JPS5844305A - 放射線厚み計 - Google Patents

放射線厚み計

Info

Publication number
JPS5844305A
JPS5844305A JP56142783A JP14278381A JPS5844305A JP S5844305 A JPS5844305 A JP S5844305A JP 56142783 A JP56142783 A JP 56142783A JP 14278381 A JP14278381 A JP 14278381A JP S5844305 A JPS5844305 A JP S5844305A
Authority
JP
Japan
Prior art keywords
thickness
measured
radiation
reference plate
plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56142783A
Other languages
English (en)
Japanese (ja)
Other versions
JPS632447B2 (enExample
Inventor
Kazunori Masanobu
正信　和則
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP56142783A priority Critical patent/JPS5844305A/ja
Publication of JPS5844305A publication Critical patent/JPS5844305A/ja
Publication of JPS632447B2 publication Critical patent/JPS632447B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
JP56142783A 1981-09-10 1981-09-10 放射線厚み計 Granted JPS5844305A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56142783A JPS5844305A (ja) 1981-09-10 1981-09-10 放射線厚み計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56142783A JPS5844305A (ja) 1981-09-10 1981-09-10 放射線厚み計

Publications (2)

Publication Number Publication Date
JPS5844305A true JPS5844305A (ja) 1983-03-15
JPS632447B2 JPS632447B2 (enExample) 1988-01-19

Family

ID=15323490

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56142783A Granted JPS5844305A (ja) 1981-09-10 1981-09-10 放射線厚み計

Country Status (1)

Country Link
JP (1) JPS5844305A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011242254A (ja) * 2010-05-18 2011-12-01 Nippon Steel Corp 鋼板の板厚測定装置およびその校正方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011242254A (ja) * 2010-05-18 2011-12-01 Nippon Steel Corp 鋼板の板厚測定装置およびその校正方法

Also Published As

Publication number Publication date
JPS632447B2 (enExample) 1988-01-19

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