JPS5825054A - 電子顕微鏡における磁場印加装置 - Google Patents
電子顕微鏡における磁場印加装置Info
- Publication number
- JPS5825054A JPS5825054A JP56104085A JP10408581A JPS5825054A JP S5825054 A JPS5825054 A JP S5825054A JP 56104085 A JP56104085 A JP 56104085A JP 10408581 A JP10408581 A JP 10408581A JP S5825054 A JPS5825054 A JP S5825054A
- Authority
- JP
- Japan
- Prior art keywords
- magnetic field
- sample
- objective lens
- magnetic
- pole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56104085A JPS5825054A (ja) | 1981-07-03 | 1981-07-03 | 電子顕微鏡における磁場印加装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56104085A JPS5825054A (ja) | 1981-07-03 | 1981-07-03 | 電子顕微鏡における磁場印加装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5825054A true JPS5825054A (ja) | 1983-02-15 |
| JPS6314814B2 JPS6314814B2 (enExample) | 1988-04-01 |
Family
ID=14371291
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56104085A Granted JPS5825054A (ja) | 1981-07-03 | 1981-07-03 | 電子顕微鏡における磁場印加装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5825054A (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002333361A (ja) * | 2001-05-07 | 2002-11-22 | Sefa Technology Kk | 容器内試料の分量測定方法およびその装置 |
-
1981
- 1981-07-03 JP JP56104085A patent/JPS5825054A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002333361A (ja) * | 2001-05-07 | 2002-11-22 | Sefa Technology Kk | 容器内試料の分量測定方法およびその装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6314814B2 (enExample) | 1988-04-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP0378237B1 (en) | Reflection electron holography apparatus | |
| JP2563134B2 (ja) | 走査透過型位相差電子顕微鏡 | |
| US7502154B2 (en) | Spatial light modulator alignment | |
| EP0263487A3 (en) | Optical axis adjusting apparatus for electron microscope | |
| US4379231A (en) | Electron microscope | |
| JPS5825054A (ja) | 電子顕微鏡における磁場印加装置 | |
| JPH0313700B2 (enExample) | ||
| US6720558B2 (en) | Transmission electron microscope equipped with energy filter | |
| US3657593A (en) | Electron microscopy | |
| JPH09185139A (ja) | カメラ及びステレオカメラシステム | |
| US2617041A (en) | Stereoscopic electron microscope | |
| JPS5851384B2 (ja) | 荷電粒子ビ−ムの偏向方法 | |
| JPH0234139B2 (enExample) | ||
| US4152599A (en) | Method for positioning a workpiece relative to a scanning field or a mask in a charged-particle beam apparatus | |
| JPS59151116A (ja) | 自動合焦装置 | |
| JPS6159405A (ja) | 透過物体2方向同時観察装置 | |
| JPS626300B2 (enExample) | ||
| JPS60103895A (ja) | 立体テレビジヨン装置 | |
| JPS5946745A (ja) | 荷電粒子線装置における自動焦点合わせ装置 | |
| Schlesinger et al. | Correction of deflection-aberrations by analog computer | |
| JPH0228601Y2 (enExample) | ||
| JPS61250950A (ja) | 電子顕微鏡の高精度焦点合せ装置 | |
| JPS58135556A (ja) | 電子光学鏡筒 | |
| JP2578507Y2 (ja) | 走査型光学顕微鏡 | |
| JPS6231473B2 (enExample) |