JPS5826656U - Sample device in multi-element simultaneous analysis device - Google Patents
Sample device in multi-element simultaneous analysis deviceInfo
- Publication number
- JPS5826656U JPS5826656U JP11951581U JP11951581U JPS5826656U JP S5826656 U JPS5826656 U JP S5826656U JP 11951581 U JP11951581 U JP 11951581U JP 11951581 U JP11951581 U JP 11951581U JP S5826656 U JPS5826656 U JP S5826656U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- simultaneous analysis
- pallet
- element simultaneous
- analysis device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来用いられていた試料装置を示すための斜面
図、第２図は本考案による試料装置を示すための斜面図
、第３図は要部を示す断面図、第４図は多元素同時分析
装置を示す断面図である。
１０・・・ＸＹステージ、１１・・・試料、１２・・・
パレット、１５・・・ホルダ、１６・・・標準サンプル
、１６Ａ・・・試料室、１７・・・シャッタ、１Ｂ・・
・予備試料室、１９・・・開口部、２０・・・電子銃、
２１．２２・・・分光器、２３・・・試料交換部材、２
４・・・蓋部である。Fig. 1 is a perspective view showing a conventional sample device, Fig. 2 is a perspective view showing a sample device according to the present invention, Fig. 3 is a sectional view showing the main parts, and Fig. 4 is a perspective view showing a sample device according to the present invention. FIG. 1 is a cross-sectional view showing a simultaneous elemental analysis device. 10...XY stage, 11...sample, 12...
Pallet, 15...Holder, 16...Standard sample, 16A...Sample chamber, 17...Shutter, 1B...
・Preliminary sample chamber, 19...opening, 20...electron gun,
21.22... Spectrometer, 23... Sample exchange member, 2
4... Lid part.
Claims (1)
からの螢光Ｘ線を検出するものにおいて、断面がほぼＵ
字型をなすパレット内に設けられた゛ 鉄部と、この
パレット内に設けられ複数の標準サンプルを有するホル
ダとを備え、パレットの移動のみで試料と標準サンプル
を同時に交換可能な構成にしたことを特徴とする多元素
同時分析装置。A device that irradiates a sample with an electron beam from an electron gun and detects fluorescent X-rays from the sample, and the cross section is approximately U.
It is equipped with a metal part installed inside a letter-shaped pallet and a holder installed inside the pallet that holds multiple standard samples, making it possible to exchange samples and standard samples at the same time simply by moving the pallet. Features: Multi-element simultaneous analysis device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11951581U JPS5826656U (en) | 1981-08-12 | 1981-08-12 | Sample device in multi-element simultaneous analysis device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11951581U JPS5826656U (en) | 1981-08-12 | 1981-08-12 | Sample device in multi-element simultaneous analysis device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5826656U true JPS5826656U (en) | 1983-02-21 |
Family
ID=29913574
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11951581U Pending JPS5826656U (en) | 1981-08-12 | 1981-08-12 | Sample device in multi-element simultaneous analysis device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5826656U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04120365U (en) * | 1991-04-15 | 1992-10-28 | 理学電機工業株式会社 | Calibration device for X-ray analysis |
-
1981
- 1981-08-12 JP JP11951581U patent/JPS5826656U/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04120365U (en) * | 1991-04-15 | 1992-10-28 | 理学電機工業株式会社 | Calibration device for X-ray analysis |
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