JPS58203698A - Semiconductor memory having auxiliary line - Google Patents

Semiconductor memory having auxiliary line

Info

Publication number
JPS58203698A
JPS58203698A JP57084803A JP8480382A JPS58203698A JP S58203698 A JPS58203698 A JP S58203698A JP 57084803 A JP57084803 A JP 57084803A JP 8480382 A JP8480382 A JP 8480382A JP S58203698 A JPS58203698 A JP S58203698A
Authority
JP
Japan
Prior art keywords
memory
lines
line
arrays
array
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57084803A
Other languages
Japanese (ja)
Inventor
Yoshiki Kawajiri
良樹 川尻
Katsuhiro Shimohigashi
下東 勝博
Shinji Horiguchi
真志 堀口
Kazuyuki Miyazawa
一幸 宮沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP57084803A priority Critical patent/JPS58203698A/en
Publication of JPS58203698A publication Critical patent/JPS58203698A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Static Random-Access Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)

Abstract

PURPOSE:To obtain a memory having a defects relief circuit, by arranging n/2 lines of normal bit lines of an arranged memory array, when arranging (n) lines of auxiliary lines, in order to eliminate the unbalance between the memory arrays. CONSTITUTION:The point which differs from a conventional one is that n/2 of the normal bits of memory arrays 16c and 16d are transferred to a part 1 indicated in a memory array 5. Due to this constitution, the length of lead wire 3 can be made to be the same to reduce bad influence given to memory characteristics. In this example, a memory having a stabilized defects relief circuit and giving no bad influence on memory characteristics is realized without increasing the size of a tip. Further, if part of the normal data lines is transferred to other arrays, it does not effect on an auxiliary line controlling circuit. The transfer of the normal data lines is performed including a decoder. The bad influence of the transfer is never caused. The increase of word line length per array due to the addition of (n) lines of auxiliary lines becomes n/2 of data lines so that time delay is lessened in comparison with a conventional method which increases the line by (n) lines.

Description

【発明の詳細な説明】 本発明は、欠陥救済手段を備えた半導体メモリに係り、
特にメモリ特性に悪影響を及ぼさない好適な、予備線の
配置とメモリアレー構成に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a semiconductor memory equipped with defect relief means,
In particular, the present invention relates to a suitable spare line arrangement and memory array configuration that does not adversely affect memory characteristics.

第1図に4つのメモリアレーで構成される半導体メモリ
のブロック区を例として示す。10はアドレスバッファ
、12a、] 2biJYデコーダ及びコモンI10糾
を含む回路ブロック、14a。
FIG. 1 shows an example of a block section of a semiconductor memory composed of four memory arrays. 10 is an address buffer, 12a, and 14a is a circuit block including a 2biJY decoder and a common I10 circuit.

14bはXデコーダ及びワードドライバを含む回路ブロ
ック、16a、16b、16c、16clBメモリアレ
ー、18r;Iセンスアンプ、20はI10制御回路、
22id制御回路を承れまた2はピット侍、3はワード
線を示す。このような半導体メモリにn本の予備線1と
予備侑用のテコーダ本配置する場合、予備線は、予備線
までの配線の複雑さ、チップサイズの等の問題から、メ
モリアレーの上下いずれか一万にn本まとめて配置しな
ければならず、メモリアレー15a、16b、16c。
14b is a circuit block including an X decoder and a word driver; 16a, 16b, 16c, 16clB memory array; 18r; I sense amplifier; 20 is an I10 control circuit;
2 represents a pit samurai, and 3 represents a word line. When arranging n spare lines 1 and a spare Tecoder in such a semiconductor memory, the spare lines must be placed either above or below the memory array due to the complexity of wiring to the spare lines, chip size, etc. 10,000 memory arrays 15a, 16b, 16c must be arranged together.

16dの間のワード線3の長さが変わり、メモリアレー
(1,01,(1,1)ではワード線長が予備線の分た
け、メモリアレー(0,O)、(0゜1)より長くなり
この分遅延時間の増加などメモリ特性の分割したアレー
毎の差を生じ好ましくない。
The length of the word line 3 between 16d changes, and in memory array (1, 01, (1, 1), the word line length is equal to the spare line, and from memory array (0, O), (0°1). This is undesirable because it causes differences in memory characteristics between the divided arrays, such as an increase in delay time.

本発明の目的は、上記メモリアレー間のバランスのくず
れをなくシ、メモリ特性に悪影響を及ぼさない、安定度
の筒い、欠陥救済回路を有する、半導体メモリの、予備
線の^「′、置、メモ1ノア1ノー構成を′1M案する
ことにある。
It is an object of the present invention to eliminate the imbalance between the memory arrays, and to improve the arrangement of spare lines in a semiconductor memory, which has a stability tube and a defect relief circuit that does not adversely affect memory characteristics. , Memo 1 Noah 1 No configuration is to be proposed '1M.

メモリアレー間のバランスのくずれを防ぐにに、n本の
予備線を配置する場合、配置されたメモリアレーの正規
のビット線をn 72本、他のメモリアレーに配置すれ
ばよい。これに、メモリアレーがデコーダおよびドライ
バをはさんで2分割されている場合で、分割数がtの場
合、−上記移動する正帰のビット約数にn / Lにす
ればよいことは明らかである。
In order to prevent imbalance between memory arrays, when n spare lines are arranged, n 72 regular bit lines of the arranged memory array may be arranged in other memory arrays. In addition, if the memory array is divided into two with a decoder and a driver in between, and the number of divisions is t, it is clear that - the bit divisor of the moving positive return described above should be set to n/L. be.

欠陥救済技術とは、正規のメモリヒツトの他にあらかじ
め予備ビットtチップ内に設けておき、検査時に不良ビ
ットを予備ビットにROM (Read−QnLy −
Memory )などの手段を用いて切り換える技術で
ある。この予備線は、一般に数本でよい。この予備線の
配置とメモリアレーの構成を本発明の実施例として以下
に述べる。
Defect relief technology is to provide spare bits in advance in addition to the regular memory bits in the chip, and use the defective bits as spare bits in the ROM (Read-QnLy -
This is a technique for switching using means such as ``Memory''. Generally, only a few spare lines are required. The arrangement of the spare lines and the structure of the memory array will be described below as an embodiment of the present invention.

第2図は、4つのメモリアレーで構成される、半導体メ
モリに本発明を実施した実施例である。
FIG. 2 shows an embodiment in which the present invention is implemented in a semiconductor memory composed of four memory arrays.

図中の符号は第1図に述べたものど同にものを示す。馳
1図と!!t′なるの(7、メモリアレー16C216
dの正帰のピッH1jln/2本をメモリアレー5に示
す部分1へ移し人−ことである。このようなah又によ
りリード痕13の長さをSlじにでき、メモリ特性への
庖影響を@yI1.できる。
The reference numerals in the figure indicate the same items as those described in FIG. Has1 figure! ! t'naruno (7, memory array 16C216
This is to transfer the positive return pitch H1jln/2 of d to the portion 1 shown in the memory array 5. By using this type of ah, the length of the lead trace 13 can be made the same as Sl, and the influence on the memory characteristics can be reduced @yI1. can.

本夾施例によれは、テツブサイスを増大することなく、
メモリ等性に影響を及はさない、安定な動作をする、欠
陥救済回路を七する半λ、岬体メモリが実現できる。ま
た正規のデータ線の一部を他のアレーへ移動しても予備
線制御回路−\は何の影響もないことは明らかである。
According to this example, without increasing the size,
It is possible to realize a half-λ, cape-shaped memory that does not affect memory equality, operates stably, and has a defect relief circuit. It is also clear that moving some of the regular data lines to another array has no effect on the spare line control circuit -\.

さらに上知のデータ線の移動はデコーダを含めて行えは
よく、この移動によっての悪影I#は全くない。さらに
、本発明゛によれば、予!in本の追加によるlアレー
あたりのワード線長の増加は、データ#n/2本分とな
り、従来方式のデータ線n本分の増加に比し、遅延時間
が少なくなり、アクセス時間が短かくなる。
Furthermore, the well-known data line movement can be carried out including the decoder, and this movement causes no ill effects I#. Furthermore, according to the present invention, prediction! The increase in word line length per l array due to the addition of in lines is equivalent to data #n/2 lines, which reduces delay time and shortens access time compared to an increase of n data lines in the conventional method. Become.

上記説明では、予備データ線を例にかつアレー2分割の
例を示した。予備ワード線の場合も同様であるため詳細
説明は省く。また2分割以上1分割の場合は、上述の正
規のデータ線の移動敬を分割した各アレーにn / 1
本づつにすればよいことは明らかである。
In the above description, the spare data line was used as an example and the array was divided into two. The same applies to the spare word line, so a detailed explanation will be omitted. In addition, in the case of 2 divisions or more, 1 division, n / 1 for each divided array of the above-mentioned normal data line movement.
It is obvious that one book at a time would be better.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、従来の4メモリアレー構成の半導体メモリに
予備線を配置したブロック図、第2図は、本発明実施し
たブロック図である。 1・・・予備線、2・・・ビット線、3・・・リード線
、4・・・予備線用デコーダ、16a、16b、16c
。 16d・・・メモリアレー。 代理人 弁理士 薄田利辛゛°− 6丁か 晰 1  図 第 2  図
FIG. 1 is a block diagram showing the arrangement of spare lines in a conventional semiconductor memory having a four-memory array configuration, and FIG. 2 is a block diagram showing the implementation of the present invention. 1... Reserve line, 2... Bit line, 3... Lead wire, 4... Reserve line decoder, 16a, 16b, 16c
. 16d...Memory array. Agent: Patent Attorney Toshiyuki Usuda - 6-cho Kashu 1 Figure 2

Claims (1)

【特許請求の範囲】[Claims] 1、デコーダなどで、ワード線もしくはデータ線が2つ
以上を個に分割芒れるメモリアレー構成を有し、かつn
本のワード線もしくはデータ絢の予備線を当該分割され
たいづれか一つのメモリアレーに有する半導体メモリに
おいて、当該予備線をもつ分割された1つのメモリアレ
ーの正規のワード線もしくはデータ線のn / を本を
、他のメモリアレーにそれぞれ移し、各メモリアレーの
予iI#を含む総ワード線もしくはデータ線数を同一と
したことを特徴とする予備線を廟する半導体メモリ。
1. It has a memory array configuration in which two or more word lines or data lines can be divided into individual parts, such as a decoder, and n
In a semiconductor memory having a regular word line or data line in one of the divided memory arrays, n/ of the regular word line or data line in one divided memory array having the reserved line is A semiconductor memory having a reserve line, characterized in that books are transferred to other memory arrays, and the total number of word lines or data lines including reserve iI# of each memory array is made the same.
JP57084803A 1982-05-21 1982-05-21 Semiconductor memory having auxiliary line Pending JPS58203698A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57084803A JPS58203698A (en) 1982-05-21 1982-05-21 Semiconductor memory having auxiliary line

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57084803A JPS58203698A (en) 1982-05-21 1982-05-21 Semiconductor memory having auxiliary line

Publications (1)

Publication Number Publication Date
JPS58203698A true JPS58203698A (en) 1983-11-28

Family

ID=13840867

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57084803A Pending JPS58203698A (en) 1982-05-21 1982-05-21 Semiconductor memory having auxiliary line

Country Status (1)

Country Link
JP (1) JPS58203698A (en)

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