JPS58178268A - Test circuit - Google Patents

Test circuit

Info

Publication number
JPS58178268A
JPS58178268A JP57060775A JP6077582A JPS58178268A JP S58178268 A JPS58178268 A JP S58178268A JP 57060775 A JP57060775 A JP 57060775A JP 6077582 A JP6077582 A JP 6077582A JP S58178268 A JPS58178268 A JP S58178268A
Authority
JP
Japan
Prior art keywords
circuit
voltage
contact
test
switch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57060775A
Other languages
Japanese (ja)
Inventor
Kazuya Kawai
河井 和弥
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Meidensha Corp
Meidensha Electric Manufacturing Co Ltd
Original Assignee
Meidensha Corp
Meidensha Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Meidensha Corp, Meidensha Electric Manufacturing Co Ltd filed Critical Meidensha Corp
Priority to JP57060775A priority Critical patent/JPS58178268A/en
Publication of JPS58178268A publication Critical patent/JPS58178268A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

PURPOSE:To enable flexible use of automatic and manual testing for large and small quantity of sample equipment respectively by controlling both testing modes with a computer in a proper combination adapted for common use. CONSTITUTION:A relay 10 is activated by a signal from a microcomputer to close a contact 10a1. Voltage of a voltage tap (a) on the secondary side of a transformer 2 is fed to a sample equipment 8 through a relay contact 11a1 while it is applied between input terminals x1 and x2 of a digital panel meter 9 through a divider 3 and a contact 11a2 for indication of voltage. In response to the operation of lock switch 6, a contact 6C is opened to lock the automatic testing. With the closing of a manual testing switch 1, voltage on the secondary side of the transformer 2 fed to the sample equipment 8 through a circuit 7-1 of a rotary switch 7 and a contact 6A while it is applied between the terminals x1 and x2 of the meter 9 through the divider 5 and the contact 16a1 for indication.

Description

【発明の詳細な説明】 本発明は、保護継電器等の試験に用いる試験回路に関し
、その目的とするところはマイクロコンピュータ等によ
る自動試験と手動試験の両方を行い得る試験囲路を提供
することにある0本発1jiK係る試験回路は、試験に
要する電気量音発生する電源部と、試験電気量を手動操
作で切換えろ手動切換回路と、試験電気量を自動的に切
換える自動切換回路と、前記手動切換回路のロック状l
lを自動試験のスタート条件とするロック回路と、前記
手動切換回路の切換動作に連動して電気量表示信号を作
p1データ出力部に付与する(9)路と、前記自動切換
回路の切換動作に連動して電気量表示信号を作〕、デー
タ出力部に付与する囲路とを備えてなることを特徴とす
る〇 以下、本発明を図示の実施例に基づいて詳細にa@する
0 図面は本発明の一実施例を示すもので、試験電気量が電
圧の場合である。図において、/は試験用スイッチ、コ
は電源部としての変圧器で、二次側には所定の電圧タラ
141口及びハが設けられている。J、u及びjは分圧
器、ぶはロック用スイッチで、すいに閉路または開路す
る接点ぶム。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a test circuit used for testing protective relays, etc., and its purpose is to provide a test circuit that can perform both automatic testing using a microcomputer, etc. and manual testing. A test circuit according to a certain 0 to 1 jiK includes a power supply unit that generates a sound for the amount of electricity required for the test, a manual switching circuit for manually switching the test amount of electricity, an automatic switching circuit for automatically switching the test amount of electricity, and the above-mentioned. Manual switching circuit lock type
A lock circuit that uses l as a start condition for automatic testing, a path (9) that generates an electrical quantity display signal to the p1 data output section in conjunction with the switching operation of the manual switching circuit, and a switching operation of the automatic switching circuit. The present invention will be described in detail below based on the illustrated embodiments. 1 shows an embodiment of the present invention, in which the amount of electricity tested is voltage. In the figure, / is a test switch, C is a transformer as a power source, and the secondary side is provided with a predetermined voltage cod 141 and C. J, u, and j are voltage dividers, and B is a locking switch, which is a contact point that immediately closes or opens.

4Bと、これとは逆の開閉状態となる接点40とを有し
ている。7は8接点2回路のロータリースイッチ、ざは
試験すべき機器(例えば、保II継電器)であり、出力
端子tl e 11間に接続されている。9はデータ出
力部としてのディジタルパネルメータ、10〜/6はリ
レーであり、リレーノ0−/JF、i ffイクロコン
ピュータからの信号で付替Sれhenこのうち、リレー
10は試験開始OためKMいゐものであって、その&接
点lO&l は前記試験用スイッチ/と並列に接続され
ている。tた、リレー//〜/Jは試験電圧の自動切換
えに用いるものであって、各リレー接点//al 、 
/Jul、 /Jalは出力端子t1と変圧器−の電圧
タップ49ロ、ハとO閲に接続されている。この自動切
換回路と並列にμツク用スイッチ≦の接点1ムとロータ
リースイッチ70一方O囲路 7−/とからなる手動切
換回路が接続されてい為。
4B, and a contact 40 that is in the opposite open/close state. 7 is a rotary switch with 8 contacts and 2 circuits, and 7 is a device to be tested (for example, a maintenance II relay), which is connected between output terminals TL and 11. 9 is a digital panel meter as a data output section, 10 to /6 are relays, which are switched by the signal from the relay node 0-/JF, i ff microcomputer.Of these, relay 10 is used to start the test. Its & contacts lO&l are connected in parallel with the test switch /. Relays //~/J are used for automatic switching of the test voltage, and each relay contact //al,
/Jul and /Jal are connected to the output terminal t1 and voltage taps 49, 49 and 49 of the transformer. This is because a manual switching circuit is connected in parallel with this automatic switching circuit, which is made up of a contact 1m of the μ-switch ≦ and a rotary switch 70, one of which is connected to an O circuit.

一方、リレーl参〜14#′iロータリースイッチ7の
他方の回路7−4とロック用スイッチ4の接点4Bを介
して入力電源端間に接続されている0重た、前記ディジ
タルパネルメータVは入力端子Xl 。
On the other hand, the digital panel meter V connected between the input power terminals via the other circuit 7-4 of the relay 1~14#'i rotary switch 7 and the contact 4B of the locking switch 4 is Input terminal Xl.

X11データ出力の丸めの出力端子yx I /1 m
71s電源膚’lt’l及び小数点信号端子す、 eb
l e 131 e ’b魯t−備えてお91入力端子
X@ 、XH関には前記リレー//、/コ、/J、/番
、#、/40纏点//1m、/コ&1 、 /Jam 
@ /4’a1. /jjl @ /4a1t−介して
前記分圧器j、@、Jの分圧電圧が選択的に入力さCる
ようになっている・そして、小数点信号端子b1 * 
bl + bl Kはマイクロコンビエータからの小数
点信号と前記リレー滓、/3./40接点/弘*@ 、
 /jam 、 /4amの開閉による信号が入力され
るようになっている。
Rounding output terminal of X11 data output yx I /1 m
71s power supply 'lt'l and decimal point signal terminal, eb
l e 131 e 'b Lut-Equipped with 91 input terminals /Jam
@ /4'a1. /jjl @ /4a1t- The divided voltages of the voltage dividers j, @, and J are selectively inputted to the decimal point signal terminal b1 *
bl + bl K is the decimal point signal from the micro combinator and the relay slag, /3. /40 contacts/Hiro*@,
Signals from the opening and closing of /jam and /4am are input.

次に、動作について述べる。Next, the operation will be described.

(1)  自動試験 自動試験の場合、ロック用スイッチ4f:ill示状態
とすると、その接点4Cの閉路によ〕マイクロコンピュ
ータの制御による自動制御回路(E示せず)のスタート
条件の一つが成立する。また、このとき、手動切換回路
はスィッチ40豪点4ムが開路しているのでロック状1
1IAKある。
(1) Automatic test In the case of an automatic test, when the lock switch 4f is set to the ill state, one of the start conditions for the automatic control circuit (E not shown) controlled by the microcomputer is satisfied by the closing of its contact 4C. . Also, at this time, the manual switching circuit is in the lock state 1 because switch 40 point 4m is open.
There is 1IAK.

リレー//、/コ、/Jはマイクロコンピュータの信号
によシいずれかが付勢される。例えば、リレー/lが付
勢されると、そC)@点//11 、 //ILIが閉
路して変圧器コO二次側の電圧タップイが選択される。
Any one of the relays //, /ko, /J is energized by a signal from the microcomputer. For example, when relay /l is energized, point C) @ point //11, //ILI is closed and the voltage tap on the secondary side of transformer CO is selected.

同時にディジタルパネルメータデの入方端子恥。At the same time, the input terminal of the digital panel meter is embarrassing.

Klは分圧器JK@続される。また、マイクロコンピュ
ータからの信号が端子bxK印加され、これによってデ
ィジタルパネルメータの電圧表示に適切な小数点表示が
行われる。
Kl is connected to a voltage divider JK@. Further, a signal from the microcomputer is applied to terminal bxK, whereby an appropriate decimal point is displayed in the voltage display of the digital panel meter.

これで自動試験準備が完了する。この後、送出されて龜
九マイクロコンピュータからの信号によpリレー10が
付勢され、そのII点IQ&1が閉路する。
This completes the automatic test preparation. Thereafter, the p-relay 10 is energized by the signal sent from the 9-microcomputer, and its II point IQ&1 is closed.

こO結果、変圧器−の二次側の電圧−ツブイの電圧がリ
レー接点171Kを介して供試機1!#に供給される。
As a result, the voltage on the secondary side of the transformer - the voltage on the tube is transferred to test machine 1 through relay contact 171K. # is supplied.

同時にこの電圧は分圧器Jと接点//&@f介してデイ
ジタルパネルメータヂO入力端子XI eXz間に印加
され、電圧表示が行われるとともに、出力端子71 +
 71 * 7mからデータがアンt−パックされてマ
イクロコンピュータのメモリに電圧値がd己憧される。
At the same time, this voltage is applied between the digital panel meter O input terminals XI eXz via the voltage divider J and the contact //&@f, and the voltage is displayed and the output terminal 71 +
The data from 71*7m is unpacked and the voltage value is stored in the memory of the microcomputer.

この後、所定の1験が完了すると、マイクロコンピュー
タからの信号によ)リレー10.//が順次消勢され、
最初の状態に復層する。
After that, when one predetermined test is completed, a signal from the microcomputer is sent to relay 10. // is deactivated one after another,
Return to the initial state.

一方、リレーノコまたは/Jが付勢された場合にはリレ
ー接点lコ亀lと/コミ露オたは/3a1 とlハ鵞が
閉路し、変圧器−の二次側の電圧タップ口またはハが選
択されるとともに、小数点信号が端子す璽tk惨輻また
はb3に印加され、前述と同様な動作が行われる。
On the other hand, when the relay saw or /J is energized, the relay contacts 1 and 3a1 and 1 and 3a1 are closed, and the voltage tap or the terminal on the secondary side of the transformer is closed. is selected, a decimal point signal is applied to the terminal tk or b3, and the same operation as described above is performed.

一ツク用スイッチits点4ム、jBが閉路するように
操作すると、接点10が開路してマイクロコンビエータ
による自動制御回路のスタート条件が成立ぜず、自動試
験がロックされる0また、四ツク用スイッチ1の接点4
ム、4]1SC)閉路によル手動切換回踏が形成される
。例えば、ロータリースイッチ70可動子が図示のよう
に接点ハ!に@触している40とすると、変圧器コの二
次側の電圧タッグハが選択される。同時にリレー/6が
付勢されるため、その接点/J&1 、 /jamが閉
路してデイジールパネルメータデの入力端子X1eXl
関に分圧1!jが接続され、また小数点浅水は端子りl
が選択されることによって電圧表示に適切な小数点表示
となる。
If the switch for one switch is operated so that points 4 and jB are closed, the contact 10 will open, and the conditions for starting the automatic control circuit by the micro combinator will not be established, and the automatic test will be locked. contact 4 of switch 1 for
4] 1SC) A manual switching circuit is formed by closing the circuit. For example, the movable element of the rotary switch 70 has a contact point H! as shown in the figure. When 40 is touched, the voltage tag on the secondary side of the transformer is selected. At the same time, relay /6 is energized, so its contacts /J&1 and /jam are closed, and the input terminals X1eXl of the daisyllel panel meter.
Partial pressure 1 in Seki! j is connected, and the decimal point is connected to the terminal l
By selecting , the decimal point display becomes appropriate for voltage display.

これで手動試験準備が完了する。この状態で試験用スイ
ッチ/を投入すると、変圧@JO二次側の電圧タツブハ
の電圧がロータリースイッチ70一方の回路7−/及び
ロック用スイッチ4011点ぶムを介して供試機器lK
供給される0同時にこの電圧は分圧器Sと接点74al
′1に介してデイジタルバネルメータタの入力端子X1
eXI間に印加され、電圧値が表示される。所定の試験
終了llK試験用スイッチ/を開路すると、手動試験は
完了する0 上記の手動試験で試験電圧を変更する場合は、ロータリ
ースイッチを操作すればよく、一方の回路7−/の接点
口′またはイ′に切換えると、電圧タップ口ま九はイが
選択される。同時にリレー/1會たは滓が付勢され、そ
の接点15a1とlj&l★九は滓&1と陣1sが閉路
して所要の試験回路が形成され、前述同様に手動試験を
行うことができる。
This completes the manual test preparation. When the test switch / is turned on in this state, the voltage on the secondary side of the transformer @JO is transferred to the test equipment lK via the rotary switch 70 (one circuit 7 - / and the lock switch 4011).
At the same time, this voltage is applied to voltage divider S and contact 74al.
'1 to the input terminal X1 of the digital panel meter.
It is applied between eXI and the voltage value is displayed. The manual test is completed when the test switch / is opened at the end of the specified test.0 If you want to change the test voltage in the above manual test, you only need to operate the rotary switch, and the contact port of one circuit 7-/ Or, if you switch to A', A is selected for the voltage tap. At the same time, relay/1 or slag is energized, and its contacts 15a1, lj&l★9, slag &1 and 1s are closed to form a required test circuit, and a manual test can be performed in the same manner as described above.

なお、前記実施例ではロータリースイッチ7によりリレ
ー滓〜/6を駆動する構成としたが、ロータリースイッ
チとして8接点4回路のものを用いればリレー滓〜16
は省略できる。!喪、図示及び説明は省略したが、入力
電源端部、即ちリレーIOの接点/□al及び試験用−
イツチ/の前段には自動及び手動のいずれでも調整可能
な調整器を有してお9、試験電圧の微設定が可能である
。更に、試験回路は電圧について例示したが、電流試験
回路にも同様に実施可能である。
In the above embodiment, the rotary switch 7 is configured to drive the relay sag ~/6, but if a rotary switch with 8 contacts and 4 circuits is used, the relay sag ~/6 will be driven by the rotary switch 7.
can be omitted. ! Although illustrations and explanations have been omitted, the input power supply end, that is, the relay IO contact/□al and the test
There is a regulator in front of the switch that can be adjusted either automatically or manually9, making it possible to finely set the test voltage. Furthermore, although the test circuit has been illustrated for voltage, it can be implemented similarly for a current test circuit.

果を奏する0 (1)lタロコンピュータ、パーソナルコンビュ−夕等
の割−による自動試験と手動試験の両方を行うことがで
きる共用形であるので、多量機種については自動試験、
少量機種については手動試験といった具合いに適宜使い
分けが可能となp1機動性に富む。
(1) Since it is a common type that can perform both automatic and manual tests using Taro Computer and Personal Computer, automatic tests and manual tests can be performed for large-volume models.
For small-volume models, p1 is highly flexible and can be used appropriately for manual testing.

(11)試験すべき4!l器に供給する電気量の電源部
は、自動試験と手動試験で共用となっている九め、回路
構成が藺単で経済的である。
(11) 4 to be tested! The power supply unit for supplying electricity to the device is shared between automatic and manual tests, and the circuit configuration is simple and economical.

(iie  自動試験と手動試験の両方に対してディジ
タルパネルメータの共用が可能であって、しかも小数点
表示を適切に行うことができ、機能的に優れている。
(iie) The digital panel meter can be used in common for both automatic testing and manual testing, and the decimal point can be displayed appropriately, making it functionally superior.

(Iψ 自動試験と手動試験はその一方をロック用スイ
ッチによって藺単にロックすることができる0
(Iψ Automatic testing and manual testing can be simply locked using a locking switch.

【図面の簡単な説明】[Brief explanation of drawings]

図面に本発明に係る試験回路の一実施例を示す回路図で
ある。 /・・・試験用スイッチ、コ・・・変圧器、j−j・・
・分圧器、4・・・ロック用スイッチ、7・・・ロータ
リースイッチ、l・・・供試機器、ヂ・・・ディジタル
パネルメータ、lO〜/4・・・リレー。
1 is a circuit diagram showing an embodiment of a test circuit according to the present invention; FIG. /...Test switch, Co...Transformer, j-j...
・Voltage divider, 4...Lock switch, 7...Rotary switch, l...Equipment under test, Di...digital panel meter, lO~/4...relay.

Claims (1)

【特許請求の範囲】[Claims] (1)  試験に要する電気量を発生する電源部と、試
験電気量を手動操作で切換える手動切換回路と、試験電
気量を自動的に切換光る自動切換回路と、前記手動切換
回路のロック状aを自動試験のスタート条件とするロッ
ク回路と、前記手動切換回路の切換動作に連動して電気
量表示信号を作り、データ出力部に付与する回路と、前
記自動切換I踏の切換動作に連動して電気量表示信号を
作力、データ出力部に付与する回路とを備えてなる試験
回路0
(1) A power supply unit that generates the amount of electricity required for the test, a manual switching circuit that manually switches the amount of electricity to be tested, an automatic switching circuit that automatically switches the amount of electricity to be tested, and a lock state a of the manual switching circuit. a lock circuit that makes the automatic test start condition, a circuit that generates an electric quantity display signal in conjunction with the switching operation of the manual switching circuit and applies it to the data output section, and a circuit that operates in conjunction with the switching operation of the automatic switching I step. A test circuit 0 comprising a circuit for applying an electric quantity display signal to a power output and a data output section.
JP57060775A 1982-04-12 1982-04-12 Test circuit Pending JPS58178268A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57060775A JPS58178268A (en) 1982-04-12 1982-04-12 Test circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57060775A JPS58178268A (en) 1982-04-12 1982-04-12 Test circuit

Publications (1)

Publication Number Publication Date
JPS58178268A true JPS58178268A (en) 1983-10-19

Family

ID=13151993

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57060775A Pending JPS58178268A (en) 1982-04-12 1982-04-12 Test circuit

Country Status (1)

Country Link
JP (1) JPS58178268A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100354637C (en) * 2003-09-09 2007-12-12 华为技术有限公司 Test circuit and test method thereof
CN108020738A (en) * 2017-11-27 2018-05-11 国网安徽省电力公司黄山供电公司 A kind of hard pressing plate verification auxiliary control device of substation

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100354637C (en) * 2003-09-09 2007-12-12 华为技术有限公司 Test circuit and test method thereof
CN108020738A (en) * 2017-11-27 2018-05-11 国网安徽省电力公司黄山供电公司 A kind of hard pressing plate verification auxiliary control device of substation

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