JPS5877264A - Manufacture of josephson element and manufacture thereof - Google Patents

Manufacture of josephson element and manufacture thereof

Info

Publication number
JPS5877264A
JPS5877264A JP56175651A JP17565181A JPS5877264A JP S5877264 A JPS5877264 A JP S5877264A JP 56175651 A JP56175651 A JP 56175651A JP 17565181 A JP17565181 A JP 17565181A JP S5877264 A JPS5877264 A JP S5877264A
Authority
JP
Japan
Prior art keywords
nbfx
barrier layer
josephson
electrode
thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56175651A
Other languages
Japanese (ja)
Inventor
Mikio Hirano
幹夫 平野
Juichi Nishino
西野 寿一
Koji Yamada
宏治 山田
Kunio Yamashita
山下 邦男
Junji Shigeta
淳二 重田
Shinichiro Yano
振一郎 矢野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP56175651A priority Critical patent/JPS5877264A/en
Publication of JPS5877264A publication Critical patent/JPS5877264A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N60/00Superconducting devices
    • H10N60/01Manufacture or treatment
    • H10N60/0912Manufacture or treatment of Josephson-effect devices

Abstract

PURPOSE:To obtain the stabilized barrier layer for the titled Josephson element by a method wherein, in the case of an element which was formed by superposing a superconductive alloy containing at least either of Nb and Pb, NbFx of 20-60Angstrom in thickness is provided as a barrier layer on the surface of the underlayer electrode of Nb through the intermediary of an extremely thin barrier layer. CONSTITUTION:An Nb electrode is formed on a Si substrate, an window is provided on an interlayer insulating film, and after a sputtering has been performed on the electrode surface in a decompressed Ar, an NbFx of 20-60Angstrom in thickness is formed while plasma of high frequency output of 10-50W is being discharged in the Freon gas pressure of 1X10<-1>Torr, and the temperature is maintained at 80-120 deg.C during the performance of above procedure. Lastly, the upper electrode of Pb-Bi (30wt%) is vapor-deposited. Thus, an extremely thin NbFx film can be formed while stably maintaining the fluorine growing speed by utilizing the activity of an F-ion and exposing the metal in the plasma discharge where the etchability of metal is considerably reduced. According to this constitution, an Nb tunnel junction type Josephson element can be obtained with excellent reproducibility and stabilized characteristics.

Description

【発明の詳細な説明】 (1)発明の利用分野 本発明は、トノネル接合型ジョセフソン素子の惺薄トン
ネル障壁層とその製造方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (1) Field of Application of the Invention The present invention relates to a very thin tunnel barrier layer of a Tononel junction type Josephson device and a method for manufacturing the same.

(2)従来技術 N b’糸ジョセフソン接合素子は、Pb系ジョセフソ
ン素子に比べ、超11iL4臨界温度Tcが高く、再結
晶温度が高くヒロックの晃生もなく熱サイクルにも強い
という特長を有し、信頼度の為い素子として期待されて
いる。しかし、Nb膜はPb膜に比べ活性で、0.CO
,N*などと反応しやすいため、欠陥の少ない緻密な薄
い酸化膜障壁層が得られないという欠点がある。このた
め特牡の揃ったNb系ジョセフソン素子を再現よく作製
することが憔めて困離でめった。
(2) Compared to Pb-based Josephson devices, the conventional Nb' yarn Josephson junction device has the features of a higher ultra-11iL4 critical temperature Tc, a higher recrystallization temperature, no hillock formation, and resistance to thermal cycles. However, it is expected to be a reliable device due to its reliability. However, the Nb film is more active than the Pb film, with 0. C.O.
, N*, etc., it has the disadvantage that a dense and thin oxide film barrier layer with few defects cannot be obtained. For this reason, it has been difficult and rare to fabricate a Nb-based Josephson element with uniform characteristics with good reproducibility.

Nb系ジョセフソン素子で鰍も代表的な例はNb−Nb
、o、  pb素子で、その製造方法は以下のとおりで
ある。すなわち清浄化処理したSi詰板またはサファイ
アi板上に10 ” ’l’orr以下の高真壁中でN
bを約3000人の4妊VC滓盾すΦ。
A typical example of Nb-based Josephson elements is Nb-Nb.
, o, pb elements, and the manufacturing method thereof is as follows. In other words, N is applied to a cleaned Si-filled plate or a sapphire i-plate in a high wall of 10'''orr or less.
About 3,000 4-year-old VCs will cover b.

−紋にNb博膜の作製は電子kA蒸7Iilr亀が用い
られる。つきにフォトエツチング技術を用いて該Nb膜
をエツチングし所望のNb電+fiを形成する。つぎに
前記Nb’iiLmMmk5〜0.5×10−”Tor
rK減圧したAr′I!、囲気、めるいはAr+0.雰
囲気中でスパッタクリーニング処理したのrQ1〜3X
 10−”l’orr  に減圧した02雰tfflk
yテrfプラズマば化し、20〜30人の悌めて碑いト
ンネル障*tvlN b Ox k形成する。破改にP
bt盛層して上@電憾を形成し、トンネル依台型ンヨセ
フンン系子を坪装していooところで「fプラズマ岐化
紙によりNb−懐懺圓にNb(Jx’iル戟する徊曾、
−叡に生城敵化展の厚さが% rf電圧や08分圧%わ
るいは欧化時間に比例して増力口するため20〜30人
と他めて博いトンネルに擁虐の厚さ2t8mよく制御す
ることが惚めて困−でめった。このため便米技術では女
足な臀社を羽−すゐNbホショセフソン素子を丹吹よ〈
装作することかで@なかった。
- An electronic kA evaporator 7IlR is used to prepare the Nb film on the pattern. Finally, the Nb film is etched using a photoetching technique to form a desired Nb charge +fi. Next, the Nb'iiLmMmk5~0.5×10-”Tor
rK depressurized Ar'I! , Enki, Meri is Ar+0. rQ1~3X treated with sputter cleaning in atmosphere
02 atmosphere tfflk with reduced pressure to 10-"l'orr
The yterf plasma spreads, and 20 to 30 people attack and form a monumental tunnel. P for breaking
Bt is layered to form the upper @electric ring, and the tunnel-based type Nyosefunn system is placed in the base. ,
- The thickness of the tunnel is 2t8m thick, with 20 to 30 people in proportion to the RF voltage and 08 partial pressure%, or the Europeanization time. I fell in love with controlling it well and had trouble. For this reason, in the rice technology, it is necessary to use a feminine buttock.
I didn't have to dress it up.

(3ン 発明の目的 本発明は前述の問題点を解消するために考案されたもの
で、安定な特性’knjるNbFx トンネル障壁層と
その製作方法を提供しようとするものである。
(3) Purpose of the Invention The present invention was devised to solve the above-mentioned problems, and is intended to provide an NbFx tunnel barrier layer with stable characteristics and a method for manufacturing the same.

(4)発明の総括脱明 すなわち減圧下に保ったフレオンガ’−t、 (CF’
4 >中でプラズマ放電させると1次のようVこガスは
解離し、清誂なF9ラジカルが先生する。
(4) General declaration of the invention, i.e., Freonga'-t kept under reduced pressure, (CF'
4 When plasma is discharged inside the plasma, the first-order V gas dissociates, producing pure F9 radicals.

CF4+e HCF、 +F* +2eこのF串の活性
IJLは、プラズマ放′駐のエネルギと7レオ/ガス圧
によって櫨々駕化する。一般にフレオンプラズマエツチ
ングVCよ/8金鵬めゐいμ無機’J(8i0!な1・
ど〕、市°慎貝(レジストなど)の加工ではhF”の活
性度の蝦も簡い鎖酸で竹っていることはよく知られてい
る。
CF4+e HCF, +F* +2eThe active IJL of this F skewer is solidified by the energy of plasma emission and 7 rheo/gas pressure. In general, freon plasma etching VC
It is well known that in the processing of materials such as resists, they are processed using simple chain acids with an activity level of hF.

不発明のMlの目的ば、Foの茫憔直tオU用したもの
である。また第2の目的はF*のエツチング性を者しく
以下させたプラズマ放′−中に缶鵜を晒すことにより、
該WM4六口のエツチング4表と弗化?!l庄成速展を
平衡状態に抹ちつつ20〜60人の薄いトンネル障壁ノ
曽NbF!(弗化ニオフ゛)を形成しようとするもので
あo0前6C方法によりNb衆而面20〜60人厚さの
渾いN b k” x忙生成させるためのに通条件は、
フレオンガス圧%IX 10−’ 〜5 X 10−”
 TOrr% +%Jmiitl力10〜50W (0
,03〜0.15W/crn” ) 、ステージax8
0C〜120Cの範囲が艮い。即ちフレオンガス圧が1
 x 10−”l’orr以上のbo N b F x
の生地速度が大きくなり、ピンホールの多い膜になる。
The purpose of the uninvented Ml is to use Fo's confusion directly. The second purpose was to expose canned cormorants to plasma radiation that significantly degraded the etching properties of F*.
Etching 4 tables and fluoridation of the WM4 six mouths? ! A thin tunnel barrier of 20 to 60 people while eliminating the Sho NbF in an equilibrium state! The general conditions for producing a 20 to 60-layer thick Nb mass using the 6C method are as follows:
Freon gas pressure %IX 10-' ~ 5 X 10-''
TOrr% +%Jmiitl force 10~50W (0
,03~0.15W/crn"), stage ax8
The range is 0C to 120C. That is, the Freon gas pressure is 1
x 10-”bo N b F x over 10-”l’orr
The fabric speed increases, resulting in a film with many pinholes.

一方、5X10−”l’orr以下の圧力ではNbFx
腺の5E属は絡められない。また尚鳩波出力がlOW 
(0,03W/cW1”  )以下ではNbFxkの生
成が紹められない。50 W(0,15W/ltnり以
上になるとF傘の宿注良が尚〈なり、Nbのエツチング
が連打し%所望のNbFx麟の年取が認められない。さ
らにステージ温良も猷密なN01I″ll朕を侍るため
に]L矢でめりsfm記生成味杆軛茜に刀口えプラズマ
放゛亀中の温kを80〜120CK促j御することによ
りF申の活性度が一部に保つことができ、女建に農の生
成ができる。
On the other hand, at pressures below 5X10-"l'orr, NbFx
The 5E genus of glands is not entangled. In addition, the pigeon wave output is lOW
(0,03W/cW1") or less, the generation of NbFxk cannot be introduced. If it becomes more than 50W (0,15W/ltn), the F umbrella's insulating condition becomes even worse, and the etching of Nb is repeated and the desired percentage is reached. The age of NbFx Rin is not recognized.Furthermore, the stage Atsura is also in order to attend the intense N01I''ll]L arrow is used to create the SFM record, and the taste is yoke to Akane, and the plasma is released. By controlling 80 to 120 CK, the activity level of F Monkey can be kept to a certain level, and agriculture can be generated in Female Ken.

(5)、*施例 以下、不発明を夫施り會参照して評細に続開する。あら
かじめ清浄化処理したate粘晶基板上に10−”l’
orr以下の筒X仝中でNbt−約3000人の厚さに
盛潰する。つき′にフォトレジストと弗敵、硝ば水浴g
t用いて、所望のパターンにエツチングし、下部電憔を
形成する。りき′に前iじNb11L他曲上に鳩間杷縁
展5iov形成する。その際リフトオフプロセスを用い
て、前口己Nbxmの一部が露出するように一口部を設
ける。つさ°に前記hliiiKil出L7’h N 
b 1tL惚狭1111 ’!k 5 X 10°3’
I’orrKs圧したAr芥四囲気中スパッタクリー二
ンクしタノち、引続Vhテア X 10−” Torr
 K@圧し%高周波出力20Wで先生じたフレオンガス
プラズマ中にlO分間放電電、前記露出したNb′#L
憔衣如に厚さ約4OAのNbFxt生取させる。
(5), *Examples The following details will be continued with reference to non-inventions. 10-"l'
Mold to a thickness of about 3,000 Nbt in a tube of less than orr. Photoresist and water bathing
t to form the lower electrode by etching the desired pattern. In Riki', Hatoma Haenen 5iov is formed on the previous iNb11L and other songs. At this time, a lift-off process is used to provide a mouth portion so that a portion of the front mouth Nbxm is exposed. The hliiiKil out L7'h N
b 1tL Kossa 1111'! k 5 x 10°3'
I'orrKs Sputter cleaning in a pressurized argon atmosphere, followed by Vh tear x 10-” Torr
The exposed Nb′#L was discharged for 10 minutes in the Freon gas plasma generated at a high frequency output of 20 W.
NbFxt with a thickness of about 4 OA is taken as raw material.

ついでpb−Bi (30wt%)を約4000人の写
場に感層して上部’ml憾を形成する。以上述べた方法
により作成したNb−NbFx−PbHj )ンネル接
合形ジョゼフソン糸子を献体He中に浸漬し、両’!I
L慣間にwL訛を流したところ、ジョセフソン臨’If
−流Jcは、2000A10n”の1μが侍られた。ま
たJcの同一ウエバ内(60φ)の友鯛は±5%、さら
にウニへ闇の震動は±10%で丹現性はきわめて良好で
あった。なおこの夫厖劉ではとくに述べなかったが、前
述の方法でトンネル#IIt壁J曽を形成したのちNb
、あるいはNb、si。
Next, pb-Bi (30wt%) was applied to a photographic area of about 4,000 people to form an upper layer. The Nb-NbFx-PbHj ) tunnel bonded Josephson thread prepared by the method described above was immersed in He, and both '! I
When I used a wL accent on my L routine, Josephson Rin'If
- Flow Jc was served with 1 μ of 2000A10n”.Furthermore, the friend sea bream in the same web (60φ) of Jc was ±5%, and the dark vibration to sea urchin was ±10%, and the immersion was extremely good. Although not specifically mentioned in this article, after forming the tunnel #IIt wall J Zeng using the method described above, the Nb
, or Nb, si.

Nb、8n、Nb、Ge等の上廊電憔勿形成した揚台も
There is also a platform made of Nb, 8n, Nb, Ge, etc.

JcおよびJcの父鯛は、Pb糸の榊台と1り禄で−め
った。
Jc and Jc's father, the sea bream, met with a Pb thread Sakakidai and a single roku.

(6)まとめ 以上説明したことく本帖@IJによればN ’b禾トン
ネル接當型ジョセフソン菓子が丹祝よく作成できるよう
になった。葦たそのi1p%性もきわめて安建しており
、成体He温度(4,2K )と至慕闇の熱サイクル臥
M’に1000回繰返した一名一でもJcO細#f叢化
は±2%以内でめシ5NbFxのトノネル障壁層は憔め
て女尾でめることか認められた。
(6) Summary As explained above, according to the main book@IJ, N'bhe tunnel-jointed Josephson confectionery can now be made easily. The i1p% property of the reeds is also extremely stable, and even when each person repeats the adult He temperature (4.2K) and the dark heat cycle M' 1000 times, the JcO fine #f plexus formation is ±2 It was observed that the tonnel barrier layer of 5NbFx could be torn down within 5%.

【図面の簡単な説明】[Brief explanation of the drawing]

ml−はトンネル振付型ジョセフソントンネル接合素子
の#面図を示す。 1・・・基板、2・・・杷城層、3・・・下部′#L慣
、4・・・トン0発 明 者 重田淳二 地株式会社日立製作所中央研究 04″!$1 @ ;::47□、工、2.1゛ 21
、−
ml- shows the # view of the tunnel choreography type Josephson tunnel junction device. 1...Substrate, 2...Haki layer, 3...Lower'#L customization, 4...Ton 0 Inventor Junji Shigeta Hitachi, Ltd. Central Research 04''!$1 @ ;: : 47□, Engineering, 2.1゛ 21
,−

Claims (1)

【特許請求の範囲】 1、Nbを下部篭憾とし、政電他表面に憔博のトンネル
障壁層を形成したうえ、Nb、pbあるいは少なくとも
どちらが一方の釜緬を含む超′−導合金を上s′llL
極としたトンネル接会苑ジョセフソン素子において、該
トンネル障壁l−に20〜60人の厚さのNbFxを用
いたことを特徴とするジョセフソン素子 Z  Nbを下S電極とし、践電他六囲に極博のトンネ
ル障壁層を形成したうえ、Nb、pbるるいは少なくと
もどちらか一方の金属を1′む超亀導曾金を上部11L
他としたトンネル接せ型ジョセフソン素子の製造におい
て、7レオ/ガス圧が1xlO”’−3X10−” T
orr、 尚周匝出力10〜50W (0,03〜0.
15W/crn” )のプラズマ放電中で該Nb下部電
極我圓にNbFxを20〜160人の厚さに形成したの
ち、 Nb。 pbあるいは少なくともどちらか一方の金17I4ヲ含
む超蒐尋合金r形成し上部′−極としたことを特徴とす
るジョセフソン系子の製造方法。
[Scope of Claims] 1. Nb is used as a lower layer, a tunnel barrier layer is formed on the surface of the wire, and a superconducting alloy containing Nb, PB, or at least one of them is superconducting. s'lllL
Josephson element Z is characterized by using NbFx with a thickness of 20 to 60 mm for the tunnel barrier l- in a Josephson element with a tunnel junction as a pole. In addition to forming a tunnel barrier layer around the outer layer, the top 11L is made of super conductive metal containing Nb, Pb, or at least one of the metals.
In the production of other tunnel-connected Josephson devices, the 7 rheo/gas pressure is 1xlO"'-3X10-"T
orr, power output 10~50W (0,03~0.
After forming NbFx to a thickness of 20 to 160 nm on the Nb lower electrode in a plasma discharge of 15 W/crn, a super alloy containing Nb.pb or at least one of gold 17I4 was formed. 1. A method for manufacturing a Josephson type device characterized by having an upper ′-pole.
JP56175651A 1981-11-04 1981-11-04 Manufacture of josephson element and manufacture thereof Pending JPS5877264A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56175651A JPS5877264A (en) 1981-11-04 1981-11-04 Manufacture of josephson element and manufacture thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56175651A JPS5877264A (en) 1981-11-04 1981-11-04 Manufacture of josephson element and manufacture thereof

Publications (1)

Publication Number Publication Date
JPS5877264A true JPS5877264A (en) 1983-05-10

Family

ID=15999817

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56175651A Pending JPS5877264A (en) 1981-11-04 1981-11-04 Manufacture of josephson element and manufacture thereof

Country Status (1)

Country Link
JP (1) JPS5877264A (en)

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