JPS5877598A - Etching method for transparent conductive film - Google Patents

Etching method for transparent conductive film

Info

Publication number
JPS5877598A
JPS5877598A JP17409481A JP17409481A JPS5877598A JP S5877598 A JPS5877598 A JP S5877598A JP 17409481 A JP17409481 A JP 17409481A JP 17409481 A JP17409481 A JP 17409481A JP S5877598 A JPS5877598 A JP S5877598A
Authority
JP
Japan
Prior art keywords
etching
transparent conductive
conductive film
electrode
electrodes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17409481A
Other languages
Japanese (ja)
Other versions
JPS6051559B2 (en
Inventor
Kaname Miyazawa
宮沢 要
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Suwa Seikosha KK
Original Assignee
Seiko Epson Corp
Suwa Seikosha KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp, Suwa Seikosha KK filed Critical Seiko Epson Corp
Priority to JP17409481A priority Critical patent/JPS6051559B2/en
Publication of JPS5877598A publication Critical patent/JPS5877598A/en
Publication of JPS6051559B2 publication Critical patent/JPS6051559B2/en
Expired legal-status Critical Current

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  • Manufacturing Of Electric Cables (AREA)

Abstract

PURPOSE:To permit etching at a constant speed in a titled method having a Cr<2+>/Cr<3+> redox system in a diaphragm separated electrolytic cell by adding an electrode pair for recovering of metals from metallic ions that decrease the etching rate. CONSTITUTION:The Cr<2+>/Cr<3+> redox system dissolved in mineral acids exist in a cathode compartment 1 separating an electrolytic cell by a diaphragm 3. Voltage is applied between electrodes 4 and 5 in such a way that the potential of the electrode 4 attains <=-0.3V (US.RHE) whereby a tin oxide transparent conductive film is etched. Metallic ions (impurities) of Sn, etc. increase gradually in an etching soln. and when the concn. thereof exceeds a certain value, the etching speed decreases considerably. Thereupon a pair of sub electrodes 6, 7 are provided in the compartment 1 and are maintained under weak current of 0.1- 5A/dm<2>. Thus the above-mentioned impurities are removed and semipermanent etching is accomplished.

Description

【発明の詳細な説明】 本発明は透明導電膜のエツチング方法に関するものであ
り、特に量産下においても半永久的に使用可能なエツチ
ング方法に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method of etching a transparent conductive film, and particularly to an etching method that can be used semi-permanently even in mass production.

透明導電膜は液晶表示パネルなどディスプレイ等に広く
用いられているがその大部分が何らかのパターニングが
施されて使われている。このパターニングの精度、歩留
り等がこれらを用いた製品の仕様、コストを大きく左右
するといってもM9″Δ盲ではない。
Transparent conductive films are widely used in displays such as liquid crystal display panels, and most of them are used with some kind of patterning. Although this patterning accuracy, yield, etc. greatly influence the specifications and costs of products using these, M9″Δ is not blind.

通常用いられる透明導電膜には酸化インジウム系と酸化
スズ系がある。前者は高価であり又電気化学的安定性が
後者に劣る。又後者は安価であるがパターニングがむず
かしいといった欠点を有している。昔から後者のパター
ニングすなわちエツチングにはZ11粉末・HCl法か
用いられてきているが反応スピードの制御がむずかしく
、又物理的接触によりレジストがはがれてしまうといっ
た問題が生じ、近年のファインパターニングには対応で
きなくなっている。一方Cr2°l/Cr3+レドック
ス系を用いた浸漬エツチング技術がN S Pat40
09061に述べられているが、この方法はエツチング
液の劣化がはげしく全く工卆的でない。そこで本発明者
は先にOr2+/Cr3″゛レドックス系を電解熱j摸
で分離し電解下Cr3+→cr2+なる反応を行なわせ
しめる方法を検討したが、工業的に使用する揚台、特に
−万枚以上のエツチングによってエツチングスピードが
除々に劣化することが見出された。エツチング液分析の
結q43.1? / /、以上のSnが検出され、これ
がエツチングスピードの低下に著しい影響を与えている
ことがわかった。本来ならCr3″゛→Cr2+ を行
なわしめるカソードコンパートメント中の電極に金属ス
ズとして電示されるはずであるが、電流密度が高すぎる
ため電解パウダーとして形成され電極から欠落してしま
うために回収されない。一方′電流密度を下げればCr
3+→Or2+の効率か低下しエツチングスピードを一
定に保ちえない。本発明はかかる欠点を解決するだめの
もので、Or  →Cr2+を進行させる高電流密度電
極ペアーの他に、エツチングスピードの低下をもたらす
スズイオン、鉄イオン、ニッケルイオン、銅イオン等か
らそれぞれの金属の回収用にさらに低ηL流密度で′市
)qtするペアー電極を備けたことを特徴とするもので
ある以下図面を用いて本発明を説明する。第1図(]本
発明の基本的エツチング槽の断面図である。
Commonly used transparent conductive films include indium oxide and tin oxide. The former is expensive and has inferior electrochemical stability to the latter. The latter is inexpensive, but has the disadvantage that patterning is difficult. Z11 powder/HCl method has long been used for the latter type of patterning, or etching, but it is difficult to control the reaction speed, and there are problems such as the resist peeling off due to physical contact, so it is not suitable for fine patterning in recent years. I can't do it anymore. On the other hand, immersion etching technology using Cr2°l/Cr3+ redox system is N S Pat40
09061, this method causes severe deterioration of the etching solution and is not practical at all. Therefore, the present inventor previously investigated a method of separating the Or2+/Cr3'' redox system using electrolytic heating and causing the reaction from Cr3+ to Cr2+ to occur under electrolysis. It was found that the etching speed gradually deteriorated due to the above etching.The results of the etching liquid analysis showed that Sn of q43.1? Originally, it should be deposited as metal tin on the electrode in the cathode compartment where Cr3'' → Cr2+ is carried out, but because the current density was too high, it formed as electrolytic powder and was missing from the electrode. Not collected. On the other hand, if the current density is lowered, Cr
The efficiency of 3+→Or2+ decreases and the etching speed cannot be kept constant. The present invention is intended to solve such drawbacks, and in addition to the high current density electrode pair that promotes Or → Cr2+, it also removes various metals such as tin ions, iron ions, nickel ions, copper ions, etc. that cause a decrease in etching speed. The present invention will be described below with reference to the drawings, which is characterized in that it is equipped with a pair of electrodes for recovery at a lower ηL flow density. FIG. 1 is a sectional view of the basic etching bath of the present invention.

3はカソードコンパートメント1とアノードコンハート
メント2を分離する1♀A liI′aであり、素焼、
イオン交換11!”G +テフロンフィルター等から成
る。1なるカソードコンパートメント中に<jh: c
liり中に溶解されたO r 2+/ Or 3+レド
ツクス系がイf在する。鉱酸としては、塩酸9硫酸、硝
酸、リン酸9フッ化水素酸、ヨウ化水素酸、臭化水素酸
等であり、単独で又はこの中から何種類化混合して用い
ても良い。濃度は0. I N以上が通常用いられる。
3 is 1♀AliI'a which separates the cathode compartment 1 and the anode compartment 2, and is unglazed,
Ion exchange 11! ``G + Teflon filter, etc. In the cathode compartment <jh: c
There is an Or 2+/Or 3+ redox system dissolved during the reaction. Examples of mineral acids include hydrochloric acid, 9-sulfuric acid, nitric acid, phosphoric acid, 9-hydrofluoric acid, hydroiodic acid, and hydrobromic acid, which may be used alone or in combination of any of these. The concentration is 0. I N or higher is usually used.

これらの酸の中で特に塩酸、臭化水棄酸等のハロゲン化
水素酸がエツチング性に優れている。Or2″゛/ O
r   レドックス糸はこれらの鉱酸にOr O/−3
−6H20,0r2(SO4)3等のクロム塩、又は金
属クロムを溶解し、電極4,5間に4の′[は位が一〇
30■(υ5−RHE )を印加することにより71.
Lられる。この′亀位差心Jポテンシオスタットを用い
ても良いし、直流電i1’、jを用いても良い。このよ
うにして3U成されたO r 2” / Or 3+レ
ドツクス系のカソードコンパートメント1に透明導電+
!Aを浸漬することによって透明導電j悶は容易にエツ
チングされる。4の電極としては水素過電圧が大きいも
のの方がOr”+→Or2+のj買元効率が良い。カー
ボン、 P b 、 F e 、 S n 、 Hg 
、 Hgアマfivガムステンレススチール等がαいが
、特に安価なカーボン、Pbが優れている。5は不溶1
1電極が良くカーボン、Pt 、Rh、Ti−Pt 、
Ti−Rh。
Among these acids, hydrohalic acids such as hydrochloric acid and aqueous bromide have particularly excellent etching properties. Or2″゛/O
r redox threads are Or O/-3 to these mineral acids.
By dissolving a chromium salt such as -6H20,0r2(SO4)3 or metallic chromium, and applying a voltage of 1030cm (υ5-RHE) between electrodes 4 and 5, 71.
Led. This 'gaze point difference center J potentiostat may be used, or direct current electric currents i1', j may be used. In this way, a transparent conductive +
! The transparent conductive layer can be easily etched by dipping A. As for the electrode No. 4, the one with a larger hydrogen overvoltage has a better j purchasing efficiency of Or"+ → Or2+. Carbon, P b , Fe , Sn , Hg
, Hg, ama-fiv gum, stainless steel, etc. are good, but inexpensive carbon and Pb are particularly good. 5 is insoluble 1
One electrode is best made of carbon, Pt, Rh, Ti-Pt,
Ti-Rh.

T i  Rh O、T i  Ru O’4が良い。T i Rh O, T i Ru O'4 are good.

第21図は電4i1ii 5にカーボン嵐持へ電槓24
にPbηL槓に、カソードコンパートメント1にOr 
OL、・6 H2Oを100r/l、6N塩酸、隔j換
6に素焼のセパレーターな用い5 A、 / tblで
5時間電解シエッチングスピードが定常状態になった時
の液温とエツチングスピードを示す。なお透ゆ1導電膜
は酸化スズである。このようなエツチングを約2万枚(
1ootα20o++X500A)続けると定常状態の
エツチングスピードは約半分に低下する。これは液分析
の結果エツチングされたスズイオンが防害をしているこ
とがわかった。0.1ii’/A以上のスズイオン濃度
になると著しい低下をきたす。本来スズイオンは金属ス
ズとして電極4に’rl・9着されるはずであるが、5
0°C以上において番Jはとんどtlj着がおこらない
。これは電流密度が高ずぎて’rat iWパウダーと
して電極から欠落してしまうため、又はカーボン、PI
)等に密着性が悪いために欠落してしまうものと考えら
れる。そこで本発明者は697のサブ電極ペアーを用い
、このべ・ア・−電イ1!Iイで不純物(エツチングス
ピードに悪影響を与える金属イオン)の除去を行なうこ
とで5万枚、10万枚と、永久的なエツチング方法を発
明するに参った。6に用いる電極はこれらの不純物が′
i−!L着に際し密着の良いものが選ばれ、P t 、
 A u 、 L(ll。
Figure 21 shows electric 4i1ii 5 and carbon arashi mochi to electric 24
to PbηL and to cathode compartment 1.
OL, ・6 H2O at 100 r/l, 6N hydrochloric acid, bisque fired separator for 5 A, / tbl for 5 hours. Shows the liquid temperature and etching speed when the electrolytic etching speed reaches a steady state. . Note that the transparent conductive film is made of tin oxide. Approximately 20,000 such etchings (
1ootα20o++X500A) If the process continues, the steady state etching speed will drop to about half. As a result of liquid analysis, it was found that etched tin ions were responsible for preventing damage. When the tin ion concentration exceeds 0.1ii'/A, a significant decrease occurs. Originally, tin ions should be attached to the electrode 4 as metal tin, but 5
At temperatures above 0°C, tlj arrival hardly occurs in No. J. This is because the current density is too high and it falls off from the electrode as 'rat iW powder, or carbon, PI
) etc., it is thought that it is missing due to poor adhesion. Therefore, the present inventor used 697 sub-electrode pairs, and used 697 sub-electrode pairs. By removing impurities (metal ions that adversely affect the etching speed) in Step 1, he was able to invent a permanent etching method that could produce 50,000 to 100,000 sheets. The electrode used in 6 is free of these impurities.
i-! When wearing L, one with good adhesion was selected, P t ,
A u, L(ll.

Pb等の板又はメツシュが良い、7は不溶性の電極なら
何でも良く5と同じ材質で良い。この6−7間に印加す
る直流′電界は0.1 A〜5 A / drJが良く
さらに望ましくは〔12A〜2 A / tUである。
A plate or mesh made of Pb or the like is preferable, and 7 may be any insoluble electrode and may be made of the same material as 5. The DC' electric field applied between 6 and 7 is preferably 0.1 A to 5 A/drJ, and more preferably 12 A to 2 A/tU.

余り電流密度が低いと電着ができず、余り高いと密着性
が悪くなり効果はなくなる。このようなOr2+10r
  のレドックス系を安定に保つシステムけ必ずしもエ
ツチング槽と兼用する必要はない。槽1の液を別槽に導
入し、その栖でエツチングを行なっても何ら問題はない
。しかし本発明のシステムはこの種のエツチングを工業
的に行なう場合に不可欠のものである。
If the current density is too low, electrodeposition will not be possible, and if the current density is too high, the adhesion will be poor and the effect will be lost. Or2+10r like this
The system for keeping the redox system stable does not necessarily have to be used as an etching tank. There is no problem even if the solution in tank 1 is introduced into a separate tank and etching is performed in that tank. However, the system of the present invention is indispensable when this type of etching is carried out industrially.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図・・・・・・本発明のエツチング槽の断面図第2
図・・・・・・本発明の実施例における温度−エツチン
グスピード関係 以上 出願人 株式会社k W’J精工舎 オ2図 糟唱曳(・乙) −513〜
Fig. 1...Cross-sectional view of the etching bath of the present invention.Second sectional view
Figure: Temperature-etching speed relationship in the embodiments of the present invention Applicant: K W'J Seikosha Co., Ltd.

Claims (1)

【特許請求の範囲】[Claims] 鉱酸中に形成されたCr2+/Cr3+レドツクス糸を
′gL解槽のカソードコンパートメント中に、陰極電位
−〇、 3 V (U s −R)(E )以下になる
ように電解上保持して成る透明導電膜のエツチング方法
において、レドックス系を保持する1対の電極の他に、
さらに1対の電極を設け0.1 A〜5 vdΔの弱電
解下に保持するようにしたことを特徴とする透明導電膜
のエツチング方法。
Cr2+/Cr3+ redox threads formed in a mineral acid are electrolytically maintained in the cathode compartment of a 'gL decomposition tank at a cathode potential of -0, 3 V (Us -R) (E) or less. In the method of etching a transparent conductive film, in addition to a pair of electrodes that hold the redox system,
A method for etching a transparent conductive film, characterized in that a pair of electrodes is further provided and the film is maintained under weak electrolysis of 0.1 A to 5 vdΔ.
JP17409481A 1981-10-30 1981-10-30 Etching method for transparent conductive film Expired JPS6051559B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17409481A JPS6051559B2 (en) 1981-10-30 1981-10-30 Etching method for transparent conductive film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17409481A JPS6051559B2 (en) 1981-10-30 1981-10-30 Etching method for transparent conductive film

Publications (2)

Publication Number Publication Date
JPS5877598A true JPS5877598A (en) 1983-05-10
JPS6051559B2 JPS6051559B2 (en) 1985-11-14

Family

ID=15972543

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17409481A Expired JPS6051559B2 (en) 1981-10-30 1981-10-30 Etching method for transparent conductive film

Country Status (1)

Country Link
JP (1) JPS6051559B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6179340U (en) * 1984-10-29 1986-05-27
JPS61292168A (en) * 1985-06-20 1986-12-22 Matsushita Electric Ind Co Ltd Detecting device for mistake in setting toner container
JPH02146567A (en) * 1988-11-29 1990-06-05 Konica Corp Color picture forming device

Also Published As

Publication number Publication date
JPS6051559B2 (en) 1985-11-14

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