JPS58186854A - Ｒａｓ機能自動検査方式 - Google Patents

Ｒａｓ機能自動検査方式

Info

Publication number
JPS58186854A
JPS58186854A JP57068376A JP6837682A JPS58186854A JP S58186854 A JPS58186854 A JP S58186854A JP 57068376 A JP57068376 A JP 57068376A JP 6837682 A JP6837682 A JP 6837682A JP S58186854 A JPS58186854 A JP S58186854A
Authority
JP
Japan
Prior art keywords
test
program
processing unit
central processing
test program
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57068376A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6223335B2 (enrdf_load_html_response
Inventor
Hisashi Ibe
井辺　寿
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP57068376A priority Critical patent/JPS58186854A/ja
Publication of JPS58186854A publication Critical patent/JPS58186854A/ja
Publication of JPS6223335B2 publication Critical patent/JPS6223335B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2215—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test error correction or detection circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP57068376A 1982-04-23 1982-04-23 Ｒａｓ機能自動検査方式 Granted JPS58186854A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57068376A JPS58186854A (ja) 1982-04-23 1982-04-23 Ｒａｓ機能自動検査方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57068376A JPS58186854A (ja) 1982-04-23 1982-04-23 Ｒａｓ機能自動検査方式

Publications (2)

Publication Number Publication Date
JPS58186854A true JPS58186854A (ja) 1983-10-31
JPS6223335B2 JPS6223335B2 (enrdf_load_html_response) 1987-05-22

Family

ID=13371959

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57068376A Granted JPS58186854A (ja) 1982-04-23 1982-04-23 Ｒａｓ機能自動検査方式

Country Status (1)

Country Link
JP (1) JPS58186854A (enrdf_load_html_response)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5262002B2 (ja) * 2007-07-11 2013-08-14 富士通株式会社 コンピュータ装置の試験方法及び装置及びプログラム

Also Published As

Publication number Publication date
JPS6223335B2 (enrdf_load_html_response) 1987-05-22

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