JPS5865145A - 超音波断層検査装置 - Google Patents

超音波断層検査装置

Info

Publication number
JPS5865145A
JPS5865145A JP56162465A JP16246581A JPS5865145A JP S5865145 A JPS5865145 A JP S5865145A JP 56162465 A JP56162465 A JP 56162465A JP 16246581 A JP16246581 A JP 16246581A JP S5865145 A JPS5865145 A JP S5865145A
Authority
JP
Japan
Prior art keywords
sound wave
ultrasonic tomographic
variable delay
piezoelectric
ultrasonic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56162465A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6366218B2 (enrdf_load_stackoverflow
Inventor
川渕　正己
村松　文夫
孝悦 斉藤
福本　晃
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP56162465A priority Critical patent/JPS5865145A/ja
Publication of JPS5865145A publication Critical patent/JPS5865145A/ja
Publication of JPS6366218B2 publication Critical patent/JPS6366218B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Ultra Sonic Daignosis Equipment (AREA)
JP56162465A 1981-10-12 1981-10-12 超音波断層検査装置 Granted JPS5865145A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56162465A JPS5865145A (ja) 1981-10-12 1981-10-12 超音波断層検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56162465A JPS5865145A (ja) 1981-10-12 1981-10-12 超音波断層検査装置

Related Child Applications (2)

Application Number Title Priority Date Filing Date
JP63171274A Division JPH064071B2 (ja) 1988-07-08 1988-07-08 超音波断層検査装置
JP63171273A Division JPH01158939A (ja) 1988-07-08 1988-07-08 超音波断層検査装置

Publications (2)

Publication Number Publication Date
JPS5865145A true JPS5865145A (ja) 1983-04-18
JPS6366218B2 JPS6366218B2 (enrdf_load_stackoverflow) 1988-12-20

Family

ID=15755130

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56162465A Granted JPS5865145A (ja) 1981-10-12 1981-10-12 超音波断層検査装置

Country Status (1)

Country Link
JP (1) JPS5865145A (enrdf_load_stackoverflow)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57174919A (en) * 1981-04-22 1982-10-27 Olympus Optical Co Ltd Surface wave delaying device
JPS57175265A (en) * 1981-04-22 1982-10-28 Olympus Optical Co Ltd Delaying device of ultrasonic wave
JPS57200139A (en) * 1981-06-05 1982-12-08 Olympus Optical Co Ultrasonic inspecting apparatus
JPS57200140A (en) * 1981-06-05 1982-12-08 Olympus Optical Co Ultrasonic inspecting apparatus

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57174919A (en) * 1981-04-22 1982-10-27 Olympus Optical Co Ltd Surface wave delaying device
JPS57175265A (en) * 1981-04-22 1982-10-28 Olympus Optical Co Ltd Delaying device of ultrasonic wave
JPS57200139A (en) * 1981-06-05 1982-12-08 Olympus Optical Co Ultrasonic inspecting apparatus
JPS57200140A (en) * 1981-06-05 1982-12-08 Olympus Optical Co Ultrasonic inspecting apparatus

Also Published As

Publication number Publication date
JPS6366218B2 (enrdf_load_stackoverflow) 1988-12-20

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