JPS5856351A - 半導体装置の検査方法 - Google Patents
半導体装置の検査方法Info
- Publication number
- JPS5856351A JPS5856351A JP15587381A JP15587381A JPS5856351A JP S5856351 A JPS5856351 A JP S5856351A JP 15587381 A JP15587381 A JP 15587381A JP 15587381 A JP15587381 A JP 15587381A JP S5856351 A JPS5856351 A JP S5856351A
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- measured
- sealing
- voltage
- sealing hole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15587381A JPS5856351A (ja) | 1981-09-29 | 1981-09-29 | 半導体装置の検査方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15587381A JPS5856351A (ja) | 1981-09-29 | 1981-09-29 | 半導体装置の検査方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5856351A true JPS5856351A (ja) | 1983-04-04 |
| JPH0121621B2 JPH0121621B2 (enrdf_load_html_response) | 1989-04-21 |
Family
ID=15615364
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15587381A Granted JPS5856351A (ja) | 1981-09-29 | 1981-09-29 | 半導体装置の検査方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5856351A (enrdf_load_html_response) |
-
1981
- 1981-09-29 JP JP15587381A patent/JPS5856351A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0121621B2 (enrdf_load_html_response) | 1989-04-21 |
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