JPS58223343A - Transport mechanism - Google Patents

Transport mechanism

Info

Publication number
JPS58223343A
JPS58223343A JP10727082A JP10727082A JPS58223343A JP S58223343 A JPS58223343 A JP S58223343A JP 10727082 A JP10727082 A JP 10727082A JP 10727082 A JP10727082 A JP 10727082A JP S58223343 A JPS58223343 A JP S58223343A
Authority
JP
Japan
Prior art keywords
tray
chamber
bellows
processing chamber
feeding means
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10727082A
Other languages
Japanese (ja)
Inventor
Yoshio Suzuki
喜雄 鈴木
Hiroshi Yamamoto
弘 山本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP10727082A priority Critical patent/JPS58223343A/en
Publication of JPS58223343A publication Critical patent/JPS58223343A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67754Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber horizontal transfer of a batch of workpieces
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67757Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber vertical transfer of a batch of workpieces
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment

Abstract

PURPOSE:To decrease the number of movable parts, to simplify the constitution of the transport mechanism and to improve the yield of the manufacture of a semiconductor device by extracting and supplying a quartz tray, etc. between the treating chamber and preparatory chamber of a vacuum device through a motion of one reciprocation. CONSTITUTION:A section between the treating chamber 11 executing treatment such as edging and the preparatory chamber 12 evacuated up to vacuum is continued by a gate valve 17. First and second bellows 13, 14 incorporating vertical motion means vertically moving the first and second quartz trays A, B of different size are set up into the treating chamber 11. A feed-means 15 with a rack 18 horizontally reciprocating between the treating chamber 11 and the preparatory chamber 12, a pinion 19 and a motor 20 is set up into the preparatory chamber 12. The feed-means 15 on which the tray A is placed is moved to the treating chamber 11 from the preparatory chamber 12 under the state in which the second tray B placed on a treating base is lifted by the bellows 14 in the treating chamber 11, and the bellows is dropped and the tray B is placed on the feed-means 15 while the bellows 13 is elevated, thus simplifying the constitution of the transport mechanism.

Description

【発明の詳細な説明】 (1)発明の技術分!l’l’ 本発明はj!l!1般機構、詳しくは真空装置内での石
英トレー等の11(!送および配置のための機構に関す
る。
[Detailed description of the invention] (1) Technical part of the invention! l'l' The present invention is j! l! It relates generally to mechanisms, and more particularly to mechanisms for transporting and placing quartz trays, etc., within a vacuum apparatus.

(2)技術の背景 半導体装置の製造工程において、半導体ウェハに対し真
空処理室内で腐蝕性の処理ガスを用いてエツチングがな
される。かかる処理は、真空と腐蝕性ガスとの双方が関
係するため、複雑、高度な機構を用いる一方で、その機
構の安定性に留意しなければならない。
(2) Background of the Technology In the manufacturing process of semiconductor devices, semiconductor wafers are etched using corrosive processing gas in a vacuum processing chamber. Since such processing involves both vacuum and corrosive gas, it uses a complex and sophisticated mechanism, but care must be taken to ensure the stability of the mechanism.

従来の運II1機構においては、第1図fa+の斜視図
に示される石英トレーが用いられ、同図において、1ば
石英トレー(以下トレーという)、2はウェハを示し、
通常10枚のウェハがトレーに載置されて1ハツチを構
成し、バッチ処理がなされる。
In the conventional Un II1 mechanism, a quartz tray shown in the perspective view of FIG.
Usually, ten wafers are placed on a tray to form one hatch, and batch processing is performed.

ウェハの載置状態は同図(blの断面図に示され、ト(
2) レー1に形成した凹部内にウェハ2を、その上面がトレ
ー表面」−に突出する如くに配置する。
The mounting state of the wafer is shown in the cross-sectional view of the same figure (bl), and
2) Place the wafer 2 in the recess formed in the tray 1 so that its upper surface protrudes onto the surface of the tray.

ウェハの処理は真空処理室内でなされ、トレーの出入り
を計画的に行うため処理室には予備室が連結されている
。第2図には従来の運Il!機構が概略断面図で示され
、同図において、3tよ処理室、4は予備室、5は処理
室の台すなわち下部電極(この電極はエツチングに際し
用いられる)、6はゲートバルブ、7關゛1−レーの保
持、解放手段をもち、−に不連動をなす第1機構、8は
予備室と処理室との間の往復運動をなし、かつ、トレー
の保持、解放手段をもった第2機構、9は上下運動をな
し受は皿として働く第3機構、10はモータ、I l 
&:L:駆動チェーンをそれぞれ示す。
Wafer processing is performed in a vacuum processing chamber, and a preliminary chamber is connected to the processing chamber in order to systematically move trays in and out. Figure 2 shows conventional luck Il! The mechanism is shown in a schematic cross-sectional view, and in the figure, 3t is a processing chamber, 4 is a preliminary chamber, 5 is a stage or lower electrode of the processing chamber (this electrode is used during etching), 6 is a gate valve, and 7 is a 1 - a first mechanism which has means for holding and releasing the tray and is non-interlocked with 8; a second mechanism 8 having means for holding and releasing the tray; mechanism, 9 is a third mechanism that moves up and down and the receiver serves as a plate; 10 is a motor;
&:L: Indicates a drive chain, respectively.

ウェハの処理を処理室および予備室とのもγ置関係で概
説すると、処理室3で処理されたウェハをのせたトレー
lは、予備室4に戻される。ここで処理室3は空いてい
るので、別のトレー1 (その上にはウェハが第1図+
a+に示す如く載置されている)を処理室3に移す。こ
のときゲートバルブ(3) 6が開閉してトレー1の移動を許す。
To summarize the processing of wafers in terms of the gamma positional relationship between the processing chamber and the preparatory chamber, the tray l carrying the wafers processed in the processing chamber 3 is returned to the preparatory chamber 4 . At this point, processing chamber 3 is empty, so another tray 1 (on which wafers are placed)
(placed as shown in a+) is transferred to the processing chamber 3. At this time, gate valves (3) 6 open and close to allow tray 1 to move.

予備室4内での操作は大路次の手順で進められる。処理
室でのエツチングに関係して2枚のトレーを使用する。
The operation in the preliminary room 4 proceeds according to the following procedure. Two trays are used in connection with etching in the processing chamber.

処理室でトレーIのウェハに対し処理がなされている間
に、予備室においては第1の機構7で既に処理されたウ
ェハをl・レー1から取り出j7、新たなウェハをトレ
ー1に供給し、第1の機構7が下方に第2の機構8の位
置まで下がる。このとき、第3の機構9は第2の機構8
の位置まで1−がってくる。ごこて、第1の機構7は)
1/−1を解放し、第3の機構9がそれを受け、予備室
は排気され真空にされる。
While the wafers on tray I are being processed in the processing chamber, in the preliminary chamber, the first mechanism 7 takes out the already processed wafers from the tray 1 and supplies new wafers to the tray 1. Then, the first mechanism 7 moves downward to the position of the second mechanism 8. At this time, the third mechanism 9 is the second mechanism 8
1- comes to the position. iron, the first mechanism 7)
1/-1 is released, the third mechanism 9 receives it, and the preliminary chamber is evacuated and evacuated.

処理室でエツチングが終了すると、ゲートバルブ6が開
く。このとき、処理室3、予備室4恭に真空状態にある
。第2の機構8は解放状態で処理室3へ動き、次いで1
〜レー1を予備室4に移す。
When etching is completed in the processing chamber, the gate valve 6 is opened. At this time, the processing chamber 3 and the preliminary chamber 4 are in a vacuum state. The second mechanism 8 moves into the processing chamber 3 in the open state and then the first
~Move Ray 1 to Preparatory Room 4.

ここで第1の機構7が爪は開いた解放状態で下がってき
て、爪がトレーをつかみ、その状態で」ニガに動く。次
に未処理ウェハを乗せたトレー】が第3の機構9により
第2の機構8の位置まで」−昇し、(4) かつ機構8の保持機構でトレーば機構9より浮かしかつ
処理室3へ移動し、所定の位置で保持機構が解放し、ト
レーを処理室へ残し、機構9は処理室4へ戻る。ここで
ゲートバルブ6が閉じ、処理室3でエツチングが開始す
る。第1の機構7は所定の位置でエツチングの終ったウ
ェハを取り出t7、新しいウェハを供給する。以下順次
上述の工程が繰り返される。
The first mechanism 7 now lowers with its claws in an open, released state, grips the tray, and moves in that state. Next, the tray carrying unprocessed wafers is raised by the third mechanism 9 to the position of the second mechanism 8, (4) and the tray is lifted from the mechanism 9 by the holding mechanism of the mechanism 8, and is moved to the processing chamber 3. The holding mechanism is released at a predetermined position, leaving the tray in the processing chamber, and the mechanism 9 returns to the processing chamber 4. At this point, the gate valve 6 is closed and etching begins in the processing chamber 3. The first mechanism 7 takes out the etched wafer at a predetermined position t7 and supplies a new wafer. Thereafter, the above-described steps are sequentially repeated.

(3)従来技術と問題点 前記した装置は、真空内で腐蝕性ガスを用いる状況下に
操作される。他方各種機構の連結部にはグリース等の潤
滑材が使用できないため、損傷が早い、いわゆるガタが
きやすい。例えば、現在テフロン製(ターカイト)のベ
アリングを用いているが、それの摩耗が早くそこがガス
で侵されて機構の正常な運動が阻害される。加え一ζ、
従来装置は複雑かつ高度であるから、前記した損傷の影
響は多大である。
(3) Prior Art and Problems The above-described apparatus is operated in a vacuum using corrosive gases. On the other hand, since lubricants such as grease cannot be used in the connecting parts of various mechanisms, they are easily damaged, or loose. For example, Teflon bearings are currently used, but they wear out quickly and are corroded by gas, which prevents the mechanism from operating normally. In addition,
Due to the complexity and sophistication of conventional equipment, the effects of such damage are significant.

(4)発明の目的 本発明は上記従来の問題点に鑑み、構成部品(5) の動きが少なく、簡単な構造で、従来の複雑高度な装置
により行われる操作を実施でき、かつトレーの供給、取
出しを2往復から1往復に短縮し、稼動率アンプに寄与
できる運Il!機構を提供することを目的とする。
(4) Purpose of the Invention In view of the above-mentioned conventional problems, the present invention has a simple structure with less movement of component parts (5), can perform operations performed by conventional complicated and sophisticated equipment, and can supply trays. , we are lucky to be able to shorten the retrieval time from 2 round trips to 1 round trip, contributing to an increase in operating efficiency! The purpose is to provide a mechanism.

(5)発明の構成 そしてこの目的は本発明によれば、真空装置の処理室と
予備室との間で石英トレー等(以下トレーという)の取
り出しおよび供給を1往復の運動で行う運搬機構を提供
することによって達成され、当該機構においては、長さ
の異なる第1と第2の1−レーを各1枚、これらのトレ
ーを上下させるための手段として4個ずつのへローズ、
トレーをのせて水平方向の往復運動をなす送り手段、お
よび処理室でトレーを交互にのせる下部電極である台が
設けられ、操作において、処理室において前記の台にの
っている第2のトレーは4つの第2のへローズにより持
ち上げられた状態で、予備室で第1のトレー八をのせた
送り手段が処理室へ移動し、次いで、4つの第2のベロ
ーズが下降保持(6) することにより第2のトレーBを送り手段へのせ、同時
に4つの第1のへローズが上昇保持することにより第1
のトレーAを送り手段より浮かせ、次に、送り手段を処
理室から予備室へ移動させ、4つの第1のへローズを下
降させ、第1のトレーAを台にのせるごとにより、台に
のせる第1と第2のトレーA、Bを交換し得ることを特
徴とし、上記の逆も同様の一連の操作で可能である。
(5) Structure and object of the invention According to the present invention, a transport mechanism is provided which takes out and supplies quartz trays, etc. (hereinafter referred to as trays) between a processing chamber and a preliminary chamber of a vacuum device in one reciprocating motion. This is accomplished by providing one each of the first and second one-lays of different lengths, four hems each as a means for raising and lowering these trays,
A feeding means for horizontally reciprocating movement on which trays are placed, and a platform which is a lower electrode on which trays are alternately placed in the processing chamber are provided, and in operation, a second electrode placed on said platform in the processing chamber is provided. With the tray being lifted up by the four second bellows, the feeding means carrying the first tray in the preliminary chamber moves to the processing chamber, and then the four second bellows lower and hold it (6). By doing this, the second tray B is placed on the feeding means, and at the same time, the four first trays are raised and held, so that the first tray B is placed on the feeding means.
Tray A is floated from the feeding means, then the feeding means is moved from the processing chamber to the preliminary chamber, the four first hems are lowered, and each time the first tray A is placed on the stand, it is placed on the stand. It is characterized in that the first and second trays A and B to be loaded can be exchanged, and the reverse of the above is also possible by a similar series of operations.

(6)発明の実施例 以下、本発明の実施例を図面によって詳述する。(6) Examples of the invention Embodiments of the present invention will be described in detail below with reference to the drawings.

第3図と第4図に本発明にかかる運W!機構が概略正面
断面図と左側断面図で示され(なお第3図以下において
、既に示された部分と同じものは同じ符号で示す)、こ
れらの図において、11はその内でエツチング等の処理
がなされる処理室、12は予備室(予備室]2の土壁は
ウェハを人手で出し入れすることができるよう開閉可能
になっている)、13と14はエアーシリンダーで」1
下されるベローズ(処理室には8つのへローブが設けら
れる)、(7) 15、15’はトレーをのせ水平運動をなして処理室1
1と予備室12間を往復するラックとビニオンにより駆
動される送り手段、Aは圏い第1のトレー、Bは短い第
2のトレー(これらはいずれも従来の石英(・レーと同
様の構造のものである)、16は処理室11内に設置さ
れた台(下部電極)、17ば開閉用の通常のゲーI−バ
ルブ、18はランク、19はビニオン、20ばピニオン
19駆動用のモータ、21はヘアリングを示し、予備室
12の図に見て右には更に他の予備室が連結されている
が、それば一部省略して示される。上記から理解されう
る如く、第1のベローズ】3は第1のトレー八を、第2
のへローズI4は第2のトレー13を上下させるための
ものであり、処理室11内ではベローズが一ヒ下運動を
するだけであり、水平方向往復運動をなす送り手段を駆
動する機構は予備室12内にのみ設けられ、ピニオン駆
動モータは1個だけ予備室の外部に位置する。
Figures 3 and 4 show the luck involved in this invention! The mechanism is shown in a schematic front sectional view and left side sectional view (in Figures 3 and below, the same parts as those already shown are indicated by the same reference numerals). 12 is a preliminary chamber (preparatory chamber) 2 whose earthen walls can be opened and closed so that wafers can be taken in and out manually), and 13 and 14 are air cylinders.
The lowered bellows (8 bellows are provided in the processing chamber), (7) 15, 15' carry the tray and move horizontally to the processing chamber 1.
1 and the preliminary chamber 12, A is the hollow first tray, B is the short second tray (both of these have the same structure as conventional quartz trays). ), 16 is a stand (lower electrode) installed in the processing chamber 11, 17 is a normal gate I-valve for opening and closing, 18 is a rank, 19 is a pinion, and 20 is a motor for driving the pinion 19. , 21 indicates a hair ring, and to the right of the preliminary chamber 12 is connected another preliminary chamber, but it is partially omitted from the illustration.As can be understood from the above, the first bellows] 3 is the first tray, the second
The bellows I4 is for raising and lowering the second tray 13, and within the processing chamber 11, the bellows only moves one step downward, and the mechanism for driving the feeding means that makes horizontal reciprocating motion is in reserve. It is provided only within the chamber 12, and only one pinion drive motor is located outside the reserve chamber.

第5図は第3図に示される配置の左部分の平面図で、第
4図の機構を上から見た図である。第6図は第4図に示
される送り手段の詳細を示す断(8) 面で、図において22は固定板を示し、ベローズ13.
14は下げられた状態にある。第7図は第6図に示す機
構の斜視図である。ランク1日にトレーをのせるための
手段が−に下に形成され、これら手段はラック】8から
張り出した構成のもので、面取りされていてトレーを正
確に位置ぎめしうる。I・レーの取外しおよび装着(供
給)およびウェハのイバ給、取出しは人手によってもま
たは自動的にもなしうる。
5 is a plan view of the left portion of the arrangement shown in FIG. 3, and a top view of the mechanism of FIG. 4; FIG. FIG. 6 is a section (8) showing the details of the feeding means shown in FIG.
14 is in a lowered state. FIG. 7 is a perspective view of the mechanism shown in FIG. 6. Means for placing the tray on the rank 1 are formed below - and these means extend from the rack [8] and are chamfered to permit accurate positioning of the tray. The removal and loading (feeding) of the I-ray and the loading and unloading of wafers can be done manually or automatically.

操作において、トレーAを処理室11におくためには、
第1のへlコーグ13を−J二げ、第1のトレー八を送
り手段15のレベルから上方に上げる。この状態で、送
り手段15を予備室に戻す。1・し−八はへローズ13
により上方に保持されているから送り手段I5は支障な
く予備室12に戻りうる。送り手段15が予備室12に
完全に移った後、ベローズ13で保持していたトレーA
はベローズ13の下降につれて台(下部電極)16に収
められる。ここでエツチング開始の準備は終る。
In operation, in order to place tray A in the processing chamber 11,
The first tray 8 is raised upwardly from the level of the feed means 15 by lowering the first cog 13. In this state, the feeding means 15 is returned to the preliminary chamber. 1. Shi-hachiha Heroes 13
Since the feed means I5 is held upward by the feed means I5, it can return to the preliminary chamber 12 without any trouble. After the feeding means 15 has completely moved to the preliminary chamber 12, the tray A held by the bellows 13
is accommodated in the base (lower electrode) 16 as the bellows 13 descends. At this point, preparations for starting etching are completed.

エツチングが終った後、トレーAを予備室12(9) に移すと共に、トレーBを処理室11に移し、」−述し
たと同じ工程を繰り返す。すなわち、予備室12から送
り手段15が処理室11へ送られるが、その前に、ベロ
ーズ13が台16にのっているトレーAを持ら」二げ、
その状態でトレーBが送られてくる。]・トレーはベロ
ーズ13により上方に上げられているからトレーBと衝
突することはない。トレーAを送り手段15にのせると
同時に、トレーBを台16にのせるため第2の4つのへ
ローズ14によってそれを持ち上げる。この上がった状
態がトレーの保持状態である。トレー八が送り手段15
にのった状態で、それを予備室12に動かすために送り
手段15は逆戻りする。トレーBを上げていた第2のベ
ローズ14が台16まで下がると次のエツチングを開始
しうる。
After etching is completed, tray A is transferred to the preliminary chamber 12 (9), tray B is transferred to the processing chamber 11, and the same steps as described above are repeated. That is, the feeding means 15 is sent from the preliminary chamber 12 to the processing chamber 11, but before that, the bellows 13 holds the tray A on the stand 16.
Tray B is sent in this state. ] - Since the tray is raised upward by the bellows 13, it will not collide with tray B. At the same time as tray A is placed on the feeding means 15, tray B is lifted up by the second four hollows 14 in order to be placed on the stand 16. This raised state is the tray holding state. Tray 8 is the feeding means 15
In order to move it to the preliminary chamber 12, the feeding means 15 moves back. When the second bellows 14, which was raising the tray B, is lowered to the platform 16, the next etching can begin.

トレーAと13との相対的なレベル関係は第8図の線図
に示され、同図において、イ、口、ハで示す位置はトレ
ーへのレベル、二、ホ、へで示す位置はトレーBのレベ
ルを示す。
The relative level relationship between trays A and 13 is shown in the diagram in Figure 8, in which the positions indicated by A, C and C are at the level to the tray, and the positions indicated by 2, H and H are at the level of the tray. Indicates the level of B.

イばトレーAがベローズ13により持ち」二げら(10
) れた位置、口はトレーAが送り手段15にのって移動さ
れる位置、ハはトレーAが台16(下部電極)」二にの
せられた位置、二はトレーBがベローズ14により持ち
−にげられた位置、ホはトレーBが送り手段15上にの
って移動される位置、へはトレーBが台16」−にのせ
られた位置、最下位の線はベローズ13.14の下降位
置を示す。
The tray A is held by the bellows 13.
), the mouth is the position where tray A is moved on the feeding means 15, c is the position where tray A is placed on the stand 16 (lower electrode), and the second position is where tray B is held by the bellows 14. - The lowered position, E is the position where tray B is moved on the feeding means 15, H is the position where tray B is placed on the stand 16'', and the lowest line is the position of the bellows 13.14. Indicates the lowered position.

ベローズ】3は第9図に示される如く先端に円錐形の固
定手段23をもち、固定手段はトレーAに設けた位置ぎ
め穴24内に収まる如く構成される。
The bellows 3 has a conical fixing means 23 at its tip, as shown in FIG.

かかる構成により、ベローズ13はトレーAを正しい位
置で支持し、また固定手段23が穴24内に収まってい
るため、トレーAが図に見て左右に動くことが阻止され
る。ベローズ14も全く同様の構成のものであり、また
トレーBにも同様に位置ぎめ穴が形成されている。
With this configuration, the bellows 13 supports the tray A in the correct position, and since the fixing means 23 are housed in the holes 24, the tray A is prevented from moving from side to side as seen in the figure. The bellows 14 has exactly the same structure, and the tray B also has positioning holes formed in the same way.

ベローズはその内部に収められた例えばエアシリンダを
腐蝕製ガスから保護すると同時に、シリンダの潤滑材が
真空にされた処理室内に飛散しエツチング等の障害とな
ることを防止するので、(11) 従来技術において処理室内の可動機構について経験され
た問題が回避される。また、処理室内に置かれる可動機
構はベローズだけであるので、構成および操作は簡単で
ある。更に、送り手段はラックとビニオンを用いる簡単
な構成のもので、それが処理室に入るときはエツチング
等の処理の終っている時であるので、ガスによる腐蝕は
なく、またそれの駆動手段であるモータは予備室外に配
置されるので、モータの損傷およびモータによる真空へ
の悪影響は回避される。
The bellows protects the air cylinder housed inside, for example, from corrosive gases, and at the same time prevents the cylinder's lubricant from scattering into the evacuated processing chamber and causing problems such as etching. Problems experienced in the art with moving mechanisms within the process chamber are avoided. Further, since the only movable mechanism placed in the processing chamber is the bellows, the configuration and operation are simple. Furthermore, the feeding means is of a simple structure using a rack and a pinion, and since it enters the processing chamber when etching or other processing has been completed, there is no corrosion due to gas, and the driving means for it is Since some motors are located outside the reserve chamber, damage to the motors and negative effects on the vacuum by the motors are avoided.

なお以上には、処理室でエツチングされるウェハを搬送
する場合を例に説明したが、本発明の適用範囲はその場
合に限定されるものでなく、真空処理室への物品搬送一
般にも及ぶことはいうまでもない。またトレー上下動、
トレー搬送の機構、構造等においてもベローズとエアシ
リンダ、ランクとビニオンの組合せにかぎらず一般的な
駆動方式も対象となる。
Although the above description has been made using an example of transporting a wafer to be etched in a processing chamber, the scope of application of the present invention is not limited to that case, but also extends to general transport of articles to a vacuum processing chamber. Needless to say. Also, the tray moves up and down,
Regarding the mechanism and structure of tray conveyance, not only combinations of bellows and air cylinders and ranks and binions, but also general drive systems are covered.

(7)発明の効果 以」−1詳細に説明したように、本発明による(12) と、可動部品の数が少なく、構造と操作が簡f(jな運
搬機構が提供され、半導体装置製造の歩留り向上に寄与
するだけでなく、装置自体が永もちする効果が得られる
(7) Effects of the Invention''-1 As explained in detail, the present invention (12) provides a transportation mechanism with a small number of moving parts and a simple structure and operation, which facilitates semiconductor device manufacturing. This not only contributes to improved yields, but also extends the lifespan of the device itself.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図fatはウェハ搬送用の石英l・レーの斜視図、
同図(blは同図(alの石莢トレーに載置されたウェ
ハを示す断面図、第2図は従来の処理室と予備室間の運
搬機構の概略1析面1図、第3図は本発明ムこかかる運
1ift機構の正面断面図、第4図は第3図の運搬機構
の左側断面図、第5図は第3図の運1般機構の左の部分
の平面図、第6図は第4図の左の部分の詳細図、第7図
は第6図の部分の斜視図、第8図は本発明の運搬機構に
おける石英トレーとベローズのレヘルを示す線図、第9
図はベローズの先端部分と石英トレーとの相対的関係を
示す断面図である。 11−処理室、12−予備室、13.14−ベローズ、
15−送り手段、16一台(下部電極)、17−ゲード
パルブ、1B−ランク、19− ビニオン、(13) 20−モータ、21− ベアリング、22−固定板、2
3−固定手段、24−位置ぎめ穴、 A、B−−一石英l・レー (14〉 弓                       D
−179− 第5図 第6図 117 図 1 一1乏 第8図
Figure 1 fat is a perspective view of a quartz l-ray for wafer transfer.
The same figure (BL is a cross-sectional view showing the wafer placed on the stone pod tray in the same figure (AL), Figure 2 is a schematic diagram of the conveyance mechanism between the conventional processing chamber and the preparatory chamber. 4 is a left sectional view of the transportation mechanism of FIG. 3, FIG. 5 is a plan view of the left part of the transportation mechanism of FIG. 3, and FIG. 6 is a detailed view of the left part of FIG. 4, FIG. 7 is a perspective view of the portion shown in FIG. 6, FIG. 8 is a line diagram showing the level of the quartz tray and bellows in the conveyance mechanism of the present invention, and FIG.
The figure is a sectional view showing the relative relationship between the tip of the bellows and the quartz tray. 11-Processing chamber, 12-Preliminary chamber, 13.14-Bellows,
15-Feeding means, 16 one unit (lower electrode), 17-Gade valve, 1B-Rank, 19-Binion, (13) 20-Motor, 21-Bearing, 22-Fixing plate, 2
3-Fixing means, 24-Positioning hole, A, B--Single quartz l.ray (14> Bow D
-179- Figure 5 Figure 6 117 Figure 1 -11 Figure 8

Claims (1)

【特許請求の範囲】 真空処理のなされる処理室と、該処理室にゲーI・バル
ブを介して連結され、それ自体真空に排気されうる予備
室との間にmi!?!搬物が載置されたトレーをIN送
する機構において、寸法の異なる第1と第2のトレーを
上下させる上下運動手段を内蔵する第1と第2のへロー
ズをそれぞれ前記処理室内に設置し、処理室と予備室と
の間を水平に往復運動可能な送り手段を予備室内に設置
し、処理室において処理台にのった第2のトレーを第2
のへローズにより持ち上げた状態で、第1のトレーをの
せた送り手段が予備室から処理室へ移動され、次いで第
2のへローズが下降保持することにより第2のトレーを
送り手段にのせ、同時に第1のベローズが上昇保持する
ことにより第1のトレーを送り手段より浮かせ、次いで
送り手段を処理室から予備室へ移動させ、かつ、第1の
ベローズを下(1) 降させ、第1のトレーを台へのせる構成としたことを特
徴とする運1ll1機構。
[Claims] A mi! ? ! In the mechanism for in-feeding trays on which objects are placed, first and second heros each having a built-in vertical movement means for vertically moving the first and second trays having different dimensions are installed in the processing chamber, respectively. , a feeding means that can horizontally reciprocate between the processing chamber and the preliminary chamber is installed in the preliminary chamber, and the second tray on the processing table is moved to the second tray in the processing chamber.
The feeding means carrying the first tray is moved from the preparatory chamber to the processing chamber while being lifted up by the melting roller, and then the second tray is placed on the feeding means by lowering and holding the second tray, At the same time, the first bellows is raised and held to float the first tray above the feeding means, then the feeding means is moved from the processing chamber to the preliminary chamber, and the first bellows is lowered (1). A 1ll1 mechanism characterized by having a structure in which a tray is placed on a stand.
JP10727082A 1982-06-22 1982-06-22 Transport mechanism Pending JPS58223343A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10727082A JPS58223343A (en) 1982-06-22 1982-06-22 Transport mechanism

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10727082A JPS58223343A (en) 1982-06-22 1982-06-22 Transport mechanism

Publications (1)

Publication Number Publication Date
JPS58223343A true JPS58223343A (en) 1983-12-24

Family

ID=14454799

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10727082A Pending JPS58223343A (en) 1982-06-22 1982-06-22 Transport mechanism

Country Status (1)

Country Link
JP (1) JPS58223343A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07273159A (en) * 1994-10-24 1995-10-20 Tokyo Electron Ltd Probe unit
KR20020000262A (en) * 2000-06-22 2002-01-05 김정곤 Carrier transfer apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07273159A (en) * 1994-10-24 1995-10-20 Tokyo Electron Ltd Probe unit
KR20020000262A (en) * 2000-06-22 2002-01-05 김정곤 Carrier transfer apparatus

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