JPS5843226Y2 - Element inspection equipment - Google Patents

Description

[Detailed Description of the Invention] The present invention relates to a control device that reduces the time required in a device performance testing process.

In general, in the performance testing process for elements such as numeric display elements, photo transistors, or light emitting diodes, which are manufactured by attaching several pieces to a frame, the elements to be tested are mounted on a frame for 10 minutes in consideration of ease of supply. Inspections are conducted with each unit installed.

The time required to feed one pitch (for one element) is tl, the time required to inspect the electrical characteristics of one element is t2, the time required to punch out the element from the mounting plate and classify it is t3. If the number of feed pitches required from supplying one frame to taking it out is N, the time required from supplying to taking it out is (t 1 + t 2 + t 3)
It is expressed in XN (seconds).

Conventionally, in this type of device, the number of feed pitches N from feeding one frame to taking it out was set at around 30 (for 2 to 3 frames) in consideration of the mechanical size of the device and ease of control. Time t required to send pitches 1. Between the time t2 required for inspecting the electrical characteristics of one element and the time t3 required for punching and classification, t2>t.
There is a relationship l>t3.

If there is no element to be tested in the inspection section or punching classification section, t2. Although t3 is unnecessary, the period of the feeding operation requires tl+t2+t3, so there is a drawback that a wasted time equal to (t2+t3)Ni is generated from supplying to taking out the device to be tested.

Here, Ni is the number of pitches to be sent when there is no device to be tested in the inspection section or the punching and classification section.

SUMMARY OF THE INVENTION An object of the present invention is to provide an element testing apparatus that eliminates the above-mentioned drawbacks and easily shortens the time required in the element performance testing process by being configured with an electronic circuit.

According to the present invention, the first sample detection section detects the presence or absence of an element to be tested in the inspection section and controls the drive of the inspection section, which is detected by the feeding section, the inspection section, and the punching classification section; a second sample detection section that detects the presence or absence of an element to be inspected in the sorting section and controls the driving of the punching and sorting section, and generates a pulse when the feeding section, the inspection section, and the punching and sorting section are all in a non-driving state. a trigger pulse generating section that generates timing signals at regular intervals based on the output signal of the trigger pulse generating section; According to the present invention, there is obtained an element testing apparatus including a drive signal generating section that generates a drive signal for the section.

The present invention will be described in detail below with reference to the drawings.

FIG. 1 is a block diagram showing an embodiment of the present invention.

101 is a numeric display element which is one type of element to be tested;
2 is a frame in which the numeral display element 101 is installed; 1 is a feeding section that carries the frame 102 to the inspection section and the punching classification section; 2;
Reference numeral 3 indicates an inspection section that makes the numeric display elements sent from the sending section 1 emit light to measure their electrical characteristics; 3 punches out the numeric display elements 101 from the frame 102 based on the measurement results of the inspection section 2;
This is a punching classification section that classifies good products and defective products.

4 is a logic value O (low potential level in a logic circuit (0 to 0.
A trigger pulse generator that generates a pulse when the voltage is 4 V),
Its output is connected to an input of a timing pulse generator 50 which generates operation and stop timing pulses for the feeding section 1, inspection section 2 and punching and sorting section 3.

6 is a logic value of 1 (high potential level in the logic circuit (2, 4 to
5V), and its output is connected to the input of the sending section 1, one input of the first gate section 7, and one of the second gate section 8.

The other input of the first gate section 7, which acts as a logical product, is connected to the output of the first sample detection section 9 installed in the inspection section 2, and the output of the first gate section 7 is connected to the human power of the inspection section 2. .

The other input of the second gate section 8 is connected to the output of the second sample detection section 10 installed in the punching classification section 3, and the output of the second gate section 8 is connected to the input of the punching classification section 3. .

The first sample detection section 9 and the second sample detection section 10 are lamps,
It is composed of a phototransistor, etc., and outputs a logical value of 1 when a numeric display element to be inspected is detected.

FIG. 2 is a timing diagram in which the horizontal axis represents time and the vertical axis represents voltage.

The output of the trigger pulse generator 4 shown in FIG.

The stop timing signal is R1, the operation timing signal of the inspection section 2 is 52, the stop timing signal is R2, the operation timing signal of the punching classification section 3 is 53, and the stop timing signal is R3.
, the drive signal of the sending section 1 is set to 01 by the output of the drive signal generating section 6.
．． The drive signal of the inspection section 2 is 02, the drive signal of the punching classification section 3 is 03, the output of the first gate section 7 is Gl, and the second gate section 8
Assuming that the output of In addition to being output at a fast cycle, when the output of the first sample detection section 9 is a logic value 0, the cycle T2 of θ1 is such that Dl is a logic value 1.
It is approximately half of the period T1 of θ1 when
can be driven at a fast cycle.

Next, the operation of this embodiment will be explained with reference to the drawings.

First, the number display element to be inspected is set in the sending section 1, and the drive signal generation section 6 is reset to set the drive signals θ1 to θ3 to the logical value O, and then the trigger pulse generation section 4 generates a pulse TR.
occurs.

At this time, since the input signals of the feeding section 1, inspection section 2, and punching and sorting section 3 are all at the logical value O, pulse generation is possible.

The pulse TR output from the trigger pulse generator 4 is input to the timing pulse generator 5, and is used to generate the operation timing Sl of the sending unit 1, the stop timing signal R1, the operation timing S2 of the inspection unit 2, the stop timing signal R2, and the punching unit. It outputs an operation timing signal S3 and a stop timing signal R3 of the classification section 3.

The drive signal generator 6 outputs a signal with a logic value of 1 from the rise of the operation timing signals S1 to S3 output from the timing pulse generator 5 to the rise of the stop timing signals R1 to R3.

(01 to θ3) At the time when the numerical display element to be inspected is supplied to the feeding section 1, the first sample detection section 9 installed in the inspection section 2 and the second sample detection section 10 installed in the punching classification section Output DI, D2
has a logical value of 0.

That is, when the first numeric display element to be inspected is sent to the inspection section 2, the trigger pulse generation section 4 generates a signal at the time when the feeding operation is completed (θ
1 becomes a logic value of 0), a pulse is generated, and the feed operation is performed again (theta1 becomes a logic value of 1), and thus only the feed operation is repeated, resulting in fast forwarding (section a of θ1).

When the numerical display element to be inspected is sent to the inspection section 2 and the punching classification section 3, that is, when the outputs DI and D2 of the first sample detection section 9 and the second sample detection section 10 are logical value 1, the sending section 1,
The input signals of the inspection section 2 and the punching classification section 3 have a logical value of 0 (θ
1. G1. When G2 becomes all 0 level), the trigger pulse generator 4 outputs the pulse TR, performs the operations of feeding, inspection, and punching classification, and thereafter repeats the above operations.

(cycle T1), when the number display element to be inspected is intermittently sent from the sending section 1, the output D1 or D2 of the first sample detecting section 9 or the second sample detecting section becomes O level, and the first gate section 7 Alternatively, since the output G1 or G2 of the second gate section 8 is set to 0 level and no inspection or punching classification operation is performed, the input condition of the trigger pulse generating section 4 is satisfied earlier than in the normal case, and the inspection section 2 Alternatively, fast forwarding is performed until the numeric display element to be inspected arrives at the punching classification section 3.

If there is no longer a numeric display element to be inspected in the feed section 1, the first
While the output of the sample detection section 9 is at a logical value of 1, the inspection and punching and classification operations are repeated, but when the output reaches a logical value of 0, the output is sent and the punching and classification operations are repeated at the output D2 of the second sample detection section 10.
There is no progress until the logical value becomes 0 (section b of G1), so fast forwarding is performed.

In this example, a numerical display element was used as the element to be tested, but even if other elements such as transistors or light emitting diodes are used, the configuration shown in Fig. 1 is exactly the same, and the timing relationship diagram shown in Fig. 2 is the same. are also exactly the same.

The structure of the present invention is not affected by what the device to be tested is.

As explained above, according to the present invention, first. Since a second sample detection section is provided to control the driving of the inspection section and punching classification section, the time required for the performance inspection process can be significantly shortened without installing a special operation switch, and it is configured with a logic circuit. Therefore, it is possible to provide a small and stable inspection device.

[Brief explanation of drawings]

FIG. 1 is a diagram showing the constituent countries of an embodiment of the present invention, and FIG. 2 is a timing diagram of the embodiment of the present invention. In the figure, 1 is a feeding section, 2 is an inspection section, 3 is a punching classification section, 4 is a trigger generation section, 5 is a timing pulse generation section, and 6
7 represents a drive signal generation section, 7 a first gate section, 8 a second gate section, 9 a first sample detection section, and 10 a second sample detection section.

Claims (1)

[Scope of utility model registration request] A first sample detection section, which is composed of a feeding section, an inspection section, and a punching classification section, detects the presence or absence of an element to be inspected in the inspection section and controls the drive of the inspection section; a second sample detection section that detects the presence or absence of the element and controls the driving of the punching classification section; and a trigger pulse generation section that generates a pulse when the feeding section, the inspection section, and the punching classification section are all in a non-driving state. ,
A timing pulse generating section generates timing signals at regular intervals based on the output signal of the trigger pulse generating section, and drive signals for the feeding section, inspection section, and punching/classifying section are generated by external force signals of the timing pulse generating section. An element testing device comprising: a drive signal generating section.