JPS5871442A - Inspecting apparatus for bottles - Google Patents

Inspecting apparatus for bottles

Info

Publication number
JPS5871442A
JPS5871442A JP16968781A JP16968781A JPS5871442A JP S5871442 A JPS5871442 A JP S5871442A JP 16968781 A JP16968781 A JP 16968781A JP 16968781 A JP16968781 A JP 16968781A JP S5871442 A JPS5871442 A JP S5871442A
Authority
JP
Japan
Prior art keywords
bottle
inspection
circuit
view
inspected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16968781A
Other languages
Japanese (ja)
Inventor
Koichi Mukai
浩一 向井
Koichi Komori
小森 孝一
Tetsuo Nakamura
哲男 中村
Shinichi Murakawa
村川 慎一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Heavy Industries Ltd
Original Assignee
Mitsubishi Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Heavy Industries Ltd filed Critical Mitsubishi Heavy Industries Ltd
Priority to JP16968781A priority Critical patent/JPS5871442A/en
Publication of JPS5871442A publication Critical patent/JPS5871442A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/90Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9009Non-optical constructional details affecting optical inspection, e.g. cleaning mechanisms for optical parts, vibration reduction

Abstract

PURPOSE:To obtain an inspecting apparatus for bottles having the advantages of simple structure, inexpensive, and easy handling, by a method wherein a plurality of positions are detected around a center line of a bottle to be inspected, and predetermined effective scanning region signals are generated according to detected positions, respectively. CONSTITUTION:Light emitted from a light source 6 diffuses at a diffuser panel 5, transmits through a bottle to be inspected 2A and reaches a line scanner 3A. An inspection is started by a signal from a trigger means for starting an inspection at the time when the bottle 2A comes within the range. Since the height of thick portion of the bottle, which is determined according to the shape of the bottle, varies as the bottle 2A is shifted, the inspection band must also be varied with. A pulse generator 16 is provided for this reason. The number of pulses generated per the bottle 2A is the parting line number of bottle body in shifting direction, and the upper limit number is determined on the basis of starting interval of time and shifting speed of the bottle 2A. The ratio of timing pulleys 10-11 is decided by the above. Thus, an inspecting apparatus of simple structure and easy handling is obtained.

Description

【発明の詳細な説明】 本発明は検びん装置に関する。[Detailed description of the invention] The present invention relates to a bottle testing device.

びん詰めラインにおける洗浄後の空びん検査は最近自動
化が進み、びんの底面検査、びんの口火は検査、残水検
査勢は機械化されているが、びんの表面積の80〜90
 %を占めるびんの側面検査は種々の提案がなされてい
るにもかかわらず、装置が大型化し高価となる、びんの
搬送が不安定となる、レイアウトが長くなる等の問題点
のために1いずれも実用化されていない。
Inspection of empty bottles after washing in the bottling line has recently been automated, and the inspection of the bottom of the bottle, the opening of the bottle, and the residual water inspection have been automated, but only 80-90% of the surface area of the bottle is used.
Although various proposals have been made for side inspection of bottles, which account for 1.5% of the total, there are still problems such as larger and more expensive equipment, unstable bottle transport, and longer layouts. has not been put into practical use either.

例えば、まず、第1因子面図、第2図部分拡大縦断面図
に示すものは、ターン、)TR上の各ヘッドにびんロペ
ルBB、びん台BS、内面鏡IM受光素子LDが配置さ
れ、スクリュー8Cおよび入口スターホイール8Fによ
シ搬送されたびんBTがターン、 トTR上で回転し、
内面鏡IMがカムによシ昇降し、びんBT側面の光源L
Sから拡散板DPを介して拡散された光が内面鏡IMを
通って受光素子LDに入り、瞬間の視野VFは、第3図
側面図に示すように、小さいが、びんBTが回転しなが
ら内面鏡IMが昇降するので全面をらせん状に走査し、
異物があると光量が、第4図線図に示すように、変化す
ることを利用するものであるが、装置が大型、高価であ
シ、メンテナンスに手間がかかる欠点がある。
For example, first, what is shown in the first factor plane view and the partially enlarged vertical cross-sectional view in FIG. The bottle BT conveyed by the screw 8C and the inlet star wheel 8F turns and rotates on the TR,
The inner mirror IM moves up and down by a cam, and the light source L on the side of the bottle BT
The light diffused from S through the diffuser plate DP passes through the inner mirror IM and enters the light receiving element LD, and the instantaneous field of view VF is small as shown in the side view of Fig. 3, but as the bottle BT rotates. As the inner mirror IM moves up and down, it scans the entire surface in a spiral pattern,
This method takes advantage of the fact that the amount of light changes when there is a foreign object, as shown in the diagram in FIG. 4, but it has the disadvantage that the device is large, expensive, and requires time and effort to maintain.

次に、第5因子面図、第6図部分拡大縦断面図に示すも
のはターレッ)TR上にびんBTを乗せ、びんBTを回
転させながら非蓄積[TVカメラTVにてターレットT
Rの回転から信号を取出し、鋸歯状波を発生させ、第7
図に示すように、常にびんの中心線上を走査するように
水平偏向コイルを制御するものであるが、装置が大型、
高価であυ、びんロベルのサニタリ性が悪い欠点がある
・ また、第8図、第9図に示すものは、固体カメラ又はT
VカメラTVにてびんBTの側面を撮影し、びん自身の
縁部信号ESを起点とする検査領域EDの信号Sを発生
させ、その領域HDにある欠陥、異物等を検査するもの
であるが、びんの中央部のみを検査する方式であるので
、びんの回転および追従装置が必要となシ、装置が大型
、高価となる欠点がある。
Next, place the bottle BT on the TR (the one shown in the 5th factor plane view and the partially enlarged vertical cross-sectional view in FIG. 6 is the turret) and rotate the bottle BT to prevent accumulation
Take the signal from the rotation of R, generate a sawtooth wave, and
As shown in the figure, the horizontal deflection coil is controlled so that it always scans on the center line of the bottle, but the device is large and
It is expensive and has the disadvantage of poor sanitary properties of the bottle label.In addition, the ones shown in Figures 8 and 9 are equipped with a solid-state camera or T
The side surface of the bottle BT is photographed by a V camera TV, and a signal S of an inspection area ED is generated starting from the edge signal ES of the bottle itself, and defects, foreign substances, etc. in that area HD are inspected. Since this method inspects only the center of the bottle, it requires a device to rotate and follow the bottle, and the device is large and expensive.

さらに、第10図、第11図に示すものは、スクリ、−
SCにてびんBTの間隔を拡げ、固体カメラCMに反射
鏡RMを介して2面の儂を写し、FROMに打ち込まれ
た検査領域EDの検査を行なうものであるが、びんの搬
送が不安定で装置のレイアウトが長くなる欠点があシ、
また第12図に示すものは、第1検びん位置l5TPで
びんBTの1面を検査し、第2検びん位置2NDP t
での間にびんBTの向きを変え他の面を検査し、第1検
びん装置、第2検びん装置が同時に働かないようにびん
のピッチをずらせたものであるが、装置が大型、高価と
なる欠点がある・ 本発明はこのような事情にSみて提案されたもので、構
造簡単2価格低摩な検びん装置を提供することを目的と
し、ラインスキャナによシガラスびん等の胴部をその中
心線方向に走査することによシ欠陥や異物の存在を検出
するようにし九検びん装置において、被検びんの中心線
の周シの複数の位置を検出する手段と、上記複数の位置
のそれぞれに対応してあらかじめ定められた有効走査領
域信号を発生する手段とを具えたことを特徴とする。
Furthermore, what is shown in FIG. 10 and FIG.
At SC, the interval between the bottles BT is widened, two sides of the camera are reflected on the solid-state camera CM via the reflector RM, and the inspection area ED written in the FROM is inspected, but the transportation of the bottles is unstable. The disadvantage is that the layout of the equipment becomes long.
Further, in the case shown in FIG. 12, one side of the bottle BT is inspected at the first inspection bottle position 15TP, and the second inspection bottle position 2NDP t is inspected.
During this process, the orientation of the bottle BT is changed and the other side is inspected, and the pitch of the bottle is shifted so that the first and second bottle inspection devices do not work at the same time, but the device is large and expensive. The present invention was proposed in view of these circumstances, and aims to provide a bottle inspection device with a simple structure, low cost, and low wear and tear. The inspection bottle apparatus detects the presence of defects or foreign substances by scanning in the direction of the center line of the bottle. The present invention is characterized by comprising means for generating a predetermined effective scanning area signal corresponding to each position.

本発明の一実施例を図面について説明すると、第13図
はその平面図、第14図は第13図の拡大縦断面図、第
15図は第14図のラインスキャナ視野と被検びんの非
検査帯との関係を示す部分拡大側面図、第16図は第1
3図の被検ぴんとラインスキャナの視野との関係を示す
部分拡大平面図、第17図は被検びんの・中ルス信号と
有効視野との関係を示す説明図、第18図はスタートパ
ルス、クロックツ臂ルス、ビデオ信号を示す波形図、第
19図はラインスキャナの検査範囲と被検びんの関係を
示す平面図、第20図は第14図の信号処理装置を示す
!ロック線図、第21図は第20図の各部の出力波形図
、第22図は第13図の部分拡大図、第23図は第14
図の部分拡大図、第24図は第13図の押し板とは異な
る他のびん回動手段を示す平面図である。
An embodiment of the present invention will be explained with reference to the drawings. FIG. 13 is a plan view thereof, FIG. 14 is an enlarged vertical sectional view of FIG. 13, and FIG. Figure 16 is a partially enlarged side view showing the relationship with the inspection zone.
Figure 3 is a partially enlarged plan view showing the relationship between the test bottle and the field of view of the line scanner, Figure 17 is an explanatory diagram showing the relationship between the medium pulse signal of the test bottle and the effective field of view, and Figure 18 is the start pulse, A waveform diagram showing clock pulses and video signals, FIG. 19 is a plan view showing the relationship between the inspection range of the line scanner and the bottles to be tested, and FIG. 20 shows the signal processing device of FIG. 14! The lock diagram, Fig. 21 is an output waveform diagram of each part in Fig. 20, Fig. 22 is a partially enlarged view of Fig. 13, and Fig. 23 is a diagram of the output waveform of each part in Fig. 14.
FIG. 24, which is a partially enlarged view of the figure, is a plan view showing another bottle rotation means different from the push plate shown in FIG. 13.

まず、第13〜14図において、1はびんを搬送するコ
ンベヤ、2は被検びんで2A、2Bはそれぞれ検査され
ている瞬間の被検びん、jA、3Bはそれぞれ適宜角度
で配設され被検びん!’A、JBを走査するラインスキ
ャナ、4はびん2を搬送するスターホイール、5は線状
光源6からの光を拡散する拡散板、1はスターホイール
4の回転軸、8.9はそれぞれ回転軸1を枢支するベア
リング、10は回転軸1に嵌着された大径タイ之ンググ
ーリ、11はタイミングベルト12で大径タイばングゾ
ーリ10に連動する小径タイ建ンググーリ、18.14
はそれぞれ小径タイ建ンダゾーリ1滅を嵌着する軸15
のベアリング、1′6は軸15の一端に付設され九)譬
ルス発生器、17はびんの向きを変えるための押し板、
18はラインスキャナjA。
First, in Figs. 13 and 14, 1 is a conveyor for conveying bottles, 2 is a bottle to be inspected, 2A and 2B are the bottles to be inspected at the moment they are being inspected, and jA and 3B are each arranged at an appropriate angle and are the bottles to be inspected. Test the bottle! 'A, a line scanner that scans JB, 4 a star wheel that conveys the bottle 2, 5 a diffuser plate that diffuses the light from the linear light source 6, 1 the rotation axis of the star wheel 4, 8.9 each rotation 18.14 A bearing that pivots the shaft 1; 10 a large-diameter tie holder fitted on the rotating shaft 1; 11 a small-diameter tie holder linked to the large-diameter tie holder 10 by a timing belt 12; 18.14
are the shafts 15 to which the small-diameter tie construction DAZOLI 1 is fitted.
1'6 is attached to one end of the shaft 15; 9) a pulse generator; 17 is a push plate for changing the direction of the bottle;
18 is line scanner jA.

3B、後記するトリガー装置1 j 、71ルス発生器
16からの信号を受けて処理する信号処理装置である。
3B, trigger device 1 j to be described later; 71 is a signal processing device that receives and processes a signal from the pulse generator 16;

次に、第20図において、100に、100Bはそれぞ
れパルス発生器16からの信号の直後のラインスキャナ
sA、3Bのスタートノ譬ルスを取シ出すためのAND
4回路、1′0・H)v−a 1αJBはそれぞれ被検
びんのびん胴下部を非検査帯とするための遅延回路、1
02ム、10:tBはそれぞれびん胴下部の非検査帯走
査後動作してクロ、クツ4ルスのダートとして使用する
7リツ270ツノF/F 1回路、103ムは7す、f
70.ゾF/F 1回路102Aおよびラインスキャナ
3Aのクロックノタルスを入力するAND1回路、10
3Bはフリツノフロラ7” F/F1回路102Bおよ
びラインスキャナ3Bのクロックツ譬ルスを入力するA
ND 1回路、104はトリガー装置19からの信号に
よ多動作し、検査開始を指令するフリ、デるAND 2
回路、106はANDj回路105の出力を記憶するフ
リッゾフロップ回路F/Fl、107はAND2回路1
05の出力を符号化するためのエンコーダ、108はび
んの非検査帯をあらかじめ定めるPROM (Prog
rammable ROM )、109ムはAND 1
回路103Aからのノ4ルス入力により出力を開始し上
記ノ4ルス入力とFROM 10 &の設定値とを比較
し上記入力t4ルス数が上記設定値を越えたとき出力を
停止するカウント比較゛回路、109BはAMD1回路
103Bからのノ9ルス入力によシ出力を開始し、上記
ノfルス入力とFROM108の設定値とを比較し上記
入力Δルス数が上記設定値を越えたとき出力を停止する
カラン・ト比較回路、1101.110Bはそれぞれカ
ウント比較回路1091.109Bからのe−)信号と
異物判別回路111人、IIIBからの異物信号とを入
力するANDJ回路、111に、IIIBはそれぞれツ
インスキャナJA、JBからのビデオ信号を受は異物信
号化するための異物判別回路、111はANDJ回路1
10ム、ll0Bの出力を入力するOR回路、113は
リゼクト装置を駆動するりぜクト回路である。
Next, in FIG. 20, 100 and 100B are AND signals for extracting the start signals of the line scanners sA and 3B immediately after the signal from the pulse generator 16, respectively.
4 circuits, 1'0・H) v-a 1αJB is a delay circuit for making the lower part of the bottle body of the bottle to be tested a non-inspection zone, 1
02m, 10:tB is a 7-unit 270-horn F/F 1 circuit that operates after scanning the non-inspection zone at the bottom of the bottle body and is used as a dart for black and white shoes, respectively, and 103m is 7s, f
70. 10 AND1 circuits for inputting clock signals of F/F 1 circuit 102A and line scanner 3A
3B is A that inputs the clock pulses of Fritsunoflora 7” F/F1 circuit 102B and line scanner 3B.
The ND 1 circuit 104 operates in response to the signal from the trigger device 19 and commands the start of the test.AND 2
106 is a frizzo flop circuit F/Fl that stores the output of the ANDj circuit 105; 107 is an AND2 circuit 1;
05 is an encoder for encoding the output of 05, and 108 is a PROM (Prog
rammable ROM), 109 ROM is AND 1
A count comparison circuit that starts output by the 4 pulse input from the circuit 103A, compares the 4 pulse input with the set value of FROM 10 &, and stops the output when the input t4 pulse number exceeds the set value. , 109B starts outputting according to the number of pulses input from the AMD1 circuit 103B, compares the number of pulses inputted above with the set value of FROM108, and stops outputting when the number of input Δ pulses exceeds the set value. The count comparison circuits 1101 and 110B respectively input the e-) signal from the count comparison circuits 1091 and 109B, and the ANDJ circuits that input the foreign object signals from the foreign object discrimination circuit 111 and IIIB. 111 is an ANDJ circuit 1 which receives video signals from scanners JA and JB and converts them into foreign object signals.
10 is an OR circuit which inputs the outputs of ll0B, and 113 is a reject circuit that drives a reject device.

このような装置において、びん2がスターホイール4に
よシ検査位置Afiで運ばれると、光源6から出た光は
拡散板5によシ拡散され、被検びん2Aを透過してライ
ンスキャナ3Aに入る・ラインスキャナ3Aはびんの側
面を下から上に常時走査しているので、もし被検びん2
Aに異物等がToシ、光量変化が生ずれば、これを異物
信号として信号処理装置18にて処理する。
In such an apparatus, when the bottle 2 is transported by the star wheel 4 to the inspection position Afi, the light emitted from the light source 6 is diffused by the diffuser plate 5, passes through the bottle to be inspected 2A, and is sent to the line scanner 3A.・The line scanner 3A constantly scans the side of the bottle from bottom to top, so if the bottle under test 2
If a foreign object or the like is present on A and a change in light intensity occurs, this is processed by the signal processing device 18 as a foreign object signal.

ここで、びんの側面を検査する際、第15図に示すよう
に、びんの肉厚部T[が異物と同様の信号を発生するの
で、このような部分を非検査帯とするために、第16図
に示すように、被検びん2Aがラインスキャナ3Aの視
野VFに入ったとき、検査開始用トリガー装置19から
の信号によシ、検査が開始されるが、被検びん2Aが移
動するにつれて、びんの形状によシ決まる肉厚部の高さ
が異なるので、それに合わせて、非検査帯を変える。
When inspecting the side surface of the bottle, as shown in Fig. 15, the thick part T of the bottle generates a signal similar to that of a foreign object. As shown in FIG. 16, when the test bottle 2A enters the field of view VF of the line scanner 3A, the test is started in response to a signal from the test start trigger device 19, but the test bottle 2A moves. As the height of the thick wall portion changes depending on the shape of the bottle, the non-inspection zone is changed accordingly.

そのために/譬ルス発生器16が設けられておシ、スタ
ーホイール4の回転軸1よシタイミングゾーリ10.タ
イミングベルト12.タイミングプーリ11.軸15を
介して駆動され、第、17図P1++P1+・・・に示
すように、)譬ルスを発生する。
For this purpose, a pulse generator 16 is provided, and the timing axis 10 is connected to the rotation axis 1 of the star wheel 4. Timing belt 12. Timing pulley 11. It is driven via the shaft 15, and generates a pulse as shown in Fig. 17, P1++P1+....

被検びんjA1本当シ発生する・9ルス数はびん側進行
方向分割数となシ、その上限はラインスキャナ3Aのス
タート間隔時間とびん2ムの送シ速度によシ定t#)、
これによシタイミンググーリ10...11の比”を決
定する。
The number of 9 pulses that occur in the test bottle jA1 is the number of divisions in the bottle side traveling direction, and its upper limit is determined by the start interval time of line scanner 3A and the feeding speed of bottle 2m).
This timing gooley 10. .. .. Determine the ratio of 11.

ここで〜びんがスターホイール4によシ、第22図に示
すように、Xからy−1で移動する間に、検査を終了し
なければならないので、この間にびん胴を所定の進行方
向分割にするためにノ4ルス発生器1#から所定数のノ
譬ルスを発生させ、このために/4ルス発生器16の軸
15の回転数社スターホィール40回転軸10回転数よ
シ増速する必要がある。
At this point, the inspection must be completed while the bottle moves from X to y-1 on the star wheel 4, as shown in FIG. To achieve this, a predetermined number of pulses are generated from the /4 pulse generator 1#, and for this purpose, the number of revolutions of the shaft 15 of the /4 pulse generator 16 is increased from the number of revolutions of the star wheel 40 to the number of revolutions of the shaft 10. There is a need to.

次に1この/4ルスを入力してびん高方向の有効区間を
決定するには、第17図に示すように、被検びん2Aが
Δルスplの位置にあるときはラインスキャナ3Aの有
効視野はHlpPlのときa H*・・・等とする必要
があシ、第18図線その際のラインスキャナのスタート
/4ルス、クロックツやルス、ピrオ信号のタイオング
をびん高に対比して示し、有効視野)I、jH,−・・
は2インスキヤナのクロック/lルスをそれぞれカウン
トすることにより決定し、Hjl、H,、・・・は信号
処理装置18のPROM 10 IIにあらかじめ設定
されている。
Next, in order to determine the effective range in the bottle height direction by inputting 1/4 lus, as shown in FIG. When HlpPl, the field of view must be set to a H*...etc. Figure 18 shows the line scanner's start/4 Luss, clock pulses, Luss, and tie-on of the PirO signal in comparison to the bottle height. (effective field of view) I, jH, --...
is determined by counting the clocks/l pulses of the two scanners, and Hjl, H, . . . are preset in the PROM 10 II of the signal processing device 18.

さらに信号処理装置180作用を第20図について説明
する。
Further, the operation of the signal processing device 180 will be explained with reference to FIG.

すなわち、同図において、びんが検査位置Aに来てトリ
ガー装置19が作動すると、7リツノフロツf F/F
2回路104の出力と次のI々ルス発生器16の出力と
がAND2回路105を経てフリツノ70.7’ F/
’F J回路106およびエンコーダ107へ入力する
That is, in the same figure, when the bottle comes to the inspection position A and the trigger device 19 is activated, the
The output of the second circuit 104 and the output of the next I pulse generator 16 are passed through the AND2 circuit 105 and then output to the second pulse generator 70.7' F/
'F J input to circuit 106 and encoder 107.

7リツグ70ツ7’ F/ff’ 3回路106の出力
はラインスキャナjA、3Bのスタート/譬ルスとそれ
ぞれAND 4回路100に、ID0Bで駒結合され、
びん下部の非検査帯を作るための遅延回路101に、l
0IBへ入力する。次に、7す、fフロラf F/l’
 1回路102人、101Bはびん胴下部非検査帯走査
にセットされ、AND 1回路1081e103Bへ入
力する。
The output of the 7 rig 70 7'F/ff' 3 circuits 106 is connected to the start/example of the line scanners jA and 3B, respectively, and to the AND 4 circuits 100 at ID0B.
l is added to the delay circuit 101 for creating a non-inspection zone at the bottom of the bottle.
Input to 0IB. Next, 7s, f flora f F/l'
One circuit has 102 people, and 101B is set to scan the non-inspection zone at the bottom of the bottle barrel, and is input to AND 1 circuit 1081e103B.

フリッf70ッグF/F j回路101に、101Bが
セ、)されている間のみラインスキャナJA。
Line scanner JA only while 101B is set in flip f70g F/F j circuit 101.

3Bのクリックノ譬ルスはカウントされ、カウント比較
回路109に、109Bはこの最初のハらり/# ルス
でONとなシ、AND3回路1101゜110Bのダー
トをONさせる。
The click noise of 3B is counted, and the count comparison circuit 109 turns on the 109B at this first noise, turning on the dart of the AND3 circuit 1101 and 110B.

一方、AND2回路105の出力パルスはエンコー〆1
01にて符号化され、びん形状によシアらかじめFRO
M J 08に設定されたびん高方向の/?ルス数を、
すなわち、びんが・9ルスP1の位置にあるときはHl
をIP、のときはHlを・・・呼び出し、この値がカウ
ント比較回路〆゛1σ、9A。
On the other hand, the output pulse of the AND2 circuit 105 is
01, and is pre-coded by bottle shape.
/? of the bottle height direction set to M J 08? Lus number,
In other words, when the bottle is in the position of P1, Hl
When is IP, Hl is called, and this value is used as the count comparison circuit 〆゛1σ, 9A.

109Bにそれぞれセットされている。109B respectively.

こうして、AMD1回路103に、103Bからのクロ
ックノヤルスがこのセットされた値を越えると、カウン
ト比較回路1091.109BはそれぞれOFFとなシ
、ANDJ回路110に、110BのダートはOFFと
な、9%r−)ONの間が有効検査区間と々る。
In this way, when the clock noise from 103B to the AMD1 circuit 103 exceeds this set value, the count comparison circuits 1091 and 109B are turned off, and the dart of 110B is turned off to the ANDJ circuit 110. %r-) ON period is the valid test period.

ラインスキャナJA、、9Bからのビデオ信号は異物判
定回路111に、111Bで異物があれば異物信号を出
すので、ANDJ回路1101p110Bのf−)がO
Nの間、異物信号はOR回路112へ入力し、OR回路
112の出力はりセクト装置を駆動するリゼクト回路1
13を作動させる。
The video signals from the line scanners JA, , 9B are sent to the foreign object determination circuit 111, and if there is a foreign object in 111B, a foreign object signal is output, so the f-) of the ANDJ circuit 1101p110B is
During N, the foreign object signal is input to the OR circuit 112, and the output of the OR circuit 112 is the reject circuit 1 that drives the sect device.
13 is activated.

叙上の各部の出力波形紘第21図に示すタイミングチャ
ートに示すようになっている。
The output waveforms of each section described above are as shown in the timing chart shown in FIG.

なお、検査位置Aで検査された被検びん2人は、検査位
置Bに達するまでの間に押し板11により、下記のよう
に、びんの向きを約90°変更する。すなわち、押し板
11は、水平藺的に第13図に示すように、側面的には
第23図に示すように、配置されて、プム等の摩擦係数
の大きな材料で作られておシ、びんが転送され押し板1
1に当接すると、びんの2側には制動力が加わり、びん
は、スターホイール4によりさらに転送されるから、第
13図に示すように、スターホイールの/”+、ト内で
回動し、その回動角度は押え板11のびんに対する当接
長で定まる。勿論、びんの回動手段としては、第24図
に示すように1スターホイール4と対向するエンドレス
ベルトELBをびん2に搗接することによシ強制的にび
ん2を回動するものでもよい。
In addition, the two subjects whose bottles were inspected at the inspection position A change the orientation of the bottle by about 90 degrees using the push plate 11 before reaching the inspection position B, as described below. That is, the push plate 11 is arranged horizontally as shown in FIG. 13 and laterally as shown in FIG. The bottle is transferred to the push plate 1
1, a braking force is applied to the 2 side of the bottle, and the bottle is further transferred by the star wheel 4. As shown in Fig. 13, the bottle rotates within the star wheel's The rotation angle is determined by the contact length of the presser plate 11 with respect to the bottle.Of course, as a means for rotating the bottle, an endless belt ELB facing the 1-star wheel 4 is attached to the bottle 2 as shown in FIG. It is also possible to forcibly rotate the bottle 2 by making contact with it.

こうしてびんの向きは約90°変更されるので、検査位
置人での2インスキヤナ3Aによる検査範囲は、第19
図ハツチング部に示す範囲のみであるが、検査位置Bで
はラインスキャナ3Bによる検査範囲はラインスキャナ
3人による検査範囲と直交する方向になるので、死角を
生ずることなく検査を行なうことができる。
In this way, the orientation of the bottle is changed by approximately 90 degrees, so the inspection range by the 2-in scanner 3A at the inspection position is the 19th
At inspection position B, the inspection range by the line scanner 3B is perpendicular to the inspection range by the three line scanners, although only the range shown in the hatched area in the figure can be inspected without creating a blind spot.

このような装置によれは、びんを回動させながら、びん
の中心線に沿ってのみ検査する従来のものに比べて、び
んの向きを変更することによシ装置が小型化され、単板
のスターホイールを有するびん検査装置にも装着するこ
とが可能となシ、びんのハンドリングが著しく安定し1
rTV又は固体面センサーを用いて検査する従来のもの
に比べて検出部カメラが安価となシ、検査領域を決定す
るメモリーが簡素化される等の卓効を奏する′。
Compared to conventional devices that inspect only along the center line of the bottle while rotating the bottle, the device is more compact by changing the orientation of the bottle, and It can also be installed on bottle inspection equipment with a star wheel, making bottle handling extremely stable.
Compared to conventional inspections using rTV or solid surface sensors, the detection unit camera is cheaper and the memory for determining the inspection area is simplified.

要するに本発明によれば、ラインスキャナによ〕ガラス
びん等の胴部をその中心線方向に走査することによシ欠
陥や異物の存在を検出するようにした検びん装置におい
て、被検びんの中心線の周りの複数の位置を検出する手
段と、上記複数の位置のそれぞれに対応してあらかじめ
定められた有効走査領域信号を発生する手段とを具えた
ことによシ、構造簡単1価格低摩、取扱容易なびん検査
装置を得るから、本発明は産業上極めて有益なものであ
る。
In short, according to the present invention, in a bottle inspection device that detects the presence of defects or foreign matter by scanning the body of a glass bottle or the like in the direction of its center line using a line scanner, It has a simple structure and low cost because it includes a means for detecting a plurality of positions around the center line and a means for generating a predetermined effective scanning area signal corresponding to each of the plurality of positions. The present invention is extremely useful industrially because it provides a bottle inspection device that is easy to use and handle.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は公知の検びん装置を示す平面図、第2図は第1
図の部分拡大縦断面図、第3図は第2図のびんの側面図
、第4図は第2図による受光素子の光量を示す線図、第
5図は公知の検びん装置を示す平面図、第6図は第5図
の部分拡大縦断面図、第7図は第5図の被検びんの拡大
側面図、第8図、第9図はそれぞれ公知の検びん要領を
示す説明図、第10図は公知の検びん装置の平面図、第
11図は第10図の被検びんの検査領域を示す説明図、
第12図は公知の検びん装置を示す平面図、第13図は
本発明の一実施例を示す平面図、第14図は第13図の
拡大縦断面図、第15図は第14図のラインスキャナ視
野と被検びんの非検査帯との関係を示す部分拡大側面図
、゛第16図は第13図の被検ぴんとラインスキャナの
視野との関係を示す部分拡大半面図、第17図は被検び
んの/4ルス信号と有効視野との関係を示す説明図、第
18図はスタートパルス、クロックツ母ルス、ピテオ信
号を示す波形図、第19図はラインスキャナの検査範囲
と被検びんの関係を示す平面図、第20−は第14図の
信号処理装置を示すブロック線図、第21図は第20図
の各部の出方波形図、第22図は第13図の部分拡大図
、第23図は1114図の部分拡大図、第24図は第1
3図の押し板とは異なる他のびん回動手段を示す平面図
である。 1・−:r y ヘヤ、2,2ムt J B・・・被検
びん、3ム、JB・・・ラインスキャナ、4・・・スタ
ーホイール、5・・・拡散板、C・・・光源、7川回転
軸、8゜9・・・ベアリング、10.11・・・タイミ
ングベルト、12・・・タイミングベルト、13.14
・・・ベアリング、15・・・軸、16・・・ノ9ルス
発生器、17・・・押し板、18・・・信号処理装置、
19・・・トリガー装置、100A、100B・・・A
ND 4回路、101に、l01B・・・遅延回路、1
021,102B・・・フリッゾ70ッゾF/ff’ 
1回路、103に、103B・・・AND 7回路、1
04・・・フリッグフロッf F/F 1回路、105
・・・AND2回路、106・・・フリ、fフ四y 7
’ F/’F 3回路、107・・・エンコーダ、10
8・・・FRO′h/i、、1091.109B・・・
カウント比較囲路、110に、110B・・・AND!
回路、111 A * 11 J B・・・異物判別回
路、112・・・0.、R回路、113−9ゼクト回路
。 出願人復代理人  弁理士 鈴 江 武 彦第1図  
     f′IS2図 醋藺〜 第8図 29図 第10図 第12図 q 第13r7I 第14図 第15図 第22 i”7J 24図
Fig. 1 is a plan view showing a known bottle inspection device, and Fig. 2 is a plan view showing a known bottle inspection device.
FIG. 3 is a side view of the bottle shown in FIG. 2, FIG. 4 is a diagram showing the amount of light of the light receiving element according to FIG. 2, and FIG. 5 is a plan view showing a known bottle inspection device. 6 is a partially enlarged vertical sectional view of FIG. 5, FIG. 7 is an enlarged side view of the bottle to be tested in FIG. 5, and FIGS. 8 and 9 are explanatory diagrams showing known bottle testing procedures, respectively. , FIG. 10 is a plan view of a known bottle testing device, and FIG. 11 is an explanatory diagram showing the testing area of the bottle to be tested in FIG. 10.
Fig. 12 is a plan view showing a known bottle inspection device, Fig. 13 is a plan view showing an embodiment of the present invention, Fig. 14 is an enlarged vertical sectional view of Fig. 13, and Fig. 15 is a plan view of Fig. 14. 16 is a partially enlarged side view showing the relationship between the field of view of the line scanner and the non-inspection zone of the bottle to be inspected; FIG. 16 is a partially enlarged half view showing the relationship between the field of view of the line scanner and the line scanner in FIG. Figure 18 is a waveform diagram showing the start pulse, clock pulse, and piteo signal, and Figure 19 shows the line scanner inspection range and the target object. 20- is a block diagram showing the signal processing device of Fig. 14, Fig. 21 is a waveform diagram of each part of Fig. 20, and Fig. 22 is a partial enlargement of Fig. 13. Fig. 23 is a partially enlarged view of Fig. 1114, Fig. 24 is a partial enlarged view of Fig. 1.
FIG. 4 is a plan view showing another bottle rotation means different from the push plate shown in FIG. 3; 1.-:ry hair, 2,2 t J B... test bottle, 3 mu, JB... line scanner, 4... star wheel, 5... diffuser plate, C... Light source, 7 rotation axis, 8°9... Bearing, 10.11... Timing belt, 12... Timing belt, 13.14
...Bearing, 15...Axle, 16...No9 Lux generator, 17...Press plate, 18...Signal processing device,
19...Trigger device, 100A, 100B...A
ND 4 circuits, 101, l01B...delay circuit, 1
021,102B... Frizzo 70 F/ff'
1 circuit, 103, 103B...AND 7 circuits, 1
04...Frigflo f F/F 1 circuit, 105
...AND2 circuit, 106...Furi, fF4y 7
'F/'F 3 circuits, 107...Encoder, 10
8...FRO'h/i,, 1091.109B...
Count comparison circle, 110, 110B...AND!
Circuit, 111 A * 11 J B...Foreign object discrimination circuit, 112...0. , R circuit, 113-9 sect circuit. Applicant Sub-Agent Patent Attorney Takehiko Suzue Figure 1
f'IS2 Figure 8 Figure 29 Figure 10 Figure 12 q 13r7I Figure 14 Figure 15 Figure 22 i"7J 24

Claims (1)

【特許請求の範囲】[Claims] ラインスキャナによシガラスびん等の胴部をその中心線
方向に走査することにょシ欠陥や異物の存在を検出する
ようにした検びん装置において、被検びんの中心線の周
シの複数の位置を検出する手段と、上記複数の位置のそ
れぞれに対応してあらかじめ定められた有効走査領域′
信号を発生する手段とを具えたことを特徴とする検びん
装置。
In a bottle inspection device that uses a line scanner to scan the body of a glass bottle, etc. in the direction of its center line, the presence of defects or foreign matter is detected at multiple positions around the center line of the bottle to be inspected. and a means for detecting an effective scanning area 'predetermined in advance corresponding to each of the plurality of positions.
A bottle inspection device comprising: means for generating a signal.
JP16968781A 1981-10-23 1981-10-23 Inspecting apparatus for bottles Pending JPS5871442A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16968781A JPS5871442A (en) 1981-10-23 1981-10-23 Inspecting apparatus for bottles

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16968781A JPS5871442A (en) 1981-10-23 1981-10-23 Inspecting apparatus for bottles

Publications (1)

Publication Number Publication Date
JPS5871442A true JPS5871442A (en) 1983-04-28

Family

ID=15891032

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16968781A Pending JPS5871442A (en) 1981-10-23 1981-10-23 Inspecting apparatus for bottles

Country Status (1)

Country Link
JP (1) JPS5871442A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60213336A (en) * 1984-04-07 1985-10-25 Sintokogio Ltd Molding of self-curing casting mold
JPS60223638A (en) * 1984-04-20 1985-11-08 Sintokogio Ltd Molding method of self-curing casting mold
JPS6466547A (en) * 1987-09-08 1989-03-13 Nissan Motor Detection of surface defect

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5546172A (en) * 1978-09-29 1980-03-31 Kirin Brewery Co Ltd Detector for foreign material

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5546172A (en) * 1978-09-29 1980-03-31 Kirin Brewery Co Ltd Detector for foreign material

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60213336A (en) * 1984-04-07 1985-10-25 Sintokogio Ltd Molding of self-curing casting mold
JPS60223638A (en) * 1984-04-20 1985-11-08 Sintokogio Ltd Molding method of self-curing casting mold
JPH0227059B2 (en) * 1984-04-20 1990-06-14 Sintokogio Ltd
JPS6466547A (en) * 1987-09-08 1989-03-13 Nissan Motor Detection of surface defect

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