JPS5846146U - Fatigue test equipment - Google Patents
Fatigue test equipmentInfo
- Publication number
- JPS5846146U JPS5846146U JP14172281U JP14172281U JPS5846146U JP S5846146 U JPS5846146 U JP S5846146U JP 14172281 U JP14172281 U JP 14172281U JP 14172281 U JP14172281 U JP 14172281U JP S5846146 U JPS5846146 U JP S5846146U
- Authority
- JP
- Japan
- Prior art keywords
- amplitude
- contact member
- test piece
- test equipment
- fatigue test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来の疲労試験方法を示す概念図、第２図は本
考案による疲労試験装置の概念的斜視図である。
１・・・・・・振動機構、２・・・・・・試験片、３・
・・・・・試験片保持用治具、４・・・・・・接触部材
、５・・・・・・作動緩衝部、６・・・・・・差動トラ
ンス。FIG. 1 is a conceptual diagram showing a conventional fatigue testing method, and FIG. 2 is a conceptual perspective view of a fatigue testing apparatus according to the present invention. 1... Vibration mechanism, 2... Test piece, 3.
... Test piece holding jig, 4 ... Contact member, 5 ... Operation buffer section, 6 ... Differential transformer.
Claims (1)
る振動機構と、該振動により発生する試験片の他端の振
幅から疲労破壊を自動的に検知する機構からなり、該検
知機構が該試験片の他端と接触する接触部材と、該接触
部材に連繋して試験片の振幅に応じて接触部材を変動さ
せる作動緩衝部と、振幅を表示するための差動トランス
からなることを特徴とする疲労試験装置。The detection mechanism consists of a vibration mechanism that holds one end of a plurality of test pieces and vibrates the test pieces, and a mechanism that automatically detects fatigue fracture from the amplitude of the other end of the test piece generated by the vibration. comprises a contact member that contacts the other end of the test piece, an operating buffer that is linked to the contact member and changes the contact member in accordance with the amplitude of the test piece, and a differential transformer for displaying the amplitude. A fatigue testing device featuring:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14172281U JPS5846146U (en) | 1981-09-24 | 1981-09-24 | Fatigue test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14172281U JPS5846146U (en) | 1981-09-24 | 1981-09-24 | Fatigue test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5846146U true JPS5846146U (en) | 1983-03-28 |
Family
ID=29934796
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14172281U Pending JPS5846146U (en) | 1981-09-24 | 1981-09-24 | Fatigue test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5846146U (en) |
-
1981
- 1981-09-24 JP JP14172281U patent/JPS5846146U/en active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS5846146U (en) | Fatigue test equipment | |
| JPS60169503U (en) | Hole diameter inspection device on processing line | |
| JPS59152440U (en) | bending test equipment | |
| JPS5851399U (en) | automatic test equipment | |
| JPS6138574U (en) | IC inspection equipment | |
| JPS5827750U (en) | Impact vibration device | |
| JPS59151441U (en) | semiconductor test equipment | |
| JPS6132946U (en) | Impact vibration device | |
| JPS59115337U (en) | Corrosion test piece | |
| JPS5871174U (en) | Characteristic measuring device for electronic components with parallel leads | |
| JPS59163946U (en) | Test specimen polishing tool | |
| JPS59151158U (en) | semiconductor test equipment | |
| JPS6093951U (en) | bending test equipment | |
| JPS59138719U (en) | Sensor holding jig | |
| JPS58165603U (en) | Inspection coil for eddy current inspection equipment | |
| JPS6093978U (en) | Measuring equipment for semiconductor devices | |
| JPS6042937U (en) | Vibration test equipment | |
| JPS60116241U (en) | Semiconductor wafer inspection equipment | |
| JPS59191667U (en) | Ultrasonic flaw detection head | |
| JPS60179864U (en) | probe holder | |
| JPS5915968U (en) | Ultrasonic probe holder | |
| JPS6027377U (en) | Stylus device for testing circuit units | |
| JPS5998328U (en) | Gap sensor with protection device for rotation test vibration measurement | |
| JPS5896220U (en) | Engine oil inspection device | |
| JPS58163806U (en) | Inspection coil for eddy current inspection equipment |