JPS5825054A - 電子顕微鏡における磁場印加装置 - Google Patents

電子顕微鏡における磁場印加装置

Info

Publication number
JPS5825054A
JPS5825054A JP56104085A JP10408581A JPS5825054A JP S5825054 A JPS5825054 A JP S5825054A JP 56104085 A JP56104085 A JP 56104085A JP 10408581 A JP10408581 A JP 10408581A JP S5825054 A JPS5825054 A JP S5825054A
Authority
JP
Japan
Prior art keywords
magnetic field
sample
objective lens
angle
electron microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56104085A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6314814B2 (enExample
Inventor
Yoshinori Aoki
青木　好則
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Nippon Telegraph and Telephone Corp
Original Assignee
Jeol Ltd
Nihon Denshi KK
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK, Nippon Telegraph and Telephone Corp filed Critical Jeol Ltd
Priority to JP56104085A priority Critical patent/JPS5825054A/ja
Publication of JPS5825054A publication Critical patent/JPS5825054A/ja
Publication of JPS6314814B2 publication Critical patent/JPS6314814B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
JP56104085A 1981-07-03 1981-07-03 電子顕微鏡における磁場印加装置 Granted JPS5825054A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56104085A JPS5825054A (ja) 1981-07-03 1981-07-03 電子顕微鏡における磁場印加装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56104085A JPS5825054A (ja) 1981-07-03 1981-07-03 電子顕微鏡における磁場印加装置

Publications (2)

Publication Number Publication Date
JPS5825054A true JPS5825054A (ja) 1983-02-15
JPS6314814B2 JPS6314814B2 (enExample) 1988-04-01

Family

ID=14371291

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56104085A Granted JPS5825054A (ja) 1981-07-03 1981-07-03 電子顕微鏡における磁場印加装置

Country Status (1)

Country Link
JP (1) JPS5825054A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002333361A (ja) * 2001-05-07 2002-11-22 Sefa Technology Kk 容器内試料の分量測定方法およびその装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002333361A (ja) * 2001-05-07 2002-11-22 Sefa Technology Kk 容器内試料の分量測定方法およびその装置

Also Published As

Publication number Publication date
JPS6314814B2 (enExample) 1988-04-01

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