JPS5899036A - Cmos gate circuit - Google Patents

Cmos gate circuit

Info

Publication number
JPS5899036A
JPS5899036A JP56198029A JP19802981A JPS5899036A JP S5899036 A JPS5899036 A JP S5899036A JP 56198029 A JP56198029 A JP 56198029A JP 19802981 A JP19802981 A JP 19802981A JP S5899036 A JPS5899036 A JP S5899036A
Authority
JP
Japan
Prior art keywords
gate
transistor
cmos
circuit
delay time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56198029A
Other languages
Japanese (ja)
Other versions
JPH0328090B2 (en
Inventor
Setsushi Kamuro
節史 禿
Kazuya Fujimoto
和也 藤本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP56198029A priority Critical patent/JPS5899036A/en
Publication of JPS5899036A publication Critical patent/JPS5899036A/en
Publication of JPH0328090B2 publication Critical patent/JPH0328090B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/01Modifications for accelerating switching
    • H03K19/017Modifications for accelerating switching in field-effect transistor circuits
    • H03K19/01707Modifications for accelerating switching in field-effect transistor circuits in asynchronous circuits
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/02Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
    • H03K19/08Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices
    • H03K19/094Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using field-effect transistors
    • H03K19/0944Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using field-effect transistors using MOSFET or insulated gate field-effect transistors, i.e. IGFET
    • H03K19/0948Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using field-effect transistors using MOSFET or insulated gate field-effect transistors, i.e. IGFET using CMOS or complementary insulated gate field-effect transistors

Abstract

PURPOSE:To minimize the gate propagation delay time, by selecting the ratio of the width of transistors (TRs), in a CMOS gate circuit applied to an LSI of gate array system. CONSTITUTION:The proparation delay time of a gate can be minimized, by determining the threshold voltage of MOS TRs QP, QN and a power supply voltage VDD applied to the CMOS TR circuit, and selecting the ratio of the gate width of both the TRs QP, QN so that said ratios is equal to or close to n<1/2>.

Description

【発明の詳細な説明】 本発明はCMOSゲート回路に関するもので。[Detailed description of the invention] The present invention relates to a CMOS gate circuit.

特にゲートアレイ方式のLSIに適用されるCMOSゲ
ート回路に関するものである。
In particular, the present invention relates to a CMOS gate circuit applied to a gate array type LSI.

半導体技術の目まぐるしい進歩及び各種機器への半導体
集積回路の応用に伴って、短い開発期間で少量生産に適
合するランダム論理LSIに対する要望が強くなってき
た。このような要望に対しては従来からゲートアレイ方
式のLSIが適しているとされ、すでにこの種のものが
実用化されている。
With the rapid progress of semiconductor technology and the application of semiconductor integrated circuits to various devices, there has been a strong demand for random logic LSIs that can be produced in small quantities with a short development period. Gate array type LSIs have been considered suitable for meeting such demands, and this type of LSI has already been put into practical use.

またこの種の集積回路においても、低消費電力でゲート
数も多く採ることができるCMO3構造のゲートアレイ
素子の開発が試みられている。
Also, in this type of integrated circuit, attempts have been made to develop a gate array element having a CMO3 structure, which has low power consumption and can have a large number of gates.

しかし従来から開発されているCMOSゲートアレイ装
置は、性能的に充分なものとはいえず。
However, the CMOS gate array devices that have been developed so far cannot be said to have sufficient performance.

改良〆余地が残されていた。There was still room for improvement.

本発明は、CMOSゲートアレイ用のゲートセルを設計
するにあたり、ゲート幅を選ぶことによりゲート伝搬遅
延時間を最小にし得るCMOSトランジスタを提供する
ものである0次に実施例を挙げて本発明の詳細な説明す
る。
The present invention provides a CMOS transistor in which the gate propagation delay time can be minimized by selecting the gate width when designing a gate cell for a CMOS gate array. explain.

第1図はPMO8)う/ジスタQPとNMO8トランジ
スタQNとが電源vDDとアース間に接続されてなるC
MOSインバータ回路で1両MOSトランジスタQP、
QNのゲートに入力Vinが与えられるのに対して、共
通接続された両ドレイン端子から出力Voutが導出さ
れている。該出力Vou tには負荷容量CLが接続さ
れている。
In Figure 1, a PMO8 transistor QP and an NMO8 transistor QN are connected between the power supply vDD and the ground.
MOS inverter circuit with one MOS transistor QP,
Input Vin is applied to the gate of QN, while output Vout is derived from both commonly connected drain terminals. A load capacitor CL is connected to the output Vout.

上記CMOSインバータ回路において、入力信号として
第2図(a)に示すステップ状の信号Vinを入力端子
に印加すると出力には第2図(b)に示すような遅れを
伴った信号波形Voutとして導出される0 ここで出力信号Voutの立下り時間tfは出力振幅の
90%から10%に゛まで下降する時間、立上り時間t
rは10%から90%になるまでの時間と定義し、入力
信号が入力端子に与えられてから出力端に出力信号が出
るまでに要する時間である伝搬遅延時間j p dをt
pd=+(tf+tr)と定義する0 上記立下り時間t、及び立上り時間trは夫々次式で与
えられる。
In the above CMOS inverter circuit, when the step-like signal Vin shown in Fig. 2(a) is applied to the input terminal as an input signal, the output is derived as a signal waveform Vout with a delay as shown in Fig. 2(b). Here, the fall time tf of the output signal Vout is the time for the output amplitude to fall from 90% to 10%, and the rise time t
r is defined as the time from 10% to 90%, and the propagation delay time j p d, which is the time required from the input signal being applied to the input terminal until the output signal appears at the output terminal, is defined as t
0 defined as pd=+(tf+tr) The above fall time t and rise time tr are given by the following equations.

但しβ8.β1はそれぞれNMO8)ランジスタQN、
PMO8)ランジスタQpのベータ値で。
However, β8. β1 is each NMO8) transistor QN,
PMO8) Beta value of transistor Qp.

きる。またVTHN、vTHPはNMO8)ランジスタ
QN、PMO8)ランジスタQPのしきい値電圧である
Wear. Further, VTHN and vTHP are threshold voltages of NMO8) transistor QN and PMO8) transistor QP.

今、CMO8)ランジスタ回路に印加される電源電圧v
DD9両MOSトランジスタの夫々しきい値電圧VTH
N、VTHPが決まれば、上記(1)式及び(2)式は
次のように書くことができる0C t、 −f  L/            (a)β
9 t−ArCL/(4) r     β。
Now, CMO8) Power supply voltage v applied to the transistor circuit
Threshold voltage VTH of both DD9 MOS transistors
Once N and VTHP are determined, the above equations (1) and (2) can be written as 0C t, -f L/ (a) β
9t-ArCL/(4)rβ.

但し上記AA  けV   V   、V   にf’
   r   DD’   THN     THPよ
り決まる定数である。このときゲートの伝搬遅延時間t
 p dは次のように書き換えることができここでPM
O8)ランジスタQPのベータ値β、をゲート幅WPの
関数とみるとβ1=βPo・W4.と書き換えることが
できる。またNMO8)ランジスタQNのベータ値β、
は、NMO8)ランジスタがPMO8)ランジスタと一
連のプロセスを利用して製造されることから、NMO8
)ランジスタのゲート幅WNと上記PMOSトランジス
タの係数βPoを用いてβ9=nβPo−WNと書き表
わすことができるO CMOSトランジスタ構造では、P、N両MOSトラン
ジスタのゲート幅の和WT=WP十WNはセル形状が決
まれば一義的に決定され、上記(5)式で表わされたゲ
ートの伝搬遅延時間t、dはと書き換えることができる
0 上記(6)式においてゲートの伝搬遅延時間t2.を最
小にするゲート幅WP、WNの関係を求めると次式とな
る。
However, in the above AA, V V , V and f'
r DD' THN This is a constant determined by THP. At this time, the gate propagation delay time t
p d can be rewritten as follows, where PM
O8) Considering the beta value β of transistor QP as a function of gate width WP, β1=βPo·W4. It can be rewritten as Also, NMO8) Beta value β of transistor QN,
Since NMO8) transistors and PMO8) transistors are manufactured using a series of processes, NMO8)
) Using the gate width WN of the transistor and the coefficient βPo of the above PMOS transistor, it can be written as β9=nβPo−WN.In the CMOS transistor structure, the sum of the gate widths of both P and N MOS transistors WT=WP + WN is Once the cell shape is determined, it is uniquely determined, and the gate propagation delay times t and d expressed in the above equation (5) can be rewritten as 0 In the above equation (6), the gate propagation delay time t2. The relationship between the gate widths WP and WN that minimizes the following equation is obtained.

るようにPMO8)ランジスタQpとNMOSトランジ
スタQNのゲート幅を設定することにより。
By setting the gate widths of PMO8) transistor Qp and NMOS transistor QN so that

ゲートの伝搬遅延時間t、dは最小にすることができる
The gate propagation delay times t, d can be minimized.

例えばPMO8)ランジスタQpとN、M・O8)ラン
ジスタQNのしきい値がVTHN=1vTHP1トラン
ジスタQpとNMO8)ランジスタQNのゲート幅を設
定すればゲートの伝搬遅延時間tdpは最小となる。
For example, if the threshold value of PMO8) transistor Qp and N, M.O8) transistor QN is set to VTHN=1vTHP1 transistor Qp and NMO8) transistor QN, the gate propagation delay time tdp will be minimized.

一般的には電子と正孔の易動度の違いなどから。Generally, this is due to the difference in mobility between electrons and holes.

上記NMO8)ランジスタQNのベータ値β、を書き換
えた場合のnは、n〉1である。この場合延時間の面か
ら有効である。
When the beta value β of the NMO8) transistor QN is rewritten, n is n>1. In this case, it is effective in terms of time extension.

尚従来のCMOSインバータ回路においては。In the conventional CMOS inverter circuit.

n)1にもかかわらずWN=WPまたはWN>WPとし
てパターン設計されるが、これは上述のようにL p 
dを最小にするという点からは望ましくない。
Although n) is 1, the pattern is designed as WN=WP or WN>WP, but this is due to L p
This is not desirable from the point of view of minimizing d.

適パターンに比べて約3%遅くなる0 上記実施例はインバータについて説明したが。Approximately 3% slower than the suitable pattern 0 In the above embodiment, an inverter was explained.

NOR,NANDその他の複合ゲートであ・っても。Even if it is a NOR, NAND or other composite gate.

最終等価回路がインバータと等価になるゲート回路であ
れば全く同様に適用することができる。
If the final equivalent circuit is a gate circuit equivalent to an inverter, it can be applied in exactly the same way.

スイッチング特性のすぐれた回路を得ることができ、特
にCMOSゲートアレイ素子に適用して著しい効果を奏
する。
A circuit with excellent switching characteristics can be obtained, and particularly when applied to a CMOS gate array element, remarkable effects can be achieved.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はCMOSインバータを示す回路図、第2図(a
) 、 (b)はCMOSインバータ回路への入力信号
と出力信号の波形図である。 QP:PMOSトランジスタ、QN: NMO8)ラン
ジスタ+ Vin :入力信号+ Vout  :出力
信号代理人 弁理士 福 士 愛 彦
Figure 1 is a circuit diagram showing a CMOS inverter, Figure 2 (a
) and (b) are waveform diagrams of input signals and output signals to the CMOS inverter circuit. QP: PMOS transistor, QN: NMO8) transistor + Vin: Input signal + Vout: Output signal Agent Patent attorney Aihiko Fuku

Claims (1)

【特許請求の範囲】[Claims] 1、最終的な電気的等価回路がインバータとして表現で
きるCMOSゲート回路において、単位ゲートを構成す
るPMO8)ランジスタ、及びNMO8)ランジスタの
ベータ置β1.β8 を夫々のゲート幅WP、WNを用
いてβ1=βpo・(Ar、A(は電源■DD、PMO
Sトランジスタのしきい値電圧V 7 Hp +及びN
MO8)ランジスタのしきい値電圧VTHNで決まる定
数)に等しいか或いは近づけてゲートの伝搬遅延時間t
、dが最小になるように選んだことを特徴とするCMO
Sゲート回路。
1. In a CMOS gate circuit whose final electrical equivalent circuit can be expressed as an inverter, the beta positions β1. β8 is calculated using the respective gate widths WP and WN, β1=βpo・(Ar, A(is the power supply ■DD, PMO
Threshold voltage of S transistor V 7 Hp + and N
MO8) The gate propagation delay time t is equal to or close to the constant determined by the threshold voltage VTHN of the transistor.
, d is selected to minimize
S gate circuit.
JP56198029A 1981-12-08 1981-12-08 Cmos gate circuit Granted JPS5899036A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56198029A JPS5899036A (en) 1981-12-08 1981-12-08 Cmos gate circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56198029A JPS5899036A (en) 1981-12-08 1981-12-08 Cmos gate circuit

Publications (2)

Publication Number Publication Date
JPS5899036A true JPS5899036A (en) 1983-06-13
JPH0328090B2 JPH0328090B2 (en) 1991-04-18

Family

ID=16384333

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56198029A Granted JPS5899036A (en) 1981-12-08 1981-12-08 Cmos gate circuit

Country Status (1)

Country Link
JP (1) JPS5899036A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4884575B2 (en) * 2010-05-13 2012-02-29 三井・デュポンポリケミカル株式会社 Multi-layer materials, solar cell encapsulants, safety (laminated) glass interlayers, solar cell modules and safety (laminated) glass

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5558574A (en) * 1978-10-26 1980-05-01 Fujitsu Ltd Cmos semiconductor device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5558574A (en) * 1978-10-26 1980-05-01 Fujitsu Ltd Cmos semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4884575B2 (en) * 2010-05-13 2012-02-29 三井・デュポンポリケミカル株式会社 Multi-layer materials, solar cell encapsulants, safety (laminated) glass interlayers, solar cell modules and safety (laminated) glass

Also Published As

Publication number Publication date
JPH0328090B2 (en) 1991-04-18

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