JPS5820101B2 - 質量分析計 - Google Patents

質量分析計

Info

Publication number
JPS5820101B2
JPS5820101B2 JP52023693A JP2369377A JPS5820101B2 JP S5820101 B2 JPS5820101 B2 JP S5820101B2 JP 52023693 A JP52023693 A JP 52023693A JP 2369377 A JP2369377 A JP 2369377A JP S5820101 B2 JPS5820101 B2 JP S5820101B2
Authority
JP
Japan
Prior art keywords
lens
grid
particles
mass analyzer
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP52023693A
Other languages
English (en)
Japanese (ja)
Other versions
JPS52117190A (en
Inventor
ジヨン・アール・リーハー
マイケル・エス・ストーリー
ロナルド・デイー・スミス
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thermo Finnigan LLC
Original Assignee
Finnigan Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Finnigan Corp filed Critical Finnigan Corp
Publication of JPS52117190A publication Critical patent/JPS52117190A/ja
Publication of JPS5820101B2 publication Critical patent/JPS5820101B2/ja
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP52023693A 1976-03-04 1977-03-04 質量分析計 Expired JPS5820101B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/664,047 US4075479A (en) 1976-03-04 1976-03-04 Focusing ion lens system for mass spectrometer for separating charged and neutral particles

Publications (2)

Publication Number Publication Date
JPS52117190A JPS52117190A (en) 1977-10-01
JPS5820101B2 true JPS5820101B2 (ja) 1983-04-21

Family

ID=24664294

Family Applications (1)

Application Number Title Priority Date Filing Date
JP52023693A Expired JPS5820101B2 (ja) 1976-03-04 1977-03-04 質量分析計

Country Status (4)

Country Link
US (1) US4075479A (enExample)
JP (1) JPS5820101B2 (enExample)
DE (1) DE2709420A1 (enExample)
FR (1) FR2343328A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5272337A (en) * 1992-04-08 1993-12-21 Martin Marietta Energy Systems, Inc. Sample introducing apparatus and sample modules for mass spectrometer
US6153880A (en) * 1999-09-30 2000-11-28 Agilent Technologies, Inc. Method and apparatus for performance improvement of mass spectrometers using dynamic ion optics

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2255302C3 (de) * 1972-11-11 1980-09-11 Leybold-Heraeus Gmbh, 5000 Koeln Einrichtung für die Sekundär-Ionen-Massenspektroskopie
US3939344A (en) * 1974-12-23 1976-02-17 Minnesota Mining And Manufacturing Company Prefilter-ionizer apparatus for use with quadrupole type secondary-ion mass spectrometers

Also Published As

Publication number Publication date
DE2709420A1 (de) 1977-10-13
US4075479A (en) 1978-02-21
FR2343328A1 (fr) 1977-09-30
JPS52117190A (en) 1977-10-01
FR2343328B1 (enExample) 1980-09-19

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