JPS5834364A - Probe - Google Patents

Probe

Info

Publication number
JPS5834364A
JPS5834364A JP13252581A JP13252581A JPS5834364A JP S5834364 A JPS5834364 A JP S5834364A JP 13252581 A JP13252581 A JP 13252581A JP 13252581 A JP13252581 A JP 13252581A JP S5834364 A JPS5834364 A JP S5834364A
Authority
JP
Japan
Prior art keywords
noise
conductor
capacitor
electrode
malfunction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13252581A
Other languages
Japanese (ja)
Inventor
Hiroshi Inoue
宏 井上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nissan Motor Co Ltd
Original Assignee
Nissan Motor Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nissan Motor Co Ltd filed Critical Nissan Motor Co Ltd
Priority to JP13252581A priority Critical patent/JPS5834364A/en
Publication of JPS5834364A publication Critical patent/JPS5834364A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06788Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

PURPOSE:To facilitate a countermeasure and treatment of noise using an oscilloscope, by providing a bypass circuit for noise removal capable of operating connection and disconnection selectively to a probe itself. CONSTITUTION:In order to observe a malfunction caused by the noise of an electric circuit or the noise of the extent that a noise component is contained, the waveform observation is carried out by bringing an electrode 1a into contact with an observing point and an electrode 2a with a reference electric potential point respectively while keeping opening a push button 13 open. On one hand, when there is the possibility of carrying out the malfunction of parts of the observing point by the noise, the condition connecting a capacitor 14 between the observing point and the refernce electric potential by using conductors 1, 2 as lead wires by pushing the button 13, is constituted. The existence of malfunction in this state is observed and when the effect of noise removal by the capacitor 14 is ascertained, a capacitor having the capacity of the same degree as the capacitor 14 is fitted between the observing point and the reference electric potential and the noise removal treatment is accomplished.

Description

【発明の詳細な説明】 本発明は電気信号計測用グローブに関する。[Detailed description of the invention] The present invention relates to a glove for measuring electrical signals.

この種の従来のプローブとしては、第1図に示すものが
ある。1は第1の導体で、同軸ケーブル等の内部導線3
の延長または別体に設けられ、その先端は信号検出端子
としての電極1aを形成する。2は第2の導体で、同軸
ケーブル等の外部導線4とネジ導体6で接続し、導体1
の信号帰路となっている。この導体2は、例えば導体1
を同心として円筒状に設けられ、その一部から基準端子
としての電極2aが伸びている。導線3.4は検出した
°電気信号をカウンタやオシロスコープナト  − の各櫨検出器へ伝達する。8は導体2の先端部と電極1
aを絶縁支持する絶縁チップである。9は、導体1,2
、この導体の端子1a+2aを一体的に収納・保持する
ケースである。10Pj同軸ケーブルの外被11に固定
されてケース9と共にプローブ筐体を構成する保持体で
ある。
A conventional probe of this type is shown in FIG. 1 is the first conductor, and internal conductor 3 such as a coaxial cable
It is provided as an extension or a separate body, and its tip forms an electrode 1a as a signal detection terminal. 2 is a second conductor, which is connected to an external conductor 4 such as a coaxial cable with a screw conductor 6, and is connected to conductor 1.
This is the signal return route. This conductor 2 is, for example, conductor 1
It is provided in a cylindrical shape with the terminals concentrically arranged, and an electrode 2a serving as a reference terminal extends from a part thereof. The conductor 3.4 transmits the detected electric signal to the counter and each of the oscilloscope detectors. 8 is the tip of conductor 2 and electrode 1
This is an insulating chip that insulates and supports a. 9 is conductor 1, 2
, is a case that integrally houses and holds the terminals 1a+2a of the conductor. This is a holder that is fixed to the jacket 11 of the 10Pj coaxial cable and forms a probe housing together with the case 9.

この構成のグローブにむ(八で、丁1工子回路等の電気
信号をオシロスコープ〜やカウンタ等の計測器に導入I
−で波形観測やパルス周波数測定をするのに、第1の電
極1mを測定点に接触させ第2の布枠2aを測定点に対
する基準電位点(例えばアース点)に接触させる。この
ようなプローブの使用方法の1つとして、電気回路のノ
イズ対策検討用として種々の測定点の耐ノイズ性を測定
及びノイズ対策処理するのに使用される。これを以下に
詳細に説明する。
Introducing the electrical signal from the electronic circuit into a measuring instrument such as an oscilloscope or counter at step 8 of this configuration.
- To observe the waveform or measure the pulse frequency, the first electrode 1m is brought into contact with the measurement point, and the second cloth frame 2a is brought into contact with the reference potential point (for example, the ground point) for the measurement point. One way to use such a probe is to measure the noise resistance of various measurement points and perform noise countermeasure processing to examine noise countermeasures for electrical circuits. This will be explained in detail below.

′電気回路が高周波ノイズによって誤動作するとさ、そ
の不敗合の解消と17て一般に次のような手順で検討、
1りL理がなされる、 (1)誤動作回路のどの部分がその原因となるかを知る
ために電気+11S品の端子部分等にグローブを接続し
、電気回路の正常時と外部からノイズを7JI]えたと
きの各信号波形の差異をプローブを重ってオンロスコー
プhで観測する。なお、ノイズ印加は通常ノ1ズシミュ
ノータによる強制的付加で行なわれる。
'If an electrical circuit malfunctions due to high-frequency noise, the following steps are generally taken to resolve the problem:
(1) To find out which part of the malfunctioning circuit is causing the malfunction, connect a glove to the terminal part of the electrical +11S product, and measure the noise from the outside and when the electrical circuit is normal. ] Observe the difference in each signal waveform with an onroscope h by overlapping the probes. Incidentally, the noise application is normally performed by forcible addition using a noise simulator.

(2)上述の(1)頃の観測において、正常時とノイズ
注入時でat号波形が顕著に異なる部品があるときに 
該部品が誤動作の原因である又F′i原因になりつると
(−で該部品端子とアース間に適当な容吐の高周波バイ
パスコンデンサを半田付けする。。
(2) In the observation around (1) above, when there is a part whose at waveform is significantly different between normal and noise injection.
If the component becomes the cause of malfunction or F'i (-), solder a high-frequency bypass capacitor of an appropriate capacity between the component terminal and ground.

(3)上述の(2)頃の処理後、バイパスコンiンサを
付加した部品端子にプローブを接触させ、・(イノくス
コンデンサのノイズ除去効果を確かめる。
(3) After processing around (2) above, touch the probe to the component terminal to which the bypass capacitor has been added, and confirm the noise removal effect of the innovation capacitor.

このように、′電気回路のノイズ対策として、曳状の各
部信号波形観測、バイパスコンデンサ等対策部品の取付
け、対策効果の確認のための信号波形観測といつ■り返
1−でなされ、ノイズ対策検討に手間取るという不都合
があった。特に、バ4・(スコンデンサ等の対策部品の
取付けには、部品の取付寸法、リード線長さ調整、半田
付は作業等に手間取るし、バイパスコンデンサ6殴の、
固定等も含めて適切なるノイズ対策部品取付処理に手間
取る問題があった。
In this way, as a countermeasure against noise in electrical circuits, the signal waveforms of each part of the string are observed, countermeasure parts such as bypass capacitors are installed, and signal waveforms are observed to confirm the effectiveness of the countermeasures. There was an inconvenience in that it took time to consider. In particular, when installing countermeasure parts such as bypass capacitors, it takes time to adjust the mounting dimensions of the parts, lead wire length adjustment, and soldering.
There was a problem in that it took time to install appropriate noise countermeasure components, including fixing them.

本発明は、上記事情に鑑みてなされたもので、接続、〃
f帷を選択操作できるノイズ除去用バイパス回路をプロ
ーブ自体[#けることにより、オシロスコープ分使用1
.定ノイズ対釆、処理が容易になるプローブを提供する
ことを目的とする。。
The present invention has been made in view of the above circumstances.
By installing a noise removal bypass circuit that can be selectively operated on the probe itself, the oscilloscope can be used 1
.. The purpose of the present invention is to provide a probe that has constant noise resistance and is easy to process. .

第2図は本発明の一実施例ケ示し、符号1〜11につい
ては第11ソ1に示す従来のものと同等に構成される。
FIG. 2 shows an embodiment of the present invention, in which reference numerals 1 to 11 are constructed in the same manner as the conventional one shown in 11th section 1.

第2図中、12は導体2に片持固定されるスイッチ接点
用弾性導体、13はケース9の側部に突出1−で導体1
2の自由端側に取付けられる押釦、14は導体]2の自
由端に対向する位置に一方のべ極を有17て導体lに他
方の′電極が導電接着代れるバイパス用貫通型コンデン
サである。
In FIG. 2, 12 is an elastic conductor for a switch contact that is cantilevered to the conductor 2, and 13 is an elastic conductor for a switch contact that protrudes from the side of the case 9.
A push button attached to the free end of 2, 14 a conductor] This is a feed-through capacitor for bypass, with one electrode 17 located opposite the free end of 2, and the other 'electrode conductively bonded to the conductor l. .

導体12は押釦13とによって電気・信号開閉スイッチ
の可動接点を構成し、押釦13の押込み操作で導体12
の自由端が接触するコンデンサ14の電極が−イ1気信
号開閉スイッチの固定接点J−なり、等側内には第5図
に示すように開閉スイッチSWとコンデンサCの直列回
路が導体1と2の間に介在1.てスイッチS Wの投入
により導体1,2間の高周波成分を除去するバイパス回
路?嗅える。なお コンデンサ14は、高周波ノイズk
 Jl過させるバイパスフィルlとするため、一般の高
周波ノイズに対1゜ては1000pF〜0.01μFの
ものが使用される。
The conductor 12 and the push button 13 constitute a movable contact of an electric/signal on/off switch, and when the push button 13 is pressed, the conductor 12
The electrode of the capacitor 14 that contacts the free end of the conductor 1 becomes the fixed contact J- of the signal switch SW, and the series circuit of the switch SW and the capacitor C is connected to the conductor 1 on the same side as shown in FIG. Intervention between 1. A bypass circuit that removes high frequency components between conductors 1 and 2 by turning on switch SW? I can smell it. Note that the capacitor 14 is used for high frequency noise k
In order to provide a bypass filter that allows Jl to pass through, a filter having a resistance of 1000 pF to 0.01 μF with respect to general high frequency noise is used.

こう1−た構成σ)プローブにより、″【ぎ、気回路の
ノイズ対策検討を容易にする。この卯中手順紮以ドに説
明する。
This configuration σ) probe facilitates the study of noise countermeasures for the air circuit.This procedure will be explained in detail.

まず、電気回路のノイズによる誤1rh作又はノイズ成
分含有程度の観測には押、fI]13を開放l−たまま
で電気部品の端子部分等にグローブを接続する。。
First, to observe erroneous 1rh operation due to noise in the electric circuit or the extent to which noise components are included, connect a glove to the terminal portion of the electric component while leaving fI13 open. .

この場合は従来のプローブと全く変らないプローブによ
る波形1視測になる□ 次iC、?IM、測点部品がノイズで誤動作又は誤動作
の恐れからろと観測されるときに、押、v口13を押へ
操作12、該観測点と基準電位間に導体1.2をリード
線としてコンデンサ14を接続した伏態を構成し、その
状ユリでのノイズ発生犬態又は誤動作の付熱を観測17
、コンデンサ14vCよるノイズ呟安効果が確かめられ
るときには該コンデンサ14と同程litの芥渚のコン
デンサを観測点と基準電位間に取付けてノイズ除去Xへ
理全完了する・ 従一つで、本処施例におけるグローブi’i 観測点の
波形観測とその部分へのノイズ除去用バイパスフィルタ
の取付けりJ果を迅、上、容易に確かめることりIでき
る。
In this case, waveform 1 will be observed using a probe that is no different from a conventional probe □ Next iC, ? IM, when the measurement point part is being observed to avoid malfunction or malfunction due to noise, press the V port 13. Operation 12: Connect the capacitor between the observation point and the reference potential using the conductor 1.2 as a lead wire. Connect 14 to form a prone state, and observe noise generation or malfunction in that state 17
, When the noise suppression effect of capacitor 14vC is confirmed, a capacitor of Kuta Nagisa with the same liter as capacitor 14 is installed between the observation point and the reference potential to complete the noise removal X. In the example, the results of observing the waveform at the observation point of the globe i'i and attaching the bypass filter for noise removal to that part can be quickly and easily checked.

なお、コンデンサ14は膚通型コンーfンザがその取付
構造上好ましいが、他のセラミックコンデンサなど適当
な取付構造手段を用意して代替できる。
Although a skin-penetrating condenser is preferable for the capacitor 14 due to its mounting structure, it may be replaced by providing a suitable mounting structure such as another ceramic capacitor.

第4図は本発明の他の実施例を示す要部構成図である。FIG. 4 is a block diagram of main parts showing another embodiment of the present invention.

本実施例においては、砲過帯域の異なる複数のバイパス
フィルタ素子を設け、これらフィルタ素子の1つを1択
して導体1.2間に接続で鋒る構成としている。第4図
中、15はケース9に軸方向に摺動可能に取付けられる
スライド導体、16は一端がスライド導体15にばね接
触1.て他端が導体2側に接続されるばね導体、17は
スライド導体15にスプリング18と共に設けられる押
φ口であり、押釦17の内部側先端に持つ接点17 A
はスライド導体15に接触して導体1側に摺−1し、ス
プリング18により開放側に付勢される。19A 、 
19B 、 l!Icは接点17 Aのスライド位置に
対向して導体1に軸方向に配設される互いに異なる容量
のバイパスフィルタ144 kW 通コンデンサである
In this embodiment, a plurality of bypass filter elements having different passbands are provided, and one of these filter elements is selected and connected between the conductors 1 and 2. In FIG. 4, 15 is a slide conductor that is slidably attached to the case 9 in the axial direction, and 16 is a spring contact 1. 17 is a spring conductor whose other end is connected to the conductor 2 side, and 17 is a push hole provided on the slide conductor 15 together with the spring 18, and a contact 17 A is held at the inner tip of the push button 17.
contacts the slide conductor 15 and slides toward the conductor 1 side, and is urged toward the open side by the spring 18. 19A,
19B, l! Ic is a bypass filter 144 kW passing capacitor having a different capacity and disposed in the axial direction on the conductor 1 facing the sliding position of the contact 17A.

従って、押fa1117 ′f/:軸方向(矢印F、R
で示す)にスライドさすて矢印P方向に押込操作するこ
とでコンデンサ19A 、 19B 、 19Cの1つ
全選択して導体12間に接続することができ、ノイズ対
策検討に最適L7)コンiンサの選択を容易にする効果
がある。
Therefore, press fa1117'f/: axial direction (arrows F, R
By sliding the capacitor (indicated by ) and pushing it in the direction of arrow P, you can select all of capacitors 19A, 19B, and 19C and connect them between conductors 12, making it ideal for considering noise countermeasures. This has the effect of making selection easier.

不実施例に訃けるフィルタ回路の貢択はスライドスイッ
チによる選択を示すが、これはフィルタ回路側々に第2
図のものと同等の押釦スイッチを設ける。駕択手段に1
〜で同等の作用効果を奏する。
The filter circuit used in the non-embodiment is selected by a slide switch, but this requires a second switch on each side of the filter circuit.
Provide a push button switch similar to the one shown. 1 as a means of selection
~ has the same effect.

以上のとおり、本発明によるグローブは、観測点の電気
信号波形観測のためのイ8号取入機能に加えて観測点と
基準電位間にノイズ除去用バイパス0 回路を接続、解離する機能を具えるため、ノイズ対策検
討に使用1.てその作礒効率を極めて向にできる効果が
ある。
As described above, the glove according to the present invention has the function of connecting and disconnecting a noise removal bypass circuit between the observation point and the reference potential in addition to the No. 8 intake function for observing the electrical signal waveform at the observation point. 1. Used for noise countermeasure study. This has the effect of greatly increasing the efficiency of sowing.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のプローブの縦断面図、第2図は本発明の
一実楕例を示す縦断面図、第5図は第2図の使用態様を
説明するための等価回路図、第4図は本発明の他の実施
例を示す縦断面図(a)とA−A線での横断面図(b)
でちる、。 1・・・@1の導体、2・・・第2の導体、3・・・内
部導線、12・・・弾性導体、13・・・押釦、14・
・・K通コンデンサ、15・・・スライド導体、16・
・・ばね導体、17・・・押釦、18−Xプ+l yグ
、19A、19B、19C−[+lnコ7デンサ□、1
1′
FIG. 1 is a vertical sectional view of a conventional probe, FIG. 2 is a vertical sectional view showing an example of the present invention, FIG. 5 is an equivalent circuit diagram for explaining the usage mode of FIG. 2, and FIG. The figures are a vertical cross-sectional view (a) and a cross-sectional view (b) taken along the line A-A, showing another embodiment of the present invention.
Dechiru. DESCRIPTION OF SYMBOLS 1... @1 conductor, 2... Second conductor, 3... Internal conductor, 12... Elastic conductor, 13... Push button, 14...
...K through capacitor, 15...slide conductor, 16.
...Spring conductor, 17...Push button, 18-X plug, 19A, 19B, 19C-[+ln 7 capacitor
1′

Claims (1)

【特許請求の範囲】[Claims] (1)  電気信号を検出するための第1の電極をもつ
tl!c1の導体と第2の電極をもつ第2の導体と、該
第1および第2の導体を保持するための筐体とを備える
プローブにおいて、ヒ記1π体に保持1−で上記第1の
導体と前記第2の導体との間に、電気信号の開閉手段と
電気信号に含まれる高周波成分のみを通過させるバイパ
スフィルタとを直列に接続してなるノイズ除去用バイパ
ス回路を備えたことを特徴とするプローブ。 (2、特許請求の範鑓第1項において、ヒーハイ’/<
 X フィルpは通過帯域の異なる複数のフィルタ回路
分有し、上記開閉手段は該複数のフィルタ回路の1つを
選択1〜て直列接続できる切換手段を備えたことを特徴
とするプローブ。
(1) tl! with a first electrode for detecting electrical signals; c1 conductor, a second conductor having a second electrode, and a casing for holding the first and second conductors; A noise-removing bypass circuit is provided between the conductor and the second conductor, in which an electrical signal switching means and a bypass filter that passes only high-frequency components contained in the electrical signal are connected in series. probe. (2. In the first claim,
X. A probe characterized in that the filter p has a plurality of filter circuits with different passbands, and the opening/closing means includes a switching means that can select one of the plurality of filter circuits and connect the filter circuits in series.
JP13252581A 1981-08-24 1981-08-24 Probe Pending JPS5834364A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13252581A JPS5834364A (en) 1981-08-24 1981-08-24 Probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13252581A JPS5834364A (en) 1981-08-24 1981-08-24 Probe

Publications (1)

Publication Number Publication Date
JPS5834364A true JPS5834364A (en) 1983-02-28

Family

ID=15083332

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13252581A Pending JPS5834364A (en) 1981-08-24 1981-08-24 Probe

Country Status (1)

Country Link
JP (1) JPS5834364A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61188324A (en) * 1985-02-13 1986-08-22 Pioneer Electronic Corp Printed circuit board extruding device
JPH0559323U (en) * 1991-11-19 1993-08-06 スタック電子株式会社 CR terminal for logic analyzer
WO2003067268A1 (en) * 2002-02-07 2003-08-14 Yokowo Co., Ltd. Capacity load type probe, and test jig using the same

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61188324A (en) * 1985-02-13 1986-08-22 Pioneer Electronic Corp Printed circuit board extruding device
JPH0559323U (en) * 1991-11-19 1993-08-06 スタック電子株式会社 CR terminal for logic analyzer
WO2003067268A1 (en) * 2002-02-07 2003-08-14 Yokowo Co., Ltd. Capacity load type probe, and test jig using the same
US7233156B2 (en) 2002-02-07 2007-06-19 Yokowo Co., Ltd. Capacity load type probe, and test jig using the same

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