形器が使用される回路め電源
側インピーダンスを模擬したリアクトル11を介して供
試遮断器3と供試負荷4とが直列に接続されている。い
ま投入器2を投入すると、コンデンサ5の電荷がりアク
ドル10を通って放電され、リアクトル10の両端子間
に振動電圧が現われる。従って供試遮断器3が!19i
位置にあればその両端子間に、また投入位置にあれば直
列に接続されたリアクトル11と供試負荷40両端に全
振動電圧が印加される。この振動電圧の周波数讐は次の
(11式で示される。FIG. 3 is a test circuit diagram showing an embodiment of the present invention. Second
As can be seen from the comparison with the figure, the commercial frequency power supply 6, rectifier 7a, resistor 7b, capacitor 5, and input device 2 are connected to the second
It is exactly the same as the figure, and the load side of the dosing device 2 is according to the present invention. In other words, insert a2 into both terminals of capacitor 50.
A resonant circuit is formed by the reactor 10 and the capacitor 5 connected through the reactor 10, and a circuit breaker having the same shape as the circuit breaker under test is used between both terminals of the reactor 10.The reactor 11 simulates the impedance on the power supply side. The test circuit breaker 3 and the test load 4 are connected in series through the test circuit breaker 3 and the test load 4. When the charger 2 is now turned on, the charge on the capacitor 5 is discharged through the handle 10, and an oscillating voltage appears between both terminals of the reactor 10. Therefore, test circuit breaker 3! 19i
If it is in the closing position, the total oscillating voltage is applied between both terminals, and if it is in the closing position, the total oscillating voltage is applied across the reactor 11 and the test load 40, which are connected in series. The frequency of this oscillating voltage is expressed by the following equation (11).
ここでLはリアクトル10のインダクタンス(H)、C
はコンデンサ5のキャパシタンスCF)である。Here, L is the inductance (H) of the reactor 10, and C
is the capacitance CF) of the capacitor 5.
また供試負荷4のインピーダンスによって共振周波数が
実質的に変化しないよう、すなわち供試遮断器に電流が
流れているときと流れていないときとで振動電圧の周波
数が実質的に変化することのないよう、リアクトル(1
0)のインダクタンスLは次の(2)式のようにきめら
れる。In addition, the resonance frequency should not be substantially changed by the impedance of the test load 4, that is, the frequency of the oscillating voltage should not substantially change between when current is flowing through the test circuit breaker and when no current is flowing. Well, reactor (1
The inductance L of 0) is determined as shown in the following equation (2).
2gfL < Z 、 (Ji常2yrfL/Z≦0
.1)、 +21ここで2は供試負荷4のインピー
ダンス〔Ω〕である。上記(1)、(2)式を満足し、
かつfが所定の商用周波数すなわち50 Hzまたは6
0H2となるようにLとCの値が設定される。また(2
)式のような関係に回路定数をきめることにより、供試
負荷の種類や力率を任意に選ぶことかできる。2gfL < Z , (Ji always2yrfL/Z≦0
.. 1), +21 where 2 is the impedance [Ω] of the test load 4. Satisfying formulas (1) and (2) above,
and f is a predetermined commercial frequency, i.e. 50 Hz or 6
The values of L and C are set to be 0H2. Also (2
) By determining the circuit constants according to the relationship shown in the equation, it is possible to arbitrarily select the type of load under test and the power factor.
次に本発明の試験回路を充電電流の遮断試験に適用した
・例を第4図に示す。ここで第4図(alは試験回路図
、第4図1b+は電圧波形の例である。この例では供試
遮断器3の試験電、圧はりアクドル10の両端子に現わ
れる振動電圧を変圧器12を用いて昇圧することによっ
て得られている。このようにすればコンデンサ5自体の
定格電圧は低くても超高圧までの試験が可能である。い
まコンデンサ5の光電、電圧なEo、変圧器12の変圧
比をa、負荷となるコンデンサ13の端子電圧波高値を
ECとして第4図(blの波形を説明する。供試遮断器
3が投入された状態で投入器2を投入すると、変圧器1
2の出力電圧etはaEoを初期波高値とする減衰振動
電圧となる。投入器20投入後、時刻t1において供試
遮断器3の主接点を開法させろと、図示されていない電
流零点の時刻t2で電流が遮断される。その後変圧器1
2の出力電圧etは電流遮断前と実質的に同一周波数で
振動を継続し、−万コンデンサ13の両端子間にはEC
の直流電圧が残る。従って供試遮断器3の両端子間には
変圧器12の出力量、圧etとコンデ、ンサ13の残留
電圧ECとの糸Erが印加されるので、供試遮断器の同
形器が使用される回路での充電電流遮断試験時の回路条
件と全く同一となり、これにより供試遮断器3の遮断性
能の検証が可能となる。また供試遮断器3による電流遮
断後、コンデンサ13の残留電圧Eeを維持したまま、
一旦開かれた投入器2を再投入後ひきつづき変圧器賃の
出力電圧e−の種;の位相において供試遮断器30投入
を行えば実電力系統における無負荷送電線の再閉路試験
を模擬することができる。以上は本発明の試験回路を充
電電流の遮断試験に適用した例であるが、供試負荷がコ
ンデンサ以外の場合でも実回路と実質的に同一の試験条
件で試験を行なうことが可能である。Next, FIG. 4 shows an example in which the test circuit of the present invention is applied to a charging current interruption test. Here, FIG. 4 (al is a test circuit diagram, and FIG. 4 1b+ is an example of a voltage waveform. In this example, the test voltage of the test circuit breaker 3 and the oscillating voltage appearing at both terminals of the pressure beam handle 10 are transferred to the transformer. 12.In this way, even if the rated voltage of capacitor 5 itself is low, it is possible to test up to ultra-high voltage.Now, the photoelectric voltage of capacitor 5, voltage Eo, and transformer The waveform of Fig. 4 (bl) will be explained assuming that the transformation ratio of 12 is a, and the peak value of the terminal voltage of capacitor 13 serving as the load is EC. Vessel 1
The output voltage et of No. 2 becomes a damped oscillating voltage whose initial peak value is aEo. After the closing device 20 is turned on, the main contact of the test circuit breaker 3 is opened at time t1, and the current is cut off at time t2 at a current zero point (not shown). Then transformer 1
The output voltage et of 2 continues to oscillate at substantially the same frequency as before the current cutoff, and the EC
dc voltage remains. Therefore, a wire Er consisting of the output amount of the transformer 12, the pressure et, and the residual voltage EC of the capacitor 13 is applied between both terminals of the test circuit breaker 3, so that a circuit breaker with the same shape as the test circuit breaker 3 is used. The circuit conditions are exactly the same as those at the time of the charging current interruption test in the circuit shown in FIG. Further, after the current is interrupted by the test circuit breaker 3, while maintaining the residual voltage Ee of the capacitor 13,
After re-closing the closing switch 2, which has been opened once, the test circuit breaker 30 is closed at the phase of the output voltage e- of the transformer, thereby simulating a re-closing test of a no-load transmission line in an actual power system. be able to. The above is an example in which the test circuit of the present invention is applied to a charging current interruption test, but even when the test load is other than a capacitor, the test can be performed under substantially the same test conditions as the actual circuit.
以上のように本発明による試験方法は予め充電されたコ
ンデンサの電荷をリアクトルを通して放電することによ
りこれらコンデンサないしりアクドルの両端子に現われ
る振動電圧を試験の電源電圧とする方法であるから、
1、コンデンサ5の充電に要する電力量が短絡発電機の
運転に要する電力量にくらべて無視できるほど小さく、
また試験員の数や試験時間が節約で診るので試験費用を
大巾に低減できる。As described above, the test method according to the present invention is a method in which the electric charge of a pre-charged capacitor is discharged through a reactor, and the oscillating voltage appearing at both terminals of the capacitor or the axle is used as the power supply voltage for the test.1. The amount of power required to charge the capacitor 5 is negligibly small compared to the amount of power required to operate the short-circuit generator.
In addition, the number of examiners and test time can be saved, so test costs can be reduced significantly.
2、コンデンサ5のキャパシタンスないしリアクトル1
0のインダクタンスを変えることにより任意に50Hz
または60Hzのいずれかの商用周波数で試験ができる
。2. Capacitance of capacitor 5 or reactor 1
50Hz arbitrarily by changing the inductance of 0
Tests can be performed at either commercial frequencies of 60 Hz or 60 Hz.
3、供試負荷の種類が制限されずまたリアクトル10の
インピーダンスが十分小さく設定されて(・るので力率
も制約されない。3. The type of test load is not limited, and the impedance of the reactor 10 is set sufficiently small, so the power factor is not limited.
4、試験の開始に先立って振動電圧が発生しているので
、任意の電圧位相における投入試験が可能である。4. Since an oscillating voltage is generated prior to the start of the test, it is possible to conduct a power-on test at any voltage phase.
などの効果が得られる。Effects such as this can be obtained.
第1図は負荷電流の開閉試験の際の従来の試験回路の例
、第2図は試験費用を低減した簡便な試験を目的とした
試験回路の例で、予め充電されたコンデンサのみを電源
としたもの、第3図は本発明の試験方法を具体化した試
験回路の一例、第4図1alは同じく別の試験回路の例
、第4図1b+ )ま供試負荷として充電電流、を模擬
するコンデンサを使用して遮断試験を行ったときの供試
遮断器3の電源側および負荷側の電圧波形を示す。
2・・・投入器、3・・・供試遮断器、4・・・供試負
荷、5・・・コンデンサ、6・・・交流電源、7・・・
整流装置、10・・・リアクトル、12・・・変圧器。
才1の
才? 閃Figure 1 shows an example of a conventional test circuit for load current switching tests, and Figure 2 shows an example of a test circuit designed for simple tests that reduce test costs, using only a pre-charged capacitor as the power source. 3 shows an example of a test circuit embodying the test method of the present invention, FIG. The voltage waveforms on the power supply side and load side of the test circuit breaker 3 are shown when a circuit breaker test is conducted using a capacitor. 2... Closing device, 3... Test breaker, 4... Test load, 5... Capacitor, 6... AC power supply, 7...
Rectifier, 10...reactor, 12...transformer. The best talent? Flash
Claims (1)
、該コンデンサの両側子に投入器を介して接続されるリ
アクトルとにより共振回路を形成させ、該共振回路の共
振周波数が所定の商用周波数に等しくかつ該商用周波数
における前記り7クトルのインピーダンスが供試弁荷の
インピーダンスの0.1倍以下となるように前記コンデ
ンサのキャパシタンスと前記リアクトルのインダクタン
スとを設定するとともに、前記リアクトルの両端子の間
に直接または変圧器を介して供試遮断器と伊試負荷とを
含む負荷側回路を接続し、予め前記コンデンサに充電さ
れた電荷を前記投入器の投入により前Pリアクトルを通
して放電した際に腋コンデンサないし前記リアクトルの
両端子間に現われる振動電圧を試験の電源電圧として試
験を行なう交流遮断器の試験方法。A resonant circuit is formed by a capacitor charged from an AC power supply via a rectifier and a reactor connected to both terminals of the capacitor via a charger, and the resonant frequency of the resonant circuit is equal to a predetermined commercial frequency. The capacitance of the capacitor and the inductance of the reactor are set so that the impedance of the above-mentioned 7 vectors at the commercial frequency is 0.1 times or less the impedance of the test valve load, and the capacitance of the capacitor and the inductance of the reactor are set so that A load-side circuit including the test breaker and the test load is connected directly or via a transformer to the armpit when the electric charge previously charged in the capacitor is discharged through the front P reactor by inputting the input device. A test method for AC circuit breakers in which an oscillating voltage appearing between both terminals of a capacitor or the reactor is used as the test power supply voltage.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57211673A JPS59100881A (en) | 1982-12-02 | 1982-12-02 | Testing method of alternating current breaker |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57211673A JPS59100881A (en) | 1982-12-02 | 1982-12-02 | Testing method of alternating current breaker |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS59100881A true JPS59100881A (en) | 1984-06-11 |
Family
ID=16609694
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57211673A Pending JPS59100881A (en) | 1982-12-02 | 1982-12-02 | Testing method of alternating current breaker |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59100881A (en) |
-
1982
- 1982-12-02 JP JP57211673A patent/JPS59100881A/en active Pending
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