JPS58225344A - Automatic analytical apparatus - Google Patents

Automatic analytical apparatus

Info

Publication number
JPS58225344A
JPS58225344A JP57110197A JP11019782A JPS58225344A JP S58225344 A JPS58225344 A JP S58225344A JP 57110197 A JP57110197 A JP 57110197A JP 11019782 A JP11019782 A JP 11019782A JP S58225344 A JPS58225344 A JP S58225344A
Authority
JP
Japan
Prior art keywords
memory
image
curve
output
image element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57110197A
Other languages
Japanese (ja)
Other versions
JPH0215012B2 (en
Inventor
Toyotaro Iwata
岩田 豊太郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sysmex Corp
Original Assignee
Sysmex Corp
Tao Medical Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sysmex Corp, Tao Medical Electronics Co Ltd filed Critical Sysmex Corp
Priority to JP57110197A priority Critical patent/JPS58225344A/en
Publication of JPS58225344A publication Critical patent/JPS58225344A/en
Publication of JPH0215012B2 publication Critical patent/JPH0215012B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59Transmissivity
    • G01N21/5907Densitometers
    • G01N21/5911Densitometers of the scanning type

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To carry out the reading of image intensity in high measuring preciseness, by aligning the snesitivity curve of each image element obtained from a photoelectric conversion element to the average sensitivity curve of all image elements. CONSTITUTION:An object to be measured is placed on an XY drive stand 1 and the output of an image reading apparatus 4 is temporarily stored by first memory 6 through an AD conversion circuit 5. The relation of light intensity and output with respect to each photoelectric conversion element of an image reading apparatus 4 constituting each image element is stored by the predetermind address within said first memory 6. Succeedingly, the information in the memory 6 corresponding to each image element is successively read out and the curve of secondary degree of compensation output with respect to light intensity is calculated in order to align the sensitivity curve of each image element to the average sensitivity of all image elements. At the same time, coefficient is read out from secondary memory 8 storing each coefficient of the curve of secondary degree corresponding to each image element and subjected to compensating operation according to the aforementioned curve of secondary degree by an operation apparatus 7 to obtain the output.

Description

【発明の詳細な説明】 本発明は、体液生成分などの各種物質の濃度を測定する
だめの自動分析装置、詳1.〈は各種物質をこれと特異
的に反応する物質と反応させ一各反応物質によって生ず
るパターンを光学的濃度と1゜て読み取り、各種物質の
濃度を測定するように1゜だ自動分析装置に関する本の
で−とくに光学的読取りのための撮像装置の各撮像素子
の特性を求め。
DETAILED DESCRIPTION OF THE INVENTION The present invention provides an automatic analyzer for measuring the concentration of various substances such as body fluid components. This is a book about automatic analyzers that measure the concentration of various substances by reacting various substances with substances that specifically react with them, reading the pattern produced by each reacting substance as optical density, and measuring the concentration of various substances. Therefore, in particular, the characteristics of each image sensor of the image sensor for optical reading are determined.

測定の際の読取り誤差を軽減せ【−めることを目的とし
ている。
The purpose is to reduce reading errors during measurements.

従来、免疫電気永動などによM!4られる抗原。Conventionally, M! 4 antigens.

抗体反応によって生ずる沈降線の濃度、または各種反応
によって得られるパターンの光学的な濃度などによって
一試料に含まれる各種成分濃度を測定する画像読取り装
置は一一般市販の撮像管捷たは半導体化されたイメージ
センサ−と称するものを用込だ場合−各画素を構成する
光電変換素子のバラツキが多いと込う欠点があった。と
ぐに各素子における出力が各種成分濃度に関与する場合
において一各素子間の暗電流の差−感度曲線の差−飽和
曲線の差がそのまま出力の差となって現われるために一
測定結果に誤差を与えるという欠点があった。、l、た
がって自動分析装置に用いられる光学的読取り装置に使
用される光電変換素子の集合体は一各素子間にお込てバ
ラツキが生じない厳選された本のを必要と17、自ずと
1個当りの中側が高くつbてLtうという欠点があった
An image reading device that measures the concentration of various components contained in a sample based on the concentration of a sedimentation line generated by an antibody reaction or the optical density of a pattern obtained by various reactions is a general commercially available image pickup tube or a semiconductor device. When using a so-called image sensor, there was a drawback that there were many variations in the photoelectric conversion elements constituting each pixel. When the output of each element is related to the concentration of various components, the difference in dark current between each element - the difference in sensitivity curve - the difference in saturation curve appears as a difference in output, resulting in an error in the measurement result. It had the disadvantage of giving , l.Therefore, an assembly of photoelectric conversion elements used in an optical reading device used in an automatic analyzer requires carefully selected materials that do not cause variations between each element17. There was a drawback that the middle part of each piece was high and Lt was high.

本発明は」1記の欠点を解消するだめになされたもので
一市販の一般的な画像センサを用いた場合で本、高精度
の画像濃度読取り機能を備えた自動分析装置を提供せん
とする本のである。
The present invention has been made to solve the drawbacks mentioned in 1. It is an object of the present invention to provide an automatic analyzer equipped with a highly accurate image density reading function when a commercially available general image sensor is used. It's a book.

以下、本発明の構成を図面に基づいて説明する。Hereinafter, the configuration of the present invention will be explained based on the drawings.

第1図は本発明σ)装置の構成例を示している。本発明
の装置は、被測定対象物を載せてX輔−Y軸方向に移動
するXY駆動台1と、とのxy駆動台1を制御するxy
駆動装置2と−xy駆動台1の1一方にレンズ3を介【
2て配置された画像読取り装置4と、この画像読取り装
置4の出力信号をディジタル信号に変換するAD変換回
路5と−とのAD変換回路5からの信号を記憶する第1
メモリ6と、この第1メモリ6および前記xy駆動装置
2に接続された演算装置7と−この演算装置7に接続さ
れた第2メモリ8−第3メモリ9および記録装置10と
からなり、各画素の感度曲線を全画素の平均の感度曲線
に合わすために一光強度対補IF出力の2次曲線を求め
、各画素に対応する2次曲線の各係数を記憶11.各画
素によって得られる出力を前記2次曲線によって補正波
グするように構成されている。
FIG. 1 shows an example of the configuration of the σ) apparatus of the present invention. The apparatus of the present invention includes an XY drive stand 1 that carries an object to be measured and moves in the
A lens 3 is connected to one of the drive device 2 and the -xy drive stand 1.
An image reading device 4 disposed in the second image reading device 4 and an AD conversion circuit 5 for converting the output signal of the image reading device 4 into a digital signal.
It consists of a memory 6, an arithmetic device 7 connected to the first memory 6 and the xy drive device 2, a second memory 8 connected to the arithmetic device 7, a third memory 9, and a recording device 10. In order to match the sensitivity curve of a pixel to the average sensitivity curve of all pixels, a quadratic curve of one light intensity versus complementary IF output is determined, and each coefficient of the quadratic curve corresponding to each pixel is stored.11. The output obtained by each pixel is corrected by the quadratic curve.

第1メモリ6には一画像読取り装置4からの生のデータ
が書き込まれ一一方、第3メモリ9には演算処理後の補
正されたデータが書き込寸れる。
Raw data from one image reading device 4 is written into the first memory 6, while corrected data after arithmetic processing is written into the third memory 9.

第2メモリ8には演算処理のだめの補正に関するパラメ
ータが書き込まれる。測定に先立ち、補正に関するパラ
メータを得るだめに以下の処理を行なう。
In the second memory 8, parameters related to correction of arithmetic processing errors are written. Prior to measurement, the following processing is performed in order to obtain parameters related to correction.

まず画像読取り装置4がN個の素子で構成されてbる場
合、XY駆動台1上にすりガラスなどの      ″
□均一な反射体を置き一光量を段階的に変化させ。
First, when the image reading device 4 is composed of N elements, there is a ground glass etc. on the XY drive base 1.
□ Place a uniform reflector and change the amount of light in stages.

各段階でN個の素子についてのそれぞれの出力を得る。At each stage, respective outputs for N elements are obtained.

これを順次第1メモリ乙に記憶させる。なお光量はn段
階に変化させる。ついで信頼性を向」ニさせすりガラス
などの不均一性や、ごみや傷による誤差を取り除くため
に−xy駆動台1を少し移動させ、前述の光量を段階的
に変化させN個の素子についてのそれぞれの出力を得る
という処理を行ない−それぞれの段階の光量と各素子に
対応する第1メモリ6内の番地姉出力を加算してい〈。
This is stored in 1 memory B in order. Note that the light amount is changed in n steps. Next, in order to improve reliability and eliminate errors caused by non-uniformities such as frosted glass, dirt, and scratches, the -xy drive platform 1 was moved a little, and the above-mentioned light intensity was changed stepwise to obtain the results for N elements. The process of obtaining each output is performed by adding the amount of light at each stage and the address output in the first memory 6 corresponding to each element.

以にのxy駆動台1の移動金所定の回数1m回とする)
行ない一第1メモリ6内の所定の番地に記憶されたm回
にわたる出力の合計Isum(N、 n )(ただI、
N=1.2.−=N、 n =1.2.−=n )およ
びN個の素子についてのn時点における平均値Mean
(n )(だだ1. n = i、2.・・・n)を求
める。
In the following, the movement of the xy drive platform 1 shall be 1 m times as specified)
First, the sum of m outputs stored at a predetermined address in the first memory 6 is Isum (N, n) (just I,
N=1.2. -=N, n=1.2. −=n ) and the mean value at time n for N elements
Find (n) (1. n = i, 2...n).

yN = Isum(N、 n)−Mean(n)x 
N= Isum(N、 n ) であるので−たとえばN番目の素子−についてグラフ化
17て曲線を求め−この曲線に対応する方程式を求める
。一般には2次式と【、て近似するだけで十分な結果が
得られるので− yN=A、、N−4−A、、N’xN+A、l、Nx”
N(N =1.2.’、、、N)と17−N番目におけ
る2次式の係数A1.N−At、N’−AIl、Nが求
められる。Nを1からNまで行なり−この係数値を第2
メモリ8に記憶させる。
yN = Isum(N, n)−Mean(n)x
Since N=Isum(N, n) - for example, for the Nth element - graph 17 a curve and find the equation corresponding to this curve. In general, a sufficient result can be obtained by approximating the quadratic formula [, - yN=A,,N-4-A,,N'xN+A,l,Nx"
N (N = 1.2.', , N) and the coefficient A1. of the quadratic equation at the 17-Nth. N-At, N'-AIl, and N are obtained. N from 1 to N - set this coefficient value to the second
Store it in memory 8.

第2図は第88番目の素子についての特性を示すグラフ
であり、第3図は第89番目の素子−第4図は第90番
目の素子についての特性を示すグラフである。すなわち
第2図〜第4図のグラフの横軸は光強度を示12.縦軸
はその素子の素子全体の平均値からのずれを示す本ので
あり、光度を変えていくと素子全体の平均的な感度に対
1.て、そ 7れぞれの素子が感度のずれを生じている
ことが3つのグラフから理解できる。なお第2図〜第4
図のグラフのy軸はm回にわたるトータルの出力合計で
はなく、1回分にもどして表示している。以上のように
して−1〜N番目の素子についての各A1、A、Asσ
’Iil[が次表のように第2メモリ8内に記憶され、
補正忙関するパラメータにつめての処理が終る。
FIG. 2 is a graph showing the characteristics of the 88th element, FIG. 3 is a graph showing the characteristics of the 89th element, and FIG. 4 is a graph showing the characteristics of the 90th element. That is, the horizontal axis of the graphs in FIGS. 2 to 4 represents the light intensity. The vertical axis shows the deviation of the element from the average value of the whole element, and as the luminous intensity is changed, the average sensitivity of the whole element changes by 1. It can be understood from the three graphs that each of the seven elements has a difference in sensitivity. In addition, Figures 2 to 4
The y-axis of the graph shown in the figure is not the total output over m times, but the output for one time is displayed. As described above, each A1, A, Asσ for the −1 to Nth elements
'Iil[ is stored in the second memory 8 as shown in the following table,
The processing of parameters related to correction is completed.

1〜記の装置を用層て実際の濃度測宇を行なうには、被
測定対象物をXY駆動台1に載せ5画像読取り装置4の
出力をAD変換回路5を介1−て第1メモリー6に一時
記憶させ、続いて各画素に対応する第1メモリ6内の情
報を順次読み出し、同時に第2メモリ8内σ)A、〜A
Rの係数を読み出i−1゜y−AIトA2x 4− A
、 x’  の式に基づいてyを求めると−このyは補
正後の値となる。
In order to perform actual concentration measurement using the apparatuses 1 to 5, the object to be measured is placed on the 6, and then sequentially read out the information in the first memory 6 corresponding to each pixel, and at the same time read out the information in the second memory 8 σ)A, ~A
Read the coefficient of R i-1゜y-AItoA2x 4-A
, x' - This y becomes the corrected value.

第5図は補iF、 railの生の出力をプリントアウ
ト1−だ例であり、被測定対象物と1.てすりガラスを
用い、縦軸を光強度と1.た例である。これを補正波q
、するととKより、第6図に示すような補jHされた出
力が得られる。光強度を種々変化させてもこの効果は変
わらす一良好な補正された出力を得ることができる。
Figure 5 is an example of printing out the raw output of supplementary iF and rail, and shows the object to be measured and 1. Using frosted glass, the vertical axis represents the light intensity and 1. This is an example. This is corrected by the wave q
, and K, a compensated output as shown in FIG. 6 is obtained. Even if the light intensity is varied, this effect changes and a good corrected output can be obtained.

以上説明[−たように、本発明の自動分析装置は一各素
子の感度バラツキを単純に均一化するだけでなく一感度
曲線そのものを11均化させる本ので−すなわち各画素
の感度曲線を全画素のIV均の感度曲線に合わすことに
より一測定精度が高くなり。
As explained above, the automatic analyzer of the present invention not only equalizes the sensitivity variations of each element, but also equalizes the sensitivity curve itself. Measurement accuracy increases by matching the pixel's IV average sensitivity curve.

また補止量も平均値からのずれを補正1〜517.均値
に近づけるものであるだめに、それ程σ)大きな補1F
は必要とせず補止量は少なくてすむなどの種々の優れた
効果を有E7ている。なお以上の補正は、光電素T・が
−・列に並べられた1次元σ)画像センサにも、2次元
の而でとらえる画像センサにも適用することができる。
The correction amount also corrects the deviation from the average value from 1 to 517. The more σ) it is possible to get close to the average value, the larger the complement 1F
It has various excellent effects, such as not requiring any replenishment and requiring only a small amount of replenishment. Note that the above correction can be applied to both a one-dimensional (σ) image sensor in which photoelements T are arranged in rows and an image sensor that captures images in two-dimensional terms.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明σ月」動分析装置の一実施態様を示す系
統的説明図−第2図〜第4図は画像読取り装置を構成す
る素子・につしての特性の一例を示すグラフ−第5図は
補正前の牛の出力をプリントアウトした例を示す図、第
6図は補正後の出力をプリントアウトした例を示す図で
ある。 1・・xy駆動台、2・・・XY駆動装置−3・・・レ
ンズ−4・・画像読取り装置−5・・AD変換回路、6
・・・第1メモlL7・・演算装置−8・・−第2メモ
リー9・・第3メモ+7.IQ・・・記録装置特許出願
人 東亜医用電子株式会社 代理人弁理士塩出真−1,。 (パ)
Figure 1 is a systematic explanatory diagram showing one embodiment of the dynamic analysis device of the present invention - Figures 2 to 4 are graphs showing examples of characteristics of elements constituting the image reading device - FIG. 5 is a diagram showing an example of printing out the output of a cow before correction, and FIG. 6 is a diagram showing an example of printing out the output after correction. 1...XY drive stand, 2...XY drive device-3...Lens-4...Image reading device-5...AD conversion circuit, 6
...First memory 1L7...Arithmetic unit -8...-Second memory 9...Third memo +7. IQ...Recording device patent applicant Makoto Shiide-1, patent attorney representing Toa Medical Electronics Co., Ltd. (pa)

Claims (1)

【特許請求の範囲】 1 被測定z1象物を載せてX軸、Y軸方向に移動する
xy駆動台と、とのxy駆動台を制御するxy駆動装置
と−xy駆動台の上方にレンズを介1.て配置された画
像読取り装置と−この画像読取り装置の出力信号をディ
ジタル信号に変換するAD変換回路と−このAD変換回
路からの信号を記憶する第1メモリと−この第1メモリ
および前記XY駆動装置に接続された演算装置と−この
演算装置に接続された第2メモリー第3メモリおよび記
録装置とからなり一各画素の感度曲線を全画素の平均の
感度曲線に合わすために、光強度対補正出力の2次曲線
を求め。 各画素に対応する2次曲線の各係数を記憶L、各画素に
よって得られる出力を前記2次曲線によって補正演算す
るようにしてなることを特徴とする自動分析装置。
[Scope of Claims] 1. An xy drive base that carries an object to be measured z1 and moves in the X-axis and Y-axis directions, an xy drive device that controls the xy drive base, and a lens above the -xy drive base. Intervention 1. - an AD conversion circuit that converts the output signal of the image reading device into a digital signal; - a first memory that stores the signal from the AD conversion circuit; - the first memory and the XY drive; The apparatus includes a computing device connected to the computing device, a second memory connected to the computing device, a third memory, and a recording device. Find the quadratic curve of the corrected output. An automatic analyzer characterized in that each coefficient of a quadratic curve corresponding to each pixel is stored L, and an output obtained by each pixel is corrected using the quadratic curve.
JP57110197A 1982-06-25 1982-06-25 Automatic analytical apparatus Granted JPS58225344A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57110197A JPS58225344A (en) 1982-06-25 1982-06-25 Automatic analytical apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57110197A JPS58225344A (en) 1982-06-25 1982-06-25 Automatic analytical apparatus

Publications (2)

Publication Number Publication Date
JPS58225344A true JPS58225344A (en) 1983-12-27
JPH0215012B2 JPH0215012B2 (en) 1990-04-10

Family

ID=14529504

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57110197A Granted JPS58225344A (en) 1982-06-25 1982-06-25 Automatic analytical apparatus

Country Status (1)

Country Link
JP (1) JPS58225344A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6154428A (en) * 1984-08-24 1986-03-18 Shimadzu Corp Densitometer
FR2591389A1 (en) * 1985-12-05 1987-06-12 Elf Aquitaine ION SELECTIVE FIELD EFFECT TRANSISTOR AND MANUFACTURING METHOD
JP2006090864A (en) * 2004-09-24 2006-04-06 Denka Seiken Co Ltd Method for calculating content of specific component in vaccine

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6154428A (en) * 1984-08-24 1986-03-18 Shimadzu Corp Densitometer
FR2591389A1 (en) * 1985-12-05 1987-06-12 Elf Aquitaine ION SELECTIVE FIELD EFFECT TRANSISTOR AND MANUFACTURING METHOD
JP2006090864A (en) * 2004-09-24 2006-04-06 Denka Seiken Co Ltd Method for calculating content of specific component in vaccine

Also Published As

Publication number Publication date
JPH0215012B2 (en) 1990-04-10

Similar Documents

Publication Publication Date Title
US5101111A (en) Method of measuring thickness of film with a reference sample having a known reflectance
US5563703A (en) Lead coplanarity inspection apparatus and method thereof
EP0919803A1 (en) Method and compact system for inspecting a reticle with high accuracy
JPS5963725A (en) Pattern inspector
JPH07190940A (en) Evaluation of video test-piece reader and test piece
JPS60119442A (en) Method of calibrating reflectometer
CN113920113B (en) Method and system for point-to-point white reference correction of hyperspectral image
JPS58109837A (en) Compensating method of calibration curve
CN101889869B (en) Imaging apparatus and control method thereof
US4659936A (en) Line width measuring device and method
Curry et al. Calibration of an array camera
JPS58225344A (en) Automatic analytical apparatus
CN109632087B (en) On-site calibration method and device suitable for imaging brightness meter
CN117870537A (en) Method, system and storage medium for measuring battery pole piece thinning area
CN111076816B (en) Full-field spectrum calibration error correction method for large-aperture static interference imaging spectrometer
JP4234703B2 (en) Defect inspection equipment
GB2064102A (en) Improvements in electro- optical dimension measurement
Takalo et al. On system calibration of digital levels
CN113341168A (en) Speed measuring method, device and system based on contact type image sensor
CN101354357A (en) Method for analyzing micro-density image of tree annual ring
JP2012211834A (en) Pattern inspection device and pattern inspection method
JPH10185657A (en) Method of measuring fluctuating material upper level, and measuring device therefor
US20020149783A1 (en) Method for determining the distance between periodic structures on an integrated circuit or a photomask
JP2768872B2 (en) Image reading method and apparatus
JPS601412Y2 (en) Automatic inspection device for chemical reaction test pieces