JPS58185417A - Deposition of thick carbon film - Google Patents

Deposition of thick carbon film

Info

Publication number
JPS58185417A
JPS58185417A JP57066984A JP6698482A JPS58185417A JP S58185417 A JPS58185417 A JP S58185417A JP 57066984 A JP57066984 A JP 57066984A JP 6698482 A JP6698482 A JP 6698482A JP S58185417 A JPS58185417 A JP S58185417A
Authority
JP
Japan
Prior art keywords
substrate
film
silicon
carbon film
carbon
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57066984A
Other languages
Japanese (ja)
Inventor
Kazuyuki Toki
土岐 和之
Kanji Watanabe
渡辺 完治
Tadayoshi Otani
男谷 忠義
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP57066984A priority Critical patent/JPS58185417A/en
Publication of JPS58185417A publication Critical patent/JPS58185417A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/26Deposition of carbon only

Abstract

PURPOSE:To form a thick carbon film having high adhesivity, by depositing a silicon film to the substrate, and depositing ionized carbon thereto. CONSTITUTION:The vacuum chamber 10 of a high-frequency ion plating device etc. is evacuated in high vacuum, Ar gas etc. is introduced into the chamber 10 through the gas inlet 12, and the surface of the metallic substrate 9, e.g. Al plate, is cleaned by bombardment. The silicon 18 contained in the crucible 13 is evaporated by the irradiation with electron beam emitted from the electron gun 16 and deflected by the deflector 17. The silicon particles are ionized by the high frequency electric field, and attracted to the substrate 9 to form a silicon film on the substrate 9. The substrate 9 is mounted in an ionizing film-forming device, and a thick carbon film is deposited on the silicon film by ionizing the vapor of a compound having carbon component. A thick carbon film can be deposited in high adhesivity to the substrate by this process.

Description

【発明の詳細な説明】 本発明は密着性のよい厚いカーボン膜の成膜す法に関す
る。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for forming a thick carbon film with good adhesion.

カーボン膜はその製法により固有の特性を示す。Carbon films exhibit unique characteristics depending on their manufacturing method.

第1図は炭素成分を持つ化合物のガスをイオン化して基
板に厚いカーボン膜を付着させるイオン化成膜装置であ
る。該装置において、先ず、被排気室1内を、排気管2
に外部で繋がった排気系により高真空に排気し、石英棒
3に巻いたカソードフィラメント4を、加熱電源5の作
動嶋より加熱する。同時に側部が網目状に構成された円
筒状のアノード電極6と前記カソードフィラメント4f
l[IにilのI[′I流電;「を印加し、更に円筒状
の基板7と該ノイノメンl−間に角の自流高電圧を印′
加する。この状態C、ガス供給1’l 8から前記被排
気室1内にフルfンガスを入れ、前記フィラメント4と
アノード電極6間の電界内でプラズマ放電を生じさせる
。該放電によりアルゴンイオン(Ar”)は前i+d 
V &71)向に引き付けられ、該基板表面をボンパー
I・してクリーニングする。該クリーニング後、前記ガ
ス供給118からベンゼンガスの如き炭化水糸系の7I
スを前記被排気室1内へ導入する。該ガスは前記カソー
ドフィラメント4の熱により加熱分解し、該フィラメン
トと前記アノード電極6間の゛電界及び前記−フィラメ
ント4からの熱電子の衝撃に」り電離する。該電離によ
り生じた炭素イオンは前記基板7どカソードフィラメン
ト4@に印加された負の高電圧により基板方向に加速さ
れ、該U根iにh−ボン膜を成膜する。この様にして脚
本成分を持つ化合物のガスをイオン化して基板にイ・1
義させたカーボン膜は非常に硬く半透明である口とから
、研削工具のにノ先等種々のものに利用出来る。所で、
この様にして厚く(例、1にÅ以上)成膜したカーボン
膜は非常に硬い為に、内部応力が強く、下地となる基板
の材質に依って膜の密着性に強弱が現われる。実験に依
ると、シリ二]ンや石英ガラス等にはよく密着するが、
金属類には密@性が悪く、非常に剥がれ易い。
FIG. 1 shows an ionization film forming apparatus for depositing a thick carbon film on a substrate by ionizing a gas of a compound having a carbon component. In this device, first, the inside of the chamber 1 to be exhausted is connected to the exhaust pipe 2.
The cathode filament 4 wound around the quartz rod 3 is heated by the heating power source 5. At the same time, the cylindrical anode electrode 6 and the cathode filament 4f each have a mesh-like side part.
A current of I['I is applied to l[I, and an angular free current high voltage is further applied between the cylindrical substrate 7 and the Neunomen l-.
Add. In this state C, full gas is introduced into the chamber 1 to be evacuated from the gas supply 1'l 8, and plasma discharge is generated within the electric field between the filament 4 and the anode electrode 6. Due to this discharge, argon ions (Ar”) are
V &71) direction, and the substrate surface is bombered and cleaned. After the cleaning, a hydrocarbon-based 7I such as benzene gas is supplied from the gas supply 118.
A gas is introduced into the chamber 1 to be evacuated. The gas is thermally decomposed by the heat of the cathode filament 4 and ionized by the electric field between the filament and the anode electrode 6 and the bombardment of hot electrons from the filament 4. The carbon ions generated by the ionization are accelerated toward the substrate by a negative high voltage applied to the cathode filament 4@ of the substrate 7, thereby forming an h-bon film on the U root i. In this way, the gas of the compound containing the script component is ionized and ionized onto the substrate.
The developed carbon film is extremely hard and translucent, so it can be used for a variety of things, such as the tips of grinding tools. By the way,
The carbon film formed in this manner to be thick (for example, 1 Å or more) is very hard and therefore has strong internal stress, and the adhesion of the film varies depending on the material of the underlying substrate. According to experiments, it adheres well to silicone, quartz glass, etc.
It has poor adhesion to metals and peels off easily.

本発明はこの様な点に鑑みてなされたもので、基板に、
炭素成分を持つ化合物のガスをイオン化し、該イオン化
した炭素を厚い膜状に付着さ已る前に、カーボン膜及び
基板の両方に強く結合する物質を膜状にバインダーとし
て付着させた新規り成膜方法を提供するものCある。
The present invention was made in view of these points, and includes a substrate,
A new method has been developed in which a compound gas containing a carbon component is ionized, and before the ionized carbon is deposited in a thick film, a material that binds strongly to both the carbon film and the substrate is deposited as a binder in the form of a film. There is C which provides a membrane method.

即ち、本発明は、厚いカーボン膜を直接基板に付けるの
ではなく、カーボン膜にも基板にも強く結合するバイン
ダーを介して厚いカー ボン膜を基板に付けることによ
り、例え基板が金属でも間接的ではあるが、密着性よく
厚いカーボン膜を付けることが出来る様にしたもので、
このバインダーとして種々の物質を実験した所、カーボ
ン膜にも基板にも強く結合する最適なバインダー物質は
ケイ素(あることか分かった。
That is, the present invention does not directly attach a thick carbon film to a substrate, but instead attaches a thick carbon film to a substrate through a binder that strongly binds both the carbon film and the substrate. However, it is possible to attach a thick carbon film with good adhesion.
After experimenting with various materials as this binder, we found that silicon was the most suitable binder material that strongly bonded to both the carbon film and the substrate.

第2図は、例えばアルミニウムの如き金属性基板9にバ
インダーとしてケイ素膜を付着させる為のKl?の 例
として示した高周波イオンプレーテング装置である。該
装置において、先ず、被排気室°10内を刊気?’q1
1に外部で繋がった排気系により昌自空にIJ)気し、
次にガス供給口12から該祷気至内にノフル、「ンガス
を入れる。この時、基板9ど坩堝13の間に配置された
高周波電極14には(b周波電源15からへ周波電力が
印加されているの(・、プラズマ故電が生じる。前記基
板9には餉の11流高電1■が印加されているので、ア
ルゴンイ4ン(Ar”)は該基板表面をボンバードし該
表面をクリーニングづる。次に、電子銃16からの電−
fビームを偏向器17により前記坩堝13内に収容され
たケイ素18に照射し、該ケイ素を蒸発さUる。該ケイ
素の粒子は^周波電界によりイ4ン化し、該イオン化し
たケイ素は基板9に引き付けられ、前記基板9Fでケイ
素の膜を作る。尚、19は外部の加熱電源20により加
熱されたヒータで、基板9を成る温度に熱づるものであ
る。この様に基板9を該基板に飛んで来る熱い粒子の渇
疫に近づけておけば、該粒子が基板に付き易くなり、又
、付着する膜の結晶性もよくなる。
FIG. 2 shows Kl? for attaching a silicon film as a binder to a metallic substrate 9, such as aluminum. This is a high-frequency ion plating device shown as an example. In this device, first, the inside of the chamber to be evacuated is 10°C. 'q1
The exhaust system connected externally to 1 allows air flow to the Changji Air Force (IJ),
Next, a gas is introduced into the gas supply port 12 from the gas supply port 12. At this time, frequency power is applied to the high frequency electrode 14 disposed between the substrate 9 and the crucible 13 (from the b frequency power source 15). A plasma waste current is generated. Since a high current of 11 current is applied to the substrate 9, the argon ion (Ar) bombards the surface of the substrate. Next, remove the electricity from the electron gun 16.
The silicon 18 housed in the crucible 13 is irradiated with the f-beam by the deflector 17 to evaporate the silicon. The silicon particles are ionized by the frequency electric field, and the ionized silicon is attracted to the substrate 9, forming a silicon film on the substrate 9F. Incidentally, reference numeral 19 denotes a heater heated by an external heating power source 20, which heats the substrate 9 to a certain temperature. If the substrate 9 is kept close to the hot particles flying to the substrate in this manner, the particles will easily adhere to the substrate, and the crystallinity of the attached film will also improve.

この様にして、ケイ素の膜が付着された金属性基板を、
前記第1図に示す如きイオン化成膜装置の基板7の位置
に配冒し、ケイ素膜の土にカーボンの厚膜を付着させる
In this way, the metal substrate with the silicon film attached is
It is placed on the substrate 7 of the ionization film forming apparatus as shown in FIG. 1, and a thick carbon film is deposited on the silicon film.

次に実験した一部を示す。基板として、チタン。The following is a part of the experiment. Titanium as a substrate.

アルミニウムを使い、バインダーとしてチツ化チタン、
金の膜を各々前記基板に付け、その土にカーボン膜を付
は始め、膜厚モニターでそのカーボン膜の膜厚を測定し
てみると、何れも0.1−に達する前にカーボン膜がバ
インダーから剥がれ始めた。次にバインダーとしてケイ
素の膜を前記各々の基板に付け、その上にカーボン膜を
付けると、約2〜3−に達するとカーボン膜がバインダ
ーから剥がれ始めた。
Using aluminum, titanium dioxide as a binder,
A gold film was applied to each of the substrates, a carbon film was started to be applied to the soil, and the film thickness of the carbon film was measured using a film thickness monitor. It started to peel off from the binder. Next, a silicon film was applied as a binder to each of the substrates, and a carbon film was applied thereon. When the temperature reached about 2 to 3 -, the carbon film began to peel off from the binder.

尚、基板にバインダーを付ける7’+1は、高周波イオ
ンプレーテングに限定されることはなく、スパッタリン
グ等神々考えられる。父、基板に/<インダーを付ける
工程と、該バインダーにh−ボン膜を付ける工程を別々
の被排気室内て(jなつr−f]”=、同−被排気室内
で(jなう様にしてしよい。
Note that 7'+1 for attaching the binder to the substrate is not limited to high frequency ion plating, and other methods such as sputtering are also possible. Father, the process of attaching the /<inder to the substrate and the process of attaching the H-bond film to the binder were carried out in separate exhaust chambers (jnatsu r-f)"=, in the same exhaust chamber (j Nau-like). You can do it.

本発明によれば、バインダーを介して2t & 4こり
いカーボン膜が密着性よく成膜される。
According to the present invention, a 2t & 4 stiff carbon film is formed with good adhesion via a binder.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図及び第2図は本発明の成模方沃を実/7I!りる
為に利用したイオン化成脱装置及び^周波イオンプレー
テング装置である。 1:被排気室、3:石英棒、4:カソードフ(ラメント
、6:アノード電極、7:にt&、9:金属性格板、1
0:被at気室、14:I5!!+I?1波電極、18
:ケイ素。 特許出願人 日本電子株式会社 代表者 加勢 忠鰭
Figures 1 and 2 show the practical application of the present invention/7I! These are the ionization decomposition equipment and the frequency ion plating equipment used for the removal. 1: Exhaust chamber, 3: Quartz rod, 4: Cathode (lament), 6: Anode electrode, 7: t&, 9: Metal character plate, 1
0: At air chamber, 14: I5! ! +I? 1 wave electrode, 18
: Silicon. Patent Applicant JEOL Ltd. Representative Tadahi Kasei

Claims (1)

【特許請求の範囲】[Claims] 基板に、ケイ素を膜状に付着さけ、護膜に、炭素成分を
持つ化合物のガスをイオン化し、該イオン化した炭素を
厚い膜状に付着さゼた厚いカーボン膜の成膜方法。
A method for forming a thick carbon film, in which silicon is adhered to a substrate in the form of a film, a gas of a compound having a carbon component is ionized to the protective film, and the ionized carbon is adhered in the form of a thick film.
JP57066984A 1982-04-21 1982-04-21 Deposition of thick carbon film Pending JPS58185417A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57066984A JPS58185417A (en) 1982-04-21 1982-04-21 Deposition of thick carbon film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57066984A JPS58185417A (en) 1982-04-21 1982-04-21 Deposition of thick carbon film

Publications (1)

Publication Number Publication Date
JPS58185417A true JPS58185417A (en) 1983-10-29

Family

ID=13331786

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57066984A Pending JPS58185417A (en) 1982-04-21 1982-04-21 Deposition of thick carbon film

Country Status (1)

Country Link
JP (1) JPS58185417A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS566920A (en) * 1979-06-28 1981-01-24 Philips Nv Dry lubricating bearing

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS566920A (en) * 1979-06-28 1981-01-24 Philips Nv Dry lubricating bearing

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