JPS58207760A - Test system of exchange system - Google Patents

Test system of exchange system

Info

Publication number
JPS58207760A
JPS58207760A JP9064882A JP9064882A JPS58207760A JP S58207760 A JPS58207760 A JP S58207760A JP 9064882 A JP9064882 A JP 9064882A JP 9064882 A JP9064882 A JP 9064882A JP S58207760 A JPS58207760 A JP S58207760A
Authority
JP
Japan
Prior art keywords
test
subscriber
circuit
line
subscriber line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9064882A
Other languages
Japanese (ja)
Inventor
Kunitoshi Otsuki
大月　邦俊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP9064882A priority Critical patent/JPS58207760A/en
Publication of JPS58207760A publication Critical patent/JPS58207760A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop
    • H04M3/302—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop using modulation techniques for copper pairs
    • H04M3/303—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop using modulation techniques for copper pairs and using PCM multiplexers, e.g. pair gain systems

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Monitoring And Testing Of Exchanges (AREA)

Abstract

PURPOSE:To test an exchange side from a subscriber line, and a subscriber line side from the subscriber line, by connecting a channel test device and a subscriber line test device with an interface circuit, and operating a common test controlling device. CONSTITUTION:Subscriber lines of a subscriber SUB are accommodated in a subscriber line LC1, the line LC1 is connected to a line concentration switch LSW, and a time division exchange network TDNW is connected to the switch LSW via an A/D signal converting circuit CODEC. This circuit LC1 consists of switches S1, S2 and test links TLS and TLN, to which a channel test device SPTE and a subscriber line test device LTE are connected respectively, and both devices SPTE and LTE are connected with the interface circuit INTF. The devices SPTE and LTE are controlled with a system test controller STC. Further, the test from the line LC1 and the test of subscriber lines LC2, LC3 from the line LC1 are performed with the operation of the device STC.

Description

【発明の詳細な説明】 本発明は１時分割交換機における交換システム試験方式
に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a switching system testing method in a one time division switch.

従来１時分割交換機の又換システム試験方式においては
、カロ入者線路を収容している加入者回路からみて交換
機側の試験と、加入者線路側の試験とで、それぞれ専用
の試験装置を専用の試験制御装置から制御することによ
り試験が行なわれている。Conventionally, in the reswitching system test method of a one-time division switch, dedicated test equipment is used for testing the switch side and the subscriber line side from the subscriber circuit that accommodates the subscriber line. Tests are conducted under control from a test control device.

本発明の目的は、上記通話路試験装置と加入者線路試験
装置とをインターフェイス回路により接続することによ
り、同一の試験制御装置を操作し加入者回路から交換機
側の試験と、加入者回路から加入者線路側の試験を行な
うことができる交換システム試験方式を提供するもので
ある。An object of the present invention is to connect the communication line testing device and the subscriber line testing device through an interface circuit, so that the same test control device can be operated to perform tests on the exchange side from the subscriber circuit and tests on the exchange side from the subscriber circuit. The present invention provides a switching system test method that allows testing on the public track side.

本発明によると１時分割交換機において加入者線路側お
よび変換機側を試験するための引き込み回路を有し加入
者線路を収容し交換機に接続される加入者回路と、前記
引き込み回路を経由して前記加入者回路から交換機側を
試験するための通話路試験装置と、前記引き込み回路を
経由して前記加入者回路から加入者線路側を試験するた
めの加入者線路試験装置と、前記通話路試験装置と加入
者線路試験装置とを接続するためのインターフェイス回
路と、前記通話路試験装置を変換機に接続するための発
信専用の加入者回路および着信専用の加入者回路と、前
記通話路試験装置と加入者線路試験装置とを制御するた
めのシステム試験制御装置とを含むことを特徴とする交
換システム試験方式が得られる。According to the present invention, in a one-time division exchange, there is provided a lead-in circuit for testing the subscriber line side and the converter side, and the subscriber circuit that accommodates the subscriber line and is connected to the switch, and the lead-in circuit via the lead-in circuit. A communication path testing device for testing the exchange side from the subscriber circuit, a subscriber line testing device for testing the subscriber line side from the subscriber circuit via the lead-in circuit, and the communication path test. an interface circuit for connecting the device and a subscriber line testing device; a subscriber circuit dedicated to outgoing calls and a subscriber circuit dedicated to incoming calls for connecting the call path testing device to a converter; and the call path testing device. and a system test control device for controlling the subscriber line test device and the subscriber line test device.

次に図面を参照して本発明の詳細な説明する。Next, the present invention will be described in detail with reference to the drawings.

第１図は１本発明の一実施例を示す時分割変換機系のブ
ロック図である。加入者回路ＬＣ１は加入者ＳＵＢの加
入者線を収容し集線スイッチＬＳＷに接続されており、
集線スイッチＬＳＷはアナログ／ディジタル信号変換回
路Ｃ０ＤＥＣを経由して時分割交換網ＴＤＮＷＫ接続さ
れる。加入者回路ＬＣ１はスイッチＳ１とテストリンク
ＴＬ８およびスイッチＳ、とテストリンクＴＬＮにょ９
構成される引き込み回路により通話路試験装［８ＰＴＥ
と、加入者線試験装置置ｔＩ、ＴＥに各々の試験時に接
続される。通話路試験装置８）’ＴＥと加入者線路試験
装置ＬＴＥとはインターフェイス回路ＩＮＴＦにより接
続されており、各々システム試験制御装置ＳＴＣにより
制御される。ＬＣ，およびＬＣ８は通話路試験装置５Ｐ
ＴＥｔ−集線スイッチＬＳＷへ接続するための加入者回
路であり、それぞれ、発信用試験端子ＯＴＬおよび着信
用試験端子’Ｌ”　Ｔ　Ｌに収容されている。FIG. 1 is a block diagram of a time division converter system showing an embodiment of the present invention. The subscriber circuit LC1 accommodates the subscriber line of the subscriber SUB and is connected to the line concentrator switch LSW,
The line concentration switch LSW is connected to the time division switching network TDNWK via the analog/digital signal conversion circuit C0DEC. The subscriber circuit LC1 connects the switch S1 to the test link TL8 and the switch S to the test link TLN9.
The communication path test equipment [8PTE
and the subscriber line test equipment tI, TE during each test. The communication path testing device 8)'TE and the subscriber line testing device LTE are connected by an interface circuit INTF, and each is controlled by a system test control device STC. LC and LC8 are communication path test equipment 5P
TEt - A subscriber circuit for connecting to the concentrator switch LSW, which is accommodated in the outgoing test terminal OTL and the incoming test terminal 'L' T L, respectively.

システム試験制御装ｚｓＴｃから、加入者線試験装置Ｌ
ＴＥを制御することにより加入者回路ＬＣ１から加入者
線路側の試験を行ない、さらに通話路試験装置８）”［
’Ｅを制御することによｒ）　７Ｊ［ｌ入者回路ＬＣ１
から交換機側の試験を行なう。From the system test control device zsTc to the subscriber line test device L
By controlling the TE, tests are performed on the subscriber line side from the subscriber circuit LC1, and furthermore, the communication path test device 8)"[
'By controlling E) 7J[l Entry circuit LC1
Perform a test on the exchange side.

加入者線路側の試験としては、絶縁抵抗測定。The test on the subscriber line side is insulation resistance measurement.

容量測定、ループ抵抗測定、ＡＣ／１）Ｃ＝ｄ流測定。Capacitance measurement, loop resistance measurement, AC/1) C=d current measurement.

ダイヤルパルススピード、ダイヤルパルスレシオ。Dial pulse speed, dial pulse ratio.

ＰＢ信号受信等の客種測定試験およびリンギング信号送
出、ハウラー音送出、モニター等の試験を行なう。交換
機側の試験としては、力ロ人者回路ＬＣ！およびＬＣ，
を用いて加入者回路ＬＣ８の発ｉ４謂試験を行なう。We conduct customer type measurement tests such as PB signal reception, ringing signal transmission, howler sound transmission, monitoring, etc. As a test on the exchange side, the power-roman circuit LC! and L.C.,
A so-called oscillation i4 test of the subscriber circuit LC8 is performed using the following.

本発明は以上説明したように、加入者線を収容している
加入者回路から交換機側の試験を行なう通話路試験装置
と、前記加入者回路から加入者線路側の試験を行なう加
入者線路試験装置とをインターフェイス回路により接続
することにより単一のシステム試験制御装置りによシ各
々の試験を制御する仁とが可能となり、交換システム試
験に要するハードウェアの童を減少し交換システム試験
の能率を高める効果がある。As explained above, the present invention provides a communication path test device for testing the exchange side from a subscriber circuit accommodating a subscriber line, and a subscriber line test device for testing the subscriber line side from the subscriber circuit. By connecting the devices with an interface circuit, it becomes possible to control each test using a single system test controller, which reduces the amount of hardware required for replacement system testing and improves the efficiency of replacement system testing. It has the effect of increasing

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は、本発明の変換システム試験方式の一実施例を
示す時分割交換機系のブロック図である。 ＳＴＣ・・・・・・システム試験制御装置、　　５ＰＴ
Ｅ・・・・・・通話路試験４４置、ＬＴＥ・・・・・・
加入者線路試験装置。 ＩＮＴＦ・・・・・・インターフェイス回路、ＬＣ，、
ＬＣ，、ＬＣ。 ・・・・・・加入者回路％　　ＳＩｎ”！・・・・・ス
イッチ、　Ｔｌ、８．Ｔｌ、Ｎ・・・・・・テストリン
ク、ＳＵＢ・・・・・・加入者、ＳＴＬ・・・・・・発
信用試験端子、ＴＴＬ・・・・・・着信用試験端子。 ＬＳＷ・・・・・・集線スイッチ、Ｃ０ＤＥＣ・・・・
・・アナログ／ディジタル信号変換回路、　’１’ＤＮ
Ｗ・・・・・・時分割交換網。FIG. 1 is a block diagram of a time division exchange system showing an embodiment of the conversion system testing method of the present invention. STC・・・System test control device, 5PT
E... Call path test 44 positions, LTE...
Subscriber line testing equipment. INTF...Interface circuit, LC,...
LC,,LC. ...Subscriber circuit % SIn"!...Switch, Tl, 8.Tl, N...Test link, SUB...Subscriber, STL... ...Test terminal for sending, TTL...Test terminal for receiving. LSW...Concentration switch, C0DEC...
・Analog/digital signal conversion circuit, '1'DN
W... Time division switching network.

Claims (1)

【特許請求の範囲】[Claims] 時分割交換機において、加入者線路側および交換機側を
試験するための引き込み回路を有し加入者線路を収容し
又換機に接続される加入者回路と、前記引き込み回路を
経由して前記加入者回路から交換機１則を試験するため
の通話路試験装置と、前記引き込み回路を経由して前記
加入者回路から加入者線路側を試験するためのガロ入省
線路試験装置と、前記通話路試験装置と加入者線路試験
装置Ｖとを接続するためのインターフェイス回路と、前
記通話路試験装Ｗを交換機に接続するための発信専用の
加入者回−および着信専用の加入者回路と、前記通話路
試験装ｆｋと加入者線路試験装置とを制御するためのシ
ステム試験制御装置とを含むことを特徴とする交換シス
テム試験方式。In a time-division exchange, there is a lead-in circuit for testing the subscriber line side and the exchange side, and a subscriber circuit that accommodates the subscriber line and is connected to the switch, and a subscriber circuit connected to the switch via the lead-in circuit. A communication path testing device for testing the first rule of an exchange from a circuit, a Gallo line testing device for testing a subscriber line side from the subscriber circuit via the lead-in circuit, and the communication path testing device and a subscriber line testing device V; a subscriber circuit dedicated to outgoing calls and a subscriber circuit dedicated to incoming calls to connect the call path testing device W to an exchange; 1. A switching system test method, comprising: a system test control device for controlling a system fk and a subscriber line test device.
JP9064882A 1982-05-28 1982-05-28 Test system of exchange system Pending JPS58207760A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9064882A JPS58207760A (en) 1982-05-28 1982-05-28 Test system of exchange system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9064882A JPS58207760A (en) 1982-05-28 1982-05-28 Test system of exchange system

Publications (1)

Publication Number Publication Date
JPS58207760A true JPS58207760A (en) 1983-12-03

Family

ID=14004326

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9064882A Pending JPS58207760A (en) 1982-05-28 1982-05-28 Test system of exchange system

Country Status (1)

Country Link
JP (1) JPS58207760A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0991252A2 (en) * 1998-10-01 2000-04-05 Fujitsu Limited Subscriber line test system for access network

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0991252A2 (en) * 1998-10-01 2000-04-05 Fujitsu Limited Subscriber line test system for access network
US6157704A (en) * 1998-10-01 2000-12-05 Fujitsu Limited Subscriber line test system for access network
EP0991252A3 (en) * 1998-10-01 2004-06-16 Fujitsu Limited Subscriber line test system for access network

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