JPS6032757U - X-ray microanalyzer - Google Patents

X-ray microanalyzer

Info

Publication number
JPS6032757U
JPS6032757U JP12400383U JP12400383U JPS6032757U JP S6032757 U JPS6032757 U JP S6032757U JP 12400383 U JP12400383 U JP 12400383U JP 12400383 U JP12400383 U JP 12400383U JP S6032757 U JPS6032757 U JP S6032757U
Authority
JP
Japan
Prior art keywords
ray microanalyzer
ray
sample
microanalyzer
sample chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12400383U
Other languages
Japanese (ja)
Inventor
滝沢 典男
Original Assignee
三菱電機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 三菱電機株式会社 filed Critical 三菱電機株式会社
Priority to JP12400383U priority Critical patent/JPS6032757U/en
Publication of JPS6032757U publication Critical patent/JPS6032757U/en
Pending legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のX線マイクロアナライザの試料室の断面
図、第2図はこの考案の一実施例のX線マイクロアナラ
イザの試料室の断面図である。図中1は試料室、2は電
子銃、3は試料、4は電子線、5はW線、6はX線検出
器、7はX線検出器移動装置、8はシャッタ、9は金網
、10は窓である。なお、図中、同一あるいは相当部分
には同一符号を付して示しである。
FIG. 1 is a sectional view of a sample chamber of a conventional X-ray microanalyzer, and FIG. 2 is a sectional view of a sample chamber of an X-ray microanalyzer according to an embodiment of the present invention. In the figure, 1 is a sample chamber, 2 is an electron gun, 3 is a sample, 4 is an electron beam, 5 is a W ray, 6 is an X-ray detector, 7 is an X-ray detector moving device, 8 is a shutter, 9 is a wire mesh, 10 is a window. In the drawings, the same or corresponding parts are designated by the same reference numerals.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] X線マイクロアナライザにおいて、試料及びX線検出器
を内蔵する試料室の壁に、真空を保持し、かつ金属性シ
ャッタ及び金網を備えた内部確認用窓を設けたことを特
徴とするX線マイクロアナライザ。
An X-ray microanalyzer, characterized in that the wall of the sample chamber containing the sample and the X-ray detector is provided with an internal confirmation window that maintains a vacuum and is equipped with a metal shutter and a wire mesh. analyzer.
JP12400383U 1983-08-10 1983-08-10 X-ray microanalyzer Pending JPS6032757U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12400383U JPS6032757U (en) 1983-08-10 1983-08-10 X-ray microanalyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12400383U JPS6032757U (en) 1983-08-10 1983-08-10 X-ray microanalyzer

Publications (1)

Publication Number Publication Date
JPS6032757U true JPS6032757U (en) 1985-03-06

Family

ID=30282840

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12400383U Pending JPS6032757U (en) 1983-08-10 1983-08-10 X-ray microanalyzer

Country Status (1)

Country Link
JP (1) JPS6032757U (en)

Similar Documents

Publication Publication Date Title
JPS6032757U (en) X-ray microanalyzer
JPS5810365U (en) decoupled cathode ray tube
JPS5817766U (en) X-ray tube anode structure
JPS6013960U (en) plasma processing equipment
JPS6076864U (en) X-ray tube equipment
JPS5826656U (en) Sample device in multi-element simultaneous analysis device
JPS5835969U (en) Fritted glass coating equipment
JPS5855358U (en) Sample loading/unloading mechanism for high vacuum equipment
JPS5813657U (en) magnetron
JPS5863559U (en) X-ray fluoroscope
JPS59103989U (en) Vacuum flange mechanism
JPS6033671U (en) radiation detection tube
JPS58128549U (en) cathode ray tube
JPS59164151U (en) electron gun
JPS59144861U (en) Electron tube cathode mounting structure
JPS5859159U (en) Cathodoluminescence detector with concave mirror
JPS5854576U (en) X-ray detector
JPS60136572U (en) CRT holding device
JPS58113954U (en) X-ray fluorescence multiplier tube
JPS5817763U (en) oscilloscope
JPS58113951U (en) electron gun
JPS6121959U (en) electronic capture detector
JPS6146455U (en) IMA electron spray equipment
JPS5879850U (en) Sample contamination prevention device
JPS5888762U (en) electron beam tube