JPS58145558U - flaw detector - Google Patents
flaw detectorInfo
- Publication number
- JPS58145558U JPS58145558U JP4385282U JP4385282U JPS58145558U JP S58145558 U JPS58145558 U JP S58145558U JP 4385282 U JP4385282 U JP 4385282U JP 4385282 U JP4385282 U JP 4385282U JP S58145558 U JPS58145558 U JP S58145558U
- Authority
- JP
- Japan
- Prior art keywords
- gate
- gates
- supplied
- flaw detector
- gate opening
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
- G01N2291/044—Internal reflections (echoes), e.g. on walls or defects
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図は従来及びこの考案による探傷機に用いる傷感知
器の配置状態を示す図、第2図は従来の探傷機のブロッ
ク図、第3図はこの考案による探傷機のブロック図、第
4図は同深傷機のタイムチャートである。
2乃至5・・・傷感知器、7・・・カウンタ、10乃至
13・・・アンド回路、14乃至17,18乃至21・
・・ゲート開放信号発生回路。
−(d)桑短葵3
(グ]ノ:sye牟11艶14Fig. 1 is a diagram showing the arrangement of flaw detectors used in conventional and inventive flaw detectors, Fig. 2 is a block diagram of the conventional flaw detector, Fig. 3 is a block diagram of the inventive flaw detector, and Fig. 4 is a block diagram of the flaw detector in accordance with the invention. The figure is a time chart of the same deeply damaged machine. 2 to 5...Flaw detector, 7...Counter, 10 to 13...AND circuit, 14 to 17, 18 to 21.
...Gate open signal generation circuit. -(d) Mulberry Short Aoi 3 (g)ノ: Sye Mu 11 Aya 14
Claims (2)
設けた傷感知器と、この感知器からの感知出力が供給さ
れるゲートと、上記感知出力に応動してこの感知出力発
生時から第1の時間経過後に第2の時間持続してゲート
開放信号を発生する回路とを1組として、これをn(n
は1以上の整数)組設け、各組の上記ゲート開放信号を
持続のゲートに供給し、最終組の上記ゲート開放信号を
第1組のゲートに供給し、上記各組のゲートからの出力
信号数をカウントし、そのカウント値が設定値に所定時
間内に達したとき出力を発生するカウンタを設けてなる
探傷機。(1) A scratch sensor provided to move relative to the outer surface of a long object in a spiral pattern, a gate to which a sensing output from this sensor is supplied, and a sensing output responsive to the sensing output. A circuit that continues to generate a gate open signal for a second period of time after the first period of time has elapsed from the time of generation is set as one set, and this is defined as n(n
is an integer greater than or equal to 1), the gate opening signals of each set are supplied to the continuous gates, the gate opening signals of the final set are supplied to the first set of gates, and the output signals from the gates of each set are provided. A flaw detector equipped with a counter that counts numbers and generates an output when the count value reaches a set value within a predetermined time.
回路を1組だけ設け、上記ゲート開放信号発生回路のゲ
ート開放信号をその組のゲートに供給したことを特徴と
する実用新案登録請求の範囲第1項記載の探傷機。(2) Claims for registration of a utility model characterized in that only one set of the flaw detector, the gate, and the gate opening signal generating circuit is provided, and the gate opening signal of the gate opening signal generating circuit is supplied to the gates of the set. The flaw detector described in paragraph 1.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4385282U JPS58145558U (en) | 1982-03-26 | 1982-03-26 | flaw detector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4385282U JPS58145558U (en) | 1982-03-26 | 1982-03-26 | flaw detector |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58145558U true JPS58145558U (en) | 1983-09-30 |
JPH0213972Y2 JPH0213972Y2 (en) | 1990-04-17 |
Family
ID=30054923
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4385282U Granted JPS58145558U (en) | 1982-03-26 | 1982-03-26 | flaw detector |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58145558U (en) |
-
1982
- 1982-03-26 JP JP4385282U patent/JPS58145558U/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPH0213972Y2 (en) | 1990-04-17 |
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