JPS58218664A - ケ−ブル導通試験方法 - Google Patents

ケ−ブル導通試験方法

Info

Publication number
JPS58218664A
JPS58218664A JP57102559A JP10255982A JPS58218664A JP S58218664 A JPS58218664 A JP S58218664A JP 57102559 A JP57102559 A JP 57102559A JP 10255982 A JP10255982 A JP 10255982A JP S58218664 A JPS58218664 A JP S58218664A
Authority
JP
Japan
Prior art keywords
cable
signal
test
pulse
continuity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57102559A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0245832B2 (enExample
Inventor
Tadao Aoto
青砥　忠雄
Yukio Kataguchi
幸男 潟口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP57102559A priority Critical patent/JPS58218664A/ja
Publication of JPS58218664A publication Critical patent/JPS58218664A/ja
Publication of JPH0245832B2 publication Critical patent/JPH0245832B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/54—Testing for continuity

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP57102559A 1982-06-15 1982-06-15 ケ−ブル導通試験方法 Granted JPS58218664A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57102559A JPS58218664A (ja) 1982-06-15 1982-06-15 ケ−ブル導通試験方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57102559A JPS58218664A (ja) 1982-06-15 1982-06-15 ケ−ブル導通試験方法

Publications (2)

Publication Number Publication Date
JPS58218664A true JPS58218664A (ja) 1983-12-19
JPH0245832B2 JPH0245832B2 (enExample) 1990-10-11

Family

ID=14330585

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57102559A Granted JPS58218664A (ja) 1982-06-15 1982-06-15 ケ−ブル導通試験方法

Country Status (1)

Country Link
JP (1) JPS58218664A (enExample)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51117825A (en) * 1975-04-10 1976-10-16 Oki Electric Ind Co Ltd Multiconductor cable continuity test

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51117825A (en) * 1975-04-10 1976-10-16 Oki Electric Ind Co Ltd Multiconductor cable continuity test

Also Published As

Publication number Publication date
JPH0245832B2 (enExample) 1990-10-11

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