JPS58149502A - Device for controlling automatic setting of control sensitivity - Google Patents

Abstract

PURPOSE:To set automatically the control sensitivity to an optimum value and to improve and stabilize the precision of control, by controlling a system with the control sensitivity when an overshoot quantity becomes a set value in a controller of the feedback system. CONSTITUTION:When the target value from a function generating circuit of a materials tester is set to 0 and a control sensitivity automatic setting instruction is issued to a controller 13 for the purpose of setting automatically the control sensitivity, a minute square wave is generated from a minute square wave generator 11, and a switch S is turned on, and it is supplied to a multiplier 14. When an initial multiplier value is supplied from the controller 13, a deviation signal is obtained in the multiplier 14 by multiplication and is supplied to a controlled system 15 to control the overshoot quantity of the wave of a controlled variable. When the overshoot quantity is attained to the range of an optimum value, the multiplier is fixed and stored, and a stop command is issued to the minute square wave generator 11, and the switch S is turned off, thus completing automatic setting of the control sensitivity.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a feedback type control device, and more particularly to a control device having a function of automatically setting optimum control sensitivity.

In general, in a feedback automatic control system, the control amount from the controlled object is relatively soft with the set target value, and the deviation is calculated as the controlled object? Form a thread that increases the width of each other as much as necessary for l-Ma-r and supplies it to the controlled object as the amount of operation f1,
The control amount of the thread J! i depends on the above-mentioned degree of amplification, that is, control sensitivity.

Conventionally, for example, in a hydraulic actuator where the control sensitivity changes depending on the characteristics of the controlled object, etc., as shown in the block diagram of Fig. A control sensitivity setting device 6 is provided, and the control sensitivity suitable for the thread, that is, the proportional element P, is set each time the test is carried out.
All constant settings were changed. In this case, its controlling PI &
It is difficult to set the temperature to the optimum value with good reproducibility.
It is undeniable that human error occurs.

The present invention has been made in view of the above, and an object of the present invention is to provide a control device that is capable of automatically setting control sensitivity to an optimum value in accordance with the response characteristics of yarn.

The control device of the present invention supplies a minute square wave to the yarn as a target value, and overshoots the control amount waveform #I! according to the deviation from the controlled amount from the controlled object. I constant value Vc period is sequentially supplied to the controlled object as a phonograph operation amount multiplied by a predetermined multiplier value, and the multiplier value at the time when the overshoot amount reaches a preset value is stored, and its control φ4j sensitivity is It is characterized by controlling the system with -C.

Embodiments of the present invention will be described below with reference to the drawings.

FIG. 2 is a block diagram showing the configuration of an embodiment in which the present invention is applied to control a servo valve of an electric/hydraulic servo type material testing machine.

In an electric/hydraulic servo type material testing machine, a sine wave, a rectangular wave, a Glodarum wave, etc. are supplied as the target 11B from a function generator, and the control amount is an electrical amount that indicates the load, counterposition, etc. applied to the test material.

The minute square wave generation circuit 11 that outputs the full square wave is connected to the switch 8? It is connected to the summing point 12 via L, and supplies a square wave as shown in FIG. 8(a) as a target value based on a command from the controller 16. The peak value P of this square wave is selected to a value with an upper limit that does not affect the test material of the material testing machine, and a lower value that causes a state change in the controlled object, and the half cycle is The time t is selected to be longer than the normal speed-hiking of the object to be controlled, and yet as short as possible. The control amount is also fed back to the addition point 12 as a negative feedback factor, and a deviation signal between the target value and the control i is supplied to the multiplier 14. The multiplier 14 multiplies the deviation signal by a multiplier value supplied from the controller 1670, outputs the result, and supplies the result to the controlled object 15 as a manipulated variable. The control claw from the controlled object 15 is fed back to the addition point 12 as described above, and is also supplied to the overshoot amount measuring circuit 16.
As shown in FIG. 8(b), the overshoe 1-fit of the control amount waveform is measured and output, and is supplied to the controller 16. Circuit 1 measures this amount of overshoot.
Reference numeral 6 employs a circuit configuration that detects, for example, the peak value of the overshoot of the control amount with respect to the step input, and reduces the value of the target value in the flat state.

In the controller 16, the above-mentioned overshoot amount is compared with the optimal overshoot amount that is necessarily set, and outputted as a predetermined signal total multiplier value corresponding to the difference signal of 7, and supplied to the multiplier 14. . This operation is repeated one after another, and when the overshoot amount of the controlled variable waveform is within a certain predetermined range, the multiplier value at that time is completely fixed and memorized, and the minute square wave generation circuit 11 is commanded to stop. Sound and light. This controller 16 is a CPU.

It is composed of a microprocessor equipped with noM, , ttAm, etc., and the above-mentioned operations are executed according to a program.

Next, the operation of the embodiment of the present invention configured as described above will be explained.

When you want to set the control sensitivity fully automatically, the Mt value from the function generation circuit of the material testing machine is set to 0''. Then, when you issue a control sensitivity self-a setting command to the controller 11 using the keyboard, etc., the controller 16 A command is issued to the minute square wave generation circuit 11 to generate a minute square wave, and the switch 8 is activated.
i"ON"[(, is supplied to the multiplier 14 via the addition point 12. The controller 16 also supplies the initial multiplier value to a separately determined full multiplier 14. The multiplier 14 uses the initial multiplier value The multiplied deviation signal is multiplied by the deviation signal and supplied to the controlled object 15. Overshoe of control amount waveform) IN Fig. 8(b)
(b) TIIJ<, if it is smaller than the preset optimal overshoot amount, the controller 16
is output by increasing the multiplier value, and when the overshoot amount of the controlled variable waveform is larger than the preset optimal overshoot lid as in (c) of the 8th (M < b), the controller 11J multiplier is output. Output a smaller number. This operation is repeated one after another, and when the overshoot amount of the controlled variable falls within a predetermined range of the optimal overshoot amount as shown in (b) of Fig. 8 (1)), the multiplier 1ia' is identified and memorized, and a stop command is issued to the minute square wave generation circuit 11, and the switch 8 is turned OFF to complete the automatic setting of the control sensitivity.

In the embodiment of the present invention described above, a minute square wave generation circuit and a switch S were provided as means for generating a minute square wave.
Alternatively, the controller may generate a minute square wave by issuing a command to a device that supplies a target value to the original point, such as a function generating circuit of a material testing machine.

As explained above, according to the present invention, the control sensitivity, which was conventionally set by the user based on experience or intuition, can be automatically and quickly set to the optimal value, so the control sensitivity can be set to the optimum value with good reproducibility. In addition, it is possible to efficiently set control sensitivity without human error, improve the precision of the control, and measure stable shoe sound. In particular, in electric/hydraulic servo type materials testing machines, etc., the control sensitivity has been affected by various factors such as the characteristics of the controlled object, and it has been necessary to make complicated adjustments.
This research has made this work unnecessary, making it possible to obtain control accuracy with good reproducibility.

[Brief explanation of drawings]

Figure 1 shows the control sensitivity adjustment period 1 in a conventional control system.
FIG. 2 is a block diagram showing the configuration of the embodiment of the present invention, and FIG. 8 is a characteristic diagram showing all the minute square waves and control amount waveforms according to the embodiment of the invention. 1... Production 1 Karizo 2... Increased "(" section 6... Control sensitivity setting device 11... Minute square wave generation circuit 12... ... Force 11 Calculation point 16 ... Controller 14 ... Multiplier 15 ... Controlled object

Claims (1)

[Claims] means for generating a square wave; a multiplier that inputs a sum signal of the square wave signal and a negative feedback signal from the controlled object, multiplies it by a predetermined multiplier value, and supplies the result to the controlled object; Output control jt? c- An overshoot amount measuring circuit that measures the amount of overshoot of the controlled variable waveform by human input, and a circuit that compares the overshoot amount measurement value with a preset overshoot amount setting value and generates a signal according to the difference signal. A control sensitivity automatic setting control device comprising: a controller that sequentially supplies the multiplier value to the multiplier and stores the multiplier value at the time when the overshoot amount of the control signal waveform reaches a predetermined value.