JPS58101111U - Device for detecting unevenness on object surface - Google Patents

Device for detecting unevenness on object surface

Info

Publication number
JPS58101111U
JPS58101111U JP19503881U JP19503881U JPS58101111U JP S58101111 U JPS58101111 U JP S58101111U JP 19503881 U JP19503881 U JP 19503881U JP 19503881 U JP19503881 U JP 19503881U JP S58101111 U JPS58101111 U JP S58101111U
Authority
JP
Japan
Prior art keywords
light emitting
light
object surface
inspected
receiving elements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19503881U
Other languages
Japanese (ja)
Inventor
浩 國枝
Original Assignee
富士電機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 富士電機株式会社 filed Critical 富士電機株式会社
Priority to JP19503881U priority Critical patent/JPS58101111U/en
Publication of JPS58101111U publication Critical patent/JPS58101111U/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は本考案による物体表面の凹凸検知装置の構成の
一例を示す概念図、第２図は本考案に用いる信号処理回
路の構成の一例を示すブロック図Ｊ第３図はその各端子
から得られる出力の波形図である。 １・・・発光部、２・・・紙葉類、３・・・投光線、３
Ａ・・・点、４，５・・・反射線、６，７・・・受光部
、８．９・・・端子、１０・・・凸部、ｓｌ、　ｓ２．
　ｓ３・・・出力、１１゜１２、　１３．　１４．　１
５・・・回路。Fig. 1 is a conceptual diagram showing an example of the configuration of the device for detecting irregularities on the surface of an object according to the present invention. Fig. 2 is a block diagram showing an example of the configuration of the signal processing circuit used in the present invention. It is a waveform diagram of the output obtained. 1... Light emitting part, 2... Paper leaf, 3... Light emitting line, 3
A...Point, 4,5...Reflection line, 6,7...Light receiving part, 8.9...Terminal, 10...Protrusion, sl, s2.
s3...output, 11°12, 13. 14. 1
5...Circuit.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 被検査物体の表面に垂直に光を照射する発光素子と、該
発光素子の投光線を含９同一平面上で前記投光線に対称
な等角度に反射する光をそれぞれ受光する２つの受光素
子と、該受光素子のそれぞれからの相異する出力により
前記被検査物体の表面の凹凸を検知する信号処理回路と
を具備したことを特徴とする物体表面の凹凸検知装置。A light emitting element that irradiates light perpendicularly to the surface of the object to be inspected, and two light receiving elements that each receive light that is reflected at equal angles symmetrical to the light emitting line on the same plane including the light emitting line of the light emitting element. An apparatus for detecting irregularities on the surface of an object, comprising: a signal processing circuit that detects irregularities on the surface of the object to be inspected using different outputs from each of the light receiving elements.
JP19503881U 1981-12-28 1981-12-28 Device for detecting unevenness on object surface Pending JPS58101111U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19503881U JPS58101111U (en) 1981-12-28 1981-12-28 Device for detecting unevenness on object surface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19503881U JPS58101111U (en) 1981-12-28 1981-12-28 Device for detecting unevenness on object surface

Publications (1)

Publication Number Publication Date
JPS58101111U true JPS58101111U (en) 1983-07-09

Family

ID=30108326

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19503881U Pending JPS58101111U (en) 1981-12-28 1981-12-28 Device for detecting unevenness on object surface

Country Status (1)

Country Link
JP (1) JPS58101111U (en)

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