JPS5826658B2 - Vapor phase growth equipment - Google Patents
Vapor phase growth equipmentInfo
- Publication number
- JPS5826658B2 JPS5826658B2 JP3614076A JP3614076A JPS5826658B2 JP S5826658 B2 JPS5826658 B2 JP S5826658B2 JP 3614076 A JP3614076 A JP 3614076A JP 3614076 A JP3614076 A JP 3614076A JP S5826658 B2 JPS5826658 B2 JP S5826658B2
- Authority
- JP
- Japan
- Prior art keywords
- vapor phase
- phase growth
- reaction
- lamps
- reaction tube
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/48—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation
- C23C16/482—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation using incoherent light, UV to IR, e.g. lamps
Description
【発明の詳細な説明】
本発明は気相成長装置、特に低い反応温度条件下でも気
相成長反応を行わしめることのできる気相成長装置に関
するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a vapor phase growth apparatus, and particularly to a vapor phase growth apparatus capable of carrying out a vapor phase growth reaction even under low reaction temperature conditions.
周知のように、気相成長装置はICあるいはLSI等を
製造する際用いられるウェーハ等の処理装置の1つであ
り、常圧又は減圧条件の下で、反応管中に反応ガスを流
通し、管内に配置したウェーハ等の表面に薄膜を成長さ
せる装置である。As is well known, a vapor phase growth apparatus is one of the processing apparatuses for processing wafers, etc. used when manufacturing ICs, LSIs, etc., and it flows a reaction gas through a reaction tube under normal pressure or reduced pressure conditions. This is a device that grows a thin film on the surface of a wafer, etc. placed inside a tube.
このような処理に際しては、反応管は抵抗加熱炉のよう
な加熱装置によって加熱される。During such treatments, the reaction tube is heated by a heating device such as a resistance heating furnace.
この加熱は、使用する反応ガスの種類によって異るけれ
ども、通常400〜1,000℃という高範囲の温度で
行われる。This heating is usually carried out at a temperature in the high range of 400 to 1,000°C, although it varies depending on the type of reaction gas used.
したがって例えばアルミニウムや金のようにシリコン基
板と共融する融点の低い金属を配線材料として用いた半
導体基板の表面に薄膜を気相成長させようとしても、そ
れは技術的に実現することができないことがある。Therefore, even if an attempt is made to vapor-phase grow a thin film on the surface of a semiconductor substrate using a metal with a low melting point that is eutectic with a silicon substrate, such as aluminum or gold, as a wiring material, it may not be technically possible to do so. be.
このような問題は、気相成長反応を低温で行うことがで
きるならば、勿論解消されるが、従来一般に用いられて
いる抵抗加熱炉を用いた気相成長装置では非常に難かし
い。Such problems would of course be solved if the vapor phase growth reaction could be carried out at a low temperature, but this is extremely difficult to do with a vapor phase growth apparatus using a conventionally commonly used resistance heating furnace.
本発明の目的は気相成長反応をより低温で行わしめるこ
とのできる気相成長装置を提供しようとするものである
。An object of the present invention is to provide a vapor phase growth apparatus that can carry out vapor phase growth reactions at lower temperatures.
このような目的に沿って、本発明は従来の抵抗加熱炉に
よる加熱方式を赤外線ランプによる加熱方式に変え、か
つこれに紫外線照射を併用することにより、反応ガスを
励起させ反応温度を低下させることを企図している。In line with these objectives, the present invention replaces the conventional heating method using a resistance heating furnace with a heating method using an infrared lamp, and also uses ultraviolet irradiation in combination with this to excite the reaction gas and lower the reaction temperature. is planned.
即ち、本発明に係る気相成長装置は、気相成長反応を行
うための反応管の外周に沿って、赤外線ランプと紫外線
ランプとを交互に配列し、全体を反射板でカバーしたこ
とを特徴としている。That is, the vapor phase growth apparatus according to the present invention is characterized in that infrared lamps and ultraviolet lamps are alternately arranged along the outer periphery of a reaction tube for carrying out a vapor phase growth reaction, and the whole is covered with a reflecting plate. It is said that
以下、図面を参照しながら本発明を説明する。The present invention will be described below with reference to the drawings.
第1図は本発明に係る気相成長装置の一例を示す縦断説
明図、第2図は第1図のX−X矢視断面図であって、特
に赤外線ランプ及び紫外線ランプの配列状態を説明する
ための図である。FIG. 1 is a longitudinal sectional view showing an example of a vapor growth apparatus according to the present invention, and FIG. 2 is a sectional view taken along the line X-X in FIG. 1, particularly illustrating the arrangement of infrared lamps and ultraviolet lamps. This is a diagram for
これらの図において、1は反応管であり、これは赤外線
及び紫外線を透過することのできる材料、例えば石英か
らつくられている。In these figures, 1 is a reaction tube, which is made of a material that is transparent to infrared and ultraviolet radiation, for example quartz.
反応管1はその両端部に反応ガスの導入口1aと排出口
1bを有する。The reaction tube 1 has a reaction gas inlet 1a and an outlet 1b at both ends thereof.
排出口1bには、ロータリーポンプのような真空ポンプ
(図示されず)が接続され、反応ガスを吸引しながらそ
れを反応管内に流通せしめている。A vacuum pump (not shown) such as a rotary pump is connected to the discharge port 1b, and sucks the reaction gas while causing it to flow into the reaction tube.
反応管1には、その外周に沿って赤外線ランプ2と紫外
線ランプ3とが交互に配置されている。In the reaction tube 1, infrared lamps 2 and ultraviolet lamps 3 are arranged alternately along its outer periphery.
両ランプ2,3を交互に配置するのは、反応管内に置い
た処理基板4及び反応管内の反応ガスに、赤外線及び紫
外線を均一に照射するためである。The reason why the lamps 2 and 3 are arranged alternately is to uniformly irradiate the processing substrate 4 placed in the reaction tube and the reaction gas in the reaction tube with infrared rays and ultraviolet rays.
赤外線の照射量の制御は、そのランプに印加する電力量
を調節したり或は点燈すべきランプ数を電源スィッチO
N、OFFで制御することによって行われる。The amount of infrared rays irradiated can be controlled by adjusting the amount of power applied to the lamp, or by turning on the power switch to control the number of lamps to be turned on.
This is done by controlling with N and OFF.
また、紫外線の照射量の制御も同様に行なう。Further, the amount of ultraviolet irradiation is also controlled in the same way.
赤外線の照射効率を向上するため、両ランプ2゜3のラ
ンプ群は反射板5によって囲まれている。In order to improve the irradiation efficiency of infrared rays, the lamp group of both lamps 2.3 is surrounded by a reflector plate 5.
反射板5は、例えば金属板に金、銀又はアルミニウムを
蒸着させてつくられている。The reflecting plate 5 is made, for example, by depositing gold, silver, or aluminum on a metal plate.
反射板5と反応管1とによって規定された空間領域内に
、空気又は窒素ガス等の冷却媒体を導入するため、反射
板5には冷却ガス導入口5aが設けられている。In order to introduce a cooling medium such as air or nitrogen gas into the spatial region defined by the reflection plate 5 and the reaction tube 1, the reflection plate 5 is provided with a cooling gas inlet 5a.
この空間領域内を冷却するのはランプ2,3のシーリン
グ部の破損を防止するためである。The purpose of cooling this space is to prevent the sealing parts of the lamps 2 and 3 from being damaged.
本発明に係る気相成長装置は、上記のような構成を有す
るので、反応管内に導入された反応ガスは紫外線の照射
を受ける。Since the vapor phase growth apparatus according to the present invention has the above configuration, the reaction gas introduced into the reaction tube is irradiated with ultraviolet rays.
この結果、その成分である反応物質は励起され、低い反
応温度でも化学反応を進行させることができる。As a result, the component reactants are excited and the chemical reaction can proceed even at low reaction temperatures.
次に、本発明の装置を用いて、実際に気相成長させた実
施例について説明する。Next, an example in which vapor phase growth was actually performed using the apparatus of the present invention will be described.
この実施例では、反応ガスとしてSiH4を使って、シ
リコンウェーハの表面に多結晶シリコンの薄膜を気相成
長させた。In this example, a thin film of polycrystalline silicon was grown in a vapor phase on the surface of a silicon wafer using SiH4 as a reactive gas.
この結果、紫外線の照射を行わない場合、成長反応を円
滑に行わせるためには、ウェーハは約700℃の温度以
上に加熱させなければならなかった。As a result, in the absence of ultraviolet irradiation, the wafer had to be heated to a temperature of about 700° C. or higher in order to cause the growth reaction to occur smoothly.
一方、400Wの水銀蒸気ランプを3本点燈させて紫外
線を照射しながら成長反応を行った場合、赤外ランプは
IKWの3本を用いるが、入力電力は低くウェーハを僅
か100℃位に加熱するだけで反応が円滑に進行した。On the other hand, when three 400W mercury vapor lamps are turned on to perform a growth reaction while irradiating ultraviolet rays, three IKW infrared lamps are used, but the input power is low and the wafer is only heated to about 100℃. The reaction proceeded smoothly just by doing this.
第1図は本発明に係る気相成長装置の一例を示す縦断面
説明図、第2図は第1図のX−X矢視断面図であって、
特に赤外線ランプ及び紫外線ランプの配列状態を説明す
るための図である。
符号の説明、1・・・・・・反応管、2・・・・・・赤
外線ランプ、3・・・・・・紫外線ランプ、5・・・・
・・反射板。FIG. 1 is an explanatory longitudinal cross-sectional view showing an example of a vapor phase growth apparatus according to the present invention, and FIG. 2 is a cross-sectional view taken along the line X-X in FIG.
In particular, it is a diagram for explaining the arrangement of infrared lamps and ultraviolet lamps. Explanation of symbols: 1...Reaction tube, 2...Infrared lamp, 3...Ultraviolet lamp, 5...
··a reflector.
Claims (1)
赤外線ランプと紫外線ランプとを交互に配置1ル、全体
を反射板でカバーした構造の気相成長装置。1 Along the outer periphery of the reaction tube for performing the vapor phase growth reaction,
A vapor phase growth device with a structure in which infrared lamps and ultraviolet lamps are arranged alternately, and the entire structure is covered with a reflector.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3614076A JPS5826658B2 (en) | 1976-04-02 | 1976-04-02 | Vapor phase growth equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3614076A JPS5826658B2 (en) | 1976-04-02 | 1976-04-02 | Vapor phase growth equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS52120681A JPS52120681A (en) | 1977-10-11 |
JPS5826658B2 true JPS5826658B2 (en) | 1983-06-04 |
Family
ID=12461470
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3614076A Expired JPS5826658B2 (en) | 1976-04-02 | 1976-04-02 | Vapor phase growth equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5826658B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59224554A (en) * | 1983-06-03 | 1984-12-17 | Mitsubishi Electric Corp | Element for gaseous oxygen concentration cell |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58158914A (en) * | 1982-03-16 | 1983-09-21 | Semiconductor Res Found | Semiconductor manufacturing device |
JPS5996719A (en) * | 1982-11-25 | 1984-06-04 | Sekisui Chem Co Ltd | Manufacture of thin film semiconductor |
JPS59129770A (en) * | 1983-01-18 | 1984-07-26 | Ushio Inc | Photochemical vapor deposition device |
JPS59188913A (en) * | 1983-04-11 | 1984-10-26 | Semiconductor Energy Lab Co Ltd | Photo cvd device |
JPS6061720U (en) * | 1983-10-01 | 1985-04-30 | ウシオ電機株式会社 | UV irradiation device |
JPS60241217A (en) * | 1984-05-16 | 1985-11-30 | Nec Corp | Longitudinal ultraviolet ray emission vapor growth device |
JPH0740552B2 (en) * | 1985-07-15 | 1995-05-01 | 三井東圧化学株式会社 | Semiconductor thin film manufacturing method |
-
1976
- 1976-04-02 JP JP3614076A patent/JPS5826658B2/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59224554A (en) * | 1983-06-03 | 1984-12-17 | Mitsubishi Electric Corp | Element for gaseous oxygen concentration cell |
Also Published As
Publication number | Publication date |
---|---|
JPS52120681A (en) | 1977-10-11 |
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