JPS5855534B2 - System test method - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a system testing method in a data transmission system, such as a loop data transmission system.

In a data transmission system, for example, a central processing unit,
When process input/output devices and peripheral devices are configured and assembled according to the user's purpose and use, the operation check is generally performed by loading a test program suitable for each device such as the above-mentioned devices and devices. It was done by

For this reason, the person in charge has to carry out procedures such as loading and starting the test program according to the device each time, which is extremely complicated and inefficient.

Particularly in cases where the remote stations are typically located far from the master station, such as in a loop data transmission system, personnel must travel to each remote station and perform the tests using the method described above. However, there was a problem that the process became even more complicated and inefficient.

This invention has been made in view of the above circumstances, and its purpose is to register configuration information of devices to be tested in a terminal processing system in a central information processing system in a data transmission system, and to By inputting information from the outside, the central information processing system creates a predetermined test program and transmits it to the corresponding terminal processing system via this test program transmission path, so that the person in charge can It is possible to test a predetermined device of the terminal processing system without going to the installation location of the processing system and loading a test program corresponding to the configuration of the device to be tested in that system, which significantly improves efficiency. It is to provide an extremely convenient system test method to obtain.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention applied to, for example, a loop data transmission system will be described below with reference to the drawings.

Figure 1 schematically shows the overall hardware configuration. For example, on two transmission lines there are a master station (hereinafter simply referred to as MST) 1 and a plurality of remote stations (hereinafter simply referred to as R8T). )20.2°, . . . 2n are connected in cascade.

A main processing unit (hereinafter simply referred to as HCPU) 3 that controls the overall management is connected to the MST 1, and this HCPU has a typewriter (hereinafter simply referred to as TW) that communicates with this HCPU 3 and prints data. (hereinafter simply referred to as O8) 4, a paper tape reader (hereinafter simply referred to as PTR) 5 for inputting programs and configuration information of the device under test, and a program configuring an operating system (hereinafter simply referred to as O8) 11 to be described later. An auxiliary storage device (hereinafter simply referred to as BULK memory) 6 in which various service programs, test programs, and the like are stored is connected.

And these MSTl, HCPU3, DingW4゜P
The TR5, BULK memory 6, etc. constitute a central information processing system CIPS.

On the other hand, for example, R8T2O, 2□, ..., 2n each include a terminal processing device (hereinafter simply referred to as CPU) 7,
.

7□, ..., 7n are connected, and these CPUs
7,+72p''·t7n is configured to exchange programs, data, etc. with the HCPU 3 via a transmission path.

In addition, except for the above CPU 7, <CPU72. ..., 7
n, for example, a cathode ray tube display device, a line printer,
Devices 8 such as PTR and TW are connected to the CPU 73
In addition to the above-mentioned device 8, a process input/output device (hereinafter simply referred to as PIO) 9 is connected to the CPU 7n as shown in the figure.

The CPUs 70, 7□, ..., 7n and various devices 8 connected to these R8T21, 2□, ..., 2n1 are each connected to a terminal processing system TPS.
It consists of

FIG. 2 schematically shows the entire software configuration in relation to the hardware configuration described above, where 11 is O8,
12 online the HCPU 3 and each CPU 70
．． ...A service program that allows you to talk with t7n (
(hereinafter referred to as the OPX service program).

With this OPX service program 12, the PTR
In addition to inputting the program from 5 and the configuration information of the device under test, conversation with the TW 4, printing of reports (key human power) and test results, etc. are performed.

13 is an initial loader 14 provided in the MST 1
15 is an initial loading service program for MST for so-called initial loading which initializes all systems and enables data transfer by activating each R8T24. ..., 2
Initial loaders 161 .・・・
・This is an initial loading service program for R8T that makes a load request to the MSTI by activating 16n, and by this request, the MSTI initializes the corresponding system and enables the transfer of data, etc. .

17 is the R8T2 according to the test execution order table described later.
A test program execution management service program 1 that controls the execution of a test program 18 that tests a device connected to O, . . . , 2n (device under test);
9 is a test program editing service program that edits the test program 18 according to the configuration information of the device under test, etc.; 20 is the HCP at the time of initial loading;
Data input/output service program for transmitting data, programs, etc. to U3, 210. ....

21n is the same as above, each CP at the time of initial loading.
U70. ..., data input/output service program for transmitting data and programs to 7n, 22
is a line monitoring and control service program for monitoring lines and handling line abnormalities.

FIG. 3 shows each R8T2O input from the PTR5,
. . t 2 Indicates various tables created based on the configuration information of the device under test for each n and stored in the BULK memory 6. For example, a is a test execution order table that indicates the test execution order, and b is a table that indicates the test execution order. is the configuration table of the device under test, and C is the address table of the device under test.

Next, the operation in such a configuration will be explained.

First, the initial loader 14 is activated in order to test the various devices that constitute each terminal processing system TPS,
Initial loading service program 1 for MST
Initial loading shall be performed based on 3.

This initializes all systems, LMSTl and each R8T2.

... between y2n, as well as the above MST1 and each R8
HCP via T 21 t” and t 2 n, respectively.
U3 and each CPU70. ...It becomes possible to transfer data between s7n.

Next, the configuration information of the device under test connected to each R8T2O, ..., 2n from PTR5 is transmitted to each R8T2.
O,..., input every 2n, this causes HCPU3
registers the configuration information of the device under test in the BULK memory 6.

Then, the HCPU 3 operates as shown in FIGS. 3a and 3b based on the registered configuration information and a predetermined program.

A test execution order table, a configuration table for the device under test, and an address table for the device under test as shown in FIG. C are created and stored in the BULK memory 6.

Next, when the key human power to start the test is performed from TW4, H
Based on the configuration table and address table of the device under test stored in the BULK memory 6, the CPU 3 creates a test program 18 suitable for the configuration of the device under test according to instructions from the test program editing service program 19.

This test program 18 is for each terminal processing system TPS.
That is, each R8T21. . . , is created every 2n.

Next, the HCPU 3 receives a command from the test program execution management service program 17 to connect the CPU 7 connected to, for example, the R8T2 according to the test execution order table.
A procedure for transferring a test program 18 for testing .

Then, the HCPU 3 transfers the predetermined test program 18 to the R8T 2 via the transmission path in accordance with the command from the data input/output service program 20.

The CPU 7 executes the transferred test program 18.
When received from ST 2, the above test program 18 is executed by the command of the data input/output service program 21.
Test according to the method and send the results via MS T1
Transfer to CPU3.

The data input/output service program 21□ and the data input/output service program 20 are executed by the CPU 7 and HCPU 3, respectively, during initial loading.
has been transferred to.

When HCPU3 receives the test results of CPU7,
The results are stored in the BULK memory 6, and in the case of failure, for example, the contents are printed on the TW 4.

On the other hand, the HCPU 3 again performs the transfer procedure for the next test program 18 according to the test execution order table according to the command from the test program execution management service program 17, and transfers this test program 18 to RS T 2 according to the command from the data input/output service program 20. Transfer to.

In this way, when all of the test devices connected to R8T2 are sequentially tested, the test device connected to R8T2□, for example, is tested next, followed by R8T23,
R8T24. All devices under test are tested in the order of...

In the above embodiment, the case where all terminal processing systems are tested has been described, but it goes without saying that any device of any terminal processing system can be selected and tested.

In addition, although the case where initial loading is performed by starting the initial loader 14 on the MSTl side has been described, each R8T24. ...tZn side initial loader 160. . . , all or necessary components of 16n may be activated to perform initial loading.

In addition, although the case where the test program 18 is obtained by inputting the configuration information of the device under test from the PTR 5 has been described, when obtaining the test program 18 that requires data input such as parameters, predetermined data is input from the TW 4. Of course, it can be input directly.

In addition, although we have explained the case where the CPUs 70.-. According to the test signal from the HCPU 3, the corresponding device 8 can be tested.

Moreover, although the case has been described in which the test is carried out to confirm the operation when a loop data transmission system is installed, it goes without saying that the test can also be carried out in system diagnosis on the user side.

Further, although the case where the present invention is implemented in a loop type data transmission system has been described, the present invention can be implemented in any data transmission system including a central information processing system and a terminal processing system, regardless of the method.

As detailed above, according to the present invention, in a data transmission system, by inputting the configuration information of the device to be tested of the terminal processing system into the central information processing system,
The central information processing system creates a predetermined test program and transmits this test program to the corresponding terminal processing system via a transmission line, so that a person in charge goes to the location where the terminal processing system is installed. We have developed an extremely convenient system test method that can test a given device in the terminal processing system without having to load a test program according to the configuration of the device to be tested in that system, and can significantly improve efficiency. Can be provided.

[Brief explanation of the drawing]

The drawings show an embodiment of the present invention; FIG. 1 shows the overall hardware configuration, FIG. 2 shows the overall software configuration, and FIGS. 3 a to 3 c show a test execution order table and a device under test, respectively. These are the configuration table of the device under test and the address table of the device under test. L...Transmission line, CIPS...Central information processing system, TPS...Terminal processing system,
3...Main processing unit HCPU, 4...Typewriter TW, 5...Paper tape reading device PT
R, 6... Auxiliary storage device (BULK memory),
17...Test program execution management service program, 18...Test program, 19.
...Test program editing service program,
20,210. ..., 21n...Data input/output service program.

Claims (1)

[Claims] 1 Data transmission between a central information processing system that manages the entire system and a plurality of terminal processing systems that are connected to this central information processing system by transmission lines and that are under the control of the central information processing system. In the data transmission system to be tested, the configuration information of the equipment to be tested in the terminal processing system is registered in the central information processing system, and the central information processing system The information processing system creates a predetermined test program and transmits the test program to the corresponding terminal processing system via the transmission path to test the predetermined device of the terminal processing system. system test method.