JPS584988B2 - Charging status visual confirmation method - Google Patents

Charging status visual confirmation method

Info

Publication number
JPS584988B2
JPS584988B2 JP7153179A JP7153179A JPS584988B2 JP S584988 B2 JPS584988 B2 JP S584988B2 JP 7153179 A JP7153179 A JP 7153179A JP 7153179 A JP7153179 A JP 7153179A JP S584988 B2 JPS584988 B2 JP S584988B2
Authority
JP
Japan
Prior art keywords
charged
image pickup
visual confirmation
mask
confirmation method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP7153179A
Other languages
Japanese (ja)
Other versions
JPS55163464A (en
Inventor
小林賢一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP7153179A priority Critical patent/JPS584988B2/en
Publication of JPS55163464A publication Critical patent/JPS55163464A/en
Publication of JPS584988B2 publication Critical patent/JPS584988B2/en
Expired legal-status Critical Current

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Description

【発明の詳細な説明】 本発明は、帯電した物体のどの部分に凡そどの程度の帯
電がなされているかを視認する為の方式一般に、帯電し
ては困るような物体が帯電する場合、その物体のどの部
分に帯電しているのか、また、その程度を知ることがで
きれば対策も立て易いし、帯電を除去しようとする際に
効果的に行なうことができる。
DETAILED DESCRIPTION OF THE INVENTION The present invention provides a method for visually confirming which part of a charged object is electrically charged and approximately how much charge is applied to the object. If you can know which part of your throat is charged and the extent of the charge, it will be easier to take countermeasures, and you will be able to take effective measures to remove the charge.

例えば、半導体装置を製造するにはリングラフィ技術が
不可欠であり、また、それにはフォト・マスクが不可欠
である。
For example, phosphorography technology is essential to manufacturing semiconductor devices, and photo masks are also essential for this.

通常の製造工程で使用される所謂ワーク・マスクはマス
ク・マスクのパターンを転写して作製される。
A so-called work mask used in a normal manufacturing process is produced by transferring a mask pattern.

その転写作業は、ガラス基板上に金属膜及びフォト・レ
ジスト膜を順次形成したものの表面、部ち、フォト・レ
ジスト膜上にマスク・マスクを密接して載置し、紫外線
を照射して行なわれる。
The transfer process is performed by placing a mask on the surface of a glass substrate in which a metal film and a photoresist film are sequentially formed, and then placing a mask closely on the photoresist film and irradiating it with ultraviolet rays. .

そのような転写作業は、1枚のマスク・マスクで何枚も
のワーク・マスクに対して繰収し実施され、マスク・マ
スクの金属膜パターンの部分は次第に帯電してくる。
Such a transfer operation is repeatedly performed on a number of workpiece masks using one mask, and the metal film pattern portion of the mask gradually becomes electrically charged.

そして、遂には転写終了後マスク・マスクとワーク・マ
スクとが密着してしまいその分離に困難を来たすように
なり、湯熱と引剥すことに依りワーク・マスクのフォト
・レジスト膜から金属膜までが損傷されてしまう事故が
しばしば生じている。
Eventually, after the transfer was completed, the mask mask and workpiece mask came into close contact with each other, making it difficult to separate them. Accidents that result in damage often occur.

マスク・マスクの帯電は金属膜パターンに依存して変化
するので、どのマスク・マスクも同じ状態に帯電すると
は限らない。
Since the electrification of the masks changes depending on the metal film pattern, not all masks are necessarily charged to the same state.

従って、前記したように、その帯電状態を目視して把握
できれば、その対策、帯電除去を円滑に行なうことがで
きる。
Therefore, as described above, if the state of charge can be visually checked, countermeasures and removal of charge can be smoothly carried out.

本発明は、物体の帯電状態を極めて簡単な装置で視認で
きる方式を提供するものであり、以下これを説明する。
The present invention provides a method for visually checking the charged state of an object using an extremely simple device, and this will be explained below.

第1図は本発明を実施する装置の一例を表わす要部説明
図である。
FIG. 1 is an explanatory diagram of essential parts showing an example of an apparatus for carrying out the present invention.

図に於いて、PTは撮像管、PTlは透明導電膜電極、
PT2は光導電膜、PT3はカソード、■sは誘電体薄
膜、DPは表示装置、MKは帯電物体をそれぞれ示す。
In the figure, PT is an image pickup tube, PTl is a transparent conductive film electrode,
PT2 is a photoconductive film, PT3 is a cathode, ■s is a dielectric thin film, DP is a display device, and MK is a charged object.

この装置に於ける撮像管PTとしては例えばビジコンに
若干の改造を施して使用することができる。
As the image pickup tube PT in this apparatus, for example, a vidicon with some modifications can be used.

尚、図示してないが、誘電体薄膜ISと透明導電膜電極
PTIとの間にはガラス板が介在しても良く、また、誘
電体薄膜Isとしては例えばポリ塩化ビニリデン系重合
物(例えば商品名サラン:米国ダウ・ケミカル社)を用
いることができる。
Although not shown, a glass plate may be interposed between the dielectric thin film IS and the transparent conductive film electrode PTI. Saran: Dow Chemical Company, USA) can be used.

さて、前記装置に於いて、帯電物体MKを誘電体薄膜■
sに押し当てると、物体MKの帯電状態は誘電体薄膜I
sに転移し、更に光導電膜PT2に転移する。
Now, in the above device, the charged object MK is transferred to the dielectric thin film ■
When pressed against s, the charged state of object MK changes to dielectric thin film I.
s and further to the photoconductive film PT2.

光導電膜PT2即ちターゲットに+電荷が存在するとき
、カソードPTaからの電子ビームで該ターゲットを走
査することに依り十電荷は減少する。
When positive charges exist in the photoconductive film PT2, that is, the target, the ten charges are reduced by scanning the target with an electron beam from the cathode PTa.

それと同時に電源から電極PTtを介して充電が行なわ
れるので、それを信号として表示装置DPに送って表示
させれば良い。
At the same time, since charging is performed from the power source via the electrode PTt, it is sufficient to send this as a signal to the display device DP for display.

第2図aは帯電物体MKの帯電状態を表わす説明図であ
り、この帯電物体MKに前記第1図に関して説明したよ
うな操作を施すと、表示装置Dpに於ける陰極線管CR
Tには第2図すに見られるように白色(高輝度)の表示
が行なわれ、その位置、形状、面積などを見れば帯電物
体MKのどの部分にどの程度の帯電が行なわれているか
視認することができる。
FIG. 2a is an explanatory diagram showing the charging state of the charged object MK, and when the charged object MK is subjected to the operation described in connection with FIG. 1, the cathode ray tube CR in the display device Dp
As shown in Figure 2, a white (high brightness) display is displayed on T, and by looking at its position, shape, area, etc., it can be visually confirmed which part of the charged object MK is charged and to what extent. can do.

以上の説明で判るように、本発明に依れば、表示装置に
結合された撮像管に誘電体薄膜を介して帯電物体を押し
当て、その物体の帯電状態を撮像管のターゲットに転移
させてから該ターゲットをカソードからの電子ビームで
走査することに依り前記転移した電荷に基因する信号を
取出して表示装置に送って表示させるようにしているの
で、表示装置の例えば陰極線管には物体の帯電状態に応
じて高輝度と低輝度のパターンが現われる。
As can be seen from the above description, according to the present invention, a charged object is pressed against an image pickup tube coupled to a display device through a dielectric thin film, and the charged state of the object is transferred to the target of the image pickup tube. By scanning the target with an electron beam from the cathode, a signal based on the transferred charge is extracted and sent to a display device for display. Patterns of high and low brightness appear depending on the state.

従って物体の帯電状態を容易に目視でき、これにより、
もしマスク・マスクが多量に帯電していることが判明し
た場合、このマスク・マスクを転写に用いないようにす
ることによって信頼性の高いワーキングマスクを得るこ
とができるようになる。
Therefore, the charged state of the object can be easily checked visually, and this allows
If it is found that the mask is heavily charged, a highly reliable working mask can be obtained by not using this mask for transfer.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明を実施する装置の一例を表わす要部説明
図、第2図は帯電状態とその表示状態を説明する為の説
明図である。 図に於いて、PTは撮像管、PTtは透明導電膜電極、
PT2は光導電膜、PT3はカソード、Isは誘電体薄
膜、DPは表示装置、MKは帯電物体、CRTは陰極線
管である。
FIG. 1 is an explanatory diagram of a main part showing an example of an apparatus for carrying out the present invention, and FIG. 2 is an explanatory diagram for explaining a charging state and its display state. In the figure, PT is an image pickup tube, PTt is a transparent conductive film electrode,
PT2 is a photoconductive film, PT3 is a cathode, Is is a dielectric thin film, DP is a display device, MK is a charged object, and CRT is a cathode ray tube.

Claims (1)

【特許請求の範囲】[Claims] 1 撮像管に誘電体薄膜を介して帯電物体を押し当て、
該撮像管のターゲットに該帯電物体の帯電状態を転移さ
せ、該撮像管のカソードからの電子ビームで該ターゲッ
トを走査して前記帯電状態に基因する信号を取出して表
示装置に加え帯電状態のパターンを映出させることを特
徴とする帯電状態視認方式。
1. Press a charged object against the image pickup tube through a dielectric thin film,
The charged state of the charged object is transferred to the target of the image pickup tube, the target is scanned with an electron beam from the cathode of the image pickup tube, a signal based on the charged state is extracted, and the signal is added to a display device to display a pattern of the charged state. A charging state visual confirmation method that is characterized by displaying.
JP7153179A 1979-06-07 1979-06-07 Charging status visual confirmation method Expired JPS584988B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7153179A JPS584988B2 (en) 1979-06-07 1979-06-07 Charging status visual confirmation method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7153179A JPS584988B2 (en) 1979-06-07 1979-06-07 Charging status visual confirmation method

Publications (2)

Publication Number Publication Date
JPS55163464A JPS55163464A (en) 1980-12-19
JPS584988B2 true JPS584988B2 (en) 1983-01-28

Family

ID=13463403

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7153179A Expired JPS584988B2 (en) 1979-06-07 1979-06-07 Charging status visual confirmation method

Country Status (1)

Country Link
JP (1) JPS584988B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8530930D0 (en) * 1985-12-16 1986-01-29 Mansfield P Inductive circuit arrangements
KR20000050249A (en) * 2000-05-30 2000-08-05 신이균 The Measurement System of Static Electricity

Also Published As

Publication number Publication date
JPS55163464A (en) 1980-12-19

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