JPS6051559B2 - Etching method for transparent conductive film - Google Patents

Etching method for transparent conductive film

Info

Publication number
JPS6051559B2
JPS6051559B2 JP17409481A JP17409481A JPS6051559B2 JP S6051559 B2 JPS6051559 B2 JP S6051559B2 JP 17409481 A JP17409481 A JP 17409481A JP 17409481 A JP17409481 A JP 17409481A JP S6051559 B2 JPS6051559 B2 JP S6051559B2
Authority
JP
Japan
Prior art keywords
etching
transparent conductive
conductive film
electrode
etching method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP17409481A
Other languages
Japanese (ja)
Other versions
JPS5877598A (en
Inventor
要 宮沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suwa Seikosha KK
Original Assignee
Suwa Seikosha KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suwa Seikosha KK filed Critical Suwa Seikosha KK
Priority to JP17409481A priority Critical patent/JPS6051559B2/en
Publication of JPS5877598A publication Critical patent/JPS5877598A/en
Publication of JPS6051559B2 publication Critical patent/JPS6051559B2/en
Expired legal-status Critical Current

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  • Manufacturing Of Electric Cables (AREA)

Description

【発明の詳細な説明】 本発明は透明導電膜のエッチング方法に関するもので
あり、特に量産下においても半永久的に使用可能なエッ
チング方法に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an etching method for a transparent conductive film, and particularly to an etching method that can be used semi-permanently even in mass production.

透明導電膜は液晶表示パネルなどディスプレイ等に広
く用いられているがその大部分が何らかのパターニング
が施されて使われている。
Transparent conductive films are widely used in displays such as liquid crystal display panels, and most of them are used with some kind of patterning.

このパターニングの精度、歩留り等がこれらを用いた製
品の仕様、コストを大きく左右するといつても過言では
ない。 通常用いられる透明導電膜には酸化インジウム
系と酸化スズ系がある。
It is no exaggeration to say that the accuracy, yield, etc. of this patterning greatly influence the specifications and costs of products using these. Commonly used transparent conductive films include indium oxide and tin oxide.

前者は高価であり又電気化学的安定性が後者に劣る。又
後者は安価であるがパターニングがむずかしいといつた
欠点を有している。昔から後者のパターニングすなわち
エッチングにはZn粉末・ HCl法が用いられてきて
いるが反応スピードの制御がむずかしく、又物理的接触
によりレジストがはがれてしまうといつた問題が生じ、
近年のファインパターニングには対応できなくなつてい
る。一方Cr゜゛/Cr’゛レドックス系を用いた浸漬
エッチング技術がUSPat4009061に述べられ
ているが、この方法はエッチング液の劣化がはげしく全
く工業的でない。そこで本発明者は先にCr″゛/ C
r’゛レドックス系を電解隔膜で分離し電解下Cr’゛
−Cr゜゛なる反応を行なわせしめる方法を検討したが
、工業的に使用する場合、特に一万枚以上のエッチング
によつてエッチングスピードが除々に劣化することが見
出された。エッチング液分析の結果O、lg/l以上の
Snが検出され、これがエッチングスピードの低下に著
しい影響を与えていることがわかつた。本来ならCr’
゛→Cr24を行なわしめるカソードコンパートメント
中の陰極に金属スズとして電着されるはずであるが、電
流密度が高すぎるため電解パウダーとして形成され電極
から欠落してしまうために回収されない。一方電流密度
を下げればCr゜゛→Cr″゛の効率が低下しエッチン
グスピードを一定に保ちえない。本発明はかかる欠点を
解決するためのもので、Cr’゛−Cr゜゛を進行させ
る高電流密度電極ヘアーの他に、エッチングスピードの
低下をもたらすスズイオン、鉄イオン、ニッケルイオン
、銅イオン等からそれぞれの金属の回収用にさらに低電
流密度で電解するヘアー電極を備けたことを特徴とする
ものてある。 以下図面を用いて本発明を説明する。
The former is expensive and has inferior electrochemical stability to the latter. The latter is inexpensive, but has the disadvantage that patterning is difficult. The Zn powder/HCl method has long been used for the latter patterning, or etching, but it is difficult to control the reaction speed, and there are problems such as resist peeling off due to physical contact.
It is no longer compatible with recent fine patterning. On the other hand, an immersion etching technique using a Cr゜゛/Cr' redox system is described in US Pat. No. 4,009,061, but this method causes severe deterioration of the etching solution and is not industrially applicable at all. Therefore, the present inventor first developed Cr″゛/C
We investigated a method of separating the r'゛redox system with an electrolytic diaphragm and causing the reaction Cr'゛-Cr゛ under electrolysis. It was found that it gradually deteriorated. As a result of analysis of the etching solution, Sn of O, lg/l or more was detected, and it was found that this had a significant effect on the reduction in etching speed. Originally Cr'
It is supposed to be electrodeposited as metal tin on the cathode in the cathode compartment where Cr24 is carried out, but because the current density is too high, it is formed as an electrolytic powder and is missing from the electrode, so it is not recovered. On the other hand, if the current density is lowered, the efficiency of Cr゜゛→Cr゛ decreases and the etching speed cannot be kept constant. In addition to the density electrode hair, it is equipped with a hair electrode that electrolyzes at a lower current density to recover each metal from tin ions, iron ions, nickel ions, copper ions, etc. that cause a reduction in etching speed. The present invention will be explained below using the drawings.

第1図は本発明の基本的エッチング槽の断面図である。
3はカソードコンパートメント1とアノードコンパート
メント2を分離する隔膜てあり、素焼、イオン交換膜、
テフロンフィルター等から成る。
FIG. 1 is a cross-sectional view of the basic etching bath of the present invention.
3 is a diaphragm that separates the cathode compartment 1 and the anode compartment 2;
Consists of Teflon filters, etc.

1なるカソードコンバートメント中には鉱酸中に溶解さ
れたCr2+/Cr3+レドックス系が存在する。
In the cathode conversion, there is a Cr2+/Cr3+ redox system dissolved in mineral acid.

鉱酸としては、塩酸、硫酸、硝酸、リン酸、フッ化水素
酸、ヨウ化水素酸、臭化水素酸等であり、単独で又はこ
の中から何種類化混合して用いても良い。濃度は0.1
N以上が通常用いられる。これらの酸の中で特に塩酸、
臭化水素酸等のハロゲン化水素酸がエッチング性に優れ
ている。Cr2+/Cr3+レドックス系はこれらの鉱
酸にCrcl3・61120,Cr2(SO4)3等の
クロム塩、又は金属クロムを溶解し、電極4,5間に4
つの電位が一0.30V(υS−RHE)を印加するこ
とにより得られる。この電位差はポテンシオスタツトを
用いても良いし、直流電源を用いても良い。このように
して形成されたCr2+/Cr3+レドックス系のカソ
ードコンバートメント1に透明導電膜を浸漬することに
よつて透明導電膜は容易にエッチングされる。4の電極
としては水素過電圧が大きいものの方がCr3+→Cr
2+の還元効率が良い。
Examples of the mineral acids include hydrochloric acid, sulfuric acid, nitric acid, phosphoric acid, hydrofluoric acid, hydroiodic acid, and hydrobromic acid, and they may be used alone or in a mixture of any of these. The concentration is 0.1
N or more is usually used. Among these acids, especially hydrochloric acid,
Hydrohalic acids such as hydrobromic acid have excellent etching properties. In the Cr2+/Cr3+ redox system, chromium salts such as Crcl3.61120, Cr2(SO4)3, or metallic chromium are dissolved in these mineral acids, and 4 is applied between the electrodes 4 and 5.
This is obtained by applying one potential of 0.30 V (υS-RHE). This potential difference may be determined by using a potentiostat or by using a DC power source. By immersing the transparent conductive film in the Cr2+/Cr3+ redox-based cathode conversion 1 thus formed, the transparent conductive film can be easily etched. As for electrode 4, the one with larger hydrogen overvoltage is Cr3+→Cr
2+ reduction efficiency is good.

カーボン、Pb,Fe,Sn,Hg,Hgアマルガム、
ステンレススチール等が良いが、特に安価なりーボン、
Pbが優れている。5は不溶性電極が良くカーボン、P
t,Rh,Tj−Pt,Ti−Rh,Ti−RhO,T
i−RuO等が良い。
Carbon, Pb, Fe, Sn, Hg, Hg amalgam,
Stainless steel etc. are good, but especially cheap ones,
Pb is superior. 5 has a good insoluble electrode, carbon, P
t, Rh, Tj-Pt, Ti-Rh, Ti-RhO, T
i-RuO etc. are good.

第2図は電極5にカーボン電極、電極4にPb電極、カ
ソードコンバートメント1にCrcl3・61120を
100g/E.6N塩酸、隔膜3に素焼のセパレーター
を用い5A/Dm2で5時間電解しエッチングスピード
が定常状態になつた時の液温とエッチングスピードを示
す。
In Figure 2, electrode 5 is a carbon electrode, electrode 4 is a Pb electrode, and cathode conversion 1 is CrCl3.61120 at 100 g/E. The solution temperature and etching speed when the etching speed reached a steady state after electrolysis was performed for 5 hours at 5 A/Dm2 using 6N hydrochloric acid and an unglazed separator as the diaphragm 3 are shown.

なお透明導電膜は酸化スズである。このようなエッチン
グを約2万枚(10CmX20c71×500A)続け
ると定常状態のエッチングスピードは約半分に低下する
。これは液分析の結果エッチングされたスズイオンが防
害をしていることがわかつた。0.1g/′以上のスズ
イオン濃度になると著しい低下をきたす。
Note that the transparent conductive film is tin oxide. If such etching is continued for about 20,000 sheets (10 cm x 20 c71 x 500 A), the steady state etching speed will drop to about half. As a result of liquid analysis, it was found that etched tin ions were responsible for preventing damage. When the tin ion concentration exceeds 0.1 g/', a significant decrease occurs.

本来スズイオンは金属スズとして電極4に電着されるは
ずであるが、50′C以上においてはほとんど電着がお
こらない。これは電流密度が高すぎて電解パウダーとし
て電極から欠落してしまうため、又はカーボン、Pb等
に密着性が悪いために欠落してしまうものと考えられる
。そこで本発明者は6,7のサブ電極ベアーを用い、こ
のベアー電極で不純物(エッチングスピードに悪影響を
与える金属イオン)の除去を行なうことで5万枚、10
万枚と、永久的なエッチング方法を発明するに至つた、
6に用いる電極はこれらの不純物が電着に際し密着の良
いものが選ばれ、Pt,Au,Rh,P蒔の板又はメッ
シュが良い、7は不溶性の電極なら何でも良く5と同じ
材質で良い。この6−7間に印加する直流電界は0.1
A−5A/Dm2が良くさらに望ましくは0.2A−2
A/Dm2である。余り電流密度が低いと電着ができず
、余り高いと密着性が悪くなり効果はなくなる。このよ
うなCr2+/Cr3+のレドックス系を安定に保つシ
ステムは必ずしもエッチング槽と兼用する必要はない。
槽1の液を別槽に導入し、その槽でエッチングを行なつ
ても何ら問題はない。しかし本発明のシステムはこの種
のエッチングを工業的に行なう場合に不可欠のものであ
る。
Originally, tin ions should be electrodeposited on the electrode 4 as metal tin, but at temperatures above 50'C, almost no electrodeposition occurs. This is thought to be because the current density is too high and the electrolytic powder is missing from the electrode, or because the adhesion to carbon, Pb, etc. is poor. Therefore, the present inventor used sub-electrode bare electrodes 6 and 7, and by removing impurities (metal ions that adversely affect etching speed) with these bare electrodes, 50,000 sheets and 10
Invented a permanent etching method that can print up to 10,000 sheets.
The electrode used in 6 is selected to have good adhesion to these impurities during electrodeposition, and is preferably a plate or mesh of Pt, Au, Rh, or P sown. 7 may be any insoluble electrode and may be made of the same material as 5. The DC electric field applied between 6 and 7 is 0.1
A-5A/Dm2 is good, more preferably 0.2A-2
A/Dm2. If the current density is too low, electrodeposition will not be possible, and if the current density is too high, the adhesion will be poor and the effect will be lost. A system for stably maintaining such a Cr2+/Cr3+ redox system does not necessarily have to be used as an etching bath.
There is no problem even if the solution in tank 1 is introduced into a separate tank and etching is performed in that tank. However, the system of the present invention is indispensable when this type of etching is carried out industrially.

【図面の簡単な説明】[Brief explanation of drawings]

第1図・・・・・・本発明のエッチング槽の断面図、第
2図・・・・・・本発明の実施例における温度一エッチ
ングスピード関係。
Fig. 1: A sectional view of an etching tank of the present invention, Fig. 2: Relationship between temperature and etching speed in an embodiment of the present invention.

Claims (1)

【特許請求の範囲】[Claims] 1 鉱酸中に形成されたCr^2^+/Cr^3^+レ
ドックス系を電解槽のカソードコンパートメント中に、
陰極電位−0.3V(US・RHE)以下になるように
電解下保持して成る透明導電膜のエッチング方法におい
て、レドックス系を保持する1対の電極の他に、さらに
1対の電極を設け0.1A〜5A/dm^2の弱電解下
に保持するようにしたことを特徴とする透明導電膜のエ
ッチング方法。
1 The Cr^2^+/Cr^3^+ redox system formed in the mineral acid is introduced into the cathode compartment of the electrolytic cell.
In a method of etching a transparent conductive film which is maintained under electrolysis so that the cathode potential is -0.3 V (US/RHE) or lower, in addition to the pair of electrodes that hold the redox system, one pair of electrodes is further provided. A method for etching a transparent conductive film, characterized in that it is maintained under weak electrolysis of 0.1 A to 5 A/dm^2.
JP17409481A 1981-10-30 1981-10-30 Etching method for transparent conductive film Expired JPS6051559B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17409481A JPS6051559B2 (en) 1981-10-30 1981-10-30 Etching method for transparent conductive film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17409481A JPS6051559B2 (en) 1981-10-30 1981-10-30 Etching method for transparent conductive film

Publications (2)

Publication Number Publication Date
JPS5877598A JPS5877598A (en) 1983-05-10
JPS6051559B2 true JPS6051559B2 (en) 1985-11-14

Family

ID=15972543

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17409481A Expired JPS6051559B2 (en) 1981-10-30 1981-10-30 Etching method for transparent conductive film

Country Status (1)

Country Link
JP (1) JPS6051559B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6179340U (en) * 1984-10-29 1986-05-27
JPS61292168A (en) * 1985-06-20 1986-12-22 Matsushita Electric Ind Co Ltd Detecting device for mistake in setting toner container
JPH02146567A (en) * 1988-11-29 1990-06-05 Konica Corp Color picture forming device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6179340U (en) * 1984-10-29 1986-05-27
JPS61292168A (en) * 1985-06-20 1986-12-22 Matsushita Electric Ind Co Ltd Detecting device for mistake in setting toner container
JPH02146567A (en) * 1988-11-29 1990-06-05 Konica Corp Color picture forming device

Also Published As

Publication number Publication date
JPS5877598A (en) 1983-05-10

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