JPS585621A - Optical temperature measuring method - Google Patents
Optical temperature measuring methodInfo
- Publication number
- JPS585621A JPS585621A JP10374581A JP10374581A JPS585621A JP S585621 A JPS585621 A JP S585621A JP 10374581 A JP10374581 A JP 10374581A JP 10374581 A JP10374581 A JP 10374581A JP S585621 A JPS585621 A JP S585621A
- Authority
- JP
- Japan
- Prior art keywords
- delay time
- light
- temperature
- excited
- phosphor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims description 15
- 230000003287 optical effect Effects 0.000 title claims description 15
- 238000009529 body temperature measurement Methods 0.000 claims abstract description 10
- 238000004020 luminiscence type Methods 0.000 claims abstract description 4
- 230000005284 excitation Effects 0.000 claims description 20
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 12
- 239000000463 material Substances 0.000 claims description 6
- 230000000638 stimulation Effects 0.000 claims description 3
- 239000000126 substance Substances 0.000 abstract 3
- 238000000926 separation method Methods 0.000 abstract 2
- 230000001678 irradiating effect Effects 0.000 abstract 1
- 239000013307 optical fiber Substances 0.000 abstract 1
- 238000005424 photoluminescence Methods 0.000 description 16
- 238000010586 diagram Methods 0.000 description 6
- 238000005259 measurement Methods 0.000 description 5
- 238000005070 sampling Methods 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/58—Photometry, e.g. photographic exposure meter using luminescence generated by light
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Radiation Pyrometers (AREA)
Abstract
Description
【発明の詳細な説明】
この発明は光刺激によるシル螢光体のホトルミネッセン
スが温度に依存することを利用して、被測温体のIL変
を測定する光学的温度計測方法(関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an optical temperature measurement method for measuring IL changes in a body to be measured by utilizing the fact that photoluminescence of a phosphor caused by light stimulation depends on temperature.
周知のように、被測温体の温度雰囲気中に配置されたシ
ん螢光体に光刺激を与えると、シん螢光体性ホトルミネ
ッセンスを発生する。第1図は光刺激として励起光パル
スAと、これによるホトルミネッセンスBとの関係を示
してお夛、ホトルミネッセンスBの発光強直Itと残光
の減衰時間Tdとはそれぞれ温度(依存した特性を有し
ている。As is well known, when optical stimulation is applied to a phosphor placed in the temperature atmosphere of a temperature-measuring object, phosphor photoluminescence is generated. Figure 1 shows the relationship between an excitation light pulse A as a light stimulus and photoluminescence B resulting from this. have.
従来%シん螢光体を温度センナとする光学的温度計測方
法には、励起光パルスAの持続時間中にりん螢光体の発
光強度Itを測定する方法がある。A conventional optical temperature measurement method using a phosphor as a temperature sensor includes a method of measuring the emission intensity It of the phosphor during the duration of an excitation light pulse A.
この場合には、励起光性パルスである必*11.ないが
、測定はリアルタイムに行なう必要がある。また、励起
光とそれ(よるホトルミネッセンスとが近接した波長で
ある場合には、これらを分離して検出することが困難で
、そのため特別のフィルターを要するなど検出器の光学
、系が複雑になるという欠点がある。In this case, the excitation light pulse must be *11. However, measurements need to be made in real time. Furthermore, if the excitation light and its photoluminescence have similar wavelengths, it is difficult to separate and detect them, which requires special filters and complicates the optics and system of the detector. There is a drawback.
そこで、この欠点を除く方法として、減衰時間Tdt−
測定する方法が提案されている。この方法によれば、励
起光パルスAとホトルミネッセンスBとの分離検出は容
易となる。しかし、減衰時間Tdはシん螢光体の材質(
もよるが、数十時間のオーダ(及ぶものもあり、計測時
間が長くなるという欠点がある。Therefore, as a method to eliminate this drawback, the decay time Tdt-
A method for measuring this has been proposed. According to this method, the excitation light pulse A and the photoluminescence B can be easily detected separately. However, the decay time Td depends on the material of the phosphor (
Depending on the situation, the measurement time can be on the order of several tens of hours (some even extend), so the disadvantage is that the measurement time is long.
この発明唸このような従来の欠点罠鑑みなされたもので
あり%シん螢光体を一励起停止してからホトルミネッセ
ンスの残光強度が減衰を始めるまでの減衰遅れ時間にも
温度依存性があることに着口して、この減衰遅れ時間を
測定することにより、励起光とホトルミネッセンスとの
分離検出が容易で、かつ、高速な電電計測を可能とする
光学的温度計測方法を提供することを目的とするもので
ある。This invention was made in view of the drawbacks and traps of the conventional technology, and the attenuation delay time from when the phosphor is stopped once to when the afterglow intensity of photoluminescence starts to attenuate is also temperature dependent. To provide an optical temperature measurement method that facilitates separate detection of excitation light and photoluminescence and enables high-speed electro-electric measurement by measuring this decay delay time. The purpose is to
以下、この発明の実施例を添付図面に基づいて詳細に説
明する。Embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
第1図および第2図はこの発明の一実施例を示す図であ
る。第1図において、発光器1社制御回路2の電気信号
に基づいて一定の励起光パルスAを発生し、この励起光
パルスAte光学系3を介してシん螢光体4に照射され
るよう(なっている。FIG. 1 and FIG. 2 are diagrams showing one embodiment of the present invention. In FIG. 1, a constant excitation light pulse A is generated based on an electric signal from a control circuit 2 of a light emitter, and the excitation light pulse A is irradiated onto a phosphor 4 via an optical system 3. (It has become.
りん螢光体4け、被測温体の温度の影響を受ける雰囲気
5内に配置され、励起パルスAKよって発生し九ホトル
ミネッセンスBは光学系6を介して受光器7に導かれて
いる。このとき、ホトルミネッセンスBは、雰囲気5の
温度に依存した発光特性を有しており、受光器7で第3
図(示すような電気信号(変換され、制御回路2に入力
される。Four phosphor phosphors are placed in an atmosphere 5 that is affected by the temperature of the object to be measured, and photoluminescence B generated by an excitation pulse AK is guided to a light receiver 7 via an optical system 6. At this time, the photoluminescence B has emission characteristics that depend on the temperature of the atmosphere 5, and the photoluminescence B has a luminescence characteristic that depends on the temperature of the atmosphere 5, and is
An electrical signal as shown in the figure (converted and input to the control circuit 2).
制御回路2では1周知のサンプリング・ホールド技術な
どによって、減衰遅れ時間Tddl 、 T4d露
を計測して、この減衰遅れ時間Tdd1. Tddt
に対応する温[Tt、T意がそれぞれ求められる。In the control circuit 2, the decay delay time Tddl and T4d exposure are determined by well-known sampling and hold technology.
This attenuation delay time Tdd1. Tddt
The corresponding temperatures [Tt and Tt] are respectively determined.
減衰遅れ時間Tddt 、 Tddlは一定の基準であ
る励起停止、この実施例ではりん螢光体を励起する励起
光パルスの立ち下がりを基準として測定され、ホトルミ
ネツセンろBの残光強度が一定レベルから減衰を始める
点までの時間である。この残光強度が一定レベルから減
衰を始める点は周知の技術。The decay delay times Tddt and Tddl are measured based on a fixed reference excitation stop, in this example, the falling edge of the excitation light pulse that excites the phosphorescent material, and the afterglow intensity of the photoluminescent filter B decays from a fixed level. is the time up to the point where . It is a well-known technology that this afterglow intensity begins to attenuate from a certain level.
例えばサンプリング技術(よって容易に検出できるO
なお、一定の基準である励起停止呟発光器1を駆動する
制御回路2の電気信号パルスの立ち下がシでも構わない
。For example, a sampling technique (therefore, it can be easily detected) may be used. Note that the falling edge of the electric signal pulse of the control circuit 2 that drives the excitation/stop light emitting device 1, which is a fixed reference, may also be used.
ホトルミネッセンスBの残光の減衰遅れ時間Tdd呟第
1図で説明した減衰時間Tdよシ龜一般に411いので
、この発明(係る方法とすれば、温度計測が迅速に行な
える。また、残光特性を利用するので、励起光とホトル
きネッセンスとの分離は自然になされている。Since the attenuation delay time Tdd of the afterglow of photoluminescence B is generally 411 times longer than the attenuation time Td explained in FIG. Since the characteristics are utilized, excitation light and photoluminescence can be separated naturally.
従って、第4図(示すように、当誼温賓計測装置を簡単
化できる。すなわち、往復の光学系を1つの光ファイバ
10で実現し、ビームスグリツタ11に:よって、励起
光パルス人とホトルミネッセンスBと分離すれば良い。Therefore, as shown in FIG. It is sufficient to separate it from photoluminescence B.
次に、第5図はこの発明の他の実施例を示す図である。Next, FIG. 5 is a diagram showing another embodiment of the present invention.
第1の実施例では、励起光パルスAの繰り返し周期を残
光時間よりも長くシ九場合の例であるが、残光の減衰遅
れ時間を測定するのであるから、励起光パルスAの繰〕
返し周期は減衰遅れ時間よりも若干長くすれば、第5図
に示すよう(、減衰遅れ時間Tddt −Tddn
を繰り返し測定することができる。従って、減衰遅れ時
間T’dd ti 、減衰過程から再励起されるT(1
(1t〜’rcid=の平均値、Tdd−一んTddk
i−1
として求められ、計測の精度を高めることができる。In the first embodiment, the repetition period of the excitation light pulse A is longer than the afterglow time, but since the attenuation delay time of the afterglow is measured, the repetition period of the excitation light pulse A is
If the return cycle is made slightly longer than the attenuation delay time, the attenuation delay time Tddt −Tddn
can be measured repeatedly. Therefore, the decay delay time T'dd ti and the re-excited T(1
(It is obtained as the average value of 1t~'rcid=, Tdd-1Tddk i-1, and the accuracy of measurement can be improved.
以上詳述したように、この発明忙よれば、りん螢光体が
発するホトルミネッセンスの減衰遅れ時間を測定するよ
う(したので、励起光とそれ(よる発光との分離が容易
にでき、かつ高速な温度計測のできる光学的温度計測方
法を提供することができる。As detailed above, according to the present invention, it is possible to measure the decay delay time of photoluminescence emitted by a phosphorescent material, which makes it possible to easily separate excitation light from the light emitted by it, and at a high speed. Therefore, it is possible to provide an optical temperature measurement method that can perform accurate temperature measurement.
【図面の簡単な説明】
第1図はりん螢光体のホトルミネッセンスの残光特性説
明図、第2図および第4図はこの発明忙係る光学的温度
計測装置を示す概略構成図、第3図はこの発明に係る光
学的温度計測方法の一実施例を示す説明図、第5vAは
この発明の他の実施例を示す説明図である。
4−・・・・・・・ りん螢光体
A・・・・・・・・・励起光ハルス
B・・・・・・・・・ホトルミネッセンス()(ルス発
光)Tddl、Tdd@、・・−・・Tddn””・・
・減衰遅れ時間特許出願人
立石電機株式会社
第1図
d
第2図
第3図
手続補正書
昭和56年8A14日
特許庁長官 島 1)春 樹 殿
l 事件の表示
特願昭56−103745号
2、発明の名称
光学的温度計測方法
3、 補正をする者
事件との関係 特許出願人
住 所 京都市右京区花園土堂町10番地名 称 (2
94)立石電機株式会社
代表者立石孝雄
4、代理人
住 所 東京都千代田区内神田1丁目15番16号6、
補正の対象
明細書の発明の詳細な説明の橢
7、補正の内容
明細書の第3頁第3行目に[数十時間−1とあるのを、
[数十msJと補正する。[BRIEF DESCRIPTION OF THE DRAWINGS] Fig. 1 is an explanatory diagram of the afterglow characteristics of photoluminescence of a phosphorescent material, Figs. 2 and 4 are schematic configuration diagrams showing the optical temperature measuring device according to the present invention, and Fig. 3 The figure is an explanatory diagram showing one embodiment of the optical temperature measuring method according to the present invention, and 5th vA is an explanatory diagram showing another embodiment of the present invention. 4-... Phosphorescent material A... Excitation light Hals B... Photoluminescence () (Lus emission) Tddl, Tdd@,...・-・Tddn””・・
・Attenuation delay time patent applicant Tateishi Electric Co., Ltd. Figure 1 d Figure 2 Figure 3 Procedural amendments dated 8A14, 1980 Director General of the Japan Patent Office Shima 1) Haruki Tonol Case Indication Patent Application No. 103745 No. 1988 2 , Name of the invention Optical temperature measurement method 3, Relationship to the case of the person making the amendment Patent applicant address 10 Hanazono Tsuchido-cho, Ukyo-ku, Kyoto City Name (2)
94) Tateishi Electric Co., Ltd. Representative: Takao Tateishi 4, Agent address: 1-15-16-6 Uchikanda, Chiyoda-ku, Tokyo.
In column 7 of the detailed description of the invention in the specification subject to amendment, in the third line of page 3 of the specification of contents of the amendment, [several tens of hours -1]
[Corrected to several tens of msJ.
Claims (1)
を利用する光学的温度計測方法において。 被測温体の温度の影響を受ける位置にシん螢光体を配置
し、これに一定の励起光パルスを照射してパルス発光さ
せ、骸りん螢光体を励起停止してから前記パルス発光の
発光強度が減衰を開始するまでの減衰遅れ時間を測定す
るようにし危ことを特徴とする光学的温度計測方法。 セ) 前記)ん螢光体を一定の励起光パルスで連続的に
照射して、前記減衰遅れ時間を繰に返し測定するように
したことを特徴とする特許請求の範囲第1現記、載の光
学的温度計測方法。[Claims] U) In an optical temperature measurement method that utilizes the temperature dependence of the luminescence characteristics of a phosphorescent material due to optical stimulation. A phosphor is placed at a position that is affected by the temperature of the body to be measured, and a constant excitation light pulse is irradiated onto it to cause it to emit pulsed light.After the excitation of the phosphor is stopped, the pulsed light is emitted. An optical temperature measurement method characterized in that the attenuation delay time until the luminescence intensity starts to attenuate is measured. c) The above-mentioned phosphor is continuously irradiated with a constant excitation light pulse, and the decay delay time is repeatedly measured. optical temperature measurement method.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10374581A JPS585621A (en) | 1981-07-02 | 1981-07-02 | Optical temperature measuring method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10374581A JPS585621A (en) | 1981-07-02 | 1981-07-02 | Optical temperature measuring method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS585621A true JPS585621A (en) | 1983-01-13 |
Family
ID=14362129
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10374581A Pending JPS585621A (en) | 1981-07-02 | 1981-07-02 | Optical temperature measuring method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS585621A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02223865A (en) * | 1988-12-16 | 1990-09-06 | Eslab Srl | Sensor for energy measurement and energy measuring apparatus |
-
1981
- 1981-07-02 JP JP10374581A patent/JPS585621A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02223865A (en) * | 1988-12-16 | 1990-09-06 | Eslab Srl | Sensor for energy measurement and energy measuring apparatus |
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