JPS583073Y2 - ブンコウコウドケイ - Google Patents

ブンコウコウドケイ

Info

Publication number
JPS583073Y2
JPS583073Y2 JP1975100786U JP10078675U JPS583073Y2 JP S583073 Y2 JPS583073 Y2 JP S583073Y2 JP 1975100786 U JP1975100786 U JP 1975100786U JP 10078675 U JP10078675 U JP 10078675U JP S583073 Y2 JPS583073 Y2 JP S583073Y2
Authority
JP
Japan
Prior art keywords
kes
circuit
absorbance
logarithmic conversion
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1975100786U
Other languages
English (en)
Japanese (ja)
Other versions
JPS5215279U (enExample
Inventor
通之助 高田
俊明 福間
克雄 福田
十五郎 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP1975100786U priority Critical patent/JPS583073Y2/ja
Priority to US05/704,530 priority patent/US4092069A/en
Priority to GB29106/76A priority patent/GB1551433A/en
Priority to DE19762632160 priority patent/DE2632160A1/de
Publication of JPS5215279U publication Critical patent/JPS5215279U/ja
Application granted granted Critical
Publication of JPS583073Y2 publication Critical patent/JPS583073Y2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP1975100786U 1975-07-19 1975-07-19 ブンコウコウドケイ Expired JPS583073Y2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP1975100786U JPS583073Y2 (ja) 1975-07-19 1975-07-19 ブンコウコウドケイ
US05/704,530 US4092069A (en) 1975-07-19 1976-07-12 Spectrophotometer
GB29106/76A GB1551433A (en) 1975-07-19 1976-07-13 Spectrophotometer
DE19762632160 DE2632160A1 (de) 1975-07-19 1976-07-16 Spektralphotometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1975100786U JPS583073Y2 (ja) 1975-07-19 1975-07-19 ブンコウコウドケイ

Publications (2)

Publication Number Publication Date
JPS5215279U JPS5215279U (enExample) 1977-02-03
JPS583073Y2 true JPS583073Y2 (ja) 1983-01-19

Family

ID=14283127

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1975100786U Expired JPS583073Y2 (ja) 1975-07-19 1975-07-19 ブンコウコウドケイ

Country Status (4)

Country Link
US (1) US4092069A (enExample)
JP (1) JPS583073Y2 (enExample)
DE (1) DE2632160A1 (enExample)
GB (1) GB1551433A (enExample)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2905230C2 (de) * 1979-02-12 1984-03-29 Siemens AG, 1000 Berlin und 8000 München Zweistrahl-Wechsellicht-Kolorimeter
US4236076A (en) * 1979-02-26 1980-11-25 Technicon Instruments Corporation Infrared analyzer
DE2924131A1 (de) * 1979-06-15 1980-12-18 Bodenseewerk Geosystem Gmbh Signalauswerterschaltung fuer ein messgeraet zur messung der extinktion
US4300203A (en) * 1979-10-19 1981-11-10 Beckman Instruments, Inc. Method and means for operating logarithmic circuits
DE3008345C2 (de) * 1980-03-05 1983-11-17 Bodenseewerk Perkin-Elmer & Co GmbH, 7770 Überlingen Spektralphotometer zur Bestimmung der Konzentration eines gesuchten Bestandteils einer Probe
JPS58103604A (ja) * 1981-12-16 1983-06-20 Teijin Ltd フイルムの厚さ測定方法及び測定装置
FR2533073A1 (fr) * 1982-09-14 1984-03-16 Telecommunications Sa Procede et dispositif de stabilisation d'une photodiode a avalanche
JPS59125040A (ja) * 1982-12-30 1984-07-19 Shimadzu Corp 分光分析装置
US4637729A (en) * 1983-12-14 1987-01-20 Carrier Corporation Fiber optic moisture analysis probe
JPS61296650A (ja) * 1985-06-25 1986-12-27 Anelva Corp 四重極型質量分析計電源
US4797000A (en) * 1986-01-02 1989-01-10 Artel Comparative colorimeter
US4857735A (en) * 1987-10-23 1989-08-15 Noller Hans G Light emitting diode spectrophotometer
JPH0518896A (ja) * 1990-02-22 1993-01-26 Heinrich Hertz Inst Nachrichtentech Berlin Gmbh 小さな吸光量の検出用測定方法
US5233470A (en) * 1992-12-30 1993-08-03 Hsin Yi Foundation Variable lens assembly
KR100737397B1 (ko) 2007-01-31 2007-07-09 한국교세라정공(주) 밀링 커터
US10586162B2 (en) * 2013-03-15 2020-03-10 Ppg Industries Ohio, Inc. Systems and methods for determining a coating formulation
US10147043B2 (en) 2013-03-15 2018-12-04 Ppg Industries Ohio, Inc. Systems and methods for texture assessment of a coating formulation
NZ631063A (en) 2013-11-08 2015-10-30 Ppg Ind Ohio Inc Texture analysis of a coated surface using cross-normalization
NZ631047A (en) 2013-11-08 2015-10-30 Ppg Ind Ohio Inc Texture analysis of a coated surface using kepler’s planetary motion laws
NZ631068A (en) 2013-11-08 2015-10-30 Ppg Ind Ohio Inc Texture analysis of a coated surface using electrostatics calculations
US11119035B2 (en) 2018-04-26 2021-09-14 Ppg Industries Ohio, Inc. Systems and methods for rapid coating composition determinations
US10970879B2 (en) 2018-04-26 2021-04-06 Ppg Industries Ohio, Inc. Formulation systems and methods employing target coating data results
US10871888B2 (en) 2018-04-26 2020-12-22 Ppg Industries Ohio, Inc. Systems, methods, and interfaces for rapid coating generation
US11874220B2 (en) 2018-04-26 2024-01-16 Ppg Industries Ohio, Inc. Formulation systems and methods employing target coating data results

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3273448A (en) * 1962-12-06 1966-09-20 Du Pont Analytical logarithmic ratio determination apparatus
US3623817A (en) * 1970-02-24 1971-11-30 Ciba Ltd Comparison densitometer including means to maintain the detector output at a means valve
JPS5214636B2 (enExample) * 1973-11-05 1977-04-22

Also Published As

Publication number Publication date
US4092069A (en) 1978-05-30
GB1551433A (en) 1979-08-30
DE2632160A1 (de) 1977-02-03
JPS5215279U (enExample) 1977-02-03

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