JPS5896745A - 電子部品テスタ用オ−トハンドラにおけるテスト治具交換機構 - Google Patents

電子部品テスタ用オ−トハンドラにおけるテスト治具交換機構

Info

Publication number
JPS5896745A
JPS5896745A JP56194912A JP19491281A JPS5896745A JP S5896745 A JPS5896745 A JP S5896745A JP 56194912 A JP56194912 A JP 56194912A JP 19491281 A JP19491281 A JP 19491281A JP S5896745 A JPS5896745 A JP S5896745A
Authority
JP
Japan
Prior art keywords
test jig
jig
component
section
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56194912A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0147895B2 (enrdf_load_stackoverflow
Inventor
Takaaki Kamiyoshi
神吉　孝明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP56194912A priority Critical patent/JPS5896745A/ja
Publication of JPS5896745A publication Critical patent/JPS5896745A/ja
Publication of JPH0147895B2 publication Critical patent/JPH0147895B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP56194912A 1981-12-03 1981-12-03 電子部品テスタ用オ−トハンドラにおけるテスト治具交換機構 Granted JPS5896745A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56194912A JPS5896745A (ja) 1981-12-03 1981-12-03 電子部品テスタ用オ−トハンドラにおけるテスト治具交換機構

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56194912A JPS5896745A (ja) 1981-12-03 1981-12-03 電子部品テスタ用オ−トハンドラにおけるテスト治具交換機構

Publications (2)

Publication Number Publication Date
JPS5896745A true JPS5896745A (ja) 1983-06-08
JPH0147895B2 JPH0147895B2 (enrdf_load_stackoverflow) 1989-10-17

Family

ID=16332400

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56194912A Granted JPS5896745A (ja) 1981-12-03 1981-12-03 電子部品テスタ用オ−トハンドラにおけるテスト治具交換機構

Country Status (1)

Country Link
JP (1) JPS5896745A (enrdf_load_stackoverflow)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5812334A (ja) * 1981-07-16 1983-01-24 Seiko Epson Corp オ−トハンドラ−

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5812334A (ja) * 1981-07-16 1983-01-24 Seiko Epson Corp オ−トハンドラ−

Also Published As

Publication number Publication date
JPH0147895B2 (enrdf_load_stackoverflow) 1989-10-17

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