JPS5873839A - 光学系の光学特性測定装置 - Google Patents

光学系の光学特性測定装置

Info

Publication number
JPS5873839A
JPS5873839A JP17352481A JP17352481A JPS5873839A JP S5873839 A JPS5873839 A JP S5873839A JP 17352481 A JP17352481 A JP 17352481A JP 17352481 A JP17352481 A JP 17352481A JP S5873839 A JPS5873839 A JP S5873839A
Authority
JP
Japan
Prior art keywords
optical
light
optical system
light emitting
circular
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17352481A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0213728B2 (enrdf_load_stackoverflow
Inventor
Hiroshi Tamaki
田巻 弘
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Optical Co Ltd
Original Assignee
Tokyo Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Optical Co Ltd filed Critical Tokyo Optical Co Ltd
Priority to JP17352481A priority Critical patent/JPS5873839A/ja
Publication of JPS5873839A publication Critical patent/JPS5873839A/ja
Publication of JPH0213728B2 publication Critical patent/JPH0213728B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0228Testing optical properties by measuring refractive power

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP17352481A 1981-10-28 1981-10-28 光学系の光学特性測定装置 Granted JPS5873839A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17352481A JPS5873839A (ja) 1981-10-28 1981-10-28 光学系の光学特性測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17352481A JPS5873839A (ja) 1981-10-28 1981-10-28 光学系の光学特性測定装置

Publications (2)

Publication Number Publication Date
JPS5873839A true JPS5873839A (ja) 1983-05-04
JPH0213728B2 JPH0213728B2 (enrdf_load_stackoverflow) 1990-04-05

Family

ID=15962115

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17352481A Granted JPS5873839A (ja) 1981-10-28 1981-10-28 光学系の光学特性測定装置

Country Status (1)

Country Link
JP (1) JPS5873839A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPH0213728B2 (enrdf_load_stackoverflow) 1990-04-05

Similar Documents

Publication Publication Date Title
US5267980A (en) Optical components for an I.V. flow detector
JP3975892B2 (ja) 位置計測システム
CN106104204B (zh) 具有扫描功能的距离测量仪器
US4873449A (en) Process and apparatus for three-dimensional surveying
JP2020038180A (ja) ターゲット装置及び測量システム
WO1989012836A1 (en) Automatic tracking type surveying apparatus
CN105167766A (zh) 血液流量测量设备及血液流量测量方法
CN108139205A (zh) 光学元件特性测定装置
CN109358435A (zh) 一种双远心镜头垂直度的调整装置和调整方法
CN106055087A (zh) 位置检测装置和位置检测方法
JPH074967A (ja) 測量装置
JPS5873839A (ja) 光学系の光学特性測定装置
JPH11512176A (ja) 複数の三角プリズムを使用して光束を再帰反射する装置
US3422686A (en) Optical pickoff means for deriving signals indicative of deviation of rotor pole from spin axis
US3323417A (en) Testing apparatus for optical lenses
JP7613973B2 (ja) 測量システム
JPS6080707A (ja) 傾斜角度計測装置
CN209416661U (zh) 一种基于psd的镜头fov测量装置
JPH0124251B2 (enrdf_load_stackoverflow)
US2854887A (en) Projection microscopes
US20050002044A1 (en) Method for determination of the level of two or more measurement points, and an arrangement for this purpose
JPH0213727B2 (enrdf_load_stackoverflow)
US20230098766A1 (en) Surveying instrument
JPS5912638Y2 (ja) 光電式検出装置
JPH0117093B2 (enrdf_load_stackoverflow)