JPS5871451A - Setting device for sensitivity for magnetic flaw detector - Google Patents

Setting device for sensitivity for magnetic flaw detector

Info

Publication number
JPS5871451A
JPS5871451A JP16971581A JP16971581A JPS5871451A JP S5871451 A JPS5871451 A JP S5871451A JP 16971581 A JP16971581 A JP 16971581A JP 16971581 A JP16971581 A JP 16971581A JP S5871451 A JPS5871451 A JP S5871451A
Authority
JP
Japan
Prior art keywords
sensitivity
flaw
detector
setting
flaw detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16971581A
Other languages
Japanese (ja)
Inventor
Shigenori Kamimura
上村 繁憲
Kin Baba
馬場 釣
Seiichi Asano
精一 浅野
Mutsuya Senkawa
洗川 睦也
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Steel Corp filed Critical Kawasaki Steel Corp
Priority to JP16971581A priority Critical patent/JPS5871451A/en
Publication of JPS5871451A publication Critical patent/JPS5871451A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9073Recording measured data
    • G01N27/9086Calibrating of recording device

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

PURPOSE:To enable the efficient setting of the flaw detection sensitivity in a short time by a method wherein a truck carrying a magnetic flaw detector is made movable along rails between a flaw detection line and a sensitivity setting line provided in a separate position therefrom. CONSTITUTION:When it is necessary to change the size of a material to be inspected, first a flaw detecting device with a truck on a flaw detection line D is transferred along rails 11 and positioned on a sensitivity setting line A. Next, a test pipe 10 is inserted into a magnetization coil 4 of the flaw detecting device, and a detector 5 is adjusted so that it is matched with the diameter of the test pipe 10. Thereafter, the test pipe 10 is moved forward and backward by a rod 20 to transfer an artificial flaw 6 onto the detector 5, and thereby the setting of sensitivity is performed. When the setting of the sensitivity of one detector 5 is completed, the test pipe 10 is rotated, and thus the setting of the sensitivity of subsequent detectors 5 is performed sequentially. After the setting of sensitivity is all completed, the flaw detecting device is returned onto the flaw detection line D to perform the flaw detection of the material to be inspected.

Description

【発明の詳細な説明】 本発明は、磁気探傷機における感度設定装置に関する。[Detailed description of the invention] The present invention relates to a sensitivity setting device for a magnetic flaw detector.

棒状鋼材、例えば鋼管の内外面を非破壊検査する方法の
一つに、銅管を磁化し、欠陥部からの漏洩磁束を検出し
て欠陥位置、大きさ等を推定する磁気探傷法がある。第
1図はとの探傷法を利用した磁気探傷機の概略的な個面
図である。探傷ラインに複数個のVロール2とこの間に
磁気探傷機9とを配置し、被探傷材の銅管lをVロール
2により、場合によっては、ピンチロール3で押さえな
がら、探傷機9の磁化コイル4に送如込んで磁化し、欠
陥部から生ずる漏洩磁束を、鋼管1が検出子5内を通過
するときに該検出子で検出する。この従来例は、検出子
固定配置方式のものであシ、第2図に示すように、検出
子5が鋼管1の回シに45度間隔で8個配置されている
。得られる信号の大きさは、検出子5を通過する鋼管1
の速度および漏洩磁束の大きさに依存して変化するO即
ち、篩記電圧をv1漏洩磁束をφ、磁束の欠陥部を通過
する時間(速度)をt、検出子5の定数をNとすれば1
、 で表わされる。この場合、鋼管の外径、肉厚、材質が変
わると、同じ磁化電流によっても漏洩磁束φが変わって
くるので、感度設定を行う必要がある。従来、この神の
磁気探傷機においては、感度設定は、同一形状および材
質の感度設定用試験材(テスト・9イゾ)lに人工欠陥
6を穿ち、このテストノJ?イブ1を探傷ラインに通し
、Vロール2により所定搬送yvで走行させて行ってい
る。即ち、形状、大きさ即知の人工欠陥6に生ずる漏洩
磁束を同一の検出子5によって検出して感度調整を行う
。このような方法では、以下に掲げるような問題点があ
る。
One of the methods for non-destructively inspecting the inner and outer surfaces of steel rods, such as steel pipes, is the magnetic flaw detection method, which magnetizes a copper pipe and detects leakage magnetic flux from a defective part to estimate the position, size, etc. of the defect. FIG. 1 is a schematic diagram of a magnetic flaw detector using the above flaw detection method. A plurality of V rolls 2 and a magnetic flaw detector 9 are arranged between them on the flaw detection line, and the copper tube 1 to be tested is held down by the V rolls 2 and, in some cases, by the pinch rolls 3, while magnetizing the flaw detector 9. When the steel pipe 1 passes through the detector 5, the leakage magnetic flux generated from the defective portion is detected by the detector 5. This conventional example is of a detector fixed arrangement type, and as shown in FIG. 2, eight detectors 5 are arranged at 45-degree intervals on the turn of the steel pipe 1. The magnitude of the obtained signal is determined by the magnitude of the steel pipe 1 passing through the detector 5.
Let V be the sieve voltage that changes depending on the speed of Ba1
, is expressed as . In this case, if the outer diameter, wall thickness, and material of the steel pipe change, the leakage magnetic flux φ will change even with the same magnetizing current, so it is necessary to set the sensitivity. Conventionally, in this divine magnetic flaw detector, the sensitivity setting was performed by drilling an artificial defect 6 in a sensitivity setting test material (Test 9 Iso) l of the same shape and material, and using this test no J? Eve 1 is passed through the flaw detection line and is run at a predetermined conveyance yv by V roll 2. That is, the same detector 5 detects the leakage magnetic flux generated in the artificial defect 6 whose shape and size are known, and the sensitivity is adjusted. This method has the following problems.

(イ)外径叫の異なる次の被検材鋼管の探傷を行うに当
たって、同じ探傷ラインで、即ち、オンラインでvロー
ルによりテストパイプを磁気探傷機に送り込んで感度設
定を行わねばならないので、それだけ稼動時間が拘束さ
れて作業能率力;下刃;るとともに、通富、長さ5〜6
m以上の長尺ノ4イブが必要となる1゜ (ロ)テストパイプは被検材と同一長さの4のを被検材
の外径、肉厚、材質毎に準備しておかなければならず、
このため多数の長いテストIJ?イブを常時保管するス
ペースが必要となる。
(b) When performing flaw detection on the next test material steel pipe with a different outer diameter, it is necessary to send the test pipe to the magnetic flaw detector using the same flaw detection line, that is, online using a V-roll, and set the sensitivity. Operation time is restricted and work efficiency is reduced; lower blade; length is 5 to 6.
1゜ (b) Test pipes that require a length of 4 m or more must be prepared for each outer diameter, wall thickness, and material of the test material, with the same length as the test material. Not,
Because of this many long tests IJ? Space is required to store the eve at all times.

(ハ)テストパイプ10回シの検出子すべてについて感
度設定しなければならないが、第2図の如き45度間隔
の8個配置の場合は1個の検出子の感度設定が終わると
45度ずらして8回行うことになる。Vロールの構造上
テストパイプの走行を途中で止めて元に戻すということ
は難しいので、結局テスト・譬イグの全長走行を8回以
上繰シ返すことになシ、感度設定に長時間を要する。
(c) Sensitivity must be set for all detectors in the test pipe 10 times, but in the case of 8 detectors arranged at 45 degree intervals as shown in Figure 2, once the sensitivity setting for one detector is completed, the sensitivity must be set by 45 degrees. This will be done 8 times. Due to the structure of the V-roll, it is difficult to stop the test pipe mid-way and return it to its original position, so in the end, the entire length of the test pipe must be repeated more than 8 times, and it takes a long time to set the sensitivity. .

(ニ)従来の装置では感度設定のだめの動力がばかにな
らない。前述した誘起電圧Vの関係式からも分かるよう
に、同一の欠陥であっても得られる信号の大きさは欠陥
部が検出子を通過する速度および漏洩磁束の大きさに依
存して変化する。感度設定においては、漏洩磁束の大き
さは材料の磁化強度および人工欠陥の形状、寸法を規制
して行うが、速度については感度設定時と探傷時とで条
件が変わらないようにするため長いテストパイプを被検
材と同一の高い速度で走行させなければならない。この
ため探傷時と同程度の大きな動力を必要とする。
(d) With conventional devices, the power required to set the sensitivity is not trivial. As can be seen from the above-mentioned relational expression for the induced voltage V, the magnitude of the signal obtained even for the same defect changes depending on the speed at which the defect passes through the detector and the magnitude of leakage magnetic flux. When setting the sensitivity, the magnitude of the leakage magnetic flux is determined by regulating the magnetization strength of the material and the shape and dimensions of the artificial defect. However, regarding the speed, a long test is conducted to ensure that the conditions do not change between the sensitivity setting and flaw detection. The pipe must be run at the same high speed as the material being tested. Therefore, it requires as much power as during flaw detection.

このように従来の磁気探傷機における感度設定は作業能
率あるいは省エネルだ−などの点で多くの問題があった
As described above, the sensitivity settings of conventional magnetic flaw detectors have had many problems in terms of work efficiency and energy conservation.

本発明は、上述の問題を解決し、短時間で効率よ〈探傷
感度の設定ができる磁気探傷機の感度設定装置を提供す
ることを目的とする。
SUMMARY OF THE INVENTION An object of the present invention is to provide a sensitivity setting device for a magnetic flaw detector, which solves the above-mentioned problems and allows flaw detection sensitivity to be set efficiently in a short time.

この目的のために本発明は、探傷ラインと別位叙に設け
られかつ感度設定用試験材の高さ位置を変え得る支承ロ
ーラを備えた感度設定ラインと、磁気探傷機を搭載した
上下位置調整可能な台車と、前記探傷ラインと前記感度
設定ラインとの間に施設された台車走行用レールと、前
記感度設定ライン上で前記試験劇を軸方向に往復運動さ
せる装置および骸試験材を所定角度回転させる装置とを
設けることにしたものである。
For this purpose, the present invention provides a sensitivity setting line that is provided separately from the flaw detection line and is equipped with a support roller that can change the height position of the test material for sensitivity setting, and a vertical position adjustment equipped with a magnetic flaw detector. A trolley, a trolley running rail installed between the flaw detection line and the sensitivity setting line, a device for reciprocating the test piece in the axial direction on the sensitivity setting line, and a carcass test material at a predetermined angle. It was decided to provide a rotating device.

以下、本発明を図面を参照しながら、実施例について説
明する。
Hereinafter, embodiments of the present invention will be described with reference to the drawings.

第3図は本発明に係る感度設定装置の平面図、第4図は
その側面図である。第1・図で説明したように、探傷ラ
インD Fi、Vローラ2と磁気探傷機とによ多構成さ
れるが、本発明ではこの磁気探傷機り台車12に搭載さ
れておシ、探傷ラインDf)側方へ搬出可能である。こ
の実施例では、探傷ラインDと平行に感度設定ラインA
が設けられている。
FIG. 3 is a plan view of the sensitivity setting device according to the present invention, and FIG. 4 is a side view thereof. As explained in FIG. Df) Can be carried out to the side. In this example, the sensitivity setting line A is parallel to the flaw detection line D.
is provided.

探傷ラインDから感度設定ラインAまで該2インに直交
する一対のレール11が施設され、このレール上を探傷
機を搭載した台車12が移動する。
A pair of rails 11 are provided from the flaw detection line D to the sensitivity setting line A, and are perpendicular to the two ins, and a cart 12 carrying a flaw detector moves on these rails.

台車12は昇降装置13を有し、この上に探傷機本体が
載せられる。14は台車12の車輪である。
The trolley 12 has a lifting device 13, on which the main body of the flaw detector is placed. 14 is a wheel of the truck 12.

感度設定ラインAには一対のレールを挾んで一対のロー
ラ支持台16が配置され、この支持台16にテストバイ
ア′lOを支承するVローラ15が軸支されている。V
ローラ15はツヤツキ17によって上下方向に位置調整
可能である。感度設定ラインにはまた/譬イグ10を軸
方向に往復運動させる往復駆動装置Bおよびテストバイ
ア10を所定角度ずつ間欠的に回転させる回転駆動装置
Cが配置される。
A pair of roller support stands 16 are arranged on the sensitivity setting line A with a pair of rails in between, and a V roller 15 supporting a test via 'lO is pivotally supported on this support stand 16. V
The position of the roller 15 can be adjusted in the vertical direction by means of a gloss 17. Also disposed on the sensitivity setting line are a reciprocating drive device B that reciprocates the test tube 10 in the axial direction, and a rotation drive device C that rotates the test via 10 intermittently by a predetermined angle.

往復駆動装置Bは、シリンダ支持台26に設置されたシ
リンダ18をガイドとしてピストン19およびこれに連
結されたピストンロッド2oが軸方向に往復移動し、こ
れによってロッド先端に連結されたテス) A?イブ1
0をVロー215上で往伽移動させるようになっている
。シリンダ18の下方に一対のスジロケット23および
これに掛けられた無端キャリヤ22が配置される。キャ
リヤ22にはドッグ21が固着されている。第5図およ
び第6図に示すように、ドッグ21は、シリンダ18の
下側部の軸方向に伸びる切欠き隣35を通ってシリンダ
内のピストン19と係合している。
In the reciprocating drive device B, the piston 19 and the piston rod 2o connected thereto reciprocate in the axial direction using the cylinder 18 installed on the cylinder support base 26 as a guide, and thereby the piston rod 2o connected to the tip of the rod A? eve 1
0 is moved back and forth on the V row 215. A pair of striped rockets 23 and an endless carrier 22 hung thereon are arranged below the cylinder 18. A dog 21 is fixed to the carrier 22. As shown in FIGS. 5 and 6, the dog 21 engages the piston 19 within the cylinder through an axially extending notch 35 in the underside of the cylinder 18. As shown in FIGS.

24はスジロケット23の支持台、25はスジロケット
23を回転させるモータである。
24 is a support base for the striped rocket 23, and 25 is a motor for rotating the striped rocket 23.

回転駆動装置Cは、第7図に示す如く、ピストンロッド
2oの後端にキー34を介して装着されたウオーム3o
と、ウオーム3oと噛ミ合うウオーム歯車31と、ウオ
ーム歯車31を回転させるノuルスモ−132トラ有f
る。33 f4、/+ルス%−タ32の出力軸とウオー
ム歯車31とを連結しているカッブリングである。
As shown in FIG. 7, the rotational drive device C includes a worm 3o attached to the rear end of the piston rod 2o via a key 34.
, a worm gear 31 that meshes with the worm 3o, and a Norsmo-132 roller that rotates the worm gear 31.
Ru. 33 f4, /+ This is a coupling ring that connects the output shaft of the rotor 32 and the worm gear 31.

ロッド20の先端には2肢に分かれたコネクタ27が固
着され、デストノ9イグ1oの端部には前記コネクタに
嵌まるナックル28が形成されている。コネクタ27と
ナックル28は固定ビン29を介して互いに連結される 次に、本発F!AK係る装置の作用・につぃて説明する
A connector 27 that is divided into two limbs is fixed to the tip of the rod 20, and a knuckle 28 that fits into the connector is formed at the end of the terminal 9 and 1o. The connector 27 and the knuckle 28 are connected to each other via the fixing pin 29. Next, the main F! The operation of the AK device will be explained.

まずサイズ替えの必要が起きると、探傷ラインD上の台
車付探傷装置をレール11を使って引込み、オフライン
の感度設定ラインムに位置決めする。次いで、テストパ
イf1oをローラ15を使って磁化コイル4内を通して
、ロッド2oの先端に取り付けられたコネクタ27とテ
スト/4イグ10の先端に城す付けられたナックル28
を同定ピン29で連結させる。このとき探傷装置の尚さ
及びローラ15の高さを昇降装置13とジヤツキ17に
より調節しながら、テスト/母イゾ1oを設置する。次
に、検出子5をテストバイブ1oの径に合わせて調節す
る。
First, when it is necessary to change the size, the flaw detection device with a trolley on the flaw detection line D is pulled in using the rail 11 and positioned at the off-line sensitivity setting line. Next, the test pie f1o is passed through the magnetizing coil 4 using the roller 15, and the connector 27 attached to the tip of the rod 2o and the knuckle 28 attached to the tip of the test/four hook 10 are connected.
are connected with an identification pin 29. At this time, the test/mother Iso 1o is installed while adjusting the height of the flaw detection device and the height of the roller 15 using the lifting device 13 and the jack 17. Next, the detector 5 is adjusted to match the diameter of the test vibe 1o.

以上で準備が完了し、次いで感度設定に入る。Now that the preparation is complete, you can start setting the sensitivity.

モータ25を正逆回転させることにょシ、キャリヤ22
を高速で正逆回転させ、ドッグ21からピストン19を
通じてロッド2oを高速で前後に移動させる。この運動
によシテストパイゾ10がローラ15上を前後に移動し
、テスト/4イグ10の人工欠陥6が検出子5土を移動
することにょ)感度設定を行う。1個の検出子5の感度
設定が終了すると、検出子5の取付角度、例えは、・母
ルスモータ32によりロッド20を45度回転させるこ
とによシ、テストパイプlOを回転させて次の検出子5
の感度設定を行う。この場合、ロッド20を角度i!&
1整するための回転動作は、ピストン19b\゛′ドツ
グ21上をスリツノしながら回転することによりなされ
る。
To rotate the motor 25 in forward and reverse directions, the carrier 22
is rotated forward and backward at high speed, and the rod 2o is moved back and forth at high speed through the dog 21 and the piston 19. Due to this movement, the test piezo 10 moves back and forth on the roller 15, and the artificial defect 6 of the test/4 sensor 10 moves on the detector 5.) Sensitivity settings are performed. When the sensitivity setting of one detector 5 is completed, the mounting angle of the detector 5 is changed, for example, by rotating the rod 20 by 45 degrees by the base motor 32, the test pipe IO is rotated, and the next detection is performed. Child 5
Set the sensitivity. In this case, the rod 20 is moved at an angle i! &
The rotational movement for adjusting the piston 19b is performed by rotating the piston 19b in a sliding motion on the dog 21.

以上の操作を繰シ返すことによシ短時間で感度設定が完
了する。感度設定が済むと探傷機を再び探傷ラインに戻
して被検材の探傷を行う。
By repeating the above operations, sensitivity setting can be completed in a short time. After setting the sensitivity, the flaw detector is returned to the flaw detection line and the test material is inspected.

本発明では、レールを探傷ラインの両飼へ長く伸ばし、
磁気探傷機を2台用意し、探傷ライン上の探傷機の稼動
中に、他方の探傷機を新サイズの次被検材に対して感度
設定することができ、前記の次被検材が搬送されてきた
とき探傷ライン上の探傷機を感度設定ラインと反対側の
レール上へ退避させ、感度設定済の探傷機を探傷ライン
へ移して探傷動作を行えば作業効率が一段と向上する。
In the present invention, the rail is extended to both sides of the flaw detection line,
Two magnetic flaw detectors are prepared, and while the flaw detector on the flaw detection line is in operation, the sensitivity of the other flaw detector can be set for the next test material of a new size, and the next test material is transported. If the flaw detector on the flaw detection line is moved to the rail on the opposite side of the sensitivity setting line and the flaw detector with the sensitivity set is moved to the flaw detection line and the flaw detection operation is performed, work efficiency will be further improved.

テスト/4イグを往復移動させて感度設定するので実際
の被検材のような長尺のものは必要ない。なお、上記実
施例では探傷ライ/と感度設定ラインを平行に配置した
例を示したが、本発明はこのような態様にのみ限定され
るものではなく、工場内のスペースに応じて感度設定ラ
インを斜めに配置するなど種々の態様がとられてよい。
Test/4 Since the sensitivity is set by moving the igu back and forth, there is no need for a long object like the actual material to be tested. Although the above embodiment shows an example in which the flaw detection line and the sensitivity setting line are arranged in parallel, the present invention is not limited to this embodiment, and the sensitivity setting line can be arranged according to the space in the factory. Various embodiments may be adopted, such as arranging the cursor diagonally.

テストバイブの往復、回転機構も図示実施例のものに限
定されない。
The reciprocating and rotating mechanism of the test vibrator is also not limited to that of the illustrated embodiment.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は磁気探傷機の概略的な側面図、第2図は磁気探
傷機における検出子の配置関係の一例を示した正面図、
#c3図は本発明の実施例に係る感度設定装置の平向図
、第4図は第3図の側面図、第5図は往復駆動装置のシ
リンダ内を破断して示した斜視図、第6図は第5図の■
−vI11iiIに沿った断面図、第7図は回転駆動装
置を概略的に示した図である。 4・・・磁化コイル、   5・・・検出子、6・・・
人工欠陥、    lO・・・テスト/クイグ、・11
・・・レール     12・・・台車、15・・・V
ローラ、    18・・・シリンダ、20・・・ピス
トンロッド、22°°°キヤリヤ、23・・・スジロケ
ット、  25・・・モータ、30・・・ウオーム、 
   31・・・ウオーム歯車、32・・・ノ譬ルスモ
ータ、4A・・・感度設定ライン、B・・・往復駆動装
置、   C・・・回、転駆動装置、1) 、、、採傷
ライン。 代理人  升堆士 染 川 利 吉 第1図 ソ 第2図 ら 第3図 第゛4図 m: L−■ 第71ゴー
Figure 1 is a schematic side view of the magnetic flaw detector, Figure 2 is a front view showing an example of the arrangement of detectors in the magnetic flaw detector,
#c3 is a plan view of the sensitivity setting device according to the embodiment of the present invention, FIG. 4 is a side view of FIG. 3, FIG. 5 is a perspective view of the cylinder of the reciprocating drive device, and Figure 6 is the ■ of Figure 5.
-vI11iiI, FIG. 7 is a diagram schematically showing the rotary drive device. 4... Magnetizing coil, 5... Detector, 6...
Artificial defect, lO...Test/Quig, 11
...Rail 12...Bolly, 15...V
Roller, 18... Cylinder, 20... Piston rod, 22°°° Carrier, 23... Stripe rocket, 25... Motor, 30... Worm,
31... Worm gear, 32... Noise motor, 4A... Sensitivity setting line, B... Reciprocating drive device, C... Rotating drive device, 1)... Scratching line. Agent: Toshikichi Somekawa Figure 1 So Figure 2 et al Figure 3 Figure 4 M: L-■ 71st Go

Claims (1)

【特許請求の範囲】[Claims] 探傷ラインと別位置に設けられかつ感度設定用試験材の
高さ位置を変え得る支承ローラを備えた感度設定ライン
と、磁気探傷機を搭載した上下位置調整可能な台車と、
前記探傷2インと前記感度設定ラインとの間に施設され
た台車走行用レールと、前記感度設定ライン上で前記試
験材を軸方向に往復移動させる装置および該試験材を所
定角度回転させる装置とを有することを特徴とする磁気
探傷機用感度設定装置。
A sensitivity setting line equipped with a support roller that is installed at a different position from the flaw detection line and that can change the height position of the sensitivity setting test material, and a cart equipped with a magnetic flaw detector whose vertical position can be adjusted.
A trolley running rail installed between the flaw detection 2-in and the sensitivity setting line, a device for reciprocating the test material in the axial direction on the sensitivity setting line, and a device for rotating the test material by a predetermined angle. A sensitivity setting device for a magnetic flaw detector, comprising:
JP16971581A 1981-10-23 1981-10-23 Setting device for sensitivity for magnetic flaw detector Pending JPS5871451A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16971581A JPS5871451A (en) 1981-10-23 1981-10-23 Setting device for sensitivity for magnetic flaw detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16971581A JPS5871451A (en) 1981-10-23 1981-10-23 Setting device for sensitivity for magnetic flaw detector

Publications (1)

Publication Number Publication Date
JPS5871451A true JPS5871451A (en) 1983-04-28

Family

ID=15891517

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16971581A Pending JPS5871451A (en) 1981-10-23 1981-10-23 Setting device for sensitivity for magnetic flaw detector

Country Status (1)

Country Link
JP (1) JPS5871451A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01209356A (en) * 1988-02-18 1989-08-23 Maakutetsuku Kk Magnetic flaw detector for long-sized steel material
JPH0637761U (en) * 1992-10-28 1994-05-20 原電子測器株式会社 Eddy current flaw detection automatic calibration device
JP2007205826A (en) * 2006-02-01 2007-08-16 Hitachi Building Systems Co Ltd Wire rope flaw detector

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01209356A (en) * 1988-02-18 1989-08-23 Maakutetsuku Kk Magnetic flaw detector for long-sized steel material
JPH0637761U (en) * 1992-10-28 1994-05-20 原電子測器株式会社 Eddy current flaw detection automatic calibration device
JP2007205826A (en) * 2006-02-01 2007-08-16 Hitachi Building Systems Co Ltd Wire rope flaw detector

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