JPS58141848U - Surface defect detection device using laser - Google Patents

Surface defect detection device using laser

Info

Publication number
JPS58141848U
JPS58141848U JP3796382U JP3796382U JPS58141848U JP S58141848 U JPS58141848 U JP S58141848U JP 3796382 U JP3796382 U JP 3796382U JP 3796382 U JP3796382 U JP 3796382U JP S58141848 U JPS58141848 U JP S58141848U
Authority
JP
Japan
Prior art keywords
laser
detection device
defect detection
surface defect
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3796382U
Other languages
Japanese (ja)
Inventor
斎藤 知行
一彦 三井
大下 如央
安吉 啓一
後藤 国親
Original Assignee
株式会社日立製作所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社日立製作所 filed Critical 株式会社日立製作所
Priority to JP3796382U priority Critical patent/JPS58141848U/en
Publication of JPS58141848U publication Critical patent/JPS58141848U/en
Pending legal-status Critical Current

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案によるレーザーを利用した表面欠陥検出
装置の一実施例を示す説明図、第2図は1個の受光端子
が欠陥検出時に生ずる電流変化を示す線図、第3図は第
2図に示すような特性を持つ2個の受光端子で欠陥検出
した場合の検出電流の位相ずれを示す線図である。 1・・・・・・被測定物、2・・・・・・対物レンズ、
3・・・・・・レーザー発信器、4a、、4b・・・・
・・レーザー光線、5・・・・・・受光レンズ、6,7
・・・・・・受光端子、訃・・・・・欠陥。
Fig. 1 is an explanatory diagram showing one embodiment of a surface defect detection device using a laser according to the present invention, Fig. 2 is a diagram showing a current change that occurs when one light receiving terminal detects a defect, and Fig. 3 is a diagram showing an example of a surface defect detection device using a laser according to the present invention. FIG. 2 is a diagram showing a phase shift of a detected current when a defect is detected using two light receiving terminals having characteristics as shown in FIG. 2; 1...Object to be measured, 2...Objective lens,
3... Laser transmitter, 4a, 4b...
...Laser beam, 5... Light receiving lens, 6,7
......Light receiving terminal, ...defect.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 対物レンズを介してレーザー光線を被測定物表面に照射
するレーザー発信器と、受光レンズを介して被測定物で
反射されたレーザー光線を受光する2個の受光端子を設
けたことを特徴とするレーザーを利用した表面欠陥検出
装置。
A laser characterized by being provided with a laser transmitter that irradiates a laser beam onto the surface of an object to be measured through an objective lens, and two light-receiving terminals that receive the laser beam reflected by the object to be measured through a light-receiving lens. Surface defect detection device used.
JP3796382U 1982-03-19 1982-03-19 Surface defect detection device using laser Pending JPS58141848U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3796382U JPS58141848U (en) 1982-03-19 1982-03-19 Surface defect detection device using laser

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3796382U JPS58141848U (en) 1982-03-19 1982-03-19 Surface defect detection device using laser

Publications (1)

Publication Number Publication Date
JPS58141848U true JPS58141848U (en) 1983-09-24

Family

ID=30049328

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3796382U Pending JPS58141848U (en) 1982-03-19 1982-03-19 Surface defect detection device using laser

Country Status (1)

Country Link
JP (1) JPS58141848U (en)

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