JPS5868651A - Tester for surface of photosensitive film - Google Patents

Abstract

PURPOSE:To enable to perform an easy detection of the presence and a place of a defect on a surface, by a method wherein infrared light by reflected light or transmitted light from a surface to be inspected of a photosensitive film is collected by a detecting part via a detecting lens. CONSTITUTION:In a tester, an infrared transmitting filter is used as a filter 2, and arrayed solid photographing element consisting of, for example, CCD, photo diode element, which are aligned rectilinearly, are used as a detecting part 12. A video signal, proportioning a light volume from the photographing elements, is fetched from the detecting part 12, and a defect is detected using a detecting circuit to display it in a display mechanism. The alignment in parallel of a number of the elements permits the accurate finding of a place of a defect on a film surface and enables the easy detection of the presence and the place of the defect on the surface.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a photosensitive film surface inspection device, and particularly to a photosensitive film surface inspection device using an arrayed solid-state image pickup device in its detection section.
The present invention relates to a one-sided inspection device.

Conventional photosensitive film surface inspection equipment is H・-N・
A 7-twin dust spot method using a laser, etc., and a rotating polygon mirror is used, but such a method may cause fogging on panchromatic photosensitive films due to its emission wavelength. Since the flying spot method involves mechanical movement of the rotating polygon mirror by rotating it at high speed, maintenance is difficult and there are problems with breakdowns. It was difficult to obtain a high level of inspection, and the large size was chosen to compensate for variations in the light receiving area due to differences in the degree of inclination. There were some flaws such as:

Furthermore, when printing in an enlarged manner such as a negative film or enlarging and projecting a film such as a reversal film, even the occurrence of very small defects poses a practical problem.

An object of the present invention is to provide a photosensitive film surface inspection device that eliminates the above-mentioned conventional drawbacks.

The surface inspection device for a photosensitive film of the present invention causes a detection unit to receive infrared light reflected or transmitted from a surface to be inspected of a photosensitive film through a detection lens, and connects the detection unit to an array-shaped solid state. The video signal is formed by an image sensor, and a video signal obtained from the arrayed solid-state image sensor is displayed by a display mechanism.

The present invention will be described in detail below with reference to the drawings.

In Figure 1, 1 is a light source such as a tungsten lamp or halogen lamp that illuminates the subject, 2 is a filter to obtain light that is not sensitive to the photosensitive film, 3 is the first condenser lens, 4 is a cylindrical lens, and 5 is a cylindrical lens. a second condenser lens; 6 a roll for conveying the photosensitive film 7;
Reference numeral 9 indicates an area to be inspected on the surface of the photosensitive film 7 by one light source, 10 indicates a defect such as a scratch on the film surface, 11 indicates a detection lens, and 12 indicates a detection section. In addition to using a filter, the detection unit 1
As 2, an array-like solid-state sensor consisting of 9 linearly arranged elements such as COD, 7 Otodiode elements, etc. is used, and a video signal proportional to the amount of light is taken out from the detection unit 12 from the O image sensor and a detection circuit is used. A display mechanism (not shown) is used to find defects and display them on a display mechanism (not shown).

According to the apparatus of the present invention, the nine video signals obtained from the detection section 12 are of the form in which the defect indication pulse 14 is generated between the synchronization pulses 13 and 13, as shown in FIG. Locations can be easily detected.

The width of each image sensor that makes up the CCD and photodiode array is extremely small, around 10 microns, and has high resolving power, making it possible to detect even the smallest defects without particularly increasing the magnification of the detection lens. It is particularly excellent as a detection part for photosensitive films.

Furthermore, the arrayed solid-state imaging device used as the detection section in the present invention has excellent applicability in the longitudinal direction and high-speed conveyance, and can also use unsensitized light for photosensitive materials such as photosensitive films. By arranging a large number of each element in parallel, it is possible to accurately identify the location of a defect on the film surface, and the information can be captured and the defect location easily removed when cutting the photosensitive film in post-processing.

Incidentally, since scratches on the film surface are generally formed in a long and narrow manner in the film transport direction, each element 12' constituting the detection section 12 of the present invention may be a rectangular element that is long in the vertical direction as shown in Figure @3. This is preferable since the S/N can be increased and the detection output can be increased. In addition, in the present invention, as shown in FIG. It is also possible to inspect a wide film at the same time by installing it continuously in the same straight line.

The device of the present invention has extremely high reliability as there are no mechanically moving parts unlike the conventional flying spot or flying image method using a galvano mirror. This is a very important factor considering that the process is dark, such as in a photosensitive film manufacturing factory, and inspection equipment cannot be adjusted during production.

Furthermore, there is no residual effect, which is a problem when using a camera tube such as a vidicon in the detection section, making it suitable for on-line inspection.

Furthermore, if an infrared laser is used in the flying spot method, its optical adjustment becomes difficult, but in the present invention, the light source 1
A tungsten lamp fitted with an infrared filter can be used as an infrared lamp, and it has great advantages such as the ease of optical adjustment by temporarily removing the filter.

[Brief explanation of drawings]

Figure @1 is an explanatory diagram of the apparatus of the present invention, Figure @2 is a waveform diagram of the detected video signal, Figure 3 is a detailed diagram of the detection section, and Figure 4 is an explanatory diagram of another embodiment of the apparatus of the present invention. . l...Light source, 2...Filter, 3...First condenser lens, 4...Cylindrical lens, 5...
- Second condenser lens, 6... Roll, 7... Photosensitive film, 9... Inspection area, 1O... Defect location, 11... Detection lens, 12... Detection section, 12 ′・
... Element, 13... Synchronization pulse, 14... Defect indication pulse, 15... Illumination system. +1 yen+20 130 12' 弗40 2

Claims (1)

[Claims] (1) Infrared light reflected or transmitted from the surface to be inspected of the photosensitive film is received by a detection section through a detection lens, and the detection section is formed by an array of solid-state image sensors, and the array 1. An apparatus for inspecting the surface of a photosensitive film, characterized in that it is configured to display a video signal obtained from a solid-state image pickup device using a display mechanism.